JPS6468673A - Semiconductor tester - Google Patents
Semiconductor testerInfo
- Publication number
- JPS6468673A JPS6468673A JP62225576A JP22557687A JPS6468673A JP S6468673 A JPS6468673 A JP S6468673A JP 62225576 A JP62225576 A JP 62225576A JP 22557687 A JP22557687 A JP 22557687A JP S6468673 A JPS6468673 A JP S6468673A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- information
- circuit
- test
- stored
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To conduct a function test efficiently and to shorten a test time by reading previously stored voltage setting information out of a memory during pattern generating operation and generating a desired voltage. CONSTITUTION:Pieces of voltage information (a)-(n) are stored in a voltage information register 6 from a CPU 10 at the start time of the test. Then a voltage selection information area of the instruction of a pattern generator 1 is read out together with pattern data and sent to a selecting circuit 4. The circuit 4 selects one of the pieces of information (a)-(n) stored in the register 6 and inputs it to a program power circuit 7 which generates a source voltage, an input voltage, and an output expected voltage for the device DUT 8 to be inspected. Consequently, the circuit 7 outputs a program value as an analog voltage. Therefore, the pattern generator need not be stopped from operating and various voltages for the DUT are varied fast to different values, thereby shortening the test time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62225576A JPS6468673A (en) | 1987-09-09 | 1987-09-09 | Semiconductor tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62225576A JPS6468673A (en) | 1987-09-09 | 1987-09-09 | Semiconductor tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6468673A true JPS6468673A (en) | 1989-03-14 |
Family
ID=16831474
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62225576A Pending JPS6468673A (en) | 1987-09-09 | 1987-09-09 | Semiconductor tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6468673A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003098234A (en) * | 2001-09-27 | 2003-04-03 | Advantest Corp | Semiconductor tester |
-
1987
- 1987-09-09 JP JP62225576A patent/JPS6468673A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003098234A (en) * | 2001-09-27 | 2003-04-03 | Advantest Corp | Semiconductor tester |
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