JPS6481262A - Active matrix substrate - Google Patents
Active matrix substrateInfo
- Publication number
- JPS6481262A JPS6481262A JP23831687A JP23831687A JPS6481262A JP S6481262 A JPS6481262 A JP S6481262A JP 23831687 A JP23831687 A JP 23831687A JP 23831687 A JP23831687 A JP 23831687A JP S6481262 A JPS6481262 A JP S6481262A
- Authority
- JP
- Japan
- Prior art keywords
- groove
- film
- pixel
- polycrystalline silicon
- silicon thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136213—Storage capacitors associated with the pixel electrode
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/10—Materials and properties semiconductor
- G02F2202/104—Materials and properties semiconductor poly-Si
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- Liquid Crystal (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Thin Film Transistor (AREA)
Abstract
PURPOSE:To obtain a high-quality display whose unevenness in a contrast at an upper part and a lower part is small and whose unevenness in a contrast at each pixel is small by a method wherein a groove is made in an insulating substrate and pixel-adding capacitance is constituted inside the groove in order to obtain a retention characteristic of a sufficient pixel potential. CONSTITUTION:A groove 11 is made in an insulating substrate. For this operation, an ordinary isotropic etching operation may be used; however, when a deep and narrow groove is to be formed, it is sufficient to execute a dry isotropic etching operation. Then, a first polycrystalline silicon thin film 12 which has been doped with an impurity is deposited; while the film inside the groove 11 and a common line 6 are left, the film in other parts is removed by a patterning operation. Then, the polycrystalline silicon thin film 12 is thermally oxidized; an insulating oxide film 13 for pixel-adding capacitance use is formed; after that, a second polycrystalline silicon thin film 14 which has been doped with an impurity is deposited in order to fill the inside of the groove 11. Then, a semiconductor thin film 2 to be used for a thin-film transistor is deposited and patterned in order to form a gate insulating film 3. A two-layer conductive film used to constitute pixel-adding capacitance is composed of the polycrystalline silicon thin films which have been doped with the impurity; however, it may be composed of metal thin films; it is not always required that the groove 11 is filled; considering its flatness, the groove is preferably filled.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23831687A JP2568857B2 (en) | 1987-09-22 | 1987-09-22 | Active matrix substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23831687A JP2568857B2 (en) | 1987-09-22 | 1987-09-22 | Active matrix substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6481262A true JPS6481262A (en) | 1989-03-27 |
JP2568857B2 JP2568857B2 (en) | 1997-01-08 |
Family
ID=17028395
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP23831687A Expired - Lifetime JP2568857B2 (en) | 1987-09-22 | 1987-09-22 | Active matrix substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2568857B2 (en) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0399846A2 (en) * | 1989-05-26 | 1990-11-28 | Sharp Kabushiki Kaisha | An active-matrix display device and a method for the production of the same |
EP0466495A2 (en) * | 1990-07-12 | 1992-01-15 | Kabushiki Kaisha Toshiba | Liquid crystal display apparatus |
JPH05265034A (en) * | 1992-03-17 | 1993-10-15 | Sharp Corp | Grooved glass base |
US5317432A (en) * | 1991-09-04 | 1994-05-31 | Sony Corporation | Liquid crystal display device with a capacitor and a thin film transistor in a trench for each pixel |
US5846854A (en) * | 1993-07-19 | 1998-12-08 | Compagnie Generale D'innovation Et De Developpement Cogidev | Electrical circuits with very high conductivity and high fineness, processes for fabricating them, and devices comprising them |
WO1999028784A1 (en) * | 1997-11-28 | 1999-06-10 | Matsushita Electric Industrial Co., Ltd. | Reflection-type display device and image device using reflection-type display device |
JP2000081636A (en) * | 1998-09-03 | 2000-03-21 | Seiko Epson Corp | Electrooptical device and its manufacture and electronic instrument |
US6414345B1 (en) | 1994-06-13 | 2002-07-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including active matrix circuit |
JP2003152086A (en) * | 2001-11-15 | 2003-05-23 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
US6825496B2 (en) | 2001-01-17 | 2004-11-30 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
WO2011080987A1 (en) * | 2009-12-29 | 2011-07-07 | シャープ株式会社 | Array substrate for liquid crystal panel and liquid crystal display device equipped with said substrate |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5437697A (en) * | 1977-08-30 | 1979-03-20 | Sharp Corp | Liquid crystal display unit of matrix type |
-
1987
- 1987-09-22 JP JP23831687A patent/JP2568857B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5437697A (en) * | 1977-08-30 | 1979-03-20 | Sharp Corp | Liquid crystal display unit of matrix type |
Cited By (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0399846A2 (en) * | 1989-05-26 | 1990-11-28 | Sharp Kabushiki Kaisha | An active-matrix display device and a method for the production of the same |
EP0399846A3 (en) * | 1989-05-26 | 1991-07-24 | Sharp Kabushiki Kaisha | An active-matrix display device and a method for the production of the same |
EP0466495A2 (en) * | 1990-07-12 | 1992-01-15 | Kabushiki Kaisha Toshiba | Liquid crystal display apparatus |
US5187602A (en) * | 1990-07-12 | 1993-02-16 | Kabushiki Kaisha Toshiba | Liquid crystal display apparatus |
US5317432A (en) * | 1991-09-04 | 1994-05-31 | Sony Corporation | Liquid crystal display device with a capacitor and a thin film transistor in a trench for each pixel |
JPH05265034A (en) * | 1992-03-17 | 1993-10-15 | Sharp Corp | Grooved glass base |
US5846854A (en) * | 1993-07-19 | 1998-12-08 | Compagnie Generale D'innovation Et De Developpement Cogidev | Electrical circuits with very high conductivity and high fineness, processes for fabricating them, and devices comprising them |
US6414345B1 (en) | 1994-06-13 | 2002-07-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including active matrix circuit |
US6566684B1 (en) | 1994-06-13 | 2003-05-20 | Semiconductor Energy Laboratory Co., Ltd. | Active matrix circuit having a TFT with pixel electrode as auxiliary capacitor |
US7479657B2 (en) | 1994-06-13 | 2009-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including active matrix circuit |
US7161178B2 (en) | 1994-06-13 | 2007-01-09 | Semiconductor Energy Laboratory Co., Ltd. | Display device having a pixel electrode through a second interlayer contact hole in a wider first contact hole formed over an active region of display switch |
WO1999028784A1 (en) * | 1997-11-28 | 1999-06-10 | Matsushita Electric Industrial Co., Ltd. | Reflection-type display device and image device using reflection-type display device |
JP2000081636A (en) * | 1998-09-03 | 2000-03-21 | Seiko Epson Corp | Electrooptical device and its manufacture and electronic instrument |
US6825496B2 (en) | 2001-01-17 | 2004-11-30 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US7242024B2 (en) | 2001-01-17 | 2007-07-10 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US7808002B2 (en) | 2001-01-17 | 2010-10-05 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US8779431B2 (en) | 2001-01-17 | 2014-07-15 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US8952385B1 (en) | 2001-01-17 | 2015-02-10 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US9171896B2 (en) | 2001-01-17 | 2015-10-27 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US9324775B2 (en) | 2001-01-17 | 2016-04-26 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US9679955B2 (en) | 2001-01-17 | 2017-06-13 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US9911801B2 (en) | 2001-01-17 | 2018-03-06 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US10263059B2 (en) | 2001-01-17 | 2019-04-16 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
JP2003152086A (en) * | 2001-11-15 | 2003-05-23 | Semiconductor Energy Lab Co Ltd | Semiconductor device |
WO2011080987A1 (en) * | 2009-12-29 | 2011-07-07 | シャープ株式会社 | Array substrate for liquid crystal panel and liquid crystal display device equipped with said substrate |
Also Published As
Publication number | Publication date |
---|---|
JP2568857B2 (en) | 1997-01-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |