JPS6459752A - Ion source for mass spectrograph device - Google Patents
Ion source for mass spectrograph deviceInfo
- Publication number
- JPS6459752A JPS6459752A JP62214801A JP21480187A JPS6459752A JP S6459752 A JPS6459752 A JP S6459752A JP 62214801 A JP62214801 A JP 62214801A JP 21480187 A JP21480187 A JP 21480187A JP S6459752 A JPS6459752 A JP S6459752A
- Authority
- JP
- Japan
- Prior art keywords
- secondary ion
- region
- mass analysis
- corpuscular beam
- deflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To raise analysis sensitivity by providing a deflection electrode for deflecting secondary ion and introducing the deflected ion to a mass analysis site via a slit provided at the predetermined position. CONSTITUTION:A sample fed from liquid chromatograph 6 infuses to a surface through the inside of a porous member 10 via an introduction tube 7 and is ionized due to the exposure thereof to a primary corpuscular beam B. The splash region A of a solvent molecule is formed in a normal direction from the part of the porous member 10 exposed to the primary corpuscular beam B. Secondary ion generated due to the impact of the primary corpuscular beam B is deflected with a deflection electrode 8 and released from said region A. Furthermore, the secondary ion passes a slit placed off said region A and enters a mass analysis site 1. According to the aforesaid system, the secondary ion enters the mass analysis site 1 without any contamination by the solvent molecule and analysis sensitivity is thereby made higher.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62214801A JPS6459752A (en) | 1987-08-28 | 1987-08-28 | Ion source for mass spectrograph device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62214801A JPS6459752A (en) | 1987-08-28 | 1987-08-28 | Ion source for mass spectrograph device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6459752A true JPS6459752A (en) | 1989-03-07 |
Family
ID=16661751
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62214801A Pending JPS6459752A (en) | 1987-08-28 | 1987-08-28 | Ion source for mass spectrograph device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6459752A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008021504A (en) * | 2006-07-12 | 2008-01-31 | Fujitsu Ltd | Irradiation direction-variable ion irradiation device, and secondary ion mass spectrometer |
-
1987
- 1987-08-28 JP JP62214801A patent/JPS6459752A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008021504A (en) * | 2006-07-12 | 2008-01-31 | Fujitsu Ltd | Irradiation direction-variable ion irradiation device, and secondary ion mass spectrometer |
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