JPS6466091A - Laser beam machine - Google Patents

Laser beam machine

Info

Publication number
JPS6466091A
JPS6466091A JP62220502A JP22050287A JPS6466091A JP S6466091 A JPS6466091 A JP S6466091A JP 62220502 A JP62220502 A JP 62220502A JP 22050287 A JP22050287 A JP 22050287A JP S6466091 A JPS6466091 A JP S6466091A
Authority
JP
Japan
Prior art keywords
laser beam
wafer
irradiation
size
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62220502A
Other languages
Japanese (ja)
Inventor
Toshikazu Kajikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62220502A priority Critical patent/JPS6466091A/en
Publication of JPS6466091A publication Critical patent/JPS6466091A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To reduce the size of a two-dimensional scanning means by calculating a laser beam irradiation position to minimize the number of irradiation pulses of half one side from a shape of a laser convergent beam, an irradiation pitch and dimensions of material to be worked to increase the number of wafers which can be processed in the service life of the laser beam. CONSTITUTION:An excimer laser output beam from a laser beam oscillator 11 is led to a condenser lens 13 by a mirror 14 and condensed on a wafer 15 held on an XYtheta stage 12 as a linear machining spot. A control part 16 constituted of a computer calculates the laser beam irradiation position from bits of information such as an inputted machining pitch and wafer size and controls the XYtheta stage 12 and issues a pulse output command with respect to the laser beam oscillator 11 at a point of time to pass the position indicated on a table. When the laser beam irradiation on half one side of the wafer 15 is finished, a theta stage part of the XYtheta stage is rotated by 180 deg. and the laser beam is projected on the remaining half one side according to the irradiation position table. Accordingly, the scanning range of in the (y) axial direction is finished with about half the wafer size and the size of the scanning means can be reduced.
JP62220502A 1987-09-04 1987-09-04 Laser beam machine Pending JPS6466091A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62220502A JPS6466091A (en) 1987-09-04 1987-09-04 Laser beam machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62220502A JPS6466091A (en) 1987-09-04 1987-09-04 Laser beam machine

Publications (1)

Publication Number Publication Date
JPS6466091A true JPS6466091A (en) 1989-03-13

Family

ID=16752041

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62220502A Pending JPS6466091A (en) 1987-09-04 1987-09-04 Laser beam machine

Country Status (1)

Country Link
JP (1) JPS6466091A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2790868A1 (en) * 1999-03-11 2000-09-15 St Microelectronics Sa METHOD AND DEVICE FOR CLEARING A SURFACE MARK FROM AN INTEGRATED CIRCUIT BOARD

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2790868A1 (en) * 1999-03-11 2000-09-15 St Microelectronics Sa METHOD AND DEVICE FOR CLEARING A SURFACE MARK FROM AN INTEGRATED CIRCUIT BOARD

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