JPWO2020148277A5 - - Google Patents
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- JPWO2020148277A5 JPWO2020148277A5 JP2021541026A JP2021541026A JPWO2020148277A5 JP WO2020148277 A5 JPWO2020148277 A5 JP WO2020148277A5 JP 2021541026 A JP2021541026 A JP 2021541026A JP 2021541026 A JP2021541026 A JP 2021541026A JP WO2020148277 A5 JPWO2020148277 A5 JP WO2020148277A5
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- 230000000737 periodic Effects 0.000 claims 14
- 230000003287 optical Effects 0.000 claims 8
- 230000001264 neutralization Effects 0.000 claims 6
- 238000005530 etching Methods 0.000 claims 5
- 239000000758 substrate Substances 0.000 claims 4
- 230000036278 prepulse Effects 0.000 claims 3
- 238000005286 illumination Methods 0.000 claims 2
- 210000002381 Plasma Anatomy 0.000 claims 1
- 230000000875 corresponding Effects 0.000 claims 1
- 230000001066 destructive Effects 0.000 claims 1
- 238000003384 imaging method Methods 0.000 claims 1
- 230000002452 interceptive Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 239000002086 nanomaterial Substances 0.000 claims 1
- 230000001629 suppression Effects 0.000 claims 1
Claims (22)
- 3つの回折構造レベル(N1~N3;N1~N4;N1~N5)を有する回折構造を含む周期的格子構造プロファイルを含み、
- 前記3つの回折構造レベルが、参照平面を基準にして異なる構造深さを事前画定し、
- 前記回折構造の配列は、第1の目標波長が前記周期的格子構造プロファイルによって回折される赤外線波長範囲の第1の目標波長λ1のまわりの波長範囲が、前記第1の目標波長λ1の少なくとも0次および/または±1次の回折で、互いに破壊的に干渉する少なくとも3つの異なる位相を有する放射線成分を有するようなものであり、
- 前記回折構造レベル(N1~N3;N1~N4;N1~N5)が、周期走行方向(x)に沿って規則的に繰り返される前記周期的格子構造プロファイルの格子周期(p)のトポグラフィーを事前画定し、
- 前記回折構造レベル(N1~N3;N1~N4;N1~N5)が、
-- ゼロの参照高さに対応するニュートラル回折構造レベル(N2)と、
-- 前記ニュートラル回折構造レベル(N2)を基準にしてλ1/4±20%の光路長だけ高く配列された正回折構造レベル(N1)と、
-- 前記ニュートラル回折構造レベル(N2)を基準にしてλ1/4±20%の光路長だけ低く配列された負回折構造レベル(N3;N3,N4;N3,N4,N5)と
を含む、光回折構成要素。 an optically diffractive component (64; 117; 118; 119; 120; 121),
- comprising a periodic grating structure profile comprising diffractive structures with three diffractive structure levels (N 1 -N 3 ; N 1 -N 4 ; N 1 -N 5 ),
- the three diffractive structure levels predefine different structure depths with respect to a reference plane,
- said array of diffractive structures is such that a wavelength range around a first target wavelength λ 1 in the infrared wavelength range at which said first target wavelength is diffracted by said periodic grating structure profile is said first target wavelength λ 1 having at least three out-of-phase radiation components that destructively interfere with each other in at least the 0th and/or ±1st diffraction orders of
- said diffraction structure levels (N 1 -N 3 ; N 1 -N 4 ; N 1 -N 5 ) are grating periods ( predefining the topography of p);
- said diffraction structure levels (N 1 -N 3 ; N 1 -N 4 ; N 1 -N 5 ) are
-- a neutral diffractive structure level ( N2 ) corresponding to a reference height of zero;
-- a forward diffraction structure level (N 1 ) arranged higher than the neutral diffraction structure level (N 2 ) by an optical path length of λ 1 /4±20%;
-- Negative diffraction structure levels ( N3; N3 , N4 ; N3 , N4 , N 5 ).
ことを特徴とする請求項2に記載の光回折構成要素。 3. A light-diffractive component according to claim 2, characterized in that the four periodic sections have the same length ( xN ) ±20% along the periodic travel direction (x).
- 参照平面を基準にして異なる構造深さ(di)を事前画定する少なくとも3つの回折構造レベル(Ni)を含み、
- 前記3つの回折構造レベル(Ni)が、少なくとも2つの回折構造グループ(35,36;61,62;65,66;72,73;77,78,79;81,82,83;87,88,89;N1,N2;N2,N3;N3,N1;Nn,Nn+1)に割り当て可能であり、
- 前記回折構造グループのうちの第1のもの(35;61;65;72;77;81;87;Nn,Nn+1)が、0次の回折で第1の目標波長λ1を抑制するために具現化され、
- 前記回折構造グループのうちの第2のもの(36;62;66;73;78;82;88;Nn+1,Nn+2)が、前記0次の回折で第2の目標波長λ1を抑制するために具現化され、
- 前記2つの目標波長λ1およびλ2に対して、(λ1-λ2)2/(λ1+λ2)2<20%が当てはまり、
- 前記回折構造レベル(Ni)のトポグラフィーが、2つのバイナリ回折構造グループ(35,36;61,62;65,66;72,73;77,78,79;81,82,83;87,88,89)の重ね合わせとして記述され得るものであり、
- 前記バイナリ回折構造グループの各々が、
-- 第1の構造深さを有する第1の表面セクション(61P;62P)と、
-- 第2の構造深さを有し、走行方向(x)に沿って前記第1の表面セクション(61P、61N)と交互になる第2の表面セクション(61N;62N)と、
を有し、
- 前記バイナリ回折構造グループ(35,36;61,62;65,66;72,73;77,78,79;81,82,83;87,88,89;N1,N2;N2,N3;N3,N1;Nn,Nn+1)の各々の隣接する表面セクション(61P,61N;62P,62N)間の境界領域(N3/N1,N2/N4,N4/N3,N1/N2)が、直線状コースを有し、
-- 前記2つのバイナリ回折構造グループ(35,36;61,62;65,66;72,73;77,78,79;81,82,83;87,88,89;N1,N2;N2,N3;N3,N1;Nn,Nn+1)のうちの前記第1のものの第1の境界領域(N3/N1,N2/N4)、および
-- 前記2つのバイナリ回折構造グループ(35,36;61,62;65,66;72,73;77,78,79;81,82,83;87,88,89;N1,N2;N2,N3;N3,N1;Nn,Nn+1)のうちの前記第2のものの第2の境界領域(N4/N3,N1/N2)が、
-- せいぜいそれらの直線状コースのセクションに沿って互いに重ね合わされる、光回折構成要素。 an optically diffractive component (34; 46; 47; 57; 58; 59; 60; 64; 71; 76; 80; 86; 91; 92 for suppressing at least one target wavelength (λ N ) by destructive interference; 93; 94; 95; 117; 118; 119; 120; 121),
- comprising at least three diffractive structure levels (N i ) predefining different structure depths (d i ) with respect to the reference plane,
- said three diffractive structure levels (N i ) comprise at least two diffractive structure groups (35,36; 61,62; 65,66; 72,73; 77,78,79; 81,82,83; 87, N1 , N2 ; N2 , N3; N3, N1; Nn, Nn +1 ) ;
- a first one of said group of diffractive structures (35; 61; 65; 72; 77; 81; 87; N n , N n+1 ) transmits a first target wavelength λ 1 in the 0th diffraction order; embodied to suppress,
- the second one of said group of diffractive structures (36; 62; 66; 73; 78; 82; 88; N n+1 , N n+2 ) has a second target wavelength in said 0th diffraction order; embodied to suppress λ1,
- for said two target wavelengths λ 1 and λ 2 , (λ 1 −λ 2 ) 2 /(λ 1 +λ 2 ) 2 < 20% holds,
- said diffractive structure level (N i ) topography comprises two binary diffractive structure groups (35,36; 61,62; 65,66; 72,73; 77,78,79; 81,82,83;87 , 88, 89), and
- each of said binary diffractive structure groups,
-- a first surface section (61 P ; 62 P ) having a first structure depth;
-- second surface sections (61 N ; 62 N ) having a second structural depth and alternating with said first surface sections (61 P , 61 N ) along the direction of travel (x); ,
has
- said binary diffraction structure group (35,36; 61,62; 65,66; 72,73; 77,78,79; 81,82,83; 87,88,89 ; N1, N2 ; N2 , N3; N3, N1; Nn , Nn+1 ) border regions ( N3 / N1 , N2 ) between adjacent surface sections ( 61P , 61N; 62P , 62N ). / N4 , N4 /N3 , N1/ N2 ) has a linear course,
-- the two binary diffraction structure groups (35, 36; 61, 62; 65, 66; 72, 73; 77, 78, 79; 81, 82, 83; 87, 88, 89; N2 , N3; N3, N1 ; Nn , Nn+1 ) of said first one (N3/N1 , N2 / N4 ), and -- 61,62; 65,66; 72,73; 77,78,79; 81,82,83; 87,88,89 ;N1, N2 ; N2 , N3; N3, N1; Nn, Nn+1 ) , the second boundary region ( N4 / N3 , N1 / N2 ) of the second one of
-- Optically diffractive components superimposed on each other along sections of their linear course at most.
-- 第1の格子周期(ph;p1)を有し、
-- 第1の回折正構造(37)と第1の回折負構造(38)との間の、これらの第1の構造(37,38)をそれぞれ囲む前記格子表面(33)の表面セクションに対して垂直な光路差として測定される第1の構造深さ(dh;d1)を有し、
- 前記回折構造グループのうちの第2のもの(36;62;66;73;78;82;88)が、第2の回折格子として具現化され、前記第2の回折格子が、前記格子表面(33)に配列され、
-- 第2の格子周期(pv;p2)を有し、
-- 第2の回折正構造(40)と第2の回折負構造(41)との間の、これらの第2の構造(40,41)をそれぞれ囲む前記格子表面(33)の表面セクションに対して垂直な光路差として測定される第2の構造深さ(dv;d2)を有することを特徴とする請求項6または7に記載の光回折構成要素。 A first one of said diffraction structure groups (35; 61; 65; 72; 77; 81; 87) is embodied as a first diffraction grating, said first diffraction grating comprising a grating surface (33 ), and
-- having a first grating period (ph; p 1 ),
-- in the surface section of said grating surface (33) between a first diffractive positive structure (37) and a first diffractive negative structure (38) and surrounding these first structures (37, 38) respectively; having a first structure depth (dh; d 1 ) measured as the optical path difference perpendicular to
- a second one of said groups of diffraction structures (36; 62; 66; 73; 78; 82; 88) is embodied as a second diffraction grating, said second diffraction grating comprising said grating surface; (33) and
-- having a second grating period (pv; p 2 ),
-- in the surface section of said grating surface (33) between a second positive diffractive structure (40) and a second negative diffractive structure (41) and surrounding these second structures (40, 41) respectively; 8. A light-diffractive component according to claim 6 or 7 , characterized in that it has a second structure depth (dv; d2) measured as the optical path difference perpendicular to it.
- 前記第2の格子周期(pv)が、前記第2の回折格子(36)の第2の周期走行方向(42)に沿って延び、
- 前記2つの周期走行方向(39,42)が、互いに平行に延びないことを特徴とする請求項8に記載の光回折構成要素。 - said first grating period (ph) extends along a first period running direction (39) of said first diffraction grating (35),
- said second grating period (pv) extends along a second period running direction (42) of said second grating (36),
- the light-diffractive component according to claim 8 , characterized in that the two periodic directions of travel (39, 42) do not run parallel to each other.
- さらなる回折正構造(49)およびさらなる回折負構造(50)を有し、前記さらなる回折負構造(50)の表面積に対する前記さらなる回折正構造(49)の表面積の表面積比が0.9と1.1との間の範囲にあり、
- さらなる格子周期(pd)を有し、
- 前記さらなる回折正構造(49)と前記さらなる回折負構造(50)との間の、これらのさらなる構造(49,50)をそれぞれ囲む前記格子表面(33)の表面セクションに対して垂直な光路差として測定されるさらなる構造深さ(dd)を有する、
少なくとも1つのさらなる回折格子(48)を特徴とする請求項8または9に記載の光回折構成要素。 at least one further diffraction grating (48) arranged on said grating surface (33);
- a further diffractive positive structure (49) and a further diffractive negative structure (50) with a surface area ratio of the surface area of said further diffractive positive structure (49) to the surface area of said further diffractive negative structure (50) between 0.9 and 1 is in the range between .1 and
- has an additional grating period (pd),
- an optical path between said further diffractive positive structure (49) and said further diffractive negative structure (50) perpendicular to the surface sections of said grating surface (33) surrounding these further structures (49, 50) respectively; with additional structural depth (dd) measured as a difference,
10. Optically diffractive component according to claim 8 or 9 , characterized by at least one further diffraction grating (48).
- 0.9と1.1との間の範囲の、前記さらなる格子周期(pd)に対する前記第1の格子周期(ph)の周期比(ph/pd)、および/または
-- 前記第1の格子周期(ph)が、前記第1の回折格子(35)の第1の周期走行方向(39)に沿って延び、
-- 前記さらなる格子周期(pd)が、前記さらなる回折格子(48)のさらなる周期走行方向(51)に沿って延び、
-- 前記2つの周期走行方向(39,51)が、互いに平行に延びないことを特徴とする請求項10に記載の光回折構成要素。 - the ratio (pd/dd) between said further grating period (pd) and said further structure depth (dd) greater than 10, and/or - in the range between 0.9 and 1.1 , the period ratio (ph/pd) of said first grating period (ph) to said further grating period (pd), and/or -- said first grating period (ph) is greater than said first grating ( 35) extending along the first periodic direction of travel (39);
-- said further grating period (pd) extends along a further period running direction (51) of said further grating (48),
-- Light-diffractive component according to claim 10 , characterized in that the two periodic directions of travel (39, 51) do not run parallel to each other.
- レチクル(10)およびウェハ(11)を用意するステップと、
- 請求項18または19に記載の前記投影露光装置の助けによって、前記レチクル(10)の構造を前記ウェハ(11)の感光層上に投影するステップと、
- 前記ウェハ(11)にミクロ構造および/またはナノ構造を生成するステップと
を含む、方法。 A method for generating structured components, comprising the following method steps:
- providing a reticle (10) and a wafer (11);
- projecting structures of the reticle (10) onto a photosensitive layer of the wafer (11) with the aid of the projection exposure apparatus according to claim 18 or 19;
- producing microstructures and/or nanostructures in said wafer (11).
- 基板を用意するステップと、
- エッチング媒体のために前記基板と源との間に配列される、エッチング媒体を通さないマスク領域(113,115;128,129,132,133;138,139,142,143;149,150,153;158,159,162)を有し、介在マスク間隙(114,116;130,131,134,135;140,141,144,145;151,152,154;160,161,163)を有する少なくとも1つのマスク構造(105,106;111,112;126,127;136,137;147,148;156,157)を用意するステップと、
- 前記エッチング媒体によって前記基板の第1のエッチングを行うステップと、
- 前記マスク構造(111;126;136;147;156)をさらなるマスク構造(112;127;137;148;157)と交換する、および/または前記走行方向(x)に沿って前記マスク構造(105;126)を変位させるステップと、
- 前記エッチング媒体によって前記基板の第2のエッチングを行うステップと
を含む、方法。 A method for producing an optically diffractive component according to any of claims 1-12, comprising the steps of:
- providing a substrate;
- etching medium impervious mask areas (113, 115; 128, 129, 132, 133; 138, 139, 142, 143; 149, 150, 149, 150, 153; 158, 159, 162) with intervening mask gaps (114, 116; 130, 131, 134, 135; 140, 141, 144, 145; 151, 152, 154; 160, 161, 163) providing at least one mask structure (105, 106; 111, 112; 126, 127; 136, 137; 147, 148; 156, 157);
- performing a first etching of the substrate with the etching medium;
- replacing said mask structures (111; 126; 136; 147; 156) with further mask structures (112; 127; 137; 148; 157) and/or along said running direction (x) said mask structures ( 105; 126);
- performing a second etching of said substrate with said etching medium.
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DE102019200376.1A DE102019200376A1 (en) | 2019-01-15 | 2019-01-15 | Optical diffraction component for suppressing at least one target wavelength by destructive interference |
DE102019200376.1 | 2019-01-15 | ||
DE102019210450.9 | 2019-07-16 | ||
DE102019210450.9A DE102019210450A1 (en) | 2019-07-16 | 2019-07-16 | Optical diffraction component for the suppression of at least one target wavelength through destructive interference |
PCT/EP2020/050809 WO2020148277A1 (en) | 2019-01-15 | 2020-01-14 | Optical diffraction component for suppressing at least one target wavelength by destructive interference |
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EP (1) | EP3912000A1 (en) |
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Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI831898B (en) | 2019-01-15 | 2024-02-11 | 德商卡爾蔡司Smt有限公司 | Optical diffraction component for suppressing at least one target wavelength by destructive interference |
US11448918B2 (en) * | 2019-01-30 | 2022-09-20 | Samsung Electronics Co., Ltd. | Grating device, screen including the grating device, method of manufacturing the screen and display apparatus for augmented reality and/or virtual reality including the screen |
DE102019213063A1 (en) * | 2019-08-30 | 2021-03-04 | Carl Zeiss Smt Gmbh | Diffractive optical component |
DE102020212367A1 (en) | 2020-09-30 | 2022-03-31 | Carl Zeiss Smt Gmbh | Optical component |
DE102022203745A1 (en) | 2022-04-13 | 2022-09-15 | Carl Zeiss Smt Gmbh | EUV collector for an EUV projection exposure system |
DE102022207545A1 (en) | 2022-07-25 | 2023-04-27 | Carl Zeiss Smt Gmbh | Optical component |
DE102022209791B3 (en) | 2022-09-19 | 2023-07-06 | Carl Zeiss Smt Gmbh | EUV collector for an EUV projection exposure system |
CN116559986B (en) * | 2023-05-15 | 2024-05-10 | 暨南大学 | Dot matrix projector device and preparation method thereof |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1537703A (en) * | 1976-01-27 | 1979-01-04 | Rca Corp | Fabrication of rectangular relief profiles in photoresist |
CA2073409A1 (en) * | 1991-10-15 | 1993-04-16 | Paul F. Sullivan | Light beam position detection and control apparatus employing diffraction patterns |
DE19516741C2 (en) | 1995-05-06 | 1997-05-07 | Kurz Leonhard Fa | Diffractive-optical structure arrangement |
JP3472103B2 (en) * | 1997-09-10 | 2003-12-02 | キヤノン株式会社 | Diffractive optical element and optical system using the same |
JP2000299197A (en) * | 1999-04-13 | 2000-10-24 | Agency Of Ind Science & Technol | X-ray generator |
DE10054503B4 (en) | 2000-11-03 | 2005-02-03 | Ovd Kinegram Ag | Light diffractive binary lattice structure and security element with such a lattice structure |
DE60312871T2 (en) | 2002-08-26 | 2007-12-20 | Carl Zeiss Smt Ag | GRID BASED SPECTRAL FILTER FOR SUPPRESSING RADIATION OUTSIDE THE UTILITY BAND IN AN EXTREMELY ULTRAVIOLET LITHOGRAPHY SYSTEM |
FR2864252B1 (en) * | 2003-12-23 | 2006-04-07 | Jobin Yvon Sas | ALTERNATE MULTILAYER STACKING DIFFRACTION NETWORK AND METHOD FOR MANUFACTURING SAME AND SPECTROSCOPIC DEVICES HAVING THESE NETWORKS |
EP1743197B1 (en) * | 2004-04-23 | 2011-08-10 | Olivier M. Parriaux | High efficiency optical diffraction device |
JP4673120B2 (en) * | 2004-04-28 | 2011-04-20 | キヤノン株式会社 | Diffractive optical element and optical system having the same |
JP4345625B2 (en) * | 2004-09-22 | 2009-10-14 | 株式会社島津製作所 | Diffraction grating |
EP1932051A1 (en) | 2005-09-14 | 2008-06-18 | Mirage Innovations Ltd. | Diffraction grating with a spatially varying duty-cycle |
US7710651B2 (en) * | 2007-03-23 | 2010-05-04 | Canon Kabushiki Kaisha | Contacting two-layer diffractive optical element |
JP2010244588A (en) * | 2009-04-01 | 2010-10-28 | Sharp Corp | Diffraction element for two wavelength, and optical pickup using the same |
DE102009044462A1 (en) | 2009-11-06 | 2011-01-05 | Carl Zeiss Smt Ag | Optical element for filtering electromagnetic radiations for illuminating system of projection exposure system, has multilayer structure, which is designed for reflection of electromagnetic radiations in extreme ultraviolet wavelength range |
NL2007215A (en) * | 2010-09-08 | 2012-03-12 | Asml Netherlands Bv | Lithographic apparatus, device manufacturing method, and method of applying a pattern to a substrate. |
US9151881B2 (en) | 2012-11-12 | 2015-10-06 | Kla-Tencor Corporation | Phase grating for mask inspection system |
WO2014114405A2 (en) | 2013-01-28 | 2014-07-31 | Asml Netherlands B.V. | Projection system, mirror and radiation source for a lithographic apparatus |
JP6232210B2 (en) * | 2013-06-03 | 2017-11-15 | ギガフォトン株式会社 | Mirror device, extreme ultraviolet light generation device, and extreme ultraviolet light generation system |
JP6357892B2 (en) * | 2014-06-09 | 2018-07-18 | 凸版印刷株式会社 | Optical element |
CN104567695B (en) * | 2015-01-09 | 2017-06-13 | 哈尔滨工业大学 | A kind of three-D displacement measurement apparatus of use double-frequency laser and diffraction grating |
DE102016209359A1 (en) | 2016-05-31 | 2017-11-30 | Carl Zeiss Smt Gmbh | EUV collector |
CN109479057B (en) | 2016-07-15 | 2021-11-23 | 三星电子株式会社 | System and method for managing audio cut-in policy in MCPTT communication |
EP3333633A1 (en) * | 2016-12-09 | 2018-06-13 | ASML Netherlands B.V. | Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus |
US11747528B2 (en) * | 2018-08-31 | 2023-09-05 | Samsung Electronics Co., Ltd. | Diffraction grating device, method of manufacturing the same, and optical apparatus including the diffraction grating device |
TWI831898B (en) | 2019-01-15 | 2024-02-11 | 德商卡爾蔡司Smt有限公司 | Optical diffraction component for suppressing at least one target wavelength by destructive interference |
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2019
- 2019-12-26 TW TW108147872A patent/TWI831898B/en active
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2020
- 2020-01-10 US US16/739,320 patent/US10852640B2/en active Active
- 2020-01-14 WO PCT/EP2020/050809 patent/WO2020148277A1/en unknown
- 2020-01-14 EP EP20701541.3A patent/EP3912000A1/en active Pending
- 2020-01-14 CN CN202080009374.3A patent/CN113302559A/en active Pending
- 2020-01-14 JP JP2021541026A patent/JP2022518221A/en active Pending
- 2020-01-14 KR KR1020217025462A patent/KR20210112377A/en unknown
- 2020-11-17 US US16/950,173 patent/US11194256B2/en active Active
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