JPWO2012160801A1 - 受動qスイッチ型固体レーザ装置 - Google Patents
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- 239000007787 solid Substances 0.000 claims abstract description 50
- 230000010355 oscillation Effects 0.000 claims abstract description 48
- 239000006096 absorbing agent Substances 0.000 claims abstract description 47
- 230000005284 excitation Effects 0.000 claims abstract description 33
- 238000010521 absorption reaction Methods 0.000 claims abstract description 31
- 239000013078 crystal Substances 0.000 claims description 46
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 16
- -1 rare earth vanadate Chemical class 0.000 claims description 15
- 230000007423 decrease Effects 0.000 description 11
- 238000002834 transmittance Methods 0.000 description 10
- 239000002904 solvent Substances 0.000 description 8
- 230000003287 optical effect Effects 0.000 description 6
- 238000002474 experimental method Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
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- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
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- 238000009792 diffusion process Methods 0.000 description 1
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- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012821 model calculation Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- LSGOVYNHVSXFFJ-UHFFFAOYSA-N vanadate(3-) Chemical compound [O-][V]([O-])([O-])=O LSGOVYNHVSXFFJ-UHFFFAOYSA-N 0.000 description 1
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- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/16—Solid materials
- H01S3/1601—Solid materials characterised by an active (lasing) ion
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- H01S3/16—Solid materials
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- H01S3/1671—Solid materials characterised by a crystal matrix vanadate, niobate, tantalate
- H01S3/1673—YVO4 [YVO]
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Abstract
Description
H. Sakai等の装置では、利得媒質をマイクロチップ化することで共振器長を短くしてピークパワーが高められており、パルス時間幅580ps、パルスエネルギ0.69mJ(ピークパワー1.2MW)が達成されている。なお、この場合は、熱問題を低減するため最大でも繰り返し周波数が100Hzに抑えられている。
実施形態の受動Qスイッチ型固体レーザ装置は、図1に示すように、共振器を形成する二つの反射要素1a、1bと、二つの反射要素1a、1b間に配置された固体利得媒質2と、二つの反射要素1a、1b間に配置された可飽和吸収体3と、固体利得媒質2を励起する励起手段4と、固体利得媒質2の誘導放出断面積及び可飽和吸収体3の吸収断面積の少なくとも一方を他方に近づける断面積制御手段5とを備えている。
Nd:YAG Laser Passively Q-switched by Cr4+:YAG Saturable Absorber”
Jpn. J. Appl. Phys. Vol.40(2001)pp.1253-1259参照。)。
Pp=(hνAglg/γgtr)ln(1/R)ngi[(1−ngt/ngi)
+{p(1−δ)(1−nα gt/nα gi)/α}
+{1−p(1−δ)}ln(ngt/ngi)] (2)
tp=Ep/Pp (3)
ここで、
α=(γSA/γg)(σa/σe)(Ag/ASA) (4)
δ=σESA/σa (5)
p=−lnT0 2/(−lnR+L−lnT0 2) (6)
ここで、ngfは最終の分布反転密度、ntiは最大フォトン数での分布反転密度、ngiは初期の分布反転密度、σeは利得媒質の誘導放出断面積、σaは可飽和吸収体の吸収断面積、σESAはESA断面積、lgは利得媒質の長さ、γgは利得媒質の熱的な分布減少ファクタ、γSAは可飽和吸収体の熱的な分布減少ファクタ、Rは出力ミラーの反射率、T0は可飽和吸収体の初期透過率、Lは2方向残余の光損失、hはプランクの定数、νは振動数、Agは利得媒質中の共振器モードの有効面積、ASAは可飽和吸収体中の共振器モードの有効面積である。
本実施形態の受動Qスイッチ型固体レーザ装置は図8に示すように、図1に示す実施形態1の受動Qスイッチ型固体レーザ装置において、断面積制御手段である温度制御手段5の代わりに、発振波長制御手段5Aを用いた以外は同じである。同じ構成要素には同一の符号を付し、説明を省略する。
本実施形態の受動Qスイッチ型固体レーザ装置は、図9に示すように、共振器を形成する二つの反射要素1a、1bと、二つの反射要素1a、1b間に配置された固体利得媒質2と、二つの反射要素1a、1b間に配置された可飽和吸収体3と、固体利得媒質2を励起する励起手段4と、固体利得媒質2の誘導放出断面積及び可飽和吸収体3の吸収断面積の少なくとも一方を他方に近づける断面積制御手段5Bとを備えている。
2・・・・・・・・・・・固体利得媒質(Nd:希土類バナデート単結晶)
3・・・・・・・・・・・可飽和吸収体(Cr4+:YAG単結晶)
4・・・・・・・・・・・励起手段
5、5A、5B・・・・・断面積制御手段(温度制御手段、発振波長制御手段)
5Bc・・・・・・・・高熱伝導率媒質(SiC)
本実施形態の受動Qスイッチ型固体レーザ装置は図8に示すように、図1に示す実施形態1の受動Qスイッチ型固体レーザ装置において、断面積制御手段である利得媒質温度制御手段5の代わりに、発振波長制御手段5Aを用いた以外は同じである。同じ構成要素には同一の符号を付し、説明を省略する。
2・・・・・・・・・・・固体利得媒質(Nd:希土類バナデート単結晶)
3・・・・・・・・・・・可飽和吸収体(Cr4+:YAG単結晶)
4・・・・・・・・・・・励起手段
5、5A、5B・・・・・断面積制御手段(利得媒質温度制御手段、発振波長制御手段)
5Bc・・・・・・・・高熱伝導率媒質(SiC)
Claims (9)
- 共振器を形成する複数の反射要素と、
前記共振器内部に配置された固体利得媒質と、
前記共振器内部に配置された可飽和吸収体と、
前記固体利得媒質を励起する励起手段と、
前記固体利得媒質の誘導放出断面積及び前記可飽和吸収体の吸収断面積の少なくとも一方を他方に近づける断面積制御手段と、
を有し、
前記断面積制御手段は、前記固体利得媒質を所定の温度に保持する温度制御手段と発振波長を所定の波長に固定する発振波長制御手段の少なくとも一方或いは両方を備えることを特徴とする受動Qスイッチ型固体レーザ装置。 - 前記所定の温度は室温以上である請求項1に記載の受動Qスイッチ型固体レーザ装置。
- 前記温度制御手段は、前記固体利得媒質をサンドイッチする高熱伝導率媒質を含む請求項1又は2に記載の受動Qスイッチ型固体レーザ装置。
- 前記発振波長制御手段は、体積ブラッグ格子である請求項1〜3のいずれか1項に記載の受動Qスイッチ型固体レーザ装置。
- 前記固体利得媒質は、Nd:希土類バナデート単結晶を含む請求項1〜4のいずれか1項に記載の受動Qスイッチ型固体レーザ装置。
- 前記高熱伝導率媒質はSiCである請求項3〜5のいずれか1項に記載の受動Qスイッチ型固体レーザ装置。
- 前記Nd:希土類バナデートは、Nd:YVO4である請求項5に記載の受動Qスイッチ型固体レーザ装置。
- 前記可飽和吸収体は、4価のCrをドープした単結晶を含む請求項1〜7のいずれか1項に記載の受動Qスイッチ型固体レーザ装置。
- 前記4価のCrをドープした単結晶は、Cr4+:YAG単結晶である請求項8に記載の受動Qスイッチ型固体レーザ装置。
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US11482831B2 (en) * | 2017-09-05 | 2022-10-25 | National Institutes for Quantum Science and Technology | Laser device, light source, and measurement apparatus |
US11881676B2 (en) * | 2019-01-31 | 2024-01-23 | L3Harris Technologies, Inc. | End-pumped Q-switched laser |
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