JPS646778A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS646778A
JPS646778A JP62136877A JP13687787A JPS646778A JP S646778 A JPS646778 A JP S646778A JP 62136877 A JP62136877 A JP 62136877A JP 13687787 A JP13687787 A JP 13687787A JP S646778 A JPS646778 A JP S646778A
Authority
JP
Japan
Prior art keywords
frequency
oscillator
high level
oscillation frequency
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62136877A
Other languages
Japanese (ja)
Inventor
Masamichi Yamashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62136877A priority Critical patent/JPS646778A/en
Publication of JPS646778A publication Critical patent/JPS646778A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)

Abstract

PURPOSE:To check the frequency of a CR oscillator, which is self-oscillating in an IC, readily, by inputting a sampling frequency into a clock input terminal in a testing state. CONSTITUTION:Terminals P1 and P2 are used to output the judge result of the frequency of a built-in CR oscillator 9. When the oscillator 9 is oscillating at a desired frequency, a sampling signal, whose frequency is higher than the oscillation frequency of the oscillator 9, is applied to a PG terminal from an external LSI tester. When the oscillation frequency of the oscillator 9 is lower than the desired frequency at this time, the width of a pulse during the high level period of the oscillation frequency becomes long. The number of the pulses at the high level of the sampling frequency is increased. Latch outputs at a high potential are taken out of the terminals P1 and P2. Meanwhile, when the oscillation frequency of the oscillator 9 is higher than the desired frequency, the pulse width during the high level period of the oscillation frequency becomes short. Then, the number of the pulses of the sampling frequency at the high level is decreased. The latch outputs at a low potential are taken out of the terminals P1 and P2.
JP62136877A 1987-05-29 1987-05-29 Semiconductor integrated circuit Pending JPS646778A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62136877A JPS646778A (en) 1987-05-29 1987-05-29 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62136877A JPS646778A (en) 1987-05-29 1987-05-29 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS646778A true JPS646778A (en) 1989-01-11

Family

ID=15185621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62136877A Pending JPS646778A (en) 1987-05-29 1987-05-29 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS646778A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08203298A (en) * 1994-08-26 1996-08-09 Sgs Thomson Microelectron Ltd Integrated circuit device and its test method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08203298A (en) * 1994-08-26 1996-08-09 Sgs Thomson Microelectron Ltd Integrated circuit device and its test method

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