JPS6468673A - Semiconductor tester - Google Patents

Semiconductor tester

Info

Publication number
JPS6468673A
JPS6468673A JP62225576A JP22557687A JPS6468673A JP S6468673 A JPS6468673 A JP S6468673A JP 62225576 A JP62225576 A JP 62225576A JP 22557687 A JP22557687 A JP 22557687A JP S6468673 A JPS6468673 A JP S6468673A
Authority
JP
Japan
Prior art keywords
voltage
information
circuit
test
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62225576A
Other languages
Japanese (ja)
Inventor
Shigeyoshi Murakoshi
Yoshihiro Saitou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP62225576A priority Critical patent/JPS6468673A/en
Publication of JPS6468673A publication Critical patent/JPS6468673A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To conduct a function test efficiently and to shorten a test time by reading previously stored voltage setting information out of a memory during pattern generating operation and generating a desired voltage. CONSTITUTION:Pieces of voltage information (a)-(n) are stored in a voltage information register 6 from a CPU 10 at the start time of the test. Then a voltage selection information area of the instruction of a pattern generator 1 is read out together with pattern data and sent to a selecting circuit 4. The circuit 4 selects one of the pieces of information (a)-(n) stored in the register 6 and inputs it to a program power circuit 7 which generates a source voltage, an input voltage, and an output expected voltage for the device DUT 8 to be inspected. Consequently, the circuit 7 outputs a program value as an analog voltage. Therefore, the pattern generator need not be stopped from operating and various voltages for the DUT are varied fast to different values, thereby shortening the test time.
JP62225576A 1987-09-09 1987-09-09 Semiconductor tester Pending JPS6468673A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62225576A JPS6468673A (en) 1987-09-09 1987-09-09 Semiconductor tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62225576A JPS6468673A (en) 1987-09-09 1987-09-09 Semiconductor tester

Publications (1)

Publication Number Publication Date
JPS6468673A true JPS6468673A (en) 1989-03-14

Family

ID=16831474

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62225576A Pending JPS6468673A (en) 1987-09-09 1987-09-09 Semiconductor tester

Country Status (1)

Country Link
JP (1) JPS6468673A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003098234A (en) * 2001-09-27 2003-04-03 Advantest Corp Semiconductor tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003098234A (en) * 2001-09-27 2003-04-03 Advantest Corp Semiconductor tester

Similar Documents

Publication Publication Date Title
US4070565A (en) Programmable tester method and apparatus
KR890004450B1 (en) Test vector indexing method & apparatus
GB2338564B (en) Semiconductor testing apparatus for testing semiconductor device including built in self test circuit
JPS5585265A (en) Function test evaluation device for integrated circuit
JPS6484342A (en) Test circuit for integrated circuit
JPH0682147B2 (en) Hierarchical test sequencer
US4888715A (en) Semiconductor test system
JPS6468673A (en) Semiconductor tester
JPH06180342A (en) Ic evaluating device
US5206862A (en) Method and apparatus for locally deriving test signals from previous response signals
KR20000077226A (en) Semiconductor device, testing device thereof and testing method thereof
JPS6447973A (en) Device tester
JP3151834B2 (en) Microcomputer
JPH1164469A (en) Pattern generator for semiconductor test device
US6629280B1 (en) Method and apparatus for delaying ABIST start
JP4130711B2 (en) Semiconductor test equipment
KR970006018B1 (en) Test mode select signal generator of boundary scan architecture
JPS609136A (en) Self-testing type lsi
KR970000820B1 (en) Test data input circuit of boundary-scan architecture
JPH11174126A (en) Self-inspection pattern generation device for incorporation in logic circuit and pattern selection method
JP3525025B2 (en) Semiconductor memory inspection method and apparatus
Roy et al. A microcomputer-controlled multichannel programmable pattern generator
JPS6413477A (en) Testing device for integrated circuit
JP2944307B2 (en) A / D converter non-linearity inspection method
JPH1019999A (en) Ic tester