JPS6410168A - Defect determining method - Google Patents
Defect determining methodInfo
- Publication number
- JPS6410168A JPS6410168A JP62164046A JP16404687A JPS6410168A JP S6410168 A JPS6410168 A JP S6410168A JP 62164046 A JP62164046 A JP 62164046A JP 16404687 A JP16404687 A JP 16404687A JP S6410168 A JPS6410168 A JP S6410168A
- Authority
- JP
- Japan
- Prior art keywords
- point
- oblique
- diffraction angle
- emat
- varying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
PURPOSE:To increase the apparent spread of sound and to improve the measurement accuracy of defect side by using an oblique electromagnetic ultrasonic transducer and performing flaw detection while varying a diffraction angle thetavarying the frequency. CONSTITUTION:The oblique electromagnetic ultrasonic transducer (oblique EMAT) 8 is moved to a point (a), and the diffraction angle is varied within a range alpha by varying the frequency to detect a waveform at each frequency. Then the oblique EMAT 8 is moved successively up to a point (b) to gather similar data at respective points. Then values at respective calculation are added repeatedly in the order of (c), (d).... Consequently, the waveforms at the respective points are in phase and equal in peak as to a defect point (p) to obtain a large value, but they cancel one another except at the point (p) and the value becomes small. This processing is performed only within the range where an ultrasonic wave beam is present in consideration of the diffraction angle of the oblique EMAT 8 and the spread of an ultrasonic beam, and the processing range at each point is widened by varying the diffraction angle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62164046A JPS6410168A (en) | 1987-07-02 | 1987-07-02 | Defect determining method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62164046A JPS6410168A (en) | 1987-07-02 | 1987-07-02 | Defect determining method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6410168A true JPS6410168A (en) | 1989-01-13 |
Family
ID=15785770
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62164046A Pending JPS6410168A (en) | 1987-07-02 | 1987-07-02 | Defect determining method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6410168A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010025555A (en) * | 2008-07-15 | 2010-02-04 | Daikure Co Ltd | Method and device for measuring wall thickness of high temperature vessel |
-
1987
- 1987-07-02 JP JP62164046A patent/JPS6410168A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010025555A (en) * | 2008-07-15 | 2010-02-04 | Daikure Co Ltd | Method and device for measuring wall thickness of high temperature vessel |
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