JPS637366U - - Google Patents

Info

Publication number
JPS637366U
JPS637366U JP9995686U JP9995686U JPS637366U JP S637366 U JPS637366 U JP S637366U JP 9995686 U JP9995686 U JP 9995686U JP 9995686 U JP9995686 U JP 9995686U JP S637366 U JPS637366 U JP S637366U
Authority
JP
Japan
Prior art keywords
contact
board
inspected
support plate
fixing pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9995686U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9995686U priority Critical patent/JPS637366U/ja
Publication of JPS637366U publication Critical patent/JPS637366U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP9995686U 1986-06-30 1986-06-30 Pending JPS637366U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9995686U JPS637366U (enExample) 1986-06-30 1986-06-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9995686U JPS637366U (enExample) 1986-06-30 1986-06-30

Publications (1)

Publication Number Publication Date
JPS637366U true JPS637366U (enExample) 1988-01-19

Family

ID=30969317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9995686U Pending JPS637366U (enExample) 1986-06-30 1986-06-30

Country Status (1)

Country Link
JP (1) JPS637366U (enExample)

Similar Documents

Publication Publication Date Title
JPH022547B2 (enExample)
JP3491824B2 (ja) 整合インピーダンステストのためのテスト用器具
CN206515413U (zh) 一种fpc电缆测试转接装置
US6049214A (en) Universal printed circuit board inspection apparatus, and method of using same
JPS637366U (enExample)
JP2000097985A (ja) 間隔が密な試験場所用走査試験機
JPS637367U (enExample)
US6359453B1 (en) Vertical probe card for attachment within a central corridor of a magnetic field generator
CN217443422U (zh) 一种检测装置
CN223637655U (zh) 一种核心板测试用的测试装置
CN103645351A (zh) 一种带有转接板的ict针床
CN215641426U (zh) 一种高密度型针床结构
JPH0438299Y2 (enExample)
JPS6161560B2 (enExample)
JPS62108874U (enExample)
CN211293152U (zh) 一种自动测试pcb板电气质量的设备
JPH0413666Y2 (enExample)
JPH0631434Y2 (ja) 実装基板テスト治具
JPH0191261U (enExample)
JPH022957A (ja) プリント配線試験用プローズ装置
JPH045025Y2 (enExample)
JPH0687874U (ja) Ｉｃテスタ用接続リングの検査ジグ
CN116359560A (zh) 连接器pin针检测装置及检测方法
JPH0128466Y2 (enExample)
KR100266612B1 (ko) 회로시험용 탐침장치