JPS6463247A - Field ionization type ion source - Google Patents
Field ionization type ion sourceInfo
- Publication number
- JPS6463247A JPS6463247A JP22081087A JP22081087A JPS6463247A JP S6463247 A JPS6463247 A JP S6463247A JP 22081087 A JP22081087 A JP 22081087A JP 22081087 A JP22081087 A JP 22081087A JP S6463247 A JPS6463247 A JP S6463247A
- Authority
- JP
- Japan
- Prior art keywords
- emitter
- tip
- ion
- emitted
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
- H01J2237/0802—Field ionization sources
- H01J2237/0807—Gas field ion sources [GFIS]
Abstract
PURPOSE:To raise the luminance of an emitted ion as well as to make the processing speed of ion beam exposure improvable by projecting the tip of an emitter to the outside from an inner side at the emitter side of a drawer electrode. CONSTITUTION:An emitter 1 passes through almost the center of an opening 3 and set up as its tip is projected as much as 2mm or so to the outside from an inner side of a drawer electrode 2 in an ionization chamber 5 where the drawer electrode 2 is acicularly formed. Ionization object gas is led into the chamber 5, and since the opening 3 doubles as a differential exhaust throttle when an ion is emitted out of the tip of the emitter 1, gas pressure around the emitter 1 comes low at the tip even if it comes high at a base of the tip part of the emitter 1. Consequently, even if it is in a high field range, it is polarized whereby an increase of gas molecules bombarding the tip of the emitter becomes lessened, and a temperature rise in the emitter tip part decreases, so that a supply action of the gas molecule being ionized to the emitter tip is not checked, and such a probability that the emitted ion collides with other neutral gas molecules, doing charge-exchange, and is restored to neutrality is also lessened, thus the luminance of the emitted ion is improved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22081087A JPS6463247A (en) | 1987-09-03 | 1987-09-03 | Field ionization type ion source |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22081087A JPS6463247A (en) | 1987-09-03 | 1987-09-03 | Field ionization type ion source |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6463247A true JPS6463247A (en) | 1989-03-09 |
Family
ID=16756916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22081087A Pending JPS6463247A (en) | 1987-09-03 | 1987-09-03 | Field ionization type ion source |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6463247A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6217932B1 (en) * | 1996-12-20 | 2001-04-17 | Fraunhofer-Gesell Schaft Zur Forderung Der Angewandten Forschung E.V. | Method of obtaining haemin from slaughter blood |
-
1987
- 1987-09-03 JP JP22081087A patent/JPS6463247A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6217932B1 (en) * | 1996-12-20 | 2001-04-17 | Fraunhofer-Gesell Schaft Zur Forderung Der Angewandten Forschung E.V. | Method of obtaining haemin from slaughter blood |
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