JPS6436963U - - Google Patents

Info

Publication number
JPS6436963U
JPS6436963U JP13262487U JP13262487U JPS6436963U JP S6436963 U JPS6436963 U JP S6436963U JP 13262487 U JP13262487 U JP 13262487U JP 13262487 U JP13262487 U JP 13262487U JP S6436963 U JPS6436963 U JP S6436963U
Authority
JP
Japan
Prior art keywords
sample
chamber
laser light
inductively coupled
plasma torch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13262487U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13262487U priority Critical patent/JPS6436963U/ja
Publication of JPS6436963U publication Critical patent/JPS6436963U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
JP13262487U 1987-08-31 1987-08-31 Pending JPS6436963U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13262487U JPS6436963U (enrdf_load_stackoverflow) 1987-08-31 1987-08-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13262487U JPS6436963U (enrdf_load_stackoverflow) 1987-08-31 1987-08-31

Publications (1)

Publication Number Publication Date
JPS6436963U true JPS6436963U (enrdf_load_stackoverflow) 1989-03-06

Family

ID=31389758

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13262487U Pending JPS6436963U (enrdf_load_stackoverflow) 1987-08-31 1987-08-31

Country Status (1)

Country Link
JP (1) JPS6436963U (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54162597A (en) * 1978-06-14 1979-12-24 Hitachi Ltd Laser probe induction coupled plasma emission analyzing apparatus
JPS6148100A (ja) * 1984-08-15 1986-03-08 シヨウワサ−ビス株式会社 在車表示システム

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54162597A (en) * 1978-06-14 1979-12-24 Hitachi Ltd Laser probe induction coupled plasma emission analyzing apparatus
JPS6148100A (ja) * 1984-08-15 1986-03-08 シヨウワサ−ビス株式会社 在車表示システム

Similar Documents

Publication Publication Date Title
JPH05251038A (ja) プラズマイオン質量分析装置
JPH08505258A (ja) プラズマ源質量分析計における干渉の低減
Belchamber et al. Correlation study of internal standardization in inductively coupled plasma atomic emission spectrometry
JPH07130325A (ja) 質量分析装置
CA2116821A1 (en) Improvements in plasma mass spectrometry
JPS6436963U (enrdf_load_stackoverflow)
GB2203241A (en) Introduction of effluent into mass spectrometers and other gas-phase or particle detectors
JPS6436964U (enrdf_load_stackoverflow)
Blades et al. Application of weakly ionized plasmas for materials sampling and analysis
JPH09127060A (ja) 溶液の質量分析に関する方法と装置
JP2001185073A (ja) 誘導結合プラズマ質量分析装置及び方法
JP3596368B2 (ja) 質量分析装置
JPH04104449A (ja) 高周波誘導プラズマ質量分析計
JPH01176359U (enrdf_load_stackoverflow)
JP3471821B2 (ja) 高周波誘導結合プラズマ分析装置
JPS6451259U (enrdf_load_stackoverflow)
JP2792140B2 (ja) 高周波誘導結合プラズマ質量分析計
JPS63139758U (enrdf_load_stackoverflow)
JPH0323653Y2 (enrdf_load_stackoverflow)
JPS6423867U (enrdf_load_stackoverflow)
JPH0637563Y2 (ja) 誘導結合プラズマ質量分析装置
JPH05107186A (ja) 固体発光分光分析装置
JPH0316656U (enrdf_load_stackoverflow)
JPH1050248A (ja) Icp質量分析装置
JPH0638371Y2 (ja) 試料導入装置