JPS6410044B2 - - Google Patents

Info

Publication number
JPS6410044B2
JPS6410044B2 JP18673981A JP18673981A JPS6410044B2 JP S6410044 B2 JPS6410044 B2 JP S6410044B2 JP 18673981 A JP18673981 A JP 18673981A JP 18673981 A JP18673981 A JP 18673981A JP S6410044 B2 JPS6410044 B2 JP S6410044B2
Authority
JP
Japan
Prior art keywords
pattern
photodetector
regular pattern
defect
photodetector array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP18673981A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5887531A (ja
Inventor
Shunsuke Mukasa
Kennosuke Sugizaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP56186739A priority Critical patent/JPS5887531A/ja
Publication of JPS5887531A publication Critical patent/JPS5887531A/ja
Publication of JPS6410044B2 publication Critical patent/JPS6410044B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95623Inspecting patterns on the surface of objects using a spatial filtering method

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
JP56186739A 1981-11-20 1981-11-20 規則性パタ−ンの欠陥検査装置 Granted JPS5887531A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56186739A JPS5887531A (ja) 1981-11-20 1981-11-20 規則性パタ−ンの欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56186739A JPS5887531A (ja) 1981-11-20 1981-11-20 規則性パタ−ンの欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS5887531A JPS5887531A (ja) 1983-05-25
JPS6410044B2 true JPS6410044B2 (enrdf_load_stackoverflow) 1989-02-21

Family

ID=16193799

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56186739A Granted JPS5887531A (ja) 1981-11-20 1981-11-20 規則性パタ−ンの欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS5887531A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6122624A (ja) * 1984-07-11 1986-01-31 Hitachi Ltd 外観検査装置
JP2007033263A (ja) * 2005-07-27 2007-02-08 Nagasaki Univ 微小凹面形状の形状誤差機上計測方法および計測装置
JP2008000248A (ja) * 2006-06-21 2008-01-10 Yamazaki Corp 清掃具

Also Published As

Publication number Publication date
JPS5887531A (ja) 1983-05-25

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