JPS6444805A - Calibrating method of position and posture of pattern projector - Google Patents

Calibrating method of position and posture of pattern projector

Info

Publication number
JPS6444805A
JPS6444805A JP62201891A JP20189187A JPS6444805A JP S6444805 A JPS6444805 A JP S6444805A JP 62201891 A JP62201891 A JP 62201891A JP 20189187 A JP20189187 A JP 20189187A JP S6444805 A JPS6444805 A JP S6444805A
Authority
JP
Japan
Prior art keywords
pattern
posture
group
pickup
points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62201891A
Other languages
Japanese (ja)
Other versions
JP2555368B2 (en
Inventor
Minoru Ito
Akira Ishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP62201891A priority Critical patent/JP2555368B2/en
Publication of JPS6444805A publication Critical patent/JPS6444805A/en
Application granted granted Critical
Publication of JP2555368B2 publication Critical patent/JP2555368B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)

Abstract

PURPOSE:To simplify and expedite the calibration of posture and to make it highly precise and highly stable, by a method wherein the three-dimensional position of each characteristic point of a projected pattern on a pickup plate is measured by two cameras whose image pickup positions are calibrated beforehand, and each characteristic point is made to correspond to each characteristic point of the original picture of the pattern. CONSTITUTION:A pattern original plate 4 is projected on the surface of an object W of measurement by a pattern projector 2. Three-dimensional positions of a group of projection points on the object W of a group of six or more characteristic points on said original plate 4 are measured at multiple points simultaneously or in a time- series manner by using one pickup camera 1 or more whose pickup position and posture are already calibrated. Using the three-dimensional positions of the group of the characteristic points thus obtained and the coordinate values of the group of the characteristic points of a pattern on the original plate 4 corresponding thereto, the correlative relationship between a spatial coordinate system and a coordinate system of projection of the pattern is calculated by a matrix computation. The projecting position and posture of the projector 2 are calibrated simply and highly precisely from the correlative relationship thus obtained.
JP62201891A 1987-08-14 1987-08-14 Position and Attitude Calibration Method for Pattern Projector Expired - Fee Related JP2555368B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62201891A JP2555368B2 (en) 1987-08-14 1987-08-14 Position and Attitude Calibration Method for Pattern Projector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62201891A JP2555368B2 (en) 1987-08-14 1987-08-14 Position and Attitude Calibration Method for Pattern Projector

Publications (2)

Publication Number Publication Date
JPS6444805A true JPS6444805A (en) 1989-02-17
JP2555368B2 JP2555368B2 (en) 1996-11-20

Family

ID=16448541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62201891A Expired - Fee Related JP2555368B2 (en) 1987-08-14 1987-08-14 Position and Attitude Calibration Method for Pattern Projector

Country Status (1)

Country Link
JP (1) JP2555368B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843026A (en) * 1994-07-29 1996-02-16 Mazda Motor Corp Calibration device and hologram
JP2009139782A (en) * 2007-12-10 2009-06-25 Nippon Hoso Kyokai <Nhk> Lens attitude/position adjusting method and device
JP2014178265A (en) * 2013-03-15 2014-09-25 Ricoh Co Ltd Calibration device, method and program
EP1379833B1 (en) 2001-04-19 2016-06-01 Mapvision OY Method for indicating a point in a measurement space
CN107014338A (en) * 2017-04-21 2017-08-04 华南农业大学 A kind of component attitude measurement method and its application based on high speed camera
CN112648956A (en) * 2021-03-01 2021-04-13 北京卫星制造厂有限公司 Spatial pose real-time measuring and adjusting method based on joint calibration

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277012A (en) * 1985-06-03 1986-12-08 Nippon Telegr & Teleph Corp <Ntt> Method and apparatus for correcting position and posture of camera
JPS6217604A (en) * 1985-07-16 1987-01-26 Agency Of Ind Science & Technol Calibration of auxiliary light for 3-dimensional measurement
JPS6230904A (en) * 1985-08-01 1987-02-09 Hitachi Ltd Position and posture detecting system for object
JPS6256814A (en) * 1985-09-06 1987-03-12 Hitachi Ltd Calibration system for three-dimensional position measuring camera

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277012A (en) * 1985-06-03 1986-12-08 Nippon Telegr & Teleph Corp <Ntt> Method and apparatus for correcting position and posture of camera
JPS6217604A (en) * 1985-07-16 1987-01-26 Agency Of Ind Science & Technol Calibration of auxiliary light for 3-dimensional measurement
JPS6230904A (en) * 1985-08-01 1987-02-09 Hitachi Ltd Position and posture detecting system for object
JPS6256814A (en) * 1985-09-06 1987-03-12 Hitachi Ltd Calibration system for three-dimensional position measuring camera

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843026A (en) * 1994-07-29 1996-02-16 Mazda Motor Corp Calibration device and hologram
EP1379833B1 (en) 2001-04-19 2016-06-01 Mapvision OY Method for indicating a point in a measurement space
JP2009139782A (en) * 2007-12-10 2009-06-25 Nippon Hoso Kyokai <Nhk> Lens attitude/position adjusting method and device
JP2014178265A (en) * 2013-03-15 2014-09-25 Ricoh Co Ltd Calibration device, method and program
CN107014338A (en) * 2017-04-21 2017-08-04 华南农业大学 A kind of component attitude measurement method and its application based on high speed camera
CN107014338B (en) * 2017-04-21 2019-02-19 华南农业大学 A kind of component attitude measurement method and its application based on high speed camera
CN112648956A (en) * 2021-03-01 2021-04-13 北京卫星制造厂有限公司 Spatial pose real-time measuring and adjusting method based on joint calibration
CN112648956B (en) * 2021-03-01 2022-10-14 北京卫星制造厂有限公司 Spatial pose real-time measuring and adjusting method based on joint calibration

Also Published As

Publication number Publication date
JP2555368B2 (en) 1996-11-20

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Legal Events

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LAPS Cancellation because of no payment of annual fees