JPS6425046A - X-ray diffraction apparatus - Google Patents

Abstract

PURPOSE:To obtain a diffraction apparatus, by which quick and accurate measurement can be performed, by a constitution wherein the mutual positional relation between X-ray detectors in neighboring lines is shifted in the circumferential direction, and the aligning plane of the X ray detectors in each line are intersected at the same sample measuring position. CONSTITUTION:In (A) in the Figure, C is an aligning circumference of an X-ray detector D, and O is the center of the circumference and is a measuring point. The diameter of each detector, which is aligned on the same circumference is denoted as (d) and the aligning pitch thereof is denoted as (p). The radius of the circumference is denoted as R. Then an angular distance between the neighboring detectors with respect to the center of the circumference is expressed by p/R. As shown in (C), three lines of the X-ray detectors 41-43 are slightly shifted. An angle, which is defined by the aligning pitch of the X-ray detectors in one detector line from the center of the circumference is, e.g., 1.5 deg.. The shifting angle between the X-ray detectors D in the adjacent lines is 0.5 deg.. The resolution capacity of one group of the X-ray detectors D is 0.5 deg.. The lines 41-43 are arranged in a fan shape on respective one plane. The fan-shaped aligning planes S1-S3 are intersected at one straight line passing the sample measuring point 0 as shown in (B).