JPS6488341A - Infrared spectrochemical analysis apparatus - Google Patents

Infrared spectrochemical analysis apparatus

Info

Publication number
JPS6488341A
JPS6488341A JP24757587A JP24757587A JPS6488341A JP S6488341 A JPS6488341 A JP S6488341A JP 24757587 A JP24757587 A JP 24757587A JP 24757587 A JP24757587 A JP 24757587A JP S6488341 A JPS6488341 A JP S6488341A
Authority
JP
Japan
Prior art keywords
light
optical path
interference
sample
mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24757587A
Other languages
Japanese (ja)
Inventor
Takashi Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP24757587A priority Critical patent/JPS6488341A/en
Publication of JPS6488341A publication Critical patent/JPS6488341A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To easily obtain the IR absorption spectrum of a single component even with a sample in which different materials unidentifiable by an ordinary visible light image co-exist by providing polarizing means movable freely to the inside and outside of an optical path between an optical path and the sample to said optical path. CONSTITUTION:A polarizer 2 and an eyepiece 5 are moved to the outside of the optical path and an IR light source 13 is lighted up. The IR light emitted from the light source 13 is split by an interferometer 11 to interference light. The interference light is projected by a concave mirror 19 to a mirror 17 rotated in a desired direction and after the light reflects on the mirror 17, the light traces the same course as the course of visible light and transmits the sample 3; thereafter, the light passes a stop 10 which is so adjusted as to allow the passage of only the light transmitted through a part to be analyzed. The interference light past the stop 10 arrives at a high- sensitivity detector 12 after condensing 14 and is detected 12. The detected light is converted to an electric signal which is sent to a computing means 15 by which the processing such as Fourier transform is executed in accordance with the interference conditions of the interferometer 11 and the spectral intensity is calculated. The IR absorption spectrum obtd. in such a manner exactly reflects the IR absorption characteristic of the part to be analyzed.
JP24757587A 1987-09-30 1987-09-30 Infrared spectrochemical analysis apparatus Pending JPS6488341A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24757587A JPS6488341A (en) 1987-09-30 1987-09-30 Infrared spectrochemical analysis apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24757587A JPS6488341A (en) 1987-09-30 1987-09-30 Infrared spectrochemical analysis apparatus

Publications (1)

Publication Number Publication Date
JPS6488341A true JPS6488341A (en) 1989-04-03

Family

ID=17165536

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24757587A Pending JPS6488341A (en) 1987-09-30 1987-09-30 Infrared spectrochemical analysis apparatus

Country Status (1)

Country Link
JP (1) JPS6488341A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04294255A (en) * 1991-03-22 1992-10-19 Shimadzu Corp Measuring apparatus for photoluminescence

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61273516A (en) * 1985-05-29 1986-12-03 Japan Spectroscopic Co Fourier transform microscope

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61273516A (en) * 1985-05-29 1986-12-03 Japan Spectroscopic Co Fourier transform microscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04294255A (en) * 1991-03-22 1992-10-19 Shimadzu Corp Measuring apparatus for photoluminescence

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