JPS636828B2 - - Google Patents
Info
- Publication number
- JPS636828B2 JPS636828B2 JP416882A JP416882A JPS636828B2 JP S636828 B2 JPS636828 B2 JP S636828B2 JP 416882 A JP416882 A JP 416882A JP 416882 A JP416882 A JP 416882A JP S636828 B2 JPS636828 B2 JP S636828B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- light emitting
- electrode
- emitting device
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 13
- 238000004458 analytical method Methods 0.000 description 16
- 230000003595 spectral effect Effects 0.000 description 12
- 230000003321 amplification Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 238000004993 emission spectroscopy Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【発明の詳細な説明】
本発明は、発光分光分析装置の発光装置の改良
に関し、特に分析時間を増大することなく分析精
度の向上を計ることのできる発光分光分析装置の
発光装置を提供するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement of a light emitting device for an optical emission spectrometer, and particularly provides a light emitting device for an optical emission spectrometer that can improve analysis accuracy without increasing analysis time. It is.
発光分光分析の原理は、試料と電極との間で火
花放電を行なわせるとそこから光を発する。その
光は試料に含まれている元素の種類により特定の
波長のスペクトル線となる。スペクトル強度は含
有量とある一定の関係をもつているのでスペクト
ル線の強さを測定すると試料中の各元素の定量を
することができる。 The principle of emission spectrometry is that light is emitted when a spark discharge occurs between a sample and an electrode. The light becomes a spectral line with a specific wavelength depending on the type of element contained in the sample. Since the spectral intensity has a certain relationship with the content, it is possible to quantify each element in the sample by measuring the intensity of the spectral lines.
このような原理にもとづく発光分光分析装置
は、第１図に示す如く発光装置と分光装置と
信号処理装置と表示装置とから構成されてい
る。そして上記発光装置は、試料１との間に火
花放電せしめる電極２と、放電用電圧を出力する
電源装置３と、電極２と電源装置３との間の電気
路に設けたオンオフスイツチ４と、このオンオフ
スイツチ４を定時間間隔でオンオフせしめるオン
オフ制御器５とからなる。 An emission spectrometer based on such a principle is composed of a light emitting device, a spectroscopic device, a signal processing device, and a display device, as shown in FIG. The light emitting device includes an electrode 2 that causes a spark discharge between the electrode 2 and the sample 1, a power supply device 3 that outputs a discharge voltage, and an on/off switch 4 provided in an electrical path between the electrode 2 and the power supply device 3. It consists of an on/off controller 5 that turns on/off the on/off switch 4 at regular time intervals.
第２図Ａは、上記発光装置のスイツチ４、制
御器５からなる電圧印加制御装置６による試料１
―電極２間への電圧印加パターンを示し、t1は上
記制御装置６の制御器５によるスイツチ４のオン
オフ周期であり、t0は電圧印加時間である。上記
時間t1は、火花放電による良好な発光を電圧印加
毎に得るために必要な放電待時間であり、通常t1
＞1.5msecが必要とされている。なおｎは試料１
の分析に必要な電圧印加（火花放電または発光）
回数を示す。また回数ｎは、オンオフ周期t1の固
定された電圧印加制御装置６では電圧印加を制御
する時間Ｔで決る。 FIG. 2A shows a sample 1 using a voltage application control device 6 consisting of a switch 4 and a controller 5 of the light emitting device.
- Shows the voltage application pattern between the electrodes 2, where t 1 is the on/off cycle of the switch 4 by the controller 5 of the control device 6, and t 0 is the voltage application time. The above time t 1 is the discharge waiting time necessary to obtain good light emission due to spark discharge every time voltage is applied, and usually t 1
>1.5msec is required. Note that n is sample 1
Voltage application required for analysis (spark discharge or luminescence)
Indicates the number of times. In addition, the number of times n is determined by the time T for controlling voltage application in the voltage application control device 6 with a fixed on-off period t1 .
第１図において、分光装置は、電極２と試料
１間の各発光をレンズ７、スリツト８を介して回
析格子９で元素毎のスペクトル線に分光し、元素
毎に設置された光電管１０へ導くようになつてい
る。 In FIG. 1, the spectrometer spectrally separates each emitted light between the electrode 2 and the sample 1 into spectral lines for each element through a lens 7 and a slit 8 with a diffraction grating 9, and sends the light to a phototube 10 installed for each element. It is meant to lead.
第２図Ｂは、第２図Ａの電圧印加パターンによ
る光電管１０の出力電流パターン（スペクトル強
度パターン）を示したものである。 FIG. 2B shows an output current pattern (spectral intensity pattern) of the phototube 10 according to the voltage application pattern of FIG. 2A.
信号処理装置は、上記分光装置の光電管１
０から時間t1間隔でｎ個出力される出力電流（ス
ペクトル情報）を信号処理して、例えば含有量等
を表示装置へ出力表示する。この信号処理装置
の具体的構成は、例えば光電管１０からのｎ個の
光電流を積分する積分器１１と、この積分器１１
の積分値をとり出し増幅した強度値と、標準強度
値と比較演算する増幅演算器１２とよりなる。 The signal processing device includes phototube 1 of the spectroscopic device.
Signal processing is performed on n output currents (spectral information) outputted from 0 to 1 at intervals of time t1, and, for example, content etc. are output and displayed on a display device. The specific configuration of this signal processing device includes, for example, an integrator 11 that integrates n photocurrents from a phototube 10;
The amplification calculator 12 extracts the integral value of , and compares and amplifies the intensity value with a standard intensity value.
以上の様な構成の発光分光分析装置では、試料
１中の１ケ所の定量分析を行なうために必要な分
析時間はt1×ｎ〔msec〕必要とされる。 In the optical emission spectrometer having the above configuration, the analysis time required to quantitatively analyze one location in the sample 1 is t 1 ×n [msec].
ところで一般に金属試料においては、試料内に
偏析があるとか、試料中に小さなピンホール等が
あるため、試料１ケ所の測定では、正しい分析値
が得られないことが多い。 By the way, in general, in metal samples, since there is segregation or small pinholes in the sample, it is often not possible to obtain a correct analytical value by measuring one place in the sample.
そこで従来の発光分光分析装置においては、試
料１を移動することによつて、発光装置の電極
２と試料１との対向位置をかえて、試料１の複数
点に対して発光分光分析し、それら分析値の平均
値を代表値として取扱う方法を実施している。こ
の方法によれば分析精度の向上効果が得られるけ
れども、分析時間が増大する欠点がある。 Therefore, in the conventional emission spectrometer, by moving the sample 1, the opposing positions of the electrode 2 of the light emitting device and the sample 1 are changed, and the emission spectrometry is performed on multiple points on the sample 1. A method is implemented in which the average value of the analysis values is treated as a representative value. Although this method has the effect of improving analysis accuracy, it has the disadvantage of increasing analysis time.
本発明は、上記欠点を解消して分析精度向上を
計るものであり、その技術思想は、試料を移動し
電極と試料との対向位置をかえて試料の分析点数
を増す従来の考え方を排して、発光分光分析装置
の分光装置の光軸上に間隔を存して、かつ試料と
所定間隙を存して複数の電極を配置して、この複
数の電極に火花放電用電圧を順番に、かつ各電極
ともに所定の放電待時間間隔で所定短時間印加す
るようにして、ある電圧印加制御時間内に従来の
単一電極を備えた発光装置の場合に得られるスペ
クトル情報数を、試料の複数箇所から各々得て、
分析時間の増大なしに、また試料の移動セツテイ
ングなしに、分析精度の向上を図るものである。 The present invention aims to improve analysis accuracy by eliminating the above-mentioned drawbacks, and its technical idea is to eliminate the conventional idea of increasing the number of analysis points of a sample by moving the sample and changing the opposing position of the electrode and the sample. Then, a plurality of electrodes are arranged at intervals on the optical axis of the spectrometer of the emission spectrometer and with a predetermined gap from the sample, and a voltage for spark discharge is applied to the plurality of electrodes in order. In addition, by applying voltage to each electrode for a predetermined short time at predetermined discharge waiting time intervals, the number of spectral information obtained in the case of a conventional light emitting device equipped with a single electrode within a certain voltage application control time can be calculated from multiple samples. Obtaining each from the passage,
The aim is to improve analysis accuracy without increasing analysis time or moving and setting samples.
本発明の要旨は、発光分光分析装置の光軸上に
間隔を存して、かつ試料と所定間隙を存して配置
した複数の電極と、この電極へ火花放電用電圧を
出力する電源装置と、この電源装置の出力電圧を
上記複数の電極に順番に、かつ各電極ともに所定
の放電待時間間隔で所定短時間印加する電圧印加
制御装置とよりなる発光分光分析装置の発光装置
にある。 The gist of the present invention is to provide a plurality of electrodes disposed at intervals on the optical axis of an optical emission spectrometer and with a predetermined gap from the sample, and a power supply device that outputs a voltage for spark discharge to the electrodes. A light emitting device of an optical emission spectrometer includes a voltage application control device that sequentially applies the output voltage of the power supply device to the plurality of electrodes for a predetermined time period at predetermined discharge waiting time intervals.
以下本発明の発光分光分析装置の発光装置の一
実施例について詳しく説明する。 An embodiment of the light emitting device of the emission spectrometer of the present invention will be described in detail below.
第３図において、２ａ及び２ｂは発光分光分析
装置の分光装置の光軸１３上に間隔を存して、
かつ試料１と所定間隙を存して配置した一対の電
極で、４ａ及び４ｂは上記電極２ａ及び２ｂと放
電用電圧を出力する電源装置３との間の電気路１
４ａ及び１４ｂに設けたオンオフスイツチで、５
は上記スイツチ４ａ及び４ｂをオンオフするオン
オフ制御器で、６は上記スイツチ４ａ及び４ｂと
オンオフ制御器５とよりなる電圧印加制御装置で
ある。この制御装置６は、周期t1/2で電極２ａ，
２ｂに交互に時間t0だけ放電用電圧を印加する。
詳しくは、装置６の制御器５は、一定オン時間t0
で、かつオンオフ周期t1でスイツチ４ａをオンオ
フせしめ、第４図Ａに示す如く電極２ａに火花放
電用電圧を印加すると共にスイツチ４ｂを上記ス
イツチ４ａのオンタイミングから時間t1/2だけ遅
れて一定オン時間t0で、かつオンオフ周期t1でオ
ンオフせしめ、第４図Ｂに示す如く電極２ｂに火
花放電用電圧を印加する。 In FIG. 3, 2a and 2b are spaced apart on the optical axis 13 of the spectrometer of the emission spectrometer,
A pair of electrodes are arranged with a predetermined gap from the sample 1, and 4a and 4b are electrical paths 1 between the electrodes 2a and 2b and the power supply device 3 that outputs the discharge voltage.
With the on/off switch provided at 4a and 14b, 5
6 is an on/off controller that turns on and off the switches 4a and 4b, and 6 is a voltage application control device comprising the switches 4a and 4b and the on/off controller 5. This control device 6 controls the electrodes 2a ,
A discharge voltage is alternately applied to 2b for a time t0 .
In particular, the controller 5 of the device 6 has a constant on-time t 0
Then, the switch 4a is turned on and off at an on-off period t1 , and a voltage for spark discharge is applied to the electrode 2a as shown in FIG. The spark discharge voltage is applied to the electrode 2b as shown in FIG. 4B by turning it on and off at a constant on-time t 0 and an on-off period t 1 .
本発明の発光分光分析装置の発光装置は以上
の如く構成している。なお第３図の，は、第
１図と同一物品を示す。 The light emitting device of the emission spectrometer of the present invention is constructed as described above. Note that the symbols in FIG. 3 indicate the same items as in FIG. 1.
前記第３図の本発明の発光装置によれば、試
料１の異なる２ケ所から、前記第１図の従来の発
光装置の1/2の周期t1/2で火花放電による発光
を生ぜしめることができる。このとき本発明装置
の電極２ａ又は２ｂは試料１との間に、第１図の
従来装置と同様に、発光不良を防止するために
必須の放電待時間（t1−t0）を有する周期t1で火
花放電を行なうから発光不良は生じない。 According to the light emitting device of the present invention shown in FIG. 3, light emission is caused by spark discharge from two different locations on the sample 1 at a period t 1 /2, which is half the period of the conventional light emitting device shown in FIG. 1. Can be done. At this time, the electrode 2a or 2b of the device of the present invention has a period between it and the sample 1, which has an essential discharge waiting time (t 1 −t 0 ) in order to prevent poor light emission, as in the conventional device shown in FIG. Spark discharge occurs at t 1 , so no light emission failure occurs.
そして、分光装置の一元素についてスペクト
ル強度に対応する光電流（スペクトル情報）を出
力する光電管１０は、第４図Ｃに示す如く本発明
の発光装置では、従来の発光装置の1/2の周
期t1/2で、２倍の光電流（スペクトル情報）を信
号処理装置の積分器１１へ出力する。 As shown in FIG. 4C, the phototube 10 that outputs a photocurrent (spectral information) corresponding to the spectral intensity of one element of the spectrometer has a period of 1/2 that of the conventional light emitting device. At t 1 /2, twice as much photocurrent (spectrum information) is output to the integrator 11 of the signal processing device.
例えば第１図の発光装置の制御装置６で制御
時間をＴとすると、スペクトル情報はｎ個となる
が、第３図の発光装置の制御装置６の制御時間
を同じくＴとすると、電極２ａの試料１対向位置
からｎ個のスペクトル情報が、また電極２ｂの試
料１対向位置からｎ個のスペクトル情報が信号処
理装置の積分器１１に与えられることになり、
分析時間を増大することなく分析精度を向上する
ことができる。 For example, if the control time of the control device 6 of the light emitting device shown in FIG. 1 is T, there will be n spectrum information, but if the control time of the control device 6 of the light emitting device of FIG. n pieces of spectral information from the position facing the sample 1 and n pieces of spectral information from the position of the electrode 2b facing the sample 1 are given to the integrator 11 of the signal processing device,
Analysis accuracy can be improved without increasing analysis time.
なお電極毎に、即ち試料発光位置毎に分析値を
得たい場合には、信号処理装置内でスペクトル
情報を電極毎に弁別処理するようにすれば良い。
例えば第５図に示す如く、例えば一対の積分器１
１ａ，１１ｂを設け、光電管１０からの光電流を
電極２ａ，２ｂ毎に上記積分器１１ａ，１１ｂへ
弁別して出力する第１切換スイツチ１５を設ける
と共に、上記積分器１１ａ，１１ｂの出力を弁別
して増幅演算器１２へ出力する第２切換スイツチ
１６を設けて、上記スイツチ１５を前記制御装置
６の制御器５のオン信号に連動して切換作動せし
めることにより信号処理装置内で電極毎、即ち
異なる試料位置２ケ所の分析値を同時に得ること
ができる。更に２つの分析値から代表値を得るよ
う上記装置を構成することもできる。 Note that if it is desired to obtain an analysis value for each electrode, that is, for each sample light emission position, the spectral information may be discriminately processed for each electrode within the signal processing device.
For example, as shown in FIG.
1a and 11b, and a first changeover switch 15 for discriminating and outputting the photocurrent from the phototube 10 to the integrators 11a and 11b for each electrode 2a and 2b, and for discriminating the outputs of the integrators 11a and 11b. A second changeover switch 16 for outputting to the amplification calculator 12 is provided, and the switch 15 is operated in conjunction with the ON signal of the controller 5 of the control device 6, so that different electrodes can be changed in the signal processing device. Analytical values for two sample positions can be obtained simultaneously. Furthermore, the above apparatus can be configured to obtain a representative value from two analyzed values.
以上詳述した様に、本発明の発光分光分析装置
の発光装置によれば、試料の移動セツテイングな
しに、また分析時間の増大なしに分析精度の向上
を図ることができ工業上極めて有効である。 As detailed above, according to the light emitting device of the optical emission spectrometer of the present invention, analysis accuracy can be improved without moving and setting the sample and without increasing analysis time, which is extremely effective industrially. .
第１図及び第２図は、従来の発光分光分析装置
の発光装置の説明図、第３図及び第４図は、本発
明の発光分光分析装置の発光装置の実施例説明
図、第５図は本発明の発光装置の実施例と組み合
せ使用することが好ましい発光分光分析装置の信
号処理装置の実施例説明図である。
……発光装置、……分光装置、……信号
処理装置、……表示装置、１……試料、２……
電極、３……電源装置、４……オンオフスイツ
チ、５……オンオフ制御器、６……電圧印加制御
装置、７……レンズ、８……スリツト、９……回
析格子、１０……光電管、１１……積分器、１２
……増幅演算器。
1 and 2 are explanatory diagrams of a light emitting device of a conventional optical emission spectrometer, FIGS. 3 and 4 are explanatory diagrams of an embodiment of a light emitting device of an optical emission spectrometer of the present invention, and FIG. FIG. 1 is an explanatory diagram of an embodiment of a signal processing device of an emission spectrometer that is preferably used in combination with an embodiment of the light emitting device of the present invention. ...light emitting device, ...spectroscopy device, ...signal processing device, ...display device, 1...sample, 2...
Electrode, 3... Power supply device, 4... On/off switch, 5... On/off controller, 6... Voltage application control device, 7... Lens, 8... Slit, 9... Diffraction grating, 10... Phototube , 11... Integrator, 12
...Amplification calculator.
Claims (1)
を存して、かつ試料と所定間隙を存して配置した
複数の電極と、この電極へ火花放電用電圧を出力
する電源装置と、この電源装置の出力電圧を上記
複数の電極に順番に、かつ各電極ともに所定の放
電待時間間隔で所定短時間印加する電圧印加制御
装置とよりなる発光分光分析装置の発光装置。1. A plurality of electrodes arranged at intervals on the optical axis of the spectrometer of an emission spectrometer and with a predetermined gap from the sample, a power supply device that outputs a voltage for spark discharge to these electrodes, and A light-emitting device for an optical emission spectrometer, comprising a voltage application control device that applies an output voltage of a power supply device to the plurality of electrodes in order and for a predetermined short time to each electrode at a predetermined discharge waiting time interval.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP416882A JPS58122449A (en) | 1982-01-14 | 1982-01-14 | Luminous device for emission spectrochemical analyzing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP416882A JPS58122449A (en) | 1982-01-14 | 1982-01-14 | Luminous device for emission spectrochemical analyzing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58122449A JPS58122449A (en) | 1983-07-21 |
| JPS636828B2 true JPS636828B2 (en) | 1988-02-12 |
Family
ID=11577202
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP416882A Granted JPS58122449A (en) | 1982-01-14 | 1982-01-14 | Luminous device for emission spectrochemical analyzing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58122449A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006078455A (en) * | 2004-09-13 | 2006-03-23 | Horiba Ltd | System and method for analyzing glow discharge emission |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4484674B2 (en) * | 2004-11-24 | 2010-06-16 | 株式会社堀場製作所 | Glow discharge emission analyzer |
| DE102009018253A1 (en) * | 2009-04-21 | 2010-11-11 | OBLF, Gesellschaft für Elektronik und Feinwerktechnik mbH | Method and device for spectrometric element analysis |
-
1982
- 1982-01-14 JP JP416882A patent/JPS58122449A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006078455A (en) * | 2004-09-13 | 2006-03-23 | Horiba Ltd | System and method for analyzing glow discharge emission |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58122449A (en) | 1983-07-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR860003508A (en) | Laser emission spectroscopy method of steel | |
| US4255051A (en) | Apparatus for emission spectrochemical analysis | |
| JP2006329881A (en) | System and method for mass spectrometry | |
| JPS636828B2 (en) | ||
| KR940022079A (en) | Gas analysis method using gas emission spectroscopy and spectroscopy | |
| US4049970A (en) | Pulsed radiation detector system | |
| JPWO2008075445A1 (en) | Atomic absorption spectrophotometer | |
| JPH0797045B2 (en) | Hollow cathode lamp and atomic absorption / fluorescence spectrophotometer using the lamp as a light source | |
| GB2185573A (en) | Process and apparatus for analysing a gaseous mixture and a visible emission spectra generator therefor | |
| US4074936A (en) | Method and apparatus for analyzing a composition of an alloy | |
| JPH0716992Y2 (en) | Emission spectroscopy analyzer | |
| EP0062478A3 (en) | Spectrochemical analyzer | |
| JP3324186B2 (en) | Emission spectrometer | |
| JP2570546B2 (en) | Atomic absorption spectrophotometer | |
| CN110441290B (en) | ICP-AES (inductively coupled plasma-atomic emission Spectroscopy) and element detection method based on digital micromirror | |
| CN204792682U (en) | Same phase photo ionization mass spectrograph | |
| JP2934451B2 (en) | How to switch hollow cathode lamp of atomic absorption spectrophotometer | |
| JP2003149135A (en) | Detector for liquid chromatography | |
| JPH0678984B2 (en) | ICP analysis method | |
| JPS5756724A (en) | Color measuring device | |
| JP2603999B2 (en) | Emission spectrometer | |
| JPS6047944A (en) | Emission spectroscopic analytical apparatus | |
| JPS61281942A (en) | Light source for atomic absorption analysis | |
| YOSHIDA et al. | Simultaneous measurements of two wavelength spectra for Ag break arc | |
| JPS61281943A (en) | Atomic absorption analyzing instrument |