JPS6428858A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS6428858A
JPS6428858A JP62183400A JP18340087A JPS6428858A JP S6428858 A JPS6428858 A JP S6428858A JP 62183400 A JP62183400 A JP 62183400A JP 18340087 A JP18340087 A JP 18340087A JP S6428858 A JPS6428858 A JP S6428858A
Authority
JP
Japan
Prior art keywords
line
power supply
circuit part
specified
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62183400A
Other languages
Japanese (ja)
Inventor
Takuo Iizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Ltd
Hitachi Microcomputer Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Microcomputer Engineering Ltd filed Critical Hitachi Ltd
Priority to JP62183400A priority Critical patent/JPS6428858A/en
Publication of JPS6428858A publication Critical patent/JPS6428858A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To make it possible to test effectively a specified circuit part from the outside, by providing an individual power supply line to supply electric power to a specified circuit part for which an operating test is performed, and arranging a diode between the individual power supply line and a common power supplying line. CONSTITUTION:A temperature detection circuit 3 constituting a specified circuit part for which an operating test is performed is provided with an individual power supply line L2 exclusively installed besides a common power supplying line L1. A diode is arranged between the line L1 and the line L2. Thereby, a specified power supply voltage Vt for testing can be supplied only to the circuit 3, while a constant ordinary operating power supplying voltage VCC is supplied to a circuit 2 of the other parts. Thereby, the operating state of the circuit part 3 can be indirectly observed from the outside.
JP62183400A 1987-07-24 1987-07-24 Semiconductor integrated circuit device Pending JPS6428858A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62183400A JPS6428858A (en) 1987-07-24 1987-07-24 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62183400A JPS6428858A (en) 1987-07-24 1987-07-24 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS6428858A true JPS6428858A (en) 1989-01-31

Family

ID=16135115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62183400A Pending JPS6428858A (en) 1987-07-24 1987-07-24 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS6428858A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04144897A (en) * 1990-10-04 1992-05-19 Toshiba Corp Control unit for elevator
JP2006292638A (en) * 2005-04-13 2006-10-26 Denso Corp Method of inspecting circuit mounted on board
JP2006322786A (en) * 2005-05-18 2006-11-30 Denso Corp Bear chip mounting circuit device and its high power supply voltage impression test method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04144897A (en) * 1990-10-04 1992-05-19 Toshiba Corp Control unit for elevator
JP2006292638A (en) * 2005-04-13 2006-10-26 Denso Corp Method of inspecting circuit mounted on board
JP2006322786A (en) * 2005-05-18 2006-11-30 Denso Corp Bear chip mounting circuit device and its high power supply voltage impression test method

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