JPS6413483A - Semiconductor integrated circuit device - Google Patents
Semiconductor integrated circuit deviceInfo
- Publication number
- JPS6413483A JPS6413483A JP62168661A JP16866187A JPS6413483A JP S6413483 A JPS6413483 A JP S6413483A JP 62168661 A JP62168661 A JP 62168661A JP 16866187 A JP16866187 A JP 16866187A JP S6413483 A JPS6413483 A JP S6413483A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit
- test
- aging
- logic part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To facilitate aging by providing a test signal generating circuit which is combined effectively for the aging and generates a test signal and a signal selecting circuit which transmits the test signal selectivity to a logic part. CONSTITUTION:The logic part LC is supplied with an input signal normally through external terminals S1-Si. The test signal generating circuit is provided which consists of an oscillation circuit OSC composed of a ring oscillator and a frequency dividing circuit FD. The circuit OSC is put in operation selectively according to an aging test signal AT supplied through an external terminal AT. At this time, an oscillation signal g0 generated by the circuit OSC is frequency-divided and edited to generate test signals g1-gi which are most effective for an aging test. A signal selecting circuit SEL is provided between input buffers IB1-IB3, and the logic part LC, and sends the input signal supplied through the terminals S1-Si or the signals g1-gi to the logic part LC selectively according to the signal AT.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62168661A JPS6413483A (en) | 1987-07-08 | 1987-07-08 | Semiconductor integrated circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62168661A JPS6413483A (en) | 1987-07-08 | 1987-07-08 | Semiconductor integrated circuit device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6413483A true JPS6413483A (en) | 1989-01-18 |
Family
ID=15872157
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62168661A Pending JPS6413483A (en) | 1987-07-08 | 1987-07-08 | Semiconductor integrated circuit device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6413483A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01227081A (en) * | 1988-03-07 | 1989-09-11 | Sharp Corp | Semiconductor integrated circuit |
CN115166462A (en) * | 2022-07-04 | 2022-10-11 | 赖俊生 | Method, device and equipment for continuously monitoring full life cycle of semiconductor |
-
1987
- 1987-07-08 JP JP62168661A patent/JPS6413483A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01227081A (en) * | 1988-03-07 | 1989-09-11 | Sharp Corp | Semiconductor integrated circuit |
CN115166462A (en) * | 2022-07-04 | 2022-10-11 | 赖俊生 | Method, device and equipment for continuously monitoring full life cycle of semiconductor |
CN115166462B (en) * | 2022-07-04 | 2023-08-22 | 赖俊生 | Method, device and equipment for continuously detecting full life cycle of semiconductor chip |
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