JPS6453499A - Multilayer printed wiring board and inspection of same - Google Patents

Multilayer printed wiring board and inspection of same

Info

Publication number
JPS6453499A
JPS6453499A JP27515087A JP27515087A JPS6453499A JP S6453499 A JPS6453499 A JP S6453499A JP 27515087 A JP27515087 A JP 27515087A JP 27515087 A JP27515087 A JP 27515087A JP S6453499 A JPS6453499 A JP S6453499A
Authority
JP
Japan
Prior art keywords
layer
central
hole
hole part
peripheral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP27515087A
Other languages
Japanese (ja)
Inventor
Fumio Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP27515087A priority Critical patent/JPS6453499A/en
Publication of JPS6453499A publication Critical patent/JPS6453499A/en
Pending legal-status Critical Current

Links

Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

PURPOSE:To enable deviation to be detected without damaging a completed product, by forming a plurality of central through hole parts for detecting deviation in external-layer and inner-layer plates, and a plurality of peripheral through hole parts around control ones the, deviation detection conductors, etc., with diameters different from each other. CONSTITUTION:A plurality of central through hole parts 5 and a plurality of peripheral through hole parts 6 are provided in a first external-layer plate 1. An inner-layer central through hole part 7, inner-layer peripheral through hole part 8, and a T-shape deviation detecting conductor 9 which are connected to them are provided to a first inner-layer plate 2. An inner-layer center through hole part 7a and inner-layer peripheral through hole part 8a are provided in a second inner-layer plate 2a. A central through hole part 5a and peripheral through hole part 6a are provided in a second external-layer plate 1a. If the inner-layer central through hole part 7 deviates from the central through hole parts 5, the inner wall conductor of the central through hole parts 5 deviates and is brought into contact with one of detection conductors 9, thus resulting into a continuity state. Thus, it can be detected by a conduction inspection jig, etc.
JP27515087A 1986-12-15 1987-10-29 Multilayer printed wiring board and inspection of same Pending JPS6453499A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27515087A JPS6453499A (en) 1986-12-15 1987-10-29 Multilayer printed wiring board and inspection of same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP19330386 1986-12-15
JP27515087A JPS6453499A (en) 1986-12-15 1987-10-29 Multilayer printed wiring board and inspection of same

Publications (1)

Publication Number Publication Date
JPS6453499A true JPS6453499A (en) 1989-03-01

Family

ID=26507798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27515087A Pending JPS6453499A (en) 1986-12-15 1987-10-29 Multilayer printed wiring board and inspection of same

Country Status (1)

Country Link
JP (1) JPS6453499A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008532295A (en) * 2005-03-01 2008-08-14 アーテー・ウント・エス・オーストリア・テヒノロギー・ウント・ジュステームテッヒニク・アクチェンゲゼルシャフト Multilayer printed circuit board having conductive test area and method for measuring misalignment of intermediate layer
JP2009147397A (en) * 2007-02-01 2009-07-02 Panasonic Corp Inspection mark structure, substrate sheet laminate, multilayer circuit board, method of inspecting lamination matching precision of multilayer circuit board, and method of designing substrate sheet laminate

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008532295A (en) * 2005-03-01 2008-08-14 アーテー・ウント・エス・オーストリア・テヒノロギー・ウント・ジュステームテッヒニク・アクチェンゲゼルシャフト Multilayer printed circuit board having conductive test area and method for measuring misalignment of intermediate layer
KR101234145B1 (en) * 2005-03-01 2013-02-18 에이티 앤 에스 오스트리아 테크놀로지 앤 시스템테크니크 악치엔게젤샤프트 Multi-layered printed circuit board comprising conductive test surfaces, and method for determining a misalignment of an inner layer
US20140034368A1 (en) * 2005-03-01 2014-02-06 At & S Austria Technologie & Systemtechnik Aktiengesellschaft Multi-layered printed circuit board with conductive test areas as well as method for determining a misalignment of an inner layer
JP2009147397A (en) * 2007-02-01 2009-07-02 Panasonic Corp Inspection mark structure, substrate sheet laminate, multilayer circuit board, method of inspecting lamination matching precision of multilayer circuit board, and method of designing substrate sheet laminate

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