JPS6421581A - Projector for image processing - Google Patents

Projector for image processing

Info

Publication number
JPS6421581A
JPS6421581A JP62177812A JP17781287A JPS6421581A JP S6421581 A JPS6421581 A JP S6421581A JP 62177812 A JP62177812 A JP 62177812A JP 17781287 A JP17781287 A JP 17781287A JP S6421581 A JPS6421581 A JP S6421581A
Authority
JP
Japan
Prior art keywords
light energy
light emitting
reflection factor
observed
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62177812A
Other languages
Japanese (ja)
Other versions
JP2644497B2 (en
Inventor
Toshimichi Masaki
Kazuhiko Saka
Mitsutaka Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP62177812A priority Critical patent/JP2644497B2/en
Publication of JPS6421581A publication Critical patent/JPS6421581A/en
Application granted granted Critical
Publication of JP2644497B2 publication Critical patent/JP2644497B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To maintain always constant measuring accuracy by setting up the light energy of radiated light in accordance with the surface reflection factor of an object to be observed and controlling the light emitting operation of a semiconductor light emitting element based on the set value. CONSTITUTION:When the surface color of an object 6 to be observed is known and the reflection factor of its surface is known, the data of the surface reflection factor is previously set up in a control unit 4. When the surface reflection factor of the object 6 is defined as gamma, the light energy E of slit beams 7 is expressed by E=f(gamma) and the set data of the light energy E are applied to a light energy control circuit 5. The circuit 5 fetch an ON/OFF specification signal and the light energy set data from the control unit 4 and controls the light emitting operation of the semiconductor light emitting element in a projector 1 based on the fetched data. Even if the object to be observed is changed, the measuring accuracy can be maintained always at a fixed level.
JP62177812A 1987-07-16 1987-07-16 Slit light projection control device for image processing Expired - Fee Related JP2644497B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62177812A JP2644497B2 (en) 1987-07-16 1987-07-16 Slit light projection control device for image processing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62177812A JP2644497B2 (en) 1987-07-16 1987-07-16 Slit light projection control device for image processing

Publications (2)

Publication Number Publication Date
JPS6421581A true JPS6421581A (en) 1989-01-24
JP2644497B2 JP2644497B2 (en) 1997-08-25

Family

ID=16037519

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62177812A Expired - Fee Related JP2644497B2 (en) 1987-07-16 1987-07-16 Slit light projection control device for image processing

Country Status (1)

Country Link
JP (1) JP2644497B2 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0658726A (en) * 1992-08-04 1994-03-04 Mitsubishi Heavy Ind Ltd Removing method of abnormal light in optical cutting method
JPH0658725A (en) * 1992-08-04 1994-03-04 Aisin Seiki Co Ltd Detecting method of attribute of high-luminance area
JPH09325010A (en) * 1996-06-05 1997-12-16 Minolta Co Ltd Three-dimensional measuring device
JPH09325009A (en) * 1996-06-05 1997-12-16 Minolta Co Ltd Three-dimensional measuring device
JPH10501360A (en) * 1994-10-25 1998-02-03 ユナイテッド パーセル サービス オブ アメリカ，インコーポレイテッド Automatic electronic camera for label image capture
WO2005103609A1 (en) * 2004-03-31 2005-11-03 Ihi Aerospace Engineering Co. Ltd. 3-dimensional shape measurement device and 3-dimensional shape measurement method
JP2018141810A (en) * 2018-06-07 2018-09-13 株式会社ニコン Shape measurement apparatus, structure manufacturing system, shape measurement method, structure manufacturing method, shape measurement program, and recording medium

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52131429A (en) * 1976-04-28 1977-11-04 Omron Tateisi Electronics Co Pattern discrimination device for printed matter
JPS5729959U (en) * 1980-07-21 1982-02-17

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52131429A (en) * 1976-04-28 1977-11-04 Omron Tateisi Electronics Co Pattern discrimination device for printed matter
JPS5729959U (en) * 1980-07-21 1982-02-17

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0658726A (en) * 1992-08-04 1994-03-04 Mitsubishi Heavy Ind Ltd Removing method of abnormal light in optical cutting method
JPH0658725A (en) * 1992-08-04 1994-03-04 Aisin Seiki Co Ltd Detecting method of attribute of high-luminance area
JPH10501360A (en) * 1994-10-25 1998-02-03 ユナイテッド パーセル サービス オブ アメリカ，インコーポレイテッド Automatic electronic camera for label image capture
US6141046A (en) * 1994-10-25 2000-10-31 Roth; Stephen Anthony Electronic camera having an illuminator with dispersing ring lens
JPH09325010A (en) * 1996-06-05 1997-12-16 Minolta Co Ltd Three-dimensional measuring device
JPH09325009A (en) * 1996-06-05 1997-12-16 Minolta Co Ltd Three-dimensional measuring device
WO2005103609A1 (en) * 2004-03-31 2005-11-03 Ihi Aerospace Engineering Co. Ltd. 3-dimensional shape measurement device and 3-dimensional shape measurement method
JP2018141810A (en) * 2018-06-07 2018-09-13 株式会社ニコン Shape measurement apparatus, structure manufacturing system, shape measurement method, structure manufacturing method, shape measurement program, and recording medium

Also Published As

Publication number Publication date
JP2644497B2 (en) 1997-08-25

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees