JPS6459169A - Characteristic measuring apparatus of superconductive material - Google Patents

Characteristic measuring apparatus of superconductive material

Info

Publication number
JPS6459169A
JPS6459169A JP62217004A JP21700487A JPS6459169A JP S6459169 A JPS6459169 A JP S6459169A JP 62217004 A JP62217004 A JP 62217004A JP 21700487 A JP21700487 A JP 21700487A JP S6459169 A JPS6459169 A JP S6459169A
Authority
JP
Japan
Prior art keywords
superconductive material
electrodes
superconductive
resistivity
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62217004A
Other languages
Japanese (ja)
Inventor
Shunichiro Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62217004A priority Critical patent/JPS6459169A/en
Publication of JPS6459169A publication Critical patent/JPS6459169A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

PURPOSE:To measure the critical temperatures of a superconductive material in various forms easily and correctly, by continuously changing the temperature of the superconductive material by the cooling effect with the use of a cooling medium and a heater, and measuring the resistivity by pin-shaped electrodes. CONSTITUTION:A superconductive material 3 is supported by a holding member 4. Resistance measuring electrodes 6 and current electrodes 7 both in pin-shaped configuration are secured to a supporting member 8 in such manner that they are point-contacted with the superconductive material 3. Then, the holding member 4 and the supporting member 8 are inserted into a cooler filled with liquid nitrogen. The resistivity of the superconductive material 3 is measured from the fall of the voltage between the electrodes 6 when the temperature of the material are continuously controlled by a heater 5 and the cooling medium, with the current flowing in the electrodes 7. Accordingly, the critical temperatures of the superconductive material 3 can be detected based on the relation between the temperatures of the superconductive material 3 indicated by a thermometer 10 and the resistivity thereof detected by the electrodes 6. Furthermore, since the electrodes 6 and 7 are pin-shaped, it can be applied to the case of superconductive materials in a variety of forms. Thus, the critical temperature of a superconductive material in various forms can be easily and correctly detected.
JP62217004A 1987-08-31 1987-08-31 Characteristic measuring apparatus of superconductive material Pending JPS6459169A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62217004A JPS6459169A (en) 1987-08-31 1987-08-31 Characteristic measuring apparatus of superconductive material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62217004A JPS6459169A (en) 1987-08-31 1987-08-31 Characteristic measuring apparatus of superconductive material

Publications (1)

Publication Number Publication Date
JPS6459169A true JPS6459169A (en) 1989-03-06

Family

ID=16697313

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62217004A Pending JPS6459169A (en) 1987-08-31 1987-08-31 Characteristic measuring apparatus of superconductive material

Country Status (1)

Country Link
JP (1) JPS6459169A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5065087A (en) * 1988-10-04 1991-11-12 Sharp Kabushiki Kaisha Apparatus for observing a superconductive phenomenon in a superconductor
US5218296A (en) * 1992-02-07 1993-06-08 International Business Machines Corporation Method and apparatus for determining at least one characteristic of a superconductive film
US5223798A (en) * 1990-10-31 1993-06-29 The United States Of America As Represented By The Secretary Of The Navy Method for measuring the resistive transition and critical current in superconductors using pulsed current
JP2009244038A (en) * 2008-03-31 2009-10-22 Railway Technical Res Inst Energization characteristic testing apparatus for evaluation sample
CN104007402A (en) * 2014-06-06 2014-08-27 泉州师范学院 Nanovolt-order superconductor resistance critical temperature measurement system
JP2016024152A (en) * 2014-07-24 2016-02-08 住友電気工業株式会社 Critical current measuring device for superconductive wire material
CN109374975A (en) * 2018-11-26 2019-02-22 华中科技大学 The resistivity test device and method of thin polymer film under a kind of high field intensity
WO2020050925A1 (en) * 2018-09-04 2020-03-12 Northrop Grumman Systems Corporation Superconductor critical temperature measurement

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5065087A (en) * 1988-10-04 1991-11-12 Sharp Kabushiki Kaisha Apparatus for observing a superconductive phenomenon in a superconductor
US5126655A (en) * 1988-10-04 1992-06-30 Sharp Kabushiki Kaisha Apparatus for observing a superconductive phenomenon in a superconductor
US5223798A (en) * 1990-10-31 1993-06-29 The United States Of America As Represented By The Secretary Of The Navy Method for measuring the resistive transition and critical current in superconductors using pulsed current
US5218296A (en) * 1992-02-07 1993-06-08 International Business Machines Corporation Method and apparatus for determining at least one characteristic of a superconductive film
JP2009244038A (en) * 2008-03-31 2009-10-22 Railway Technical Res Inst Energization characteristic testing apparatus for evaluation sample
CN104007402A (en) * 2014-06-06 2014-08-27 泉州师范学院 Nanovolt-order superconductor resistance critical temperature measurement system
JP2016024152A (en) * 2014-07-24 2016-02-08 住友電気工業株式会社 Critical current measuring device for superconductive wire material
WO2020050925A1 (en) * 2018-09-04 2020-03-12 Northrop Grumman Systems Corporation Superconductor critical temperature measurement
AU2019336595B2 (en) * 2018-09-04 2021-12-09 Northrop Grumman Systems Corporation Superconductor critical temperature measurement
JP2021535603A (en) * 2018-09-04 2021-12-16 ノースロップ グラマン システムズ コーポレーション Superconducting critical temperature measurement
CN109374975A (en) * 2018-11-26 2019-02-22 华中科技大学 The resistivity test device and method of thin polymer film under a kind of high field intensity

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