JPS6415645A - Lattice-plate inspecting apparatus - Google Patents
Lattice-plate inspecting apparatusInfo
- Publication number
- JPS6415645A JPS6415645A JP62170974A JP17097487A JPS6415645A JP S6415645 A JPS6415645 A JP S6415645A JP 62170974 A JP62170974 A JP 62170974A JP 17097487 A JP17097487 A JP 17097487A JP S6415645 A JPS6415645 A JP S6415645A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- distribution
- measuring
- crack
- tip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Abstract
PURPOSE:To detect cracks accurately in a nondestructive way, by measuring the difference in heat conductivity, which is changed by the presence of cracks. CONSTITUTION:A heating device 4, which supplies heat energy, and a temperature-distribution measuring device 3, which measures the distribution of temperature, are connected to a sensor 1, which is scanned with a driving device 2. The driving device 2, the temperature-distribution measuring device 3 and the heating device 4 are connected to a data processing device 7. Measuring conditions and measured data are inputted into a data processing device 7 and operated. A device is set on a lattice plate. The measuring range of the sensor is set, and measurement is started. After the measurement, the image of temperature distribution is synthesized and operated based on the measured data stored in a memory device 6. The high point of the temperature distribution is judged to be the tip of a crack. The size of the crack or a defect is judged based on the temperature gradient around the tip. The result is outputted to a display device 5 and also received in a recorder 6.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62170974A JPS6415645A (en) | 1987-07-10 | 1987-07-10 | Lattice-plate inspecting apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62170974A JPS6415645A (en) | 1987-07-10 | 1987-07-10 | Lattice-plate inspecting apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6415645A true JPS6415645A (en) | 1989-01-19 |
Family
ID=15914805
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62170974A Pending JPS6415645A (en) | 1987-07-10 | 1987-07-10 | Lattice-plate inspecting apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6415645A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014503810A (en) * | 2010-12-13 | 2014-02-13 | ウエスチングハウス・エレクトリック・カンパニー・エルエルシー | Upper lattice plate inspection tool |
JP2017227620A (en) * | 2016-05-02 | 2017-12-28 | ザ・ボーイング・カンパニーThe Boeing Company | Thermo-chromatic witness features for lightning strike indication in both metallic and composite structures |
-
1987
- 1987-07-10 JP JP62170974A patent/JPS6415645A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014503810A (en) * | 2010-12-13 | 2014-02-13 | ウエスチングハウス・エレクトリック・カンパニー・エルエルシー | Upper lattice plate inspection tool |
JP2017227620A (en) * | 2016-05-02 | 2017-12-28 | ザ・ボーイング・カンパニーThe Boeing Company | Thermo-chromatic witness features for lightning strike indication in both metallic and composite structures |
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