JPWO2008062657A1 - Manufacturing method of glass substrate for information recording medium, glass substrate for information recording medium, and information recording medium - Google Patents

Manufacturing method of glass substrate for information recording medium, glass substrate for information recording medium, and information recording medium Download PDF

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Publication number
JPWO2008062657A1
JPWO2008062657A1 JP2008545354A JP2008545354A JPWO2008062657A1 JP WO2008062657 A1 JPWO2008062657 A1 JP WO2008062657A1 JP 2008545354 A JP2008545354 A JP 2008545354A JP 2008545354 A JP2008545354 A JP 2008545354A JP WO2008062657 A1 JPWO2008062657 A1 JP WO2008062657A1
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Prior art keywords
glass substrate
information recording
recording medium
polishing
chemical strengthening
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Inventor
太 石田
太 石田
幸敏 中辻
幸敏 中辻
浩明 澤田
浩明 澤田
慎一 佐伯
慎一 佐伯
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Konica Minolta Opto Inc
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Konica Minolta Opto Inc
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • C03C15/02Surface treatment of glass, not in the form of fibres or filaments, by etching for making a smooth surface
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C19/00Surface treatment of glass, not in the form of fibres or filaments, by mechanical means
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/62Record carriers characterised by the selection of the material
    • G11B5/73Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
    • G11B5/739Magnetic recording media substrates
    • G11B5/73911Inorganic substrates
    • G11B5/73921Glass or ceramic substrates
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/84Processes or apparatus specially adapted for manufacturing record carriers
    • G11B5/8404Processes or apparatus specially adapted for manufacturing record carriers manufacturing base layers

Abstract

化学強化による高い強度と高い平滑性を兼ね備え、効率的に製造することができる情報記録媒体用ガラス基板の製造方法、該製造方法により製造した情報記録媒体用ガラス基板及び該情報記録媒体用ガラス基板を用いた情報記録媒体を提供する。A method for producing a glass substrate for information recording medium that has both high strength and high smoothness by chemical strengthening and can be efficiently produced, a glass substrate for information recording medium produced by the production method, and the glass substrate for information recording medium An information recording medium using the above is provided.

Description

本発明は、磁気、光、光磁気等の性質を利用した記録層を有する情報記録媒体に用いる情報記録媒体用ガラス基板の製造方法、該製造方法により製造した情報記録媒体用ガラス基板、及び、該情報記録媒体用ガラス基板を用いた情報記録媒体に関する。   The present invention relates to a method for producing a glass substrate for an information recording medium used for an information recording medium having a recording layer utilizing properties such as magnetism, light, and magnetomagnetism, a glass substrate for information recording medium produced by the production method, and The present invention relates to an information recording medium using the glass substrate for information recording medium.

磁気、光、光磁気等の性質を利用した記録層を有する情報記録媒体のなかで、代表的なものとして磁気ディスクがある。磁気ディスク用基板として、従来アルミニウム基板が広く用いられていた。しかし、近年、記録密度向上のための磁気ヘッド浮上量の低減の要請に伴い、アルミニウム基板よりも表面の平滑性に優れ、しかも表面欠陥が少ないことから磁気ヘッド浮上量の低減を図ることができるガラス基板を磁気ディスク用基板として用いる割合が増えてきている。   Among information recording media having a recording layer utilizing properties such as magnetism, light, and magnetomagnetism, a typical example is a magnetic disk. Conventionally, aluminum substrates have been widely used as magnetic disk substrates. However, in recent years, with the demand for a reduction in the flying height of the magnetic head for improving the recording density, the surface smoothness is superior to that of an aluminum substrate and the surface defects are few, so that the flying height of the magnetic head can be reduced. The proportion of using glass substrates as magnetic disk substrates is increasing.

このような磁気ディスク等の情報記録媒体用ガラス基板の製造方法においては、ガラス基板の耐衝撃性や耐振動性を向上させ衝撃や振動によって基板が破損するのを防止する目的で、ガラス基板の表面に化学強化処理を施して基板を強化することが一般的に行われている。化学強化処理は、通常、化学強化処理液にガラス基板を浸漬し、ガラス基板に含まれるリチウムイオン、ナトリウムイオン等のアルカリ金属イオンをこれらのイオンよりイオン半径の大きなカリウムイオン等のアルカリ金属イオンでイオン交換することでガラス基板の表面に圧縮応力層を形成するイオン交換法によって行われる。   In such a method for producing a glass substrate for an information recording medium such as a magnetic disk, for the purpose of improving the impact resistance and vibration resistance of the glass substrate and preventing the substrate from being damaged by impact and vibration, In general, a substrate is strengthened by applying a chemical strengthening treatment to the surface. In the chemical strengthening treatment, a glass substrate is usually immersed in a chemical strengthening treatment solution, and alkali metal ions such as lithium ions and sodium ions contained in the glass substrate are alkali metal ions such as potassium ions having a larger ion radius than these ions. It is performed by an ion exchange method in which a compressive stress layer is formed on the surface of the glass substrate by ion exchange.

しかし、このような化学強化処理を行うことで、ガラス基板の平滑性が悪化することが知られている。これを解決するための一つの方策として、ガラス基板の表面をイオン交換処理した後、研磨による厚さの減少が1つの面において0.7μmよりも大きくなるように研磨処理を行う方法が提案されている(例えば、特許文献1を参照。)。
特開平8−124153号公報
However, it is known that the smoothness of the glass substrate is deteriorated by performing such chemical strengthening treatment. As one measure for solving this, a method has been proposed in which after the surface of the glass substrate is subjected to ion exchange treatment, the polishing treatment is performed so that the thickness reduction due to polishing is larger than 0.7 μm on one surface. (For example, refer to Patent Document 1).
JP-A-8-124153

しかしながら、特許文献1で提案されているように、化学強化処理されたガラス基板の表面をそのまま再度研磨する方法では、要求されている平滑性を得ることができなかったり、平滑性が得られたとしてもそのために多大な時間と労力が必要になるという問題があった。   However, as proposed in Patent Document 1, the method of polishing again the surface of the chemically strengthened glass substrate as it is cannot obtain the required smoothness or obtain the smoothness. However, there was a problem that much time and labor were required for that purpose.

特に、近年、記録密度向上のための磁気ヘッド浮上量の低減の要請に伴って、情報記録媒体用ガラス基板には、表面粗さRaが0.3nm以下という非常に高いレベルの平滑性が要求されるようになってきたが、このような高い平滑性を有するガラス基板を効率的に製造することは非常に困難であった。   In particular, with the recent demand for reduction in the flying height of the magnetic head for improving the recording density, the glass substrate for information recording media is required to have a very high level of smoothness with a surface roughness Ra of 0.3 nm or less. However, it has been very difficult to efficiently manufacture such a glass substrate having high smoothness.

本発明は上記のような技術的課題に鑑みてなされたものであり、本発明の目的は、化学強化による高い強度と高い平滑性を兼ね備え、効率的に製造することができる情報記録媒体用ガラス基板の製造方法、該製造方法により製造した情報記録媒体用ガラス基板及び該情報記録媒体用ガラス基板を用いた情報記録媒体を提供することである。   The present invention has been made in view of the technical problems as described above, and an object of the present invention is to provide a glass for an information recording medium that has high strength and high smoothness by chemical strengthening and can be efficiently manufactured. It is providing the manufacturing method of a board | substrate, the glass substrate for information recording media manufactured by this manufacturing method, and the information recording medium using this glass substrate for information recording media.

上記の課題を解決するために、本発明は以下の特徴を有するものである。
1.
化学強化処理液にガラス基板を浸漬し、前記ガラス基板に含まれるアルカリ金属イオンを前記化学強化処理液に含まれるアルカリ金属イオンで置換して前記ガラス基板を化学強化する化学強化工程を含む情報記録媒体用ガラス基板の製造方法において、
前記化学強化工程と、
前記ガラス基板の表面の表面粗さRaを増大させる均一化工程と、
前記表面を研磨する第2研磨工程と、
をこの順に行うことを特徴とする情報記録媒体用ガラス基板の製造方法。
2.
前記均一化工程は、化学強化された前記ガラス基板の前記表面を溶解液でエッチングする工程であることを特徴とする1.に記載の情報記録媒体用ガラス基板の製造方法。
3.
前記表面の表面粗さRaが、
前記化学強化工程を行う前は0.3〜0.5nm、前記均一化工程後は0.6〜2nm、前記第2研磨工程後は0.3nm以下であることを特徴とする1.又は2.に記載の情報記録媒体用ガラス基板の製造方法。
4.
1.乃至3.の何れか1項に記載の情報記録媒体用ガラス基板の製造方法によって製造されたことを特徴とする情報記録媒体用ガラス基板。
5.
4.に記載された情報記録媒体用ガラス基板の上に、少なくとも情報を記録する記録層が形成されていることを特徴とする情報記録媒体。
6.
前記記録層は、磁性材料から成る磁性層であることを特徴とする5.に記載の情報記録媒体。
In order to solve the above problems, the present invention has the following features.
1.
Information recording including a chemical strengthening step of chemically strengthening the glass substrate by immersing the glass substrate in a chemical strengthening treatment liquid and replacing alkali metal ions contained in the glass substrate with alkali metal ions contained in the chemical strengthening treatment liquid. In the method for producing a glass substrate for a medium,
The chemical strengthening step;
A homogenization step of increasing the surface roughness Ra of the surface of the glass substrate;
A second polishing step for polishing the surface;
A method for manufacturing a glass substrate for an information recording medium, wherein the steps are performed in this order.
2.
The homogenizing step is a step of etching the surface of the chemically strengthened glass substrate with a solution. The manufacturing method of the glass substrate for information recording media as described in 2 ..
3.
The surface roughness Ra of the surface is
It is 0.3 to 0.5 nm before the chemical strengthening step, 0.6 to 2 nm after the homogenizing step, and 0.3 nm or less after the second polishing step. Or 2. The manufacturing method of the glass substrate for information recording media as described in 2 ..
4).
1. To 3. An information recording medium glass substrate produced by the method for producing an information recording medium glass substrate according to any one of the above.
5).
4). An information recording medium, wherein at least a recording layer for recording information is formed on the glass substrate for information recording medium described in 1.
6).
4. The recording layer is a magnetic layer made of a magnetic material. The information recording medium described in 1.

本発明によれば、ガラス基板の化学強化を行った後、化学強化されたガラス基板の表面を均一に荒らして、該表面の表面粗さRaを増大させる工程を行うことで、ガラス基板の表面全体が均一化された状態となり、その後再び研磨することによって高い平滑性を有するガラス基板を効率的に得ることができる。従って、化学強化による高い強度と高い平滑性を兼ね備え、効率的に製造することができる情報記録媒体用ガラス基板の製造方法、該製造方法により製造した情報記録媒体用ガラス基板及び該情報記録媒体用ガラス基板を用いた情報記録媒体を提供することができる。   According to the present invention, after chemically strengthening the glass substrate, the surface of the glass substrate is subjected to a step of uniformly roughening the surface of the chemically strengthened glass substrate and increasing the surface roughness Ra of the surface. A glass substrate having high smoothness can be obtained efficiently by polishing the entire surface after the entire surface is made uniform. Therefore, a method for producing a glass substrate for information recording medium that has both high strength and high smoothness by chemical strengthening and can be efficiently produced, a glass substrate for information recording medium produced by the production method, and the information recording medium use An information recording medium using a glass substrate can be provided.

本発明における情報記録媒体用ガラス基板の製造工程の一例を示すフローチャートである。It is a flowchart which shows an example of the manufacturing process of the glass substrate for information recording media in this invention. 本発明の情報記録媒体用ガラス基板の一例を示す図である。It is a figure which shows an example of the glass substrate for information recording media of this invention. 本発明の情報記録媒体用ガラス基板の別の例を示す図である。It is a figure which shows another example of the glass substrate for information recording media of this invention. 化学強化工程の前後におけるガラス基板の表面の粗さ曲線のイメージ図である。It is an image figure of the roughness curve of the surface of the glass substrate before and behind a chemical strengthening process. 均一化工程後のガラス基板の表面の粗さ曲線のイメージ図である。It is an image figure of the roughness curve of the surface of the glass substrate after a homogenization process. 第2研磨工程後のガラス基板の表面の粗さ曲線のイメージ図である。It is an image figure of the roughness curve of the surface of the glass substrate after a 2nd grinding | polishing process.

符号の説明Explanation of symbols

10、10a、10b ガラス基板
11、11a、11b 表面
13 中心孔
14 外周端面
15 内周端面
10, 10a, 10b Glass substrate 11, 11a, 11b Surface 13 Center hole 14 Outer peripheral end surface 15 Inner peripheral end surface

以下、本発明の実施の形態について図面を参照しながら詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

(情報記録媒体用ガラス基板)
図2は、本発明の情報記録媒体用ガラス基板の一例を示す図である。図2(a)は斜視図、図2(b)は断面図である。ガラス基板10は、中心孔13を有する円板状ガラス基板であり、記録層が形成される表面11を有する。外周端面14及び内周端面15には面取り部16及び17がそれぞれ設けられている。
(Glass substrate for information recording media)
FIG. 2 is a view showing an example of the glass substrate for information recording medium of the present invention. 2A is a perspective view, and FIG. 2B is a cross-sectional view. The glass substrate 10 is a disk-shaped glass substrate having a central hole 13 and has a surface 11 on which a recording layer is formed. Chamfered portions 16 and 17 are provided on the outer peripheral end surface 14 and the inner peripheral end surface 15, respectively.

また、ガラス基板10は、化学強化された領域18と化学強化されていない領域19とを有している。化学強化された領域18とは、ガラス基板を加熱された化学強化処理液に浸漬することによって、ガラス基板に含まれるリチウムイオン、ナトリウムイオン等のアルカリ金属イオンがそれよりイオン半径の大きなカリウムイオン等のアルカリ金属イオンによって置換された領域であり、イオン半径の違いによって生じる歪みにより、化学強化された領域18に圧縮応力が発生することでガラス基板が強化されている。   Moreover, the glass substrate 10 has the area | region 18 strengthened chemically and the area | region 19 which is not chemically strengthened. The chemically strengthened region 18 is obtained by immersing a glass substrate in a heated chemical strengthening treatment solution, so that alkali metal ions such as lithium ions and sodium ions contained in the glass substrate have a larger ion radius than potassium ions. The glass substrate is strengthened by generating compressive stress in the chemically strengthened region 18 due to distortion caused by the difference in ion radius.

図3は、本発明の情報記録媒体用ガラス基板の別の例を示す図である。図3(a)は、第2研磨工程(化学強化処理後の研磨工程)における研磨量を大きくした場合のガラス基板10aを示す断面図であり、図3(b)は、第2研磨工程における研磨量を更に大きくした場合のガラス基板10bを示す断面図である。図3(a)のガラス基板10aは、表面11aを研磨したことによって、表面11aに残る化学強化された領域の深さが、外周端面14及び内周端面15に残る化学強化された領域の深さよりも浅くなっている。更に、図3(b)のガラス基板10bでは、表面11bの研磨量が更に大きいため、表面11bには化学強化されていない領域19が直接露出しており、化学強化された領域18は外周端面14及び内周端面15のみに存在している。   FIG. 3 is a view showing another example of the glass substrate for information recording medium of the present invention. FIG. 3A is a cross-sectional view showing the glass substrate 10a when the amount of polishing in the second polishing step (polishing step after chemical strengthening treatment) is increased, and FIG. 3B is a diagram in the second polishing step. It is sectional drawing which shows the glass substrate 10b at the time of further enlarging polishing amount. In the glass substrate 10a of FIG. 3A, the depth of the chemically strengthened region remaining on the surface 11a is the depth of the chemically strengthened region remaining on the outer peripheral end surface 14 and the inner peripheral end surface 15 by polishing the surface 11a. It is shallower than that. Further, in the glass substrate 10b of FIG. 3B, since the polishing amount of the surface 11b is larger, a region 19 that is not chemically strengthened is directly exposed on the surface 11b, and the chemically strengthened region 18 is an outer peripheral end face. 14 and the inner peripheral end face 15 only.

このように、本発明の情報記録媒体用ガラス基板においては、表面に強化された領域が残っているか否か、あるいは強化された領域の厚みなどについて特に限定はされず、少なくとも外周端面14及び内周端面15に強化された領域18が存在していれば良い。   Thus, in the glass substrate for an information recording medium of the present invention, there is no particular limitation on whether or not a strengthened region remains on the surface, or the thickness of the strengthened region, etc., and at least the outer peripheral end surface 14 and the inner surface It suffices if the reinforced region 18 exists on the peripheral end face 15.

ガラス基板10の材料としては、イオン交換による化学強化が可能なガラスであれば特に制限はない。例えば、SiO2、Na2O、CaOを主成分としたソーダライムガラス;SiO2、Al23、R2O(R=K、Na、Li)を主成分としたアルミノシリケートガラス;ボロシリケートガラス;Li2O−SiO2系ガラス;Li2O−Al23−SiO2系ガラス;R’O−Al23−SiO2系ガラス(R’=Mg、Ca、Sr、Ba)などを使用することができる。中でも、アルミノシリケートガラスやボロシリケートガラスは、耐衝撃性や耐振動性に優れるため特に好ましい。The material of the glass substrate 10 is not particularly limited as long as it can be chemically strengthened by ion exchange. For example, soda lime glass mainly composed of SiO 2 , Na 2 O and CaO; aluminosilicate glass mainly composed of SiO 2 , Al 2 O 3 and R 2 O (R = K, Na, Li); borosilicate Glass; Li 2 O—SiO 2 glass; Li 2 O—Al 2 O 3 —SiO 2 glass; R′O—Al 2 O 3 —SiO 2 glass (R ′ = Mg, Ca, Sr, Ba) Etc. can be used. Among these, aluminosilicate glass and borosilicate glass are particularly preferable because they are excellent in impact resistance and vibration resistance.

特に、溶解特性と情報記録媒体用としての機械強度、各種物理特性、安定性のバランスを考慮すると、SiO2を主成分とした材料がより好ましい。さらに、SiO2の含有量は45〜85質量%の範囲であることがより好ましい。In particular, considering the balance between solubility characteristics and mechanical strength for information recording media, various physical characteristics, and stability, a material mainly composed of SiO 2 is more preferable. Furthermore, the content of SiO 2 is more preferably in the range of 45 to 85% by mass.

ガラス基板10の大きさに限定はない。例えば、外径が2.5インチ、1.8インチ、1インチ、0.8インチなど種々の大きさのガラス基板を用いることができる。また、ガラス基板10の厚みにも限定はない。例えば、2mm、1mm、0.63mmなど種々の厚みのガラス基板10を用いることができる。   There is no limitation on the size of the glass substrate 10. For example, glass substrates having various sizes such as 2.5 inches, 1.8 inches, 1 inch, and 0.8 inches in outer diameter can be used. Further, the thickness of the glass substrate 10 is not limited. For example, glass substrates 10 having various thicknesses such as 2 mm, 1 mm, and 0.63 mm can be used.

(情報記録媒体用ガラス基板の製造工程)
図1は、本発明における情報記録媒体用ガラス基板の製造工程の一例を示すフローチャートである。
(Manufacturing process of glass substrate for information recording medium)
FIG. 1 is a flowchart showing an example of a manufacturing process of a glass substrate for an information recording medium in the present invention.

本発明の情報記録媒体用ガラス基板は、S1のブランク材作製工程、S2の内外周加工工程、S3のラッピング工程等の前工程を経た後、S4の第1研磨工程、S5の化学強化工程、S6の均一化工程及びS7の第2研磨工程を順に行うことで製造される。本発明の情報記録媒体用ガラス基板の製造方法は、これらの工程の内、主にS6の均一化工程及びS7の第2研磨工程に特徴を有するものである。   The glass substrate for an information recording medium of the present invention is subjected to a preparatory process such as a blank material manufacturing process of S1, an inner and outer peripheral processing process of S2, a lapping process of S3, a first polishing process of S4, a chemical strengthening process of S5, It manufactures by performing the equalization process of S6, and the 2nd grinding | polishing process of S7 in order. The manufacturing method of the glass substrate for information recording media of this invention has the characteristics in the equalization process of S6 and the 2nd grinding | polishing process of S7 among these processes.

ブランク材作製工程、内外周加工工程、ラッピング工程等の前工程は、情報記録媒体用ガラス基板の製造方法として通常用いられている方法により行うことができる。ブランク材作製工程は情報記録媒体用ガラス基板の基になるブランク材を作製する工程であり、溶融ガラスをプレス成形して作製する方法や、シート状のガラスを切断して作製する方法が知られている。内外周加工工程は、中心孔の穿孔加工、外周端面や内周端面の形状や寸法精度確保のための研削加工、内外周端面の研磨加工等を行う工程である。ラッピング工程は、記録層が形成される面の平坦度、厚み、平行度等を満足させるためのラッピング加工を行う工程である。   Pre-processes such as a blank material manufacturing process, an inner and outer peripheral processing process, and a lapping process can be performed by a method that is usually used as a method for manufacturing a glass substrate for an information recording medium. The blank material production process is a process for producing a blank material that is the basis of a glass substrate for an information recording medium, and a method for producing a molten glass by press molding or a method for producing a sheet glass by cutting is known. ing. The inner and outer peripheral machining step is a step of performing drilling of the center hole, grinding for ensuring the shape and dimensional accuracy of the outer peripheral end surface and the inner peripheral end surface, polishing of the inner and outer peripheral end surfaces, and the like. The lapping process is a process of lapping for satisfying the flatness, thickness, parallelism, etc. of the surface on which the recording layer is formed.

これらの前工程の各工程の順序は、図1に示したものに限定されず、状況に応じて適宜変更して実施することができる。例えば、ブランク材作製工程及びラッピング工程を行った後に内外周加工工程を行っても良い。また、ラッピング工程を前半工程と後半工程の二つの工程に分け、ラッピング工程の前半工程の後に内外周加工工程を行い、その後にラッピング工程の後半工程を行っても良い。   The order of each of these pre-processes is not limited to that shown in FIG. 1, and can be appropriately changed depending on the situation. For example, the inner and outer peripheral machining steps may be performed after the blank material manufacturing step and the lapping step. Further, the lapping process may be divided into two processes, a first half process and a second half process, and the inner and outer peripheral machining processes may be performed after the first half process of the lapping process, and then the second half process of the lapping process may be performed.

なお、本発明の情報記録媒体用ガラス基板の製造方法においては、上記以外の種々の工程を有していても良い。例えば、ガラス基板10の内部歪みを緩和するためのアニール工程、ガラス基板10の強度の信頼性確認のためのヒートショック工程、ガラス基板10の表面に残った研磨剤や化学強化処理液等の異物を除去する洗浄工程、種々の検査・評価工程等を有していても良い。   In addition, in the manufacturing method of the glass substrate for information recording media of this invention, you may have various processes other than the above. For example, an annealing process for relaxing internal strain of the glass substrate 10, a heat shock process for confirming the reliability of the strength of the glass substrate 10, and foreign matters such as abrasives and chemical strengthening treatment liquid remaining on the surface of the glass substrate 10 It may have a cleaning process for removing, various inspection / evaluation processes, and the like.

(第1研磨工程)
第1研磨工程は、化学強化工程の前にガラス基板10の表面を研磨する工程であり、ガラス基板10の表面のキズや凹凸を除去し、平滑性を向上させる工程である。研磨の方法は、情報記録媒体用ガラス基板の製造方法として公知の方法をそのまま用いることができる。例えば、対向配置した2つの回転可能な定盤の対向する面にパッドを貼り付け、2つのパッド間にガラス基板10を配置し、ガラス基板10表面にパッドを接触させながら回転させると同時に、ガラス基板10表面に研磨剤を供給する方法で行うことができる。
(First polishing process)
A 1st grinding | polishing process is a process of grind | polishing the surface of the glass substrate 10 before a chemical strengthening process, and is a process of removing the flaw and unevenness | corrugation of the surface of the glass substrate 10, and improving smoothness. As a polishing method, a known method can be used as it is as a method for producing a glass substrate for an information recording medium. For example, a pad is pasted on the opposing surfaces of two rotatable surface plates arranged opposite to each other, a glass substrate 10 is disposed between the two pads, and the glass substrate 10 is rotated while contacting the pad with the surface of the glass substrate 10. This can be done by supplying an abrasive to the surface of the substrate 10.

研磨剤としては、例えば、酸化セリウム、酸化ジルコニウム、酸化アルミニウム、酸化マンガン、コロイダルシリカ、ダイヤモンドなどが挙げられる。この中でも、ガラスとの反応性が高く、短時間で平滑な研磨面が得られる酸化セリウムを用いることが好ましい。   Examples of the abrasive include cerium oxide, zirconium oxide, aluminum oxide, manganese oxide, colloidal silica, and diamond. Among these, it is preferable to use cerium oxide which has high reactivity with glass and can obtain a smooth polished surface in a short time.

パッドは硬質パッドと軟質パッドとに分けられるが、必要に応じて適宜選択して用いることができる。硬質パッドとしては、硬質ベロア、ウレタン発泡、ピッチ含有スウェード等を素材とするパッドが挙げられ、軟質パッドとしては、スウェードやベロア等を素材とするパッドが挙げられる。   The pad is divided into a hard pad and a soft pad, but can be appropriately selected and used as necessary. Examples of the hard pad include pads made of hard velor, urethane foam, pitch-containing suede, etc., and examples of the soft pad include pads made of suede, velor, etc.

また、研磨剤の粒度やパッドの種類を変えて、粗研磨工程、精密研磨工程といったように複数の工程に分けて研磨を行うことも好ましい。また、第1研磨工程の後、ガラス基板10の表面に残った研磨剤を除去するための洗浄工程を行うことが好ましい。   Further, it is also preferable to perform polishing in a plurality of steps such as a rough polishing step and a precision polishing step by changing the particle size of the abrasive and the type of pad. Moreover, it is preferable to perform the washing | cleaning process for removing the abrasive | polishing agent which remained on the surface of the glass substrate 10 after a 1st grinding | polishing process.

本発明において、第1研磨工程後のガラス基板10の表面の表面粗さRaについて特に制限はないが、最終的に高い平滑性を有するガラス基板10を得るためには、第1研磨工程後のガラス基板10の表面の表面粗さRaを0.3〜0.5nmの範囲とすることが好ましい。続く化学強化工程においてはガラス基板10の表面の平滑性が不均一に悪化するという現象が起こるのであるが、第1研磨工程後のRaが0.5nmを超えると、その悪化の程度が顕著に大きくなってくる。そのため、最終的に高い平滑性を有するガラス基板10を得るためには均一化工程におけるRaの増加量を大きくしなければならず、第2研磨工程に必要以上の時間と労力が必要となってくる。また、Raを0.3nm未満としても、最終的に高い平滑性を有するガラス基板10を得るという本発明の効果に影響はないが、第1研磨工程に必要以上に時間と労力をかけることになってしまう。   In the present invention, the surface roughness Ra of the surface of the glass substrate 10 after the first polishing step is not particularly limited, but in order to finally obtain the glass substrate 10 having high smoothness, The surface roughness Ra of the surface of the glass substrate 10 is preferably in the range of 0.3 to 0.5 nm. In the subsequent chemical strengthening step, the phenomenon that the smoothness of the surface of the glass substrate 10 deteriorates unevenly occurs, but when Ra after the first polishing step exceeds 0.5 nm, the degree of the deterioration becomes remarkable. It gets bigger. Therefore, in order to finally obtain a glass substrate 10 having high smoothness, the amount of increase in Ra in the homogenization process must be increased, and more time and labor than necessary for the second polishing process are required. come. Further, even if Ra is less than 0.3 nm, there is no influence on the effect of the present invention to finally obtain a glass substrate 10 having high smoothness, but it takes more time and effort for the first polishing step than necessary. turn into.

なお、表面粗さRaとは、JIS B0601:2001で規定されている算術平均高さRaのことをいう。表面粗さRaは、原子間力顕微鏡(AFM)等により測定することができる。   In addition, surface roughness Ra means arithmetic mean height Ra prescribed | regulated by JISB0601: 2001. The surface roughness Ra can be measured by an atomic force microscope (AFM) or the like.

(化学強化工程)
化学強化工程は、加熱された化学強化処理液にガラス基板10を浸漬することによってガラス基板10に含まれるリチウムイオン、ナトリウムイオン等のアルカリ金属イオンをそれよりイオン半径の大きなカリウムイオン等のアルカリ金属イオンによって置換するイオン交換法によって行われる。イオン半径の違いによって生じる歪みより、イオン交換された領域に圧縮応力が発生し、ガラス基板10の表面が強化される。
(Chemical strengthening process)
In the chemical strengthening step, by immersing the glass substrate 10 in a heated chemical strengthening treatment liquid, alkali metal ions such as lithium ions and sodium ions contained in the glass substrate 10 are converted into alkali metals such as potassium ions having a larger ion radius. This is performed by an ion exchange method in which ions are substituted. Compressive stress is generated in the ion-exchanged region due to the distortion caused by the difference in ion radius, and the surface of the glass substrate 10 is strengthened.

化学強化処理液に特に制限はなく、公知の化学強化処理液を用いることができる。通常、カリウムイオンを含む溶融塩又はカリウムイオンとナトリウムイオンをふくむ溶融塩を用いることが一般的である。カリウムイオンやナトリウムイオンを含む溶融塩としては、カリウムやナトリウムの硝酸塩、炭酸塩、硫酸塩やこれらの混合溶融塩が挙げられる。中でも、融点が低く、ガラス基板10の変形を防止できるという観点からは、硝酸塩を用いることが好ましい。   There is no restriction | limiting in particular in a chemical strengthening process liquid, A well-known chemical strengthening process liquid can be used. In general, a molten salt containing potassium ions or a molten salt containing potassium ions and sodium ions is generally used. Examples of the molten salt containing potassium ions and sodium ions include potassium and sodium nitrates, carbonates, sulfates, and mixed molten salts thereof. Among these, from the viewpoint that the melting point is low and deformation of the glass substrate 10 can be prevented, it is preferable to use nitrate.

化学強化処理液は、上記の成分が融解する温度よりも高温になるよう加熱される。一方、化学強化処理液の加熱温度が高すぎると、ガラス基板10の温度が上がりすぎ、ガラス基板10の変形を招く虞がある。このため、化学強化処理液の加熱温度はガラス基板10のガラス転移点(Tg)よりも低い温度が好ましく、ガラス転移点−50℃よりも低い温度とすることが更に好ましい。   The chemical strengthening treatment liquid is heated to a temperature higher than the temperature at which the above components melt. On the other hand, if the heating temperature of the chemical strengthening treatment liquid is too high, the temperature of the glass substrate 10 is excessively increased and the glass substrate 10 may be deformed. For this reason, the heating temperature of the chemical strengthening treatment liquid is preferably lower than the glass transition point (Tg) of the glass substrate 10, and more preferably lower than the glass transition point −50 ° C.

従来、化学強化処理を行うことで、ガラス基板10の平滑性が悪化することが知られていた。本発明者は、化学強化処理による平滑性の悪化は、ガラス基板10の表面が均一に荒らされて起こるものではなく、比較的大きな凹凸、特に凸部が不均一に発生することによって起こることを突き止めた。このような凹凸は、化学強化処理液である硝酸塩等の結晶が強固に付着したり、化学強化処理液による浸食等によって起こるものと考えられる。   Conventionally, it has been known that the smoothness of the glass substrate 10 is deteriorated by performing the chemical strengthening treatment. The present inventor has found that the deterioration of smoothness due to the chemical strengthening treatment does not occur when the surface of the glass substrate 10 is uniformly roughened, but occurs when relatively large irregularities, particularly convex portions, occur unevenly. I found it. Such unevenness is considered to be caused by a crystal such as a nitrate that is a chemical strengthening treatment liquid being firmly attached or by erosion by the chemical strengthening treatment liquid.

図4は、化学強化工程の前後におけるガラス基板10の表面の粗さ曲線のイメージ図である。図4の横軸はガラス基板10の表面11の距離L(μm)、縦軸は表面11の高さH(nm)である。図4(a)は化学強化工程の前、図4(b)は化学強化工程の後の状態を示している。化学強化工程の前は、第1研磨工程によって均一に研磨された状態であり、粗さ曲線は均一で大きな異常は認められない。しかし、化学強化工程の後は、平均的な粗さに大きな変化は見られないが、比較的大きな凹凸が不均一に存在することが認められる。   FIG. 4 is an image diagram of the surface roughness curve of the glass substrate 10 before and after the chemical strengthening step. The horizontal axis in FIG. 4 is the distance L (μm) of the surface 11 of the glass substrate 10 and the vertical axis is the height H (nm) of the surface 11. FIG. 4A shows a state before the chemical strengthening step, and FIG. 4B shows a state after the chemical strengthening step. Before the chemical strengthening step, the first polishing step is uniformly polished, the roughness curve is uniform, and no large abnormality is observed. However, after the chemical strengthening step, no significant change is observed in the average roughness, but it is recognized that relatively large irregularities exist unevenly.

ガラス基板10の表面がこのような状態のままで更に表面の研磨を行っても、不均一に存在する凹凸の影響を受けるため、表面全体を高い平滑性に仕上げることは困難である。本発明者は、化学強化工程の後そのまま研磨を行うのではなく、一旦ガラス基板10の表面を均一に荒らして表面粗さRaを増大させる均一化工程を行った後に研磨を行うことで、化学強化工程で発生した不均一な凹凸の影響を受けず、ガラス基板10の表面全体を効率的に高い平滑性に仕上げることができることを見いだしたのである。   Even if the surface of the glass substrate 10 is further polished in this state, it is difficult to finish the entire surface with high smoothness because it is affected by unevenness that exists unevenly. The present inventor does not perform the polishing directly after the chemical strengthening step, but performs the polishing after performing the uniformizing step for increasing the surface roughness Ra by uniformly roughing the surface of the glass substrate 10 once. The present inventors have found that the entire surface of the glass substrate 10 can be efficiently finished with high smoothness without being affected by uneven unevenness generated in the strengthening process.

なお、加熱された化学強化処理液に浸漬される際の熱衝撃によるガラス基板10の割れや微細なクラックの発生を防止するため、化学強化処理液への浸漬に先立って、予熱槽でガラス基板10を所定温度に加熱する予熱工程を有していても良い。   In addition, in order to prevent generation | occurrence | production of the crack of the glass substrate 10 by a thermal shock at the time of being immersed in the heated chemical strengthening process liquid, and generation | occurrence | production of a fine crack, a glass substrate is used in a preheating tank prior to immersion in a chemical strengthening process liquid. You may have the preheating process which heats 10 to predetermined temperature.

(均一化工程)
均一化工程は、化学強化されたガラス基板10の表面を荒らして、表面の表面粗さRaを増大させる工程である。上述のように、化学強化工程の後、一旦ガラス基板10の表面を均一に荒らして表面粗さRaを増大させる均一化工程を行った後に研磨を行うことで、化学強化工程で発生した不均一な凹凸の影響を受けず、ガラス基板10の表面全体を効率的に高い平滑性に仕上げることができる。すなわち、図4(b)に示すようなガラス基板10の表面の出っ張り部を除去した後、図5に示すような均一な凹凸をガラス基板10の表面に形成する。
(Uniformization process)
The homogenizing step is a step of increasing the surface roughness Ra by roughening the surface of the chemically strengthened glass substrate 10. As described above, after the chemical strengthening step, the surface of the glass substrate 10 is once uniformly roughened, and the polishing is performed after the uniformizing step of increasing the surface roughness Ra, thereby causing non-uniformity generated in the chemical strengthening step. The entire surface of the glass substrate 10 can be efficiently finished with high smoothness without being affected by unevenness. That is, after removing the protruding portion on the surface of the glass substrate 10 as shown in FIG. 4B, uniform irregularities as shown in FIG. 5 are formed on the surface of the glass substrate 10.

均一化工程は、化学強化されたガラス基板10の表面を荒らして、表面の表面粗さRaを増大させることができれば、その方法に特に制限はない。例えば、第2研磨工程で用いる研磨剤よりも大きな粒径の研磨剤を用いて研磨する方法、溶解液によってエッチングする方法、サンドブラストを行う方法等が挙げられる。中でも、ガラス基板10の表面全体を効率的に荒らすことができるという観点からは、溶解液によるエッチングを行う方法が好ましい。   The homogenization step is not particularly limited as long as the surface of the chemically strengthened glass substrate 10 can be roughened to increase the surface roughness Ra of the surface. For example, a method of polishing using a polishing agent having a particle size larger than that of the polishing agent used in the second polishing step, a method of etching with a solution, a method of sandblasting, and the like can be mentioned. Among these, from the viewpoint that the entire surface of the glass substrate 10 can be efficiently roughened, a method of performing etching with a solution is preferable.

エッチングに用いる溶解液は、フッ化水素酸、ケイフッ酸、フッ化アンモニウム、およびそれらの少なくとも一つ以上を含む酸性水溶液、もしくはNaOH、KOHを主成分とする強アルカリ水溶液等を適宜選択して用いることができる。
酸性水溶液を用いる場合については、溶解速度、均質性、安定性などを加味して必要に応じて、塩酸、硝酸、硫酸、酢酸、シュウ酸、クエン酸などの酸薬品、界面活性剤などを添加し、溶解液の特性を調整することが好ましい。強アルカリ水溶液を用いる場合についても、界面活性剤などを添加し、溶解液の特性を調整して、溶解液の特性を調整することが好ましい。このようにして溶解液の特性を調整することによりSiO2を主成分とするガラスに対するエッチング反応性を高めることができる。
より好ましくは、ケイフッ酸、フッ化アンモニウム、およびそれらの少なくとも一つ以上を含む酸性水溶液を用いることにより、SiO2を主成分とするガラスに対するエッチング反応性を非常に高めることができ、かつ表面粗さの制御を容易行うことができる。
また、効率的にエッチングを行うために溶解液を加熱して用いることも好ましい。
As the solution used for etching, hydrofluoric acid, silicic hydrofluoric acid, ammonium fluoride, an acidic aqueous solution containing at least one of them, or a strong alkaline aqueous solution containing NaOH or KOH as a main component is appropriately selected and used. be able to.
When using acidic aqueous solutions, add acid chemicals such as hydrochloric acid, nitric acid, sulfuric acid, acetic acid, oxalic acid, citric acid, surfactants, etc. as necessary, taking dissolution rate, homogeneity, stability, etc. into consideration. It is preferable to adjust the characteristics of the solution. Also in the case of using a strong alkaline aqueous solution, it is preferable to adjust the characteristics of the solution by adding a surfactant and adjusting the characteristics of the solution. Thus, the etching reactivity with respect to the glass containing SiO 2 as a main component can be enhanced by adjusting the characteristics of the solution.
More preferably, by using an acidic aqueous solution containing at least one of silicic acid, ammonium fluoride, and at least one of them, the etching reactivity with respect to the glass mainly composed of SiO 2 can be greatly increased, and the surface roughness is increased. This can be easily controlled.
In addition, it is also preferable to heat and use the solution for efficient etching.

図5は、均一化工程後のガラス基板10の表面の粗さ曲線のイメージ図である。図5の横軸はガラス基板10の表面11の距離L(μm)、縦軸は表面11の高さH(nm)である。
図5に示すように、化学強化工程で発生した凹凸が減少し、全体が均一に荒らされた状態となっている。均一化工程後のガラス基板10の表面の表面粗さRaについて特に制限はないが、最終的に高い平滑性を有するガラス基板10を効率的に得るためには、均一化工程後のガラス基板10の表面の表面粗さRaを0.6〜2nmの範囲とすることが好ましい。表面粗さRaが0.6nm未満の場合は化学強化工程で発生した凹凸を十分除去できず、最終的に高い平滑性を有するガラス基板10を得ることが困難となる虞がある。表面粗さRaが2nmを超える場合には、第2研磨工程に必要以上に時間と労力をかけることになってしまう。
FIG. 5 is an image diagram of the roughness curve of the surface of the glass substrate 10 after the homogenization step. The horizontal axis in FIG. 5 is the distance L (μm) of the surface 11 of the glass substrate 10, and the vertical axis is the height H (nm) of the surface 11.
As shown in FIG. 5, the unevenness | corrugation which generate | occur | produced in the chemical strengthening process has decreased, and it has been in the state where the whole was uniformly roughened. Although there is no restriction | limiting in particular about surface roughness Ra of the surface of the glass substrate 10 after a homogenization process, In order to obtain the glass substrate 10 which finally has high smoothness efficiently, the glass substrate 10 after a homogenization process The surface roughness Ra of the surface is preferably in the range of 0.6 to 2 nm. When the surface roughness Ra is less than 0.6 nm, the unevenness generated in the chemical strengthening process cannot be sufficiently removed, and it may be difficult to finally obtain the glass substrate 10 having high smoothness. If the surface roughness Ra exceeds 2 nm, the second polishing step takes more time and effort than necessary.

なお、均一化工程の前後に、化学強化処理液や溶解液等を十分に除去するための洗浄工程を設けることも好ましい。   In addition, it is also preferable to provide the washing | cleaning process for fully removing a chemical strengthening process liquid, a solution, etc. before and after a homogenization process.

(第2研磨工程)
第2研磨工程は、均一化工程によって表面が均一に荒らされたガラス基板10の表面を研磨する工程である。研磨の方法は、情報記録媒体用ガラス基板10の製造方法として公知の方法をそのまま用いることができる。例えば、第1研磨工程と同様の研磨剤やパッドを用いて、第1研磨工程と同様の方法で研磨することができる。
あるいは、テクスチャー加工を用いて研磨してもよい。テクスチャー加工は、ダイヤモンド等の微細な研磨スラリーを用いたテープ研磨加工方法であり、情報記録媒体用ガラス基板の製造方法として一般的な方法である。
(Second polishing step)
The second polishing step is a step of polishing the surface of the glass substrate 10 whose surface has been uniformly roughened by the homogenizing step. As a polishing method, a known method can be used as it is as a method for manufacturing the glass substrate 10 for an information recording medium. For example, it is possible to polish by the same method as in the first polishing step using the same polishing agent and pad as in the first polishing step.
Or you may grind | polish using texturing. Texture processing is a tape polishing method using a fine polishing slurry such as diamond, and is a general method for manufacturing a glass substrate for an information recording medium.

第2研磨工程によって、ガラス基板10の表面の化学強化された領域が減少する。第2研磨工程の後のガラス基板10の表面に強化された領域が残っているか否か、あるいは残っている強化された領域の厚み等についても制限はない。   By the second polishing process, the chemically strengthened region on the surface of the glass substrate 10 is reduced. There is no restriction on whether or not the strengthened region remains on the surface of the glass substrate 10 after the second polishing step, or the thickness of the remaining strengthened region.

図6は、第2研磨工程後のガラス基板10の表面の粗さ曲線のイメージ図である。図6の横軸はガラス基板10の表面11の距離L(μm)、縦軸は表面11の高さH(nm)である。
このように、第2研磨工程後のガラス基板10の表面11は、均一で高い平滑性が得られている。第2研磨工程後のガラス基板10の表面の表面粗さRaについても特に制限はないが、記録密度向上のための磁気ヘッド浮上量の低減を図るという観点からは、第2研磨工程後のガラス基板10の表面の表面粗さRaを0.3nm以下とすることが好ましい。
FIG. 6 is an image diagram of the roughness curve of the surface of the glass substrate 10 after the second polishing step. The horizontal axis in FIG. 6 is the distance L (μm) of the surface 11 of the glass substrate 10, and the vertical axis is the height H (nm) of the surface 11.
As described above, the surface 11 of the glass substrate 10 after the second polishing step is uniform and has high smoothness. The surface roughness Ra of the surface of the glass substrate 10 after the second polishing step is not particularly limited, but from the viewpoint of reducing the flying height of the magnetic head for improving the recording density, the glass after the second polishing step. The surface roughness Ra of the surface of the substrate 10 is preferably 0.3 nm or less.

(情報記録媒体)
本発明の情報記録媒体用ガラス基板10の上に、少なくとも記録層を形成することで情報記録媒体を得ることができる。記録層は特に限定されず、磁気、光、光磁気等の性質を利用した種々の記録層を用いることができるが、特に磁性層を記録層として用いた情報記録媒体(磁気ディスク)の製造に好適である。
(Information recording medium)
An information recording medium can be obtained by forming at least a recording layer on the glass substrate 10 for information recording medium of the present invention. The recording layer is not particularly limited, and various recording layers utilizing properties such as magnetism, light, and magnetomagnetism can be used. Is preferred.

磁性層に用いる磁性材料としては、特に限定はなく公知の材料を適宜選択して用いることができる。例えば、Coを主成分とするCoPt、CoCr、CoNi、CoNiCr、CoCrTa、CoPtCr、CoNiPt、CoNiCrPt、CoNiCrTa、CoCrPtTa、CoCrPtSiOなどが挙げられる。また、磁性層を非磁性膜(例えば、Cr、CrMo、CrVなど)で分割してノイズの低減を図った多層構成としてもよい。   The magnetic material used for the magnetic layer is not particularly limited, and a known material can be appropriately selected and used. Examples thereof include CoPt, CoCr, CoNi, CoNiCr, CoCrTa, CoPtCr, CoNiPt, CoNiCrPt, CoNiCrTa, CoCrPtTa, and CoCrPtSiO containing Co as a main component. The magnetic layer may be divided by a nonmagnetic film (for example, Cr, CrMo, CrV, etc.) to have a multilayer structure in which noise is reduced.

磁性層として、上記のCo系材料の他、フェライト系や鉄−希土類系の材料や、SiO2、BNなどからなる非磁性膜中にFe、Co、CoFe、CoNiPt等の磁性粒子が分散された構造のグラニュラーなどを用いることもできる。磁性層は、面内型、垂直型の何れであっても良い。As the magnetic layer, in addition to the above-mentioned Co-based material, ferrite or iron - and material of the rare earth-based, Fe, Co, CoFe, magnetic particles such CoNiPt are dispersed in a non-magnetic film made of SiO 2, BN A granular structure can also be used. The magnetic layer may be either an in-plane type or a vertical type.

磁性膜の形成方法としては、公知の方法を用いることがでる。例えば、スパッタリング法、無電解メッキ法、スピンコート法などが挙げられる。   As a method for forming the magnetic film, a known method can be used. For example, a sputtering method, an electroless plating method, a spin coating method, and the like can be given.

磁気ディスクには、更に必要により下地層、保護層、潤滑層等を設けても良い。これらの層はいずれも公知の材料を適宜選択して用いることができる。下地層の材料としては、例えば、Cr、Mo、Ta、Ti、W、V、B、Al、Niなどが挙げられる。保護層の材料としては、例えば、Cr、Cr合金、C、ZrO2、SiO2などが挙げられる。また、潤滑層としては、例えば、パーフロロポリエーテル(PFPE)等からなる液体潤滑剤を塗布し、必要に応じ加熱処理を行ったものなどが挙げられる。The magnetic disk may further be provided with an underlayer, a protective layer, a lubricating layer, etc., if necessary. Any of these layers can be used by appropriately selecting a known material. Examples of the material for the underlayer include Cr, Mo, Ta, Ti, W, V, B, Al, and Ni. Examples of the material for the protective layer include Cr, Cr alloy, C, ZrO 2 , and SiO 2 . Moreover, as a lubrication layer, the thing etc. which apply | coated the liquid lubricant which consists of perfluoro polyether (PFPE) etc., and heat-processed as needed are mentioned, for example.

(実施例1〜4)
ガラス材料としてアルミノシリケートガラスを用い、溶融ガラスをプレス成形してブランク材を作製した。内外周加工工程、ラッピング工程の後、第1研磨工程を行い外径65mm、内径20mm、厚み0.635mmのガラス基板10とした。第1研磨工程では、研磨剤として酸化セリウムを用いた。第1研磨工程後のガラス基板10の表面の表面粗さRaは0.4nmであった。表面粗さRaの測定は、原子間力顕微鏡(AFM)を用いて行った。
(Examples 1-4)
Aluminosilicate glass was used as the glass material, and the blank glass was produced by press molding the molten glass. After the inner and outer peripheral processing steps and the lapping step, a first polishing step was performed to obtain a glass substrate 10 having an outer diameter of 65 mm, an inner diameter of 20 mm, and a thickness of 0.635 mm. In the first polishing step, cerium oxide was used as an abrasive. The surface roughness Ra of the surface of the glass substrate 10 after the first polishing step was 0.4 nm. The surface roughness Ra was measured using an atomic force microscope (AFM).

次に、ガラス基板10を化学強化処理液に浸漬して化学強化工程を行った。化学強化処理液には、硝酸カリウム(KNO3)と硝酸ナトリウム(NaNO3)の混合溶融塩を用いた。混合比は質量比で1:1とした。また、化学強化処理液の温度は400℃、浸漬時間は40分とした。Next, the glass substrate 10 was immersed in a chemical strengthening treatment solution to perform a chemical strengthening step. As the chemical strengthening treatment liquid, a mixed molten salt of potassium nitrate (KNO 3 ) and sodium nitrate (NaNO 3 ) was used. The mixing ratio was 1: 1 by mass ratio. The temperature of the chemical strengthening treatment liquid was 400 ° C. and the immersion time was 40 minutes.

化学強化処理工程の後、ガラス基板10を溶解液に浸漬して均一化工程を行った。溶解液にはフッ化水素酸を用いた。溶解液の温度は25℃とした。浸漬時間を種々変更して、表面粗さRaが0.6nm(実施例1)、1nm(実施例2)、2nm(実施例3)、3nm(実施例4)となったガラス基板10をそれぞれ10枚ずつ作製した。   After the chemical strengthening treatment step, the glass substrate 10 was immersed in a solution to perform a homogenization step. Hydrofluoric acid was used for the solution. The temperature of the solution was 25 ° C. Glass substrates 10 having surface roughness Ra of 0.6 nm (Example 1), 1 nm (Example 2), 2 nm (Example 3), and 3 nm (Example 4) were obtained by variously changing the immersion time. Ten sheets were produced.

その後、第2研磨工程を行い、表面粗さRaの測定を行った。第1研磨工程と同様に研磨剤として酸化セリウムを用いた。各条件で10枚ずつのガラス基板10のうち、第2研磨工程における研磨時間が5分のものを5枚、研磨時間が15分のものを5枚とした。評価は、研磨時間5分の条件で表面粗さRaが0.3nm以下となった場合を最も良好(評価◎)、研磨時間15分の条件で表面粗さRaが0.3nm以下となった場合を良好(評価○)、研磨時間15分の条件でも表面粗さRaが0.3nm以下とならなかった場合を問題有り(評価×)とした。なお、表面粗さRaは、ガラス基板105枚の測定値の平均値を用いた。   Then, the 2nd grinding | polishing process was performed and the surface roughness Ra was measured. As in the first polishing step, cerium oxide was used as an abrasive. Of the 10 glass substrates 10 under each condition, 5 sheets with a polishing time of 5 minutes in the second polishing step and 5 sheets with a polishing time of 15 minutes were used. The evaluation was best when the surface roughness Ra was 0.3 nm or less under the condition of polishing time 5 minutes (evaluation ◎), and the surface roughness Ra was 0.3 nm or less under the condition of polishing time 15 minutes. The case was good (evaluation ○), and the case where the surface roughness Ra did not become 0.3 nm or less even under the condition of the polishing time of 15 minutes was regarded as problematic (evaluation x). In addition, the surface roughness Ra used the average value of the measured value of 105 glass substrates.

結果を表1に示す。第2研磨工程後の表面粗さRaが0.6〜2nmの範囲にある実施例1、2、3は、いずれも研磨時間5分の条件で表面粗さRaが0.3nm以下となっており、非常に良好であった。第2研磨工程後の表面粗さRaが3nmであった実施例4は、研磨時間15分の条件で表面粗さRaが0.3nm以下となり、良好な平滑性を有するガラス基板10を得ることができた。   The results are shown in Table 1. In Examples 1, 2, and 3 in which the surface roughness Ra after the second polishing step is in the range of 0.6 to 2 nm, the surface roughness Ra becomes 0.3 nm or less under the condition of the polishing time of 5 minutes. And it was very good. In Example 4 in which the surface roughness Ra after the second polishing step was 3 nm, the surface roughness Ra was 0.3 nm or less under the condition of the polishing time of 15 minutes, and the glass substrate 10 having good smoothness was obtained. I was able to.

(比較例1)
均一化工程を行わなかった以外は実施例1と同じ条件でガラス基板10を作製し、第2研磨工程後の表面粗さRaを測定した。結果を表1に併せて示す。均一化工程を行わなかったため、第2研磨工程における研磨時間が15分の条件でも表面粗さRaが0.3nm以下とならず、良好な平滑性を有するガラス基板10を得ることはできなかった。
(Comparative Example 1)
A glass substrate 10 was produced under the same conditions as in Example 1 except that the homogenization step was not performed, and the surface roughness Ra after the second polishing step was measured. The results are also shown in Table 1. Since the homogenization process was not performed, the surface roughness Ra did not become 0.3 nm or less even when the polishing time in the second polishing process was 15 minutes, and a glass substrate 10 having good smoothness could not be obtained. .

Claims (6)

化学強化処理液にガラス基板を浸漬し、前記ガラス基板に含まれるアルカリ金属イオンを前記化学強化処理液に含まれるアルカリ金属イオンで置換して前記ガラス基板を化学強化する化学強化工程を含む情報記録媒体用ガラス基板の製造方法において、
前記化学強化工程と、
前記ガラス基板の表面の表面粗さRaを増大させる均一化工程と、
前記表面を研磨する第2研磨工程と、
をこの順に行うことを特徴とする情報記録媒体用ガラス基板の製造方法。
Information recording including a chemical strengthening step of chemically strengthening the glass substrate by immersing the glass substrate in a chemical strengthening treatment liquid and replacing alkali metal ions contained in the glass substrate with alkali metal ions contained in the chemical strengthening treatment liquid. In the method for producing a glass substrate for a medium,
The chemical strengthening step;
A homogenization step of increasing the surface roughness Ra of the surface of the glass substrate;
A second polishing step for polishing the surface;
A method for manufacturing a glass substrate for an information recording medium, wherein the steps are performed in this order.
前記均一化工程は、化学強化された前記ガラス基板の前記表面を溶解液でエッチングする工程であることを特徴とする請求の範囲第1項に記載の情報記録媒体用ガラス基板の製造方法。 The method for producing a glass substrate for an information recording medium according to claim 1, wherein the homogenizing step is a step of etching the surface of the chemically strengthened glass substrate with a solution. 前記表面の表面粗さRaが、
前記化学強化工程を行う前は0.3〜0.5nm、前記均一化工程後は0.6〜2nm、前記第2研磨工程後は0.3nm以下であることを特徴とする請求の範囲第1項又は第2項に記載の情報記録媒体用ガラス基板の製造方法。
The surface roughness Ra of the surface is
3. The method according to claim 1, wherein the thickness is 0.3 to 0.5 nm before the chemical strengthening step, 0.6 to 2 nm after the homogenization step, and 0.3 nm or less after the second polishing step. The manufacturing method of the glass substrate for information recording media of 1 term | claim or 2nd term | claim.
請求の範囲第1項乃至第3項の何れか1項に記載の情報記録媒体用ガラス基板の製造方法によって製造されたことを特徴とする情報記録媒体用ガラス基板。 A glass substrate for an information recording medium manufactured by the method for manufacturing a glass substrate for an information recording medium according to any one of claims 1 to 3. 請求の範囲第4項に記載された情報記録媒体用ガラス基板の上に、少なくとも情報を記録する記録層が形成されていることを特徴とする情報記録媒体。 An information recording medium, wherein at least a recording layer for recording information is formed on the glass substrate for information recording medium according to claim 4. 前記記録層は、磁性材料から成る磁性層であることを特徴とする請求の範囲第5項に記載の情報記録媒体。 6. The information recording medium according to claim 5, wherein the recording layer is a magnetic layer made of a magnetic material.
JP2008545354A 2006-11-22 2007-11-05 Manufacturing method of glass substrate for information recording medium, glass substrate for information recording medium, and information recording medium Pending JPWO2008062657A1 (en)

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