JPS6439541A - Simplified apparatus for analyzing absorbancy - Google Patents

Abstract

PURPOSE:To easily, accurately and stably analyze a material contained in a low concn. region to a high concn. region by changing a specific wavelength and/or the transmitted light path length in a liquid to be inspected according to the concn. of the specific material in the liquid to be inspected. CONSTITUTION:A luminous flux is projected on the liquid to be inspected and the absorbancy with respect to the specific wavelength is measured by receiving the transmitted light thereof. The specific wavelength and/or the transmitted light path length in the liquid to be inspected is changed according to the concn. of the specific material which is the object to be analyzed in the liquid to be inspected. As to the type of changing the specific wavelength, the concn. range of the specific material in, for example, the liquid to be inspected is divided to plural regions and the respectively separate specific wavelengths, the absorbancies of which charge as largely as possible with a change in concn. in correspondence to the respective divided regions are preferably used. The system of decreasing the transmitted light path length by providing a spacer of glass, etc., in, for example, a part of the transmitted light path part in the liquid to be inspected is preferable as the type of changing the transmitted light path length in the liquid to be inspected. The measured absorbancy is converted to the concn. of the specific material in the liquid to be inspected and the temp. correction by the temp. of the liquid to be inspected or the periphery thereof is executed.