JPS6452113A - Method and device for microscope image measurement - Google Patents
Method and device for microscope image measurementInfo
- Publication number
- JPS6452113A JPS6452113A JP20957087A JP20957087A JPS6452113A JP S6452113 A JPS6452113 A JP S6452113A JP 20957087 A JP20957087 A JP 20957087A JP 20957087 A JP20957087 A JP 20957087A JP S6452113 A JPS6452113 A JP S6452113A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- measurement
- stage
- magnification
- stored
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Microscoopes, Condenser (AREA)
Abstract
PURPOSE:To take a measurement in a short time with high accuracy by mounting a sample on an X-Y stage and scanning the sample with low power, detecting and storing the position, and measuring the sample at the stored position with high magnification. CONSTITUTION:A microscope 10 is provided with the X-Y stage 16 and an objective 20 and an ocular 22 of different magnifications are fitted to a lens barrel 18. Then an adjusting handle 17 is operated to move up and down the X-Y stage 16 and also move it in an X and Y direction under the command of an image processing part 28. The sample 24 (e.g. skin cell) on the X-Y stage 16 is scanned with about X100 low magnification and its position is detected and stored. Then switching to about X400 high magnification is performed and the sample 24 at the stored position is precisely measured. The measurement is performed automatically by the image processing part 28 through a television camera 26. Thus, the position is confirmed first with the low magnification and the measurement is performed next with the high magnification, so the measurement is performed in a short time with high accuracy.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20957087A JPS6452113A (en) | 1987-08-24 | 1987-08-24 | Method and device for microscope image measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20957087A JPS6452113A (en) | 1987-08-24 | 1987-08-24 | Method and device for microscope image measurement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6452113A true JPS6452113A (en) | 1989-02-28 |
Family
ID=16575019
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20957087A Pending JPS6452113A (en) | 1987-08-24 | 1987-08-24 | Method and device for microscope image measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6452113A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5391885A (en) * | 1991-04-26 | 1995-02-21 | Sharp Kabushiki Kaisha | Method of detecting and analyzing defective portion of semiconductor element and apparatus for detecting and analyzing the same |
| WO2009125547A1 (en) * | 2008-04-09 | 2009-10-15 | 株式会社ニコン | Culture apparatus controller and control program |
| JP2011508238A (en) * | 2007-12-27 | 2011-03-10 | サイテック コーポレイション | Method and system for controllably scanning a cell sample |
-
1987
- 1987-08-24 JP JP20957087A patent/JPS6452113A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5391885A (en) * | 1991-04-26 | 1995-02-21 | Sharp Kabushiki Kaisha | Method of detecting and analyzing defective portion of semiconductor element and apparatus for detecting and analyzing the same |
| JP2011508238A (en) * | 2007-12-27 | 2011-03-10 | サイテック コーポレイション | Method and system for controllably scanning a cell sample |
| WO2009125547A1 (en) * | 2008-04-09 | 2009-10-15 | 株式会社ニコン | Culture apparatus controller and control program |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5260825A (en) | Microscope | |
| US5673203A (en) | Crack monitoring apparatus | |
| JPH0352178B2 (en) | ||
| JPH0150844B2 (en) | ||
| JPH0340355A (en) | Complex scan type tunnel microscope | |
| JPS5463768A (en) | Automatic changeover device of microscope lighting | |
| JPH03152846A (en) | Automatic focusing system for electron microscope | |
| EP0126776B1 (en) | Indentation hardness tester | |
| JPS6452113A (en) | Method and device for microscope image measurement | |
| JPH0562638A (en) | Focused ion beam device | |
| JPS6453157A (en) | Method and instrument for measuring characteristic of cutaneous cell | |
| GREEN et al. | The design, operation and evaluation of a high speed automatic metaphase finder | |
| JPH10258382A (en) | Focal position regulating method and its correcting method in laser beam machine and laser beam machine | |
| GB2002547A (en) | Investigation of astigmatism in electron beam probe instruments | |
| US6852964B2 (en) | Method and arrangement for scanning microscopic specimens with a scanning device | |
| EP0388812A2 (en) | Microscope | |
| CN111272659A (en) | Full-automatic mycobacterium tuberculosis micro-scanning analyzer | |
| JPH0522894Y2 (en) | ||
| CN211478354U (en) | Full-automatic detection equipment | |
| US20230350181A1 (en) | Microscopic observation method and microscopic observation device | |
| JPS6429730A (en) | Minute material testing instrument | |
| JPS5590045A (en) | Electronic microscope equipped with optical microscope | |
| JPS5543714A (en) | Electron beam irradiating method and device for electronic microscope | |
| JPS6410559A (en) | Sample image pattern measuring device | |
| US20230041003A1 (en) | Microscope auxiliary apparatus |