JPS6393505U - - Google Patents

Info

Publication number
JPS6393505U
JPS6393505U JP1986190395U JP19039586U JPS6393505U JP S6393505 U JPS6393505 U JP S6393505U JP 1986190395 U JP1986190395 U JP 1986190395U JP 19039586 U JP19039586 U JP 19039586U JP S6393505 U JPS6393505 U JP S6393505U
Authority
JP
Japan
Prior art keywords
contact
sphere
abutted
tip
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1986190395U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986190395U priority Critical patent/JPS6393505U/ja
Priority to US07/128,694 priority patent/US4829677A/en
Publication of JPS6393505U publication Critical patent/JPS6393505U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/002—Constructional details of contacts for gauges actuating one or more contacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012—Contact-making feeler heads therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)

Description

【図面の簡単な説明】
第１図は縦断側面図、第２図は縦断正面図、第
３図ａは要部の分解斜視図、第３図ｂは同要部の
変形例を示す分解斜視図、第４図〜第６図は要部
の拡大縦断面図、第７図は使用状態の説明図であ
る。 １…本体、２…乾電池収納部、３…接触子支持
部、４…キヤツプ、５…接触子、８…接触子フラ
ンジ部、９…電気絶縁層、１０〜１２…球体（鋼
球）、１３〜１５…第一〜第三被当接部、１６…
電気絶縁材製部材、１７…導電板、１８…圧縮コ
イルスプリング、１９…乾電池、２０…接点板、
２１…表示用発光体（ＬＥＤ）、２２…配線、２
５…凹窪部、２６…凹溝、２７…扁平面、２９…
工具ホルダー、３０…チヤツク、３１…主軸、３
２…機械本体、３３…ワーク支持台、３４…ワー
ク。

Claims (1)

    【実用新案登録請求の範囲】
  1. 本体先端から突出する接触子の内端で、軸心位
    置から半径方向に離れた周方向３箇所と、この３
    箇所に対し当該接触子の先端側で対向する前記本
    体側の周方向３箇所との何れか一方側に球体を、
    他方側に当該球体に当接する被当接部を夫々設け
    、更に接触子内端軸心部を接触子先端方向へ押圧
    するスプリングを設けて成るタツチセンサーの接
    触子支持構造であつて、前記周方向３箇所の被当
    接部は、前記球体の一部が内嵌し、前記接触子が
    その軸心に直交する面域へ移動するのを阻止する
    凹窪部から成る第一被当接部と、前記球体の一部
    が内嵌し、前記接触子がその軸心周りに回動する
    のを阻止する凹溝から成る第二被当接部と、前記
    球体が当接する扁平面から成る第三被当接部とか
    ら構成して成るタツチセンサーの接触子支持構造
    。
JP1986190395U 1986-12-10 1986-12-10 Pending JPS6393505U (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1986190395U JPS6393505U (ja) 1986-12-10 1986-12-10
US07/128,694 US4829677A (en) 1986-12-10 1987-12-04 Device for supporting a stylus in a touch sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986190395U JPS6393505U (ja) 1986-12-10 1986-12-10

Publications (1)

Publication Number Publication Date
JPS6393505U true JPS6393505U (ja) 1988-06-16

Family

ID=16257441

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986190395U Pending JPS6393505U (ja) 1986-12-10 1986-12-10

Country Status (2)

Country Link
US (1) US4829677A (ja)
JP (1) JPS6393505U (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH674485A5 (ja) * 1988-03-11 1990-06-15 Saphirwerk Ind Prod
EP0390342B1 (en) * 1989-03-31 1994-07-06 Renishaw plc Coupling mechanism
US5148608A (en) * 1991-05-01 1992-09-22 Moshe Meller Edge sensor with multi-size outer engagement surfaces
ATE111590T1 (de) * 1991-07-26 1994-09-15 Heidenhain Gmbh Dr Johannes Mehrkoordinaten-tastkopf.
GB9401692D0 (en) * 1994-01-28 1994-03-23 Renishaw Plc Performing measurement or calibration on positioning machines
US6519863B1 (en) * 1999-10-13 2003-02-18 Renishaw Plc Probe arm for machine tool
US8832953B2 (en) * 2008-01-07 2014-09-16 Q-Mark Manufacturing, Inc. Coordinate measuring apparatus
WO2009089219A1 (en) * 2008-01-07 2009-07-16 Mark David Osterstock Coordinate measuring apparatus
CN102385035A (zh) * 2010-08-31 2012-03-21 深圳富泰宏精密工业有限公司 触摸键测试笔

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892804A (ja) * 1981-11-27 1983-06-02 Yoshiaki Kakino 接触検出装置
JPS60185314A (ja) * 1983-12-05 1985-09-20 ジ−テイ−イ−・ベイルロン・コ−ポレ−シヨン プロ−ブ

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1445977A (en) * 1972-09-21 1976-08-11 Rolls Royce Probes
EP0068899B1 (en) * 1981-06-30 1988-11-30 Renishaw plc Probe for measuring workpieces
US4608763A (en) * 1983-06-14 1986-09-02 Gte Valeron Corporation Probe
JPH0617766B2 (ja) * 1984-08-23 1994-03-09 株式会社ミツトヨ タッチ信号プロ−ブ
GB8431746D0 (en) * 1984-12-17 1985-01-30 Renishaw Plc Contact-sensing probe

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892804A (ja) * 1981-11-27 1983-06-02 Yoshiaki Kakino 接触検出装置
JPS60185314A (ja) * 1983-12-05 1985-09-20 ジ−テイ−イ−・ベイルロン・コ−ポレ−シヨン プロ−ブ

Also Published As

Publication number Publication date
US4829677A (en) 1989-05-16

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