JPS6438617A - Measuring apparatus of light distribution - Google Patents

Measuring apparatus of light distribution

Info

Publication number
JPS6438617A
JPS6438617A JP19483187A JP19483187A JPS6438617A JP S6438617 A JPS6438617 A JP S6438617A JP 19483187 A JP19483187 A JP 19483187A JP 19483187 A JP19483187 A JP 19483187A JP S6438617 A JPS6438617 A JP S6438617A
Authority
JP
Japan
Prior art keywords
light
screen
distance
intensity
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19483187A
Other languages
Japanese (ja)
Inventor
Michiaki Senda
Takashi Nagase
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yaskawa Electric Corp
Original Assignee
Yaskawa Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yaskawa Electric Manufacturing Co Ltd filed Critical Yaskawa Electric Manufacturing Co Ltd
Priority to JP19483187A priority Critical patent/JPS6438617A/en
Publication of JPS6438617A publication Critical patent/JPS6438617A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To make it possible to show in a diagram the relationship between a distance from a light-emitting surface and the distribution of the intensity of light within a section vertical to the optical axis of a flux of light, by a method wherein a light is applied onto a translucent screen and an image projected on the screen is picked up and subjected to an image processing. CONSTITUTION:A light emitted from a light-emitting body 1 formed of LED is projected onto a translucent screen {frosted glass) 2, an image thereof is picked up 3 and inputted to an image processing device 4, and a line of equal luminous intensity of the light on the image is prepared and displayed. This operation is repeated with a gap between the screen 2 and the pickup device 3 fixed and with a distance Z between the light-emitting body 1 and the screen 2 varied. The intensity of the light is converted into digital amounts of eight grades, for instance, and subjected to binary-coded display in such a manner that the intensity of light of some picture element is displayed with black when it is at an odd-number grade while it is displayed with white when it is at an even-number grade. Then a radius (r) to the boundary of concentric circles of black and white is measured. If the radius (r) of the same circle is unvaried, the emitted light of the light-emitting body 1 forms parallel rays of light even when the distance Z is varied, and the emitted light can be determined not to be parallel rays of light if the radious (r) is varied in accordance with the distance Z.
JP19483187A 1987-08-04 1987-08-04 Measuring apparatus of light distribution Pending JPS6438617A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19483187A JPS6438617A (en) 1987-08-04 1987-08-04 Measuring apparatus of light distribution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19483187A JPS6438617A (en) 1987-08-04 1987-08-04 Measuring apparatus of light distribution

Publications (1)

Publication Number Publication Date
JPS6438617A true JPS6438617A (en) 1989-02-08

Family

ID=16330984

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19483187A Pending JPS6438617A (en) 1987-08-04 1987-08-04 Measuring apparatus of light distribution

Country Status (1)

Country Link
JP (1) JPS6438617A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07168406A (en) * 1993-12-16 1995-07-04 Ricoh Co Ltd Average illuminance measuring device
US5432609A (en) * 1993-01-06 1995-07-11 Minolta Co., Ltd. Two-dimensional colorimeter
US5499304A (en) * 1990-10-02 1996-03-12 Delco Electronics Corporation Light mask
JP2002005785A (en) * 2000-06-26 2002-01-09 Matsushita Electric Works Ltd Measuring method for characteristics of infrared module
JP2012103107A (en) * 2010-11-10 2012-05-31 Sony Corp Device, method and program for measuring light distribution
WO2013140556A1 (en) * 2012-03-21 2013-09-26 パイオニア株式会社 Light emission quantity estimating apparatus and light emission quantity estimating method for semiconductor light emitting element
CN103411754A (en) * 2013-07-24 2013-11-27 兰州大成科技股份有限公司 Method for measuring distribution of intensity of light spots of reflecting type concentrating photovoltaic condenser
CN103630332A (en) * 2013-11-15 2014-03-12 南京中电熊猫照明有限公司 Backlight brightness uniformity measuring device and method
WO2014192347A1 (en) * 2013-05-31 2014-12-04 本田技研工業株式会社 Optical sensor inspection system and optical sensor inspection method
WO2015086704A1 (en) * 2013-12-11 2015-06-18 Infiniled Limited Apparatus and method for profiling a beam of a light emitting semiconductor device
WO2015151488A1 (en) * 2014-04-03 2015-10-08 パナソニックＩｐマネジメント株式会社 Radiant flux distribution measurement method and radiant flux distribution measurement device
JP2015206645A (en) * 2014-04-18 2015-11-19 株式会社バンザイ Measurement device of head light for vehicle
US9952090B2 (en) 2011-10-21 2018-04-24 National Central University Detecting apparatus and detecting method thereof

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS534590A (en) * 1976-07-02 1978-01-17 Hitachi Denshi Ltd Measurement of optical distribution on optical axis

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS534590A (en) * 1976-07-02 1978-01-17 Hitachi Denshi Ltd Measurement of optical distribution on optical axis

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5499304A (en) * 1990-10-02 1996-03-12 Delco Electronics Corporation Light mask
US5432609A (en) * 1993-01-06 1995-07-11 Minolta Co., Ltd. Two-dimensional colorimeter
JPH07168406A (en) * 1993-12-16 1995-07-04 Ricoh Co Ltd Average illuminance measuring device
JP2002005785A (en) * 2000-06-26 2002-01-09 Matsushita Electric Works Ltd Measuring method for characteristics of infrared module
JP2012103107A (en) * 2010-11-10 2012-05-31 Sony Corp Device, method and program for measuring light distribution
US9952090B2 (en) 2011-10-21 2018-04-24 National Central University Detecting apparatus and detecting method thereof
WO2013140556A1 (en) * 2012-03-21 2013-09-26 パイオニア株式会社 Light emission quantity estimating apparatus and light emission quantity estimating method for semiconductor light emitting element
JP5897213B2 (en) * 2013-05-31 2016-03-30 本田技研工業株式会社 Optical sensor inspection system and optical sensor inspection method
WO2014192347A1 (en) * 2013-05-31 2014-12-04 本田技研工業株式会社 Optical sensor inspection system and optical sensor inspection method
CN103411754A (en) * 2013-07-24 2013-11-27 兰州大成科技股份有限公司 Method for measuring distribution of intensity of light spots of reflecting type concentrating photovoltaic condenser
CN103630332A (en) * 2013-11-15 2014-03-12 南京中电熊猫照明有限公司 Backlight brightness uniformity measuring device and method
WO2015086704A1 (en) * 2013-12-11 2015-06-18 Infiniled Limited Apparatus and method for profiling a beam of a light emitting semiconductor device
US11099063B2 (en) 2013-12-11 2021-08-24 Facebook Technologies, Llc Apparatus and method for profiling a beam of a light emitting semiconductor device
WO2015151488A1 (en) * 2014-04-03 2015-10-08 パナソニックＩｐマネジメント株式会社 Radiant flux distribution measurement method and radiant flux distribution measurement device
JP2015206645A (en) * 2014-04-18 2015-11-19 株式会社バンザイ Measurement device of head light for vehicle

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