JPS6370066U - - Google Patents
Info
- Publication number
- JPS6370066U JPS6370066U JP16527486U JP16527486U JPS6370066U JP S6370066 U JPS6370066 U JP S6370066U JP 16527486 U JP16527486 U JP 16527486U JP 16527486 U JP16527486 U JP 16527486U JP S6370066 U JPS6370066 U JP S6370066U
- Authority
- JP
- Japan
- Prior art keywords
- optical disk
- standard sample
- sample pieces
- clamp
- film surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 7
- 238000007689 inspection Methods 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 claims description 2
- 239000011521 glass Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
Description
第１図および第２図は本考案の光デイスク検査
装置校正用基準板の一実施例を示す構成図および
断面図、第３図は標準試料片Ｓ０〜Ｓ１１の形成
例を示す断面図、第４図は本考案の光デイスク検
査装置校正用基準板を光デイスク検査装置に装着
した状態の一例を示す構成図である。
Ｓ０〜Ｓ１１…標準試料片、１…基板部、２…
クランプ部、３１…ガラス基板、３２…反射膜ま
たは透過膜、４…クランプ機構、５…光学ヘツド
。
1 and 2 are a configuration diagram and a cross-sectional view showing an embodiment of the reference plate for calibrating an optical disk inspection device of the present invention, and FIG. 3 is a cross-sectional view showing an example of the formation of standard sample pieces S0 to S11. FIG. 4 is a configuration diagram showing an example of a state in which the reference plate for calibrating an optical disk inspection apparatus of the present invention is attached to an optical disk inspection apparatus. S0 to S11...Standard sample piece, 1...Substrate part, 2...
Clamp section, 31...Glass substrate, 32...Reflection film or transmission film, 4...Clamp mechanism, 5...Optical head.
Claims (1)
基板の一方の面に誘電体多層膜よりなる反射膜ま
たは透過膜が形成され所定の基準値に値付けされ
た複数の標準試料片と、光デイスクのクランプ機
構により共通にクランプされるクランプ部を有し
前記複数の標準試料片を同一円周上に配置すると
ともにこれら複数の標準試料片をその反射膜面ま
たは透過膜面の位置およびクランプ面からの高さ
が前記クランプ機構にクランプされる通常の光デ
イスクの記録膜面と一致するように保持する基板
部とを具備してなる光デイスク検査装置校正用基
準板。 A glass substrate with the same thickness as a normal optical disk has a reflective film or a transparent film made of a dielectric multilayer formed on one side, and a plurality of standard sample pieces are rated at a predetermined reference value. It has a clamp section that is commonly clamped by a clamp mechanism, and the plurality of standard sample pieces are arranged on the same circumference, and the plurality of standard sample pieces are arranged at the position of the reflective film surface or the transmission film surface and from the clamp surface. 1. A reference plate for calibrating an optical disk inspection apparatus, comprising a substrate portion held so that its height matches the recording film surface of a normal optical disk clamped by the clamp mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16527486U JPH0443815Y2 (en) | 1986-10-28 | 1986-10-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16527486U JPH0443815Y2 (en) | 1986-10-28 | 1986-10-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6370066U true JPS6370066U (en) | 1988-05-11 |
| JPH0443815Y2 JPH0443815Y2 (en) | 1992-10-15 |
Family
ID=31095165
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16527486U Expired JPH0443815Y2 (en) | 1986-10-28 | 1986-10-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0443815Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002202267A (en) * | 2000-12-28 | 2002-07-19 | Kirin Brewery Co Ltd | Reference sample bottle for inspection, bottle inspection system, and calibrating method for bottle inspection system |
-
1986
- 1986-10-28 JP JP16527486U patent/JPH0443815Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002202267A (en) * | 2000-12-28 | 2002-07-19 | Kirin Brewery Co Ltd | Reference sample bottle for inspection, bottle inspection system, and calibrating method for bottle inspection system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0443815Y2 (en) | 1992-10-15 |
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