JPS6395681A - Semiconductor light-emitting device - Google Patents

Semiconductor light-emitting device

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Publication number
JPS6395681A
JPS6395681A JP61241665A JP24166586A JPS6395681A JP S6395681 A JPS6395681 A JP S6395681A JP 61241665 A JP61241665 A JP 61241665A JP 24166586 A JP24166586 A JP 24166586A JP S6395681 A JPS6395681 A JP S6395681A
Authority
JP
Japan
Prior art keywords
region
layer
disordered
conductivity type
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61241665A
Other languages
Japanese (ja)
Inventor
Tetsuya Yagi
哲哉 八木
Hitoshi Mizuochi
水落 均
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61241665A priority Critical patent/JPS6395681A/en
Publication of JPS6395681A publication Critical patent/JPS6395681A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To introduce generated beams to the outside efficiently by forming the central sections of a clad layer, an active layer and a contact layer in multiple quantum well structure and shaping side sections except the central sections in a disordered region. CONSTITUTION:Currents flowing into a device flow only through a current path 7, a region not disordered (a central section 17, an n-type MQW clad layer 13 and an n-type InP substrate 1), by the difference of diffusion potential. Electrons injected from an n-side electrode 4 and holes from a region in which there is no SiO2 insulating film 2 between a p-side electrode 3 and a p-type MQW contact layer 11 are recombined in an active region 12 and converted into beams. Since the disordered MQW layer has a refractive index smaller than an original MQW layer, beams generated in the active region 12 are confined only in the region not disordered, and are not propagated in the cross direction of the device, thus efficiently introducing beams to the outside.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体発光装置に関し、特に発光ダイオード
装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor light emitting device, and particularly to a light emitting diode device.

〔従来の技術〕[Conventional technology]

第2図は従来の半導体発光装置を示す断面図である。第
2図において、■はn型rnP基板、2はSin、絶縁
膜、3はp側電極、4はn側電極、5は球レンズ、6は
球レンズ5固定用の樹脂、7は電流の流れる電流経路、
8はn型1nPクラッド層、9はp型InCyaAs活
性層、10はp型InPクラッド層、11はp型1nG
aAs:lンタクト層、12は活性領域である。
FIG. 2 is a sectional view showing a conventional semiconductor light emitting device. In Figure 2, ■ is an n-type rnP substrate, 2 is a Sin insulating film, 3 is a p-side electrode, 4 is an n-side electrode, 5 is a ball lens, 6 is a resin for fixing the ball lens 5, and 7 is a current flowing current path,
8 is an n-type 1nP cladding layer, 9 is a p-type InCyaAs active layer, 10 is a p-type InP cladding layer, and 11 is a p-type 1nG layer.
aAs:1 contact layer; 12 is an active region;

次に動作について説明する。p側電極3とn側電極4の
間にp側が十となるような正のバイアスを印加すると、
n側電極4からは電子がデバイス中に注入され、p側電
極3とp型InGaAsコンタクト層11の間にSin
、絶縁膜2の存在していない領域からは正孔がデバイス
中に注入される。つまり電流が流れる。この電流は経路
7のように流れる。p型1nGaAs活性層9内の活性
領域12に注入された電子および正孔は再結合して光に
変わる。ここで発生した光はデバイス中を伝搬し、球レ
ンズ5を通して外部に導がれる。
Next, the operation will be explained. When a positive bias is applied between the p-side electrode 3 and the n-side electrode 4 so that the p-side becomes 10,
Electrons are injected into the device from the n-side electrode 4, and a sin
, holes are injected into the device from the region where the insulating film 2 is not present. In other words, current flows. This current flows along path 7. Electrons and holes injected into the active region 12 in the p-type 1nGaAs active layer 9 are recombined and converted into light. The light generated here propagates through the device and is guided to the outside through the ball lens 5.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来の半導体発光装置は以上のように構成されているの
で、活性領域12で発生した光のうち基板1方向に放射
された光はそのまま球レンズ5を。
Since the conventional semiconductor light emitting device is constructed as described above, the light emitted toward the substrate 1 out of the light generated in the active region 12 is directly transmitted to the ball lens 5.

通して外部に導かれ、また、コンタクト層11方向に放
射された光はn側電極3で反射されて基板1内を通り球
レンズ5を通って外部に導かれるが、他の方向に放射さ
れた光は外部に導かれることなう消失してしまうので、
光出力が大きくできないなどの問題があった。
The light emitted in the direction of the contact layer 11 is reflected by the n-side electrode 3, passes through the substrate 1, passes through the ball lens 5, and is guided to the outside, but the light is emitted in other directions. The light will disappear without being guided to the outside,
There were problems such as the inability to increase the light output.

本発明はこのような点に鑑みてなされたものであり、そ
の目的とするところは、活性領域で発生した光を効率良
(外部に導くことのできる半導体発光装置を得ることに
ある。
The present invention has been made in view of these points, and its purpose is to provide a semiconductor light-emitting device that can efficiently guide light generated in an active region to the outside.

〔問題点を解決するための手段〕[Means for solving problems]

このような目的を達成するために本発明は、第1導電型
の半導体基板上に、第1導電型の多重量子井戸構造のク
ラッド層と、中央部に第15電型もしくは第2導電型も
しくは真性導電型の多重量子井戸構造の活性領域を有し
この活性領域以外の領域であるサイド部が第2導電型の
無秩序化領域である活性層と、中央部に第2導電型の多
重量子井戸構造領域を有し中央部以外の部分であるサイ
ド部に第2導電型の無秩序化領域を有するクラッド層と
、中央部に第24電型の多重量子井戸構造領域を有し中
央部以外の部分であるサイド部に第2導電型の無秩序化
領域を有するコンタクト層とを設けるようにしたもので
ある。
In order to achieve such an object, the present invention provides a cladding layer having a multi-quantum well structure of a first conductivity type on a semiconductor substrate of a first conductivity type, and a cladding layer of a 15th conductivity type, a second conductivity type, or The active layer has an active region having a multi-quantum well structure of an intrinsic conductivity type, and the side part, which is a region other than the active region, is a disordered region of a second conductivity type, and the center part has a multi-quantum well structure of a second conductivity type. A cladding layer having a structure region and a disordered region of a second conductivity type in a side part which is a part other than the central part, and a cladding layer having a multi-quantum well structure region of a 24th conductivity type in a central part and a part other than the central part. A contact layer having a disordered region of the second conductivity type is provided on the side portion.

〔作用〕[Effect]

本発明の装置は、活性領域で発生した光を多重量子井戸
構造領域に閉じ込め、光を効率良く外部に導く。
The device of the present invention confines the light generated in the active region in the multiple quantum well structure region and efficiently guides the light to the outside.

〔実施例〕〔Example〕

本発明に係わる半導体発光装置の一実施例を第1図に示
す。第1図において、13はn型の多重量子井戸構造(
以下rMQWJという)のクラフト層、13aはクラッ
ド層13と後述の活性層14のサイド部との間にあるp
要領域、14は中央部17にn型もしくはp型もしくは
真性導電型のMQWの活性領域12を有し活性領域12
以外の領域であるサイド部18がp型の無秩序化領域で
ある活性層、15は中央部17がp型のMQWでありサ
イド部18がp型の無秩序化領域であるクラッド層、1
6は中央部17がp型のMQWでありサイド部18がp
型の無秩序化領域であるコンタクト層、1’H$pn接
合である。
An embodiment of a semiconductor light emitting device according to the present invention is shown in FIG. In FIG. 1, 13 is an n-type multiple quantum well structure (
A craft layer 13a of the cladding layer 13 (hereinafter referred to as rMQWJ) is a p
The main region 14 has an n-type, p-type, or intrinsic conductivity type MQW active region 12 in the central part 17.
15 is a cladding layer in which the center portion 17 is a p-type MQW and the side portion 18 is a p-type disordered region;
6, the center part 17 is a p-type MQW, and the side parts 18 are p-type MQW.
The contact layer is a disordered region of the type, 1'H$pn junction.

無秩序化領域としてのサイド部18はZn拡散によりM
QWwi域を無秩序化した領域であり、この無秩序化さ
れたMQW領域としてのサイド部18は、無秩序化され
ていない元のM Q W ?+JI域である中央部17
より禁止帯幅が大きい。禁止帯幅が大きいということは
屈折率が小さいということであり、活性領域12で発生
した光を無秩序化されなかった領域つまり中央部17に
閉じ込め、光を効率良く外部に導くことができる。
The side part 18 as a disordered region has M due to Zn diffusion.
This area is a disordered QWwi area, and the side part 18 as a disordered MQW area is the original M Q W ? +Central part 17 which is JI area
The prohibited band width is larger. A large forbidden band width means a small refractive index, and the light generated in the active region 12 is confined in the undisordered region, that is, the central region 17, and the light can be efficiently guided to the outside.

なお、本実施例においては、MQWはIno、53Ga
o、ntA S  I n P系またはInGaAsP
−InGaAs系により構成されており、禁止帯間の関
係は、次の+1)式のようになる。
In this example, the MQW is Ino, 53Ga
o, ntA S I n P system or InGaAsP
-InGaAs system, and the relationship between forbidden bands is as shown in the following equation +1).

Eg(活性層)≦Eg(コンタクト層) <Eg(クラ
ッド層)・ ・ ・ ・(1) 次に動作について説明する。n側電極3とn側電極4の
間にp側が十となるような正のバイアスを印加すると、
n側電極3とp型MQWコンタクト層16の間でSiO
□絶縁膜2の存在していない領域からデバイス中に電流
が流れ込む。デバイス中に流れ込んだ電流は、拡散電位
の差により、電流経路7つまり無秩序化されていない領
域(中央部17.n型MQWクラッド層13.n型!n
P基板1)のみを流れる。活性領域12において、n側
電極4から注入された電子と、n側電極3とp型MQW
コンタクト層11の間のSiO□絶縁膜2の存在してい
ない領域からの正孔とは再結合して光に変換される。と
ころで、無秩序化されたMQW層は元のMQW層に比べ
て屈折率が小さくなるため、活性領域12において発生
した光は無秩序化されていない領域にのみ閉じ込められ
、デバイスの横方向には伝搬せず、効率良く外部に導か
れる。
Eg (active layer)≦Eg (contact layer) <Eg (cladding layer) (1) Next, the operation will be explained. When applying a positive bias such that the p side is 10 between the n-side electrode 3 and the n-side electrode 4,
SiO between the n-side electrode 3 and the p-type MQW contact layer 16
□Current flows into the device from the region where the insulating film 2 is not present. Due to the difference in diffusion potential, the current flowing into the device flows through the current path 7, that is, the non-disordered region (center 17.n-type MQW cladding layer 13.n-type!n
It flows only through the P substrate 1). In the active region 12, the electrons injected from the n-side electrode 4 and the n-side electrode 3 and the p-type MQW
Holes from the region between the contact layers 11 where the SiO□ insulating film 2 is not present are recombined and converted into light. By the way, since the disordered MQW layer has a smaller refractive index than the original MQW layer, the light generated in the active region 12 is confined only to the non-disordered region and cannot propagate in the lateral direction of the device. The system is efficiently guided to the outside.

なお、上記実施例では球レンズ付発光ダイオード装置の
場合について述べたが、その他の場合にも全く同様の効
果を得ることができる。またSiO□絶縁膜の存在する
装置について述べたが、5i02絶縁膜がなくても全く
同様の効果を奏する。
In the above embodiment, the case of a light emitting diode device with a ball lens has been described, but the same effect can be obtained in other cases as well. Furthermore, although the device in which the SiO□ insulating film is present has been described, the same effect can be achieved even without the 5i02 insulating film.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、クラッド層と活性層とコ
ンタクト層との中央部を多重量子井戸構造領域とし、中
央部以外のサイド部を無秩序化領域としたことにより、
発生した光を多重量子井戸構造領域に閉じ込め、デバイ
スの横方向には伝搬しないようにすることができるので
、発生した光を効率良く外部に導くことができる効果が
ある。
As explained above, in the present invention, the central part of the cladding layer, the active layer, and the contact layer is made into a multiple quantum well structure region, and the side parts other than the central part are made into disordered regions.
Since the generated light can be confined in the multiple quantum well structure region and prevented from propagating in the lateral direction of the device, it is possible to efficiently guide the generated light to the outside.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係わる半導体発光装置の一実施例を示
す断面図、第2図は従来の半導体発光装置を示す断面図
である。 1・・・n型!nP基板、2・・・SiO□絶縁膜、3
・・・p側電極、4・・・n側電極、5・・・球レンズ
、6・・・樹脂、7・・・電流経路、12・・・活性領
域、13・・・n型MQWクラッド層、13a・・・p
壁領域、14・・・活性層、15・・・p型りラッド層
、16・・・p型コンタクト層、17・・・中央部、1
8・・・サイド部、19・・・pn接合。
FIG. 1 is a sectional view showing an embodiment of a semiconductor light emitting device according to the present invention, and FIG. 2 is a sectional view showing a conventional semiconductor light emitting device. 1...n type! nP substrate, 2...SiO□ insulating film, 3
...p side electrode, 4...n side electrode, 5...ball lens, 6...resin, 7...current path, 12...active region, 13...n type MQW cladding layer, 13a...p
wall region, 14... active layer, 15... p-type rad layer, 16... p-type contact layer, 17... central part, 1
8...Side part, 19...pn junction.

Claims (2)

【特許請求の範囲】[Claims] (1)第1導電型の半導体基板上に、第1導電型の多重
量子井戸構造のクラッド層と、中央部に第1導電型もし
くは第2導電型もしくは真性導電型の多重量子井戸構造
の活性領域を有しこの活性領域以外の領域であるサイド
部が第2導電型の無秩序化領域である活性層と、中央部
に第2導電型の多重量子井戸構造領域を有し中央部以外
の部分であるサイド部に第2導電型の無秩序化領域を有
するクラッド層と、中央部に第2導電型の多重量子井戸
構造領域を有し中央部以外の部分であるサイド部に第2
導電型の無秩序化領域を有するコンタクト層とを順次積
層したことを特徴とする半導体発光装置。
(1) A cladding layer with a multi-quantum well structure of the first conductivity type on a semiconductor substrate of the first conductivity type, and an active multi-quantum well structure of the first conductivity type, second conductivity type, or intrinsic conductivity type in the central part. an active layer having a region other than the active region, the side portions of which are disordered regions of the second conductivity type, and a central portion having a multi-quantum well structure region of the second conductivity type, the portions other than the central portion; A cladding layer having a disordered region of the second conductivity type in the side part thereof, a multi-quantum well structure region of the second conductivity type in the central part, and a second conductivity type disordered region in the side part other than the central part.
A semiconductor light emitting device characterized in that a contact layer having a disordered region of a conductivity type is sequentially laminated.
(2)半導体基板はInPで構成され、クラッド層と活
性層とコンタクト層はInGaAs系材料で構成された
ことを特徴とする特許請求の範囲第1項記載の半導体発
光装置。
(2) The semiconductor light emitting device according to claim 1, wherein the semiconductor substrate is made of InP, and the cladding layer, active layer, and contact layer are made of InGaAs-based materials.
JP61241665A 1986-10-09 1986-10-09 Semiconductor light-emitting device Pending JPS6395681A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61241665A JPS6395681A (en) 1986-10-09 1986-10-09 Semiconductor light-emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61241665A JPS6395681A (en) 1986-10-09 1986-10-09 Semiconductor light-emitting device

Publications (1)

Publication Number Publication Date
JPS6395681A true JPS6395681A (en) 1988-04-26

Family

ID=17077696

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61241665A Pending JPS6395681A (en) 1986-10-09 1986-10-09 Semiconductor light-emitting device

Country Status (1)

Country Link
JP (1) JPS6395681A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03296289A (en) * 1990-04-13 1991-12-26 Mitsubishi Electric Corp Semiconductor light element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03296289A (en) * 1990-04-13 1991-12-26 Mitsubishi Electric Corp Semiconductor light element

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