JPS636339U - - Google Patents

Info

Publication number
JPS636339U
JPS636339U JP9729886U JP9729886U JPS636339U JP S636339 U JPS636339 U JP S636339U JP 9729886 U JP9729886 U JP 9729886U JP 9729886 U JP9729886 U JP 9729886U JP S636339 U JPS636339 U JP S636339U
Authority
JP
Japan
Prior art keywords
test piece
fracture position
bridge circuit
detection device
position detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9729886U
Other languages
Japanese (ja)
Other versions
JPH0519800Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9729886U priority Critical patent/JPH0519800Y2/ja
Publication of JPS636339U publication Critical patent/JPS636339U/ja
Application granted granted Critical
Publication of JPH0519800Y2 publication Critical patent/JPH0519800Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す機器配置図、
第2図は第1図の装置の電気的構成を示す結線図
である。 1,2……つかみ具、3……試験片、30……
標点距離部、31,32……つかみ部、R4……
抵抗、E……直流電源、4……増幅器、5……判
断装置。
FIG. 1 is an equipment layout diagram showing an embodiment of the present invention;
FIG. 2 is a wiring diagram showing the electrical configuration of the device shown in FIG. 1. 1, 2...Gripper, 3...Test piece, 30...
Gauge length part, 31, 32...Gripping part, R4...
Resistor, E...DC power supply, 4...Amplifier, 5...Judgment device.

Claims (1)

【実用新案登録請求の範囲】 導電性試験片に通電し、材料試験時の電流変化
から試験片の破断位置を検出する試験片の破断位
置検出装置において、 前記試験片の標点距離部の抵抗と、その両外側
のつかみ部の抵抗と、前記試験片の両端間に接続
される外部抵抗とからなるブリツジ回路と、 このブリツジ回路の一方の対角点間に接続され
る直流電源と、 前記ブリツジ回路の他方の対角点間に生ずる電
圧に基づいて前記試験片の破断位置を判断する判
断装置と、 を具備したことを特徴とする試験片の破断位置検
出装置。
[Scope of Claim for Utility Model Registration] In a test piece fracture position detection device that applies current to a conductive test piece and detects the fracture position of the test piece from a change in current during a material test, the resistance of the gauge length portion of the test piece , a bridge circuit consisting of a resistor on both outside grip portions, and an external resistor connected between both ends of the test piece; a DC power supply connected between one diagonal point of the bridge circuit; A test piece fracture position detection device comprising: a determination device that determines the fracture position of the test piece based on the voltage generated between the other diagonal points of the bridge circuit.
JP9729886U 1986-06-25 1986-06-25 Expired - Lifetime JPH0519800Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9729886U JPH0519800Y2 (en) 1986-06-25 1986-06-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9729886U JPH0519800Y2 (en) 1986-06-25 1986-06-25

Publications (2)

Publication Number Publication Date
JPS636339U true JPS636339U (en) 1988-01-16
JPH0519800Y2 JPH0519800Y2 (en) 1993-05-25

Family

ID=30964105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9729886U Expired - Lifetime JPH0519800Y2 (en) 1986-06-25 1986-06-25

Country Status (1)

Country Link
JP (1) JPH0519800Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007309736A (en) * 2006-05-17 2007-11-29 Toshiba Corp Crack development testing method and crack development testing machine

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007309736A (en) * 2006-05-17 2007-11-29 Toshiba Corp Crack development testing method and crack development testing machine

Also Published As

Publication number Publication date
JPH0519800Y2 (en) 1993-05-25

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