JPS6442446U - - Google Patents
Info
- Publication number
- JPS6442446U JPS6442446U JP13810987U JP13810987U JPS6442446U JP S6442446 U JPS6442446 U JP S6442446U JP 13810987 U JP13810987 U JP 13810987U JP 13810987 U JP13810987 U JP 13810987U JP S6442446 U JPS6442446 U JP S6442446U
- Authority
- JP
- Japan
- Prior art keywords
- scratch
- pulse
- optical disk
- monomulti
- disk inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 2
- 230000001960 triggered effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Manufacturing Optical Record Carriers (AREA)
Description
第１図および第２図は本考案の光デイスク検査
装置の一実施例を示す構成図およびその動作波形
図、第３図〜第６図は従来の光デイスク検査装置
の一例を示す構成図およびその動作波形図である
。
１……光デイスク、２……スピンドルモータ、
３……測定ヘツド、３１……レーザ光源、３２…
…集光レンズ、３３……ビームスプリツタ、３４
……受光素子、４……測定回路、４１……比較回
路、４２……プリセツトカウンタ、４３……フリ
ツプフロツプ回路、４４……モノマルチ、４５…
…オアゲート、４６……デイレイライン。
1 and 2 are block diagrams and operational waveform diagrams showing one embodiment of the optical disk inspection device of the present invention, and FIGS. 3 to 6 are block diagrams and diagrams showing an example of conventional optical disk inspection devices. It is an operation waveform diagram. 1... Optical disk, 2... Spindle motor,
3...Measuring head, 31...Laser light source, 32...
... Condenser lens, 33 ... Beam splitter, 34
... Light receiving element, 4 ... Measurement circuit, 41 ... Comparison circuit, 42 ... Preset counter, 43 ... Flip-flop circuit, 44 ... Monomulti, 45 ...
...Orgate, 46...Daylay Line.
Claims (1)
と比較して傷パルスを発生する比較回路とこの傷
パルスのパルス幅を測定することによりその傷の
長さを判別する判別回路とを有する光デイスク検
査装置において、オアゲートを介して前記比較回
路と判別回路との間に並列に接続されたモノマル
チを具備し、このモノマルチを前記傷パルスの立
下りでトリガするようにしてなる光デイスク検査
装置。 An optical disk inspection system comprising a comparison circuit that compares the output signal from a measurement head with a certain reference level to generate a scratch pulse, and a discrimination circuit that determines the length of the scratch by measuring the pulse width of the scratch pulse. An optical disk inspection device comprising a monomulti connected in parallel between the comparison circuit and the discrimination circuit via an OR gate, the monomulti being triggered by the falling edge of the scratch pulse.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13810987U JPS6442446U (en) | 1987-09-09 | 1987-09-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13810987U JPS6442446U (en) | 1987-09-09 | 1987-09-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6442446U true JPS6442446U (en) | 1989-03-14 |
Family
ID=31400141
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13810987U Pending JPS6442446U (en) | 1987-09-09 | 1987-09-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6442446U (en) |
-
1987
- 1987-09-09 JP JP13810987U patent/JPS6442446U/ja active Pending
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