JPS5689067A - Method for inspecting wiring substrate - Google Patents

Method for inspecting wiring substrate

Info

Publication number
JPS5689067A
JPS5689067A JP16665979A JP16665979A JPS5689067A JP S5689067 A JPS5689067 A JP S5689067A JP 16665979 A JP16665979 A JP 16665979A JP 16665979 A JP16665979 A JP 16665979A JP S5689067 A JPS5689067 A JP S5689067A
Authority
JP
Japan
Prior art keywords
wiring substrate
inspection
check
conduction states
states
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16665979A
Other languages
Japanese (ja)
Inventor
Noboru Hanioka
Osamu Nakao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP16665979A priority Critical patent/JPS5689067A/en
Publication of JPS5689067A publication Critical patent/JPS5689067A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE: To reduce inspection time by dividing the multiple inspection terminals of a wiring substrate to a pluraity of inspection terminal groups, and comparing the conduction states thereof and the conduction states of a normal wiring substrate having beforehand been stroed thereby detecting disconnection and short-circuiting.
CONSTITUTION: Multiple check pins provide to a wiring substrate 40 are divided to plural check pin groups 60, each group consisting of a fixed number of check pins. The conduction state between respective check pins is checked with a normal viring substrate 41, and these conduction states are stored for every check pin group 30, in a storage device 50. The conduction states of the wiring substrate 40 are detected through the check pin groups 30 connected via an interface 20 by a microcomputer 10, and said states and the conduction states having been stored in the storage device 50 are compared, whereby the decision of acceptance or rejection is accomplished. Hence, emphasis is placed on the checking of accetance or rejection, whereby the number of inspection times is reduced and the reliable inspection may be carried out.
COPYRIGHT: (C)1981,JPO&Japio
JP16665979A 1979-12-20 1979-12-20 Method for inspecting wiring substrate Pending JPS5689067A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16665979A JPS5689067A (en) 1979-12-20 1979-12-20 Method for inspecting wiring substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16665979A JPS5689067A (en) 1979-12-20 1979-12-20 Method for inspecting wiring substrate

Publications (1)

Publication Number Publication Date
JPS5689067A true JPS5689067A (en) 1981-07-20

Family

ID=15835351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16665979A Pending JPS5689067A (en) 1979-12-20 1979-12-20 Method for inspecting wiring substrate

Country Status (1)

Country Link
JP (1) JPS5689067A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766367A (en) * 1980-10-13 1982-04-22 Shonan Eng Kk Inspection apparatus for printed board
JPS61104387U (en) * 1984-12-14 1986-07-02

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766367A (en) * 1980-10-13 1982-04-22 Shonan Eng Kk Inspection apparatus for printed board
JPS61104387U (en) * 1984-12-14 1986-07-02
JPH0422307Y2 (en) * 1984-12-14 1992-05-21

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