JPS6476769A - High power semiconductor device with nonvolatile memory - Google Patents
High power semiconductor device with nonvolatile memoryInfo
- Publication number
- JPS6476769A JPS6476769A JP62232115A JP23211587A JPS6476769A JP S6476769 A JPS6476769 A JP S6476769A JP 62232115 A JP62232115 A JP 62232115A JP 23211587 A JP23211587 A JP 23211587A JP S6476769 A JPS6476769 A JP S6476769A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- nonvolatile memory
- bias circuit
- gate
- high power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 230000006870 function Effects 0.000 abstract 1
- 230000006386 memory function Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Landscapes
- Non-Volatile Memory (AREA)
Abstract
PURPOSE:To unnecessitate a gate bias circuit even in the ON state, and realize the saving of power and the preventing of an accident of service interruption, by using a device having a nonvolatile memory function, in the main body of a power MOSFET or its bias circuit. CONSTITUTION:When the source 3 of a high power MOSFET Q1 acting as a main switch is grounded, a drain 4 is connected to a load terminal, and a gate 5 is connected to the floating gate terminal 6 of a MOSFET Q2 having function of electrically rewritable nonvolatile memory. A second gate terminal 8 of Q2 is grounded, a drain terminal 7 is connected to a bias circuit. By electric charge stored in the floating gate terminal 6 of Q2, the gate terminal 5 of Q1 is biased, and Q1 turns ON. Once Q1 turns ON, the ON state of Q1 is maintained, even if the bias circuit connected to the terminal 7 of Q2 is eliminated, if only charge stored in the terminal 6 is kept. On the contrary, in the case of making Q1 turn ON, the terminal 7 is reverse-biased.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62232115A JP2654384B2 (en) | 1987-09-18 | 1987-09-18 | High power semiconductor device with nonvolatile memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62232115A JP2654384B2 (en) | 1987-09-18 | 1987-09-18 | High power semiconductor device with nonvolatile memory |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6476769A true JPS6476769A (en) | 1989-03-22 |
JP2654384B2 JP2654384B2 (en) | 1997-09-17 |
Family
ID=16934242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62232115A Expired - Fee Related JP2654384B2 (en) | 1987-09-18 | 1987-09-18 | High power semiconductor device with nonvolatile memory |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2654384B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005536048A (en) * | 2002-08-13 | 2005-11-24 | ジェネラル・セミコンダクター・インコーポレーテッド | DMOS device with programmable threshold voltage |
JP2008141195A (en) * | 2006-11-30 | 2008-06-19 | Dongbu Hitek Co Ltd | Semiconductor device and method of manufacturing the same |
JP2013033993A (en) * | 2006-07-26 | 2013-02-14 | Koninkl Philips Electronics Nv | Device and method for deactivating electrical element when malfunctioning |
-
1987
- 1987-09-18 JP JP62232115A patent/JP2654384B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005536048A (en) * | 2002-08-13 | 2005-11-24 | ジェネラル・セミコンダクター・インコーポレーテッド | DMOS device with programmable threshold voltage |
JP2013033993A (en) * | 2006-07-26 | 2013-02-14 | Koninkl Philips Electronics Nv | Device and method for deactivating electrical element when malfunctioning |
JP2008141195A (en) * | 2006-11-30 | 2008-06-19 | Dongbu Hitek Co Ltd | Semiconductor device and method of manufacturing the same |
Also Published As
Publication number | Publication date |
---|---|
JP2654384B2 (en) | 1997-09-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |