JPS6466539A - Cold heat cycle apparatus - Google Patents

Cold heat cycle apparatus

Info

Publication number
JPS6466539A
JPS6466539A JP22372187A JP22372187A JPS6466539A JP S6466539 A JPS6466539 A JP S6466539A JP 22372187 A JP22372187 A JP 22372187A JP 22372187 A JP22372187 A JP 22372187A JP S6466539 A JPS6466539 A JP S6466539A
Authority
JP
Japan
Prior art keywords
chamber
doors
supply section
temperature gas
gas supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22372187A
Other languages
Japanese (ja)
Inventor
Masao Yasaka
Keiichi Murano
Yoshihiko Kotani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tabai Espec Co Ltd
Original Assignee
Tabai Espec Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tabai Espec Co Ltd filed Critical Tabai Espec Co Ltd
Priority to JP22372187A priority Critical patent/JPS6466539A/en
Publication of JPS6466539A publication Critical patent/JPS6466539A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

PURPOSE:To simplify a construction, by arranging a door and a single fan for gas circulation at one pair of vent blocks connecting gas supply section to the outside of a test chamber provided with a high temperature gas supply section made adjacent to a low temperature gas supply section. CONSTITUTION:A test chamber 1 is provided with a high temperature gas supply section 2 and a low temperature gas supply section 3 and a door 11 free to open or close is arranged in front thereof while opening-closing heat insulating doors 51, 61 and 71 at vents 21, 31, 41/ Doors 52, 62 and 72 are provided at vents 22, 32 and 42 on the other end side of the chamber 1 while a multi-blade fan 8 in the chamber 1. Then, when a sample is exposed to a high temperature atmosphere, the doors 51 and 52 are opened between the chamber 1 and the supply section 2 while the other doors are closed and a fan 8 is driven to let a high temperature gas flow into the chamber 1. When it is exposed t a low temperature atmosphere, the doors 61 and 62 are opened while the other doors are closed and the fan 8 is driven to let a low temperature gas flow into the chamber 1, thereby enabling simplification of a construction.
JP22372187A 1987-09-07 1987-09-07 Cold heat cycle apparatus Pending JPS6466539A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22372187A JPS6466539A (en) 1987-09-07 1987-09-07 Cold heat cycle apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22372187A JPS6466539A (en) 1987-09-07 1987-09-07 Cold heat cycle apparatus

Publications (1)

Publication Number Publication Date
JPS6466539A true JPS6466539A (en) 1989-03-13

Family

ID=16802637

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22372187A Pending JPS6466539A (en) 1987-09-07 1987-09-07 Cold heat cycle apparatus

Country Status (1)

Country Link
JP (1) JPS6466539A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02249946A (en) * 1989-03-24 1990-10-05 Tabai Espec Corp Thermal atmosphere testing device
CN105136508A (en) * 2015-09-30 2015-12-09 武汉辰龙精密仪器有限公司 DMMP vapor protective dosage test system and testing method thereof
CN112162008A (en) * 2020-09-28 2021-01-01 中国建筑材料科学研究总院有限公司 Device and method for testing use reliability of latent heat material

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6142447B2 (en) * 1977-06-29 1986-09-20 Hitachi Ltd

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6142447B2 (en) * 1977-06-29 1986-09-20 Hitachi Ltd

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02249946A (en) * 1989-03-24 1990-10-05 Tabai Espec Corp Thermal atmosphere testing device
CN105136508A (en) * 2015-09-30 2015-12-09 武汉辰龙精密仪器有限公司 DMMP vapor protective dosage test system and testing method thereof
CN105136508B (en) * 2015-09-30 2018-09-14 武汉辰龙精密仪器有限公司 DMMP vapor protection dosage tests system and its test method
CN112162008A (en) * 2020-09-28 2021-01-01 中国建筑材料科学研究总院有限公司 Device and method for testing use reliability of latent heat material

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