JPS6363115A - Thin film magnetic head - Google Patents
Thin film magnetic headInfo
- Publication number
- JPS6363115A JPS6363115A JP20737786A JP20737786A JPS6363115A JP S6363115 A JPS6363115 A JP S6363115A JP 20737786 A JP20737786 A JP 20737786A JP 20737786 A JP20737786 A JP 20737786A JP S6363115 A JPS6363115 A JP S6363115A
- Authority
- JP
- Japan
- Prior art keywords
- film
- magnetic
- coil
- insulating layer
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims description 26
- 239000010408 film Substances 0.000 claims description 74
- 239000000758 substrate Substances 0.000 claims description 14
- 239000010410 layer Substances 0.000 abstract description 33
- 238000009792 diffusion process Methods 0.000 abstract description 16
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 6
- 238000010438 heat treatment Methods 0.000 abstract description 6
- 239000012790 adhesive layer Substances 0.000 abstract description 4
- 229910052681 coesite Inorganic materials 0.000 abstract description 3
- 229910052906 cristobalite Inorganic materials 0.000 abstract description 3
- 239000000377 silicon dioxide Substances 0.000 abstract description 3
- 235000012239 silicon dioxide Nutrition 0.000 abstract description 3
- 229910052682 stishovite Inorganic materials 0.000 abstract description 3
- 229910052905 tridymite Inorganic materials 0.000 abstract description 3
- 229910052726 zirconium Inorganic materials 0.000 abstract description 2
- 239000000853 adhesive Substances 0.000 abstract 3
- 230000001070 adhesive effect Effects 0.000 abstract 3
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 230000008021 deposition Effects 0.000 abstract 1
- 239000011162 core material Substances 0.000 description 14
- 230000002265 prevention Effects 0.000 description 13
- 239000000463 material Substances 0.000 description 9
- 229920002120 photoresistant polymer Polymers 0.000 description 8
- 229910045601 alloy Inorganic materials 0.000 description 7
- 239000000956 alloy Substances 0.000 description 7
- 239000004020 conductor Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910000808 amorphous metal alloy Inorganic materials 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000001556 precipitation Methods 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 238000000992 sputter etching Methods 0.000 description 3
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910000859 α-Fe Inorganic materials 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Landscapes
- Magnetic Heads (AREA)
- ing And Chemical Polishing (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、薄膜磁気ヘッドの構造に関し、特に、微細加
工が可能で且つ熱的にも安定な導体コイルを形成するこ
とができる高密度記録に通した薄膜磁気ヘッドに関する
ものである。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to the structure of a thin film magnetic head, and in particular to a structure suitable for high-density recording in which a conductive coil that is microfabricated and thermally stable can be formed. This invention relates to a thin film magnetic head.
従来技術
近年、情報の多様化及び高密度化の要望に対応して、デ
ィスクやテープへの磁化記憶を行う磁気へラドの小型化
、狭トランク化、狭ギャップ化。Prior Art In recent years, in response to the demands for diversification and higher density of information, magnetic helads that store magnetization on disks and tapes have become smaller, have narrower trunks, and have narrower gaps.
多素子化が著しく進んでいる。このような磁気ヘッドの
一例として、磁性基板、又は軟磁性薄膜を被覆した磁性
又は非磁性基板よりなる基部磁気コアと、この基部磁気
コアに被せられる軟磁性薄膜との間に絶縁層を介して、
Cu等よりなる導電性のコイル膜を挟設してなる薄膜磁
気ヘッドが、近年軟磁性体バルク材料を加工して作製す
る磁気へラドと比較して、上記狭トラック化、狭ギャッ
プ化、多素子化が容易なことから、高密度記録用ヘッド
として重要視されている。The number of elements is increasing significantly. As an example of such a magnetic head, an insulating layer is provided between a base magnetic core made of a magnetic substrate or a magnetic or non-magnetic substrate coated with a soft magnetic thin film, and a soft magnetic thin film covered with the base magnetic core. ,
In recent years, thin-film magnetic heads formed by sandwiching a conductive coil film made of Cu or the like have achieved the narrower tracks, narrower gaps, and multi-layered magnetic heads compared to magnetic heads manufactured by processing soft magnetic bulk materials. Because it is easy to form elements, it is considered important as a head for high-density recording.
上記のようなi膜磁気ヘッドにおいては、更に高密度記
録を達成するために、上記狭トランク化、狭ギャップ化
及び多素子化の外に、導電体コイルのマルチターンによ
る高効率化が要求され、導電体コイルの配置スペースの
小型化が必要とされている。また、トラック数の少ない
磁気ヘッドにおいても、マルチターン化への要求により
導電体コイルに対する微細加工が必要とされている。In the above-mentioned i-film magnetic head, in order to achieve even higher density recording, in addition to the above-mentioned narrower trunk, narrower gap, and multi-element structure, higher efficiency is required through multi-turn conductor coils. , there is a need to reduce the space in which the conductor coil is placed. Further, even in magnetic heads with a small number of tracks, microfabrication of conductor coils is required due to the demand for multi-turn magnetic heads.
かかる導電体コイルの微細加工を行う場合、その精密性
において従来の湿式エツチングや電着法を用いることが
できないため、一般にイオンミリング法のようなドライ
エツチング法が採用されている。When carrying out microfabrication of such conductive coils, conventional wet etching and electrodeposition methods cannot be used due to their precision, so dry etching methods such as ion milling are generally employed.
従来技術の問題点
しかしながら、上記のようなイオンミリング法を用いて
導電体コイルを加工する場合、コイルを構成する導電体
材料としては、薄膜磁気へンド′の記録動作時にコイル
への通電により発生するジェール熱を極少に抑え、発熱
による断線を防止するために電気抵抗率が小さい材質を
選択する必要があることは勿論のこと、イオンミリング
法によるエツチング速度がマスクとなるレジストより充
分大きい材質であることが必要である。このような条件
を満足する半導体材料として、Cu膜が通しているが、
Cu膜はコイルを電気的に絶縁するために用いられる絶
縁層としてのS i 02に対する密着強度が低いとい
う欠点が存在する。Problems with the conventional technology However, when processing a conductive coil using the ion milling method as described above, the conductive material constituting the coil has a tendency to generate electricity when the coil is energized during the recording operation of the thin film magnetic head. It goes without saying that it is necessary to select a material with low electrical resistivity in order to minimize the gel heat generated by the etching process and to prevent wire breakage due to heat generation. It is necessary that there be. Cu film is used as a semiconductor material that satisfies these conditions, but
The Cu film has a drawback in that it has low adhesion strength to SiO2, which serves as an insulating layer used to electrically insulate the coil.
従来、このような欠点を解消するため、Cu1lとS
10271との間にTi膜を挟設して、密着強度の向上
を図っている。しかしながら、″f#膜磁気ヘッドの信
頼性向上のために、保護膜をガラスモールにしたり、コ
アの材質としての軟磁性薄膜にFeAl5 i合金等を
用いて、特性の改善を図ろうとする場合には、製造工程
中において、熱処理等のためにIII!磁気ヘッドが5
00〜600℃の高温まで加熱されることになり、上記
のようなTl1lを密着層に用いた構造では、CuがT
i1iiを通過して拡散し、Tl膜と5i02層との間
に析出し、コイル層の密着強度を低下させるという欠点
があった。Conventionally, in order to eliminate such drawbacks, Cu1l and S
A Ti film is sandwiched between the 10271 and 10271 to improve adhesion strength. However, in order to improve the reliability of the f# film magnetic head, when trying to improve the characteristics by using a glass mold for the protective film or using FeAl5i alloy for the soft magnetic thin film as the core material, During the manufacturing process, the III! magnetic head is heated due to heat treatment, etc.
Cu is heated to a high temperature of 00 to 600°C, and in the structure using Tl1l as the adhesive layer as described above, Cu
It has the disadvantage that it diffuses through ilii and precipitates between the Tl film and the 5i02 layer, reducing the adhesion strength of the coil layer.
発明の目的
本発明は、上記したような従来の薄膜磁気ヘッドの構造
における問題点の解消を目的とするもので、イオンミリ
ング等による微細加工が可能で、且つ、高温下において
もCu1lを主とするコイル層と5i02絶縁層の帝著
優→密着部分にCuの析出等の生じない熱的に安定なi
膜磁気ヘッドの構造を提供することである。Purpose of the Invention The present invention aims to solve the problems in the structure of the conventional thin film magnetic head as described above. The superiority of the coil layer and the 5i02 insulating layer → thermally stable i with no Cu precipitation etc. in the close contact area
An object of the present invention is to provide a structure for a film magnetic head.
発明の構成
上記目的を達成するために、本発明が採用する主たる手
段は、その要旨とするところが、磁性基板、又は軟磁性
i膜を被覆した磁性又は鼻磁性基板よりなる基部磁気コ
アと、この基部磁気コアに被せられる軟磁性*mとの間
に、絶縁層を介してCuよりなるコイル膜を挟設してな
る薄膜磁気ヘッドにおいて、上記コイル膜の片面又は両
面に、MoI1% Ta1ll、 Z r膜もしくは
WINのいずれか1種又は2種以上の膜を沿設した点に
係る薄膜磁気ヘッドである。Structure of the Invention In order to achieve the above object, the main means employed by the present invention is to provide a base magnetic core made of a magnetic substrate or a magnetic or rhinomagnetic substrate coated with a soft magnetic i-film; In a thin film magnetic head in which a coil film made of Cu is sandwiched between a soft magnetic material *m covered with a base magnetic core and an insulating layer interposed therebetween, one or both sides of the coil film are coated with MoI1% Ta1ll, Z. This is a thin film magnetic head in which one or more films of R film or WIN are provided along the film.
発明の作用
上記Cuよりなるコイル膜の片面又は両面に沿設される
Mo膜、Ta1li、Zr膜及びW膜は、熱的に安定で
加熱処理時にCuがZ+45!、Mo膜等の内部に拡散
して絶縁層との間に析出するような不都合がなくなる。Effect of the Invention The Mo film, Ta1li, Zr film, and W film provided along one or both sides of the coil film made of Cu are thermally stable, and Cu becomes Z+45 during heat treatment! This eliminates the inconvenience of diffusion into the interior of the Mo film or the like and precipitation between the insulating layer and the like.
また、Mo膜、Ta膜及び2r膜はそれ自身絶縁層であ
る5I02Nとの密着強度も強く、別の特別な5i02
層との密着層を設ける必要がない、但し、W膜の場合に
は、絶縁層との密着強度が比較的弱いため、前記Ti、
Mo、Ta、Zr等の熱的に安定な密着層を介在させる
ことにより熱的に安定な導電体コイルの成形が可能とな
る。In addition, the Mo film, Ta film, and 2r film themselves have strong adhesion strength to 5I02N, which is an insulating layer.
However, in the case of a W film, since the adhesion strength with the insulating layer is relatively weak, the Ti,
By interposing a thermally stable adhesive layer of Mo, Ta, Zr, etc., it is possible to form a thermally stable conductor coil.
実j3缶fダJ
続いて、添付した図面を参照して、本発明を具体化した
実施例につき説明し、本発明の理解に供する。ここに第
1図+a1. (bl、 tc+はそれぞれ本発明の一
実施例にかかる薄膜磁気ヘッドの製造過程を示す説明図
である。尚、以下の実施例は、本発明の具体的−例にす
ぎず、本発明の技術的範囲を限定する性格のものではな
い。EMBODIMENT OF THE INVENTION Next, embodiments embodying the present invention will be described with reference to the accompanying drawings to provide an understanding of the present invention. Here is Figure 1+a1. (bl and tc+ are explanatory diagrams showing the manufacturing process of a thin film magnetic head according to an embodiment of the present invention, respectively.The following embodiments are only specific examples of the present invention, and the technology of the present invention It is not in the nature of limiting the scope.
第1図(C1は本発明の一実施例に係る薄膜磁気ヘッド
の断面構造を示すもので、1は耐摩耗性に優れたフェラ
イト、アルミナ又はガラス板等の基板で、該基板1上に
基部磁気コア2が層状に形成されている。この基部磁気
コア2は、磁性基板、又は軟磁性薄膜を被覆した磁性又
は非磁性基板よりなり、軟磁性膜材料の例としては、F
eAj!St合金r Nl合金金金またはCo系アモル
ファス合金等が挙げられる。FIG. 1 (C1 shows a cross-sectional structure of a thin film magnetic head according to an embodiment of the present invention. 1 is a substrate made of ferrite, alumina, or glass plate with excellent wear resistance, and a base plate is placed on the substrate 1. A magnetic core 2 is formed in a layered manner. This base magnetic core 2 is made of a magnetic substrate or a magnetic or non-magnetic substrate coated with a soft magnetic thin film. Examples of the soft magnetic film material include F.
eAj! Examples include St alloy, Nl alloy, gold, and Co-based amorphous alloy.
上記基部磁気コア2には、軟磁性溝1!!!9が被せら
れ、この軟磁性溝1119と基部磁気コア2との間に1
色線N3.8を介してCuよりなるコイルFi5が挟設
されているが、上記コイル膜5の上下面にはそれぞれM
oHL Ta1L Zr膜のうちのいずれかIft、
又はこれらとW膜とを積層した拡散防止膜4,6が延設
され、高温雰囲気下におけるコイル膜5のCu材料が拡
散しないようになっている。The base magnetic core 2 has a soft magnetic groove 1! ! ! 9 is placed over the soft magnetic groove 1119 and the base magnetic core 2.
A coil Fi5 made of Cu is sandwiched through the colored line N3.8, and M is provided on the upper and lower surfaces of the coil film 5, respectively.
oHL Ta1L Zr film Ift,
Alternatively, diffusion prevention films 4 and 6, which are laminated with these and a W film, are extended to prevent the Cu material of the coil film 5 from diffusing in a high-temperature atmosphere.
次に、上記第1図(c)に示した薄膜磁気ヘッドを例に
とってその製造手順を第1図(al〜IcIの図面を参
照して説明する。Next, the manufacturing procedure of the thin film magnetic head shown in FIG. 1(c) will be explained with reference to FIGS. 1(al to IcI).
第1図(5)に示すように耐摩耗性に優れたフェライト
、アルミナ又はガラス材等の基板1上にFeAnt+合
金、NiFe合金またはCo系アモルファス合金等の軟
磁性薄膜よりなる基部磁気コア2をスパッタ法で積層す
る。更に、SiO□よりなる絶縁層3を、P−CVD法
またはスパッタ法で前記基部磁気コア2上に8!層する
と共に、電子ビーム蒸着法等により、Mo膜よりなる拡
散防止114、Cuよりなるコイル膜5.Moよりなる
拡散防止膜6を順次上記絶縁層3上に積層する。As shown in FIG. 1 (5), a base magnetic core 2 made of a soft magnetic thin film such as FeAnt+ alloy, NiFe alloy, or Co-based amorphous alloy is mounted on a substrate 1 made of ferrite, alumina, or glass material with excellent wear resistance. Laminated by sputtering method. Furthermore, an insulating layer 3 made of SiO□ is deposited on the base magnetic core 2 by P-CVD or sputtering. At the same time, a diffusion prevention film 114 made of a Mo film and a coil film 5 made of Cu are formed using an electron beam evaporation method or the like. A diffusion prevention film 6 made of Mo is sequentially laminated on the insulating layer 3.
上記コイル膜5は、0.5μm〜5.0μmの範囲で設
定され、この実施例においては例えば1.5μmに設定
される。拡散防止膜4及び6についてはその拡散防止の
機能の点から200Å以上あれば充分であり、逆に厚す
ぎると加工上の問題が生じるので、通常2000Å以下
に設定される。この実施例では500人となっている。The coil film 5 is set to have a thickness in the range of 0.5 μm to 5.0 μm, and in this example, is set to 1.5 μm, for example. For the diffusion prevention films 4 and 6, it is sufficient to have a thickness of 200 Å or more from the viewpoint of their diffusion prevention function; on the other hand, if they are too thick, processing problems will occur, so they are usually set to 2000 Å or less. In this example, there are 500 people.
上記第1図(a)に示しような積層の最上膜である拡散
防止膜6の上に更にフォト・レジスト膜7を成形する。A photoresist film 7 is further formed on the diffusion prevention film 6, which is the uppermost film of the stack as shown in FIG. 1(a).
そして、このフォト・レジスト膜7を所望のパターンに
エンチングした後、このフォト・レジスト膜をマスク層
としてイオンミリング法により、上記拡散防止FJ6.
コイル膜5及び拡散防止膜4を同時にエツチングすると
、第1図山)に示すようなフォト・レジスト膜7で覆わ
れたコイルパターンが形成される。After etching this photoresist film 7 into a desired pattern, the above-mentioned diffusion prevention FJ6.
When the coil film 5 and the diffusion prevention film 4 are etched at the same time, a coil pattern covered with a photoresist film 7 as shown in FIG. 1 is formed.
この場合、フォト・レジスト膜7として、例えばAZ1
350Jを使用し、イオン・ミリングの条件を適当に設
定することにより、コイル膜5と上記フォト・レジスト
膜7とのエツチング速度の比を3以上に設定することが
できる。従って、例えばMoよりなる拡散防止膜のミリ
ング時間を考慮しても、フォト・レジスト膜7の膜厚は
2μm程度であれば充分であり、この程度の厚みであれ
ば、レジストパターンを精度よく形成することができる
。In this case, as the photoresist film 7, for example, AZ1
By using 350J and appropriately setting the ion milling conditions, the etching rate ratio between the coil film 5 and the photoresist film 7 can be set to 3 or more. Therefore, even considering the milling time for a diffusion prevention film made of Mo, for example, it is sufficient that the photoresist film 7 has a thickness of about 2 μm, and with this thickness, a resist pattern can be formed with high precision. can do.
次いで、上記第1図(blに示されたフォト・レジスト
膜7を除去した後、上記コイル膜5上に第2図の絶縁層
8を介してFeAj!St合金、NiFe合金またはC
o系アモルファス合金等の軟磁性溝1!I9をスパッタ
法等により積層することにより、第1図fc)に示した
薄膜磁気ヘッドが得られる。Next, after removing the photoresist film 7 shown in FIG. 1 (bl), FeAj!St alloy, NiFe alloy, or C
Soft magnetic groove 1 of o-based amorphous alloy, etc. By laminating I9 by sputtering or the like, the thin film magnetic head shown in FIG. 1fc) can be obtained.
この実施例では、拡散防止膜4.6の材質としてMoを
採用したが、こうして得られた薄膜磁気ヘッドでは、例
えば600℃で3時間の熱処理を行っても、コイル膜5
の(uが上記拡散防止膜4又は6を通って絶縁層3.8
を構成するS10゜層との間に析出することはなく、従
ってコイル膜5の絶縁層3.8に対する密着強度が低下
することがない、上記Mo膜はそれ自体絶縁層3,8と
の密着性が強く、例えば450kgf/cII!以上の
密着強度を示しているので、熱的に安定で且つ、微細な
加工を可能とした薄膜磁気ヘッドの4電体コイル構造が
得られる。In this example, Mo was used as the material for the diffusion prevention film 4.6, but in the thin film magnetic head obtained in this way, even after heat treatment at 600°C for 3 hours, the coil film 4.6
(u passes through the above-mentioned diffusion prevention film 4 or 6 to the insulating layer 3.8)
Therefore, the adhesion strength of the coil film 5 to the insulating layer 3.8 does not decrease. For example, 450kgf/cII! Since the above adhesion strength is exhibited, it is possible to obtain a four-electric coil structure of a thin film magnetic head that is thermally stable and allows fine processing.
上記拡散防止膜4.6の材質は、上記のようなMo膜の
他にTayI、Zr1Q及びwIl!があり、これらの
どの材質を用いても本発明におけるコイル膜と絶縁層と
の密着強度不足を補う効果及び熱処理等によりCuが拡
散することを防止して、上記密着性を確保する効果が期
待できる。In addition to the above-mentioned Mo film, the materials of the diffusion prevention film 4.6 include TayI, Zr1Q, and wIl! Regardless of which of these materials is used, it is expected that the effect of compensating for the lack of adhesion strength between the coil film and the insulating layer in the present invention and the effect of ensuring the above adhesion by preventing Cu from diffusing due to heat treatment etc. can.
ただし、T a [9及びZr1lについては上記Mo
膜膜様様3102層の密着強度が450krf/aj以
上あり、それ自身充分な密着強度を有しているが、W膜
の場合には、5i02層との密着強度が若干低いため、
別に上記したTi屓、Mo層、TaJii、Zr1iの
ような密着性を高めるための層を並設することが望まし
い。However, for T a [9 and Zr1l, the above Mo
The adhesion strength of the Membrane-like 3102 layer is 450krf/aj or more, which itself has sufficient adhesion strength, but in the case of the W film, the adhesion strength with the 5i02 layer is slightly lower.
In addition, it is desirable to provide a layer for improving adhesion such as the above-mentioned Ti layer, Mo layer, TaJii, and Zr1i in parallel.
発明の効果
本発明は、以上述べたように、磁性基板、又は軟磁性薄
膜を被覆した磁性又は非磁性基板よりなる基部磁気コア
と、この基部磁気コアに被せられる軟磁性WI#膜との
間に、絶縁層を介してCuよりなるコイル膜を挟設して
なるii*磁気ヘッドにおいて、上記コイル膜の片面又
は両面に、MoI!l!、Ta1LZr膜もしくはwB
のいずれか1種又は2fi以上の膜を沿設したことを特
徴とする薄膜磁気ヘッドであるから、Cuと絶縁層との
密着強度が高く、且つ、高温時には、Cuの絶縁層への
拡散が防止され、密着層と絶縁層との間にCuが析出す
ることによる密着強度の低下といった問題もなく、種々
の熱処理によってもコイル膜の密着強度が低下すること
なく、熱的に安定なIE膜磁気ヘッドを得ることができ
る。Effects of the Invention As described above, the present invention provides a magnetic base magnetic core made of a magnetic substrate or a magnetic or non-magnetic substrate coated with a soft magnetic thin film, and a soft magnetic WI# film covered with this base magnetic core. In the ii* magnetic head in which a coil film made of Cu is sandwiched between an insulating layer, MoI! is applied to one or both sides of the coil film. l! , Ta1LZr film or wB
Since this is a thin film magnetic head characterized by having one of the following or a film of 2fi or more along the film, the adhesion strength between the Cu and the insulating layer is high, and at high temperatures, Cu does not diffuse into the insulating layer. This is a thermally stable IE film that prevents the problem of reduced adhesion strength due to Cu precipitation between the adhesion layer and the insulating layer, and does not reduce the adhesion strength of the coil film even after various heat treatments. A magnetic head can be obtained.
第1図(al、 (bl、 (C1はそれぞれ本発明の
一実施例にかかる薄膜磁気ヘッドの製造過程を示す説明
図である。
(符号の説明)
1・・・基板 2・・・基部磁気コア3.8
・・・絶縁層 4.6・・・拡散防止膜5・・・コ
イル11!?・・・フォト・レジスト膜。FIG. 1 (al, bl, (C1) are explanatory diagrams each showing the manufacturing process of a thin film magnetic head according to an embodiment of the present invention. (Explanation of symbols) 1...Substrate 2...Base magnetism core 3.8
...Insulating layer 4.6...Diffusion prevention film 5...Coil 11! ? ...Photoresist film.
Claims (1)
板よりなる基部磁気コアと、この基部磁気コアに被せら
れる軟磁性薄膜との間に、絶縁層を介してCuよりなる
コイル膜を挟設してなる薄膜磁気ヘッドにおいて、上記
コイル膜の片面又は両面に、Mo膜、Ta膜、Zr膜も
しくはW膜のいずれか1種又は2種以上の膜を沿設した
ことを特徴とする薄膜磁気ヘッド。A coil film made of Cu is sandwiched between a base magnetic core made of a magnetic substrate or a magnetic or non-magnetic substrate coated with a soft magnetic thin film, and a soft magnetic thin film covered with the base magnetic core, with an insulating layer interposed therebetween. A thin film magnetic head comprising a thin film magnetic head, characterized in that one or more films of a Mo film, a Ta film, a Zr film, or a W film are provided on one or both sides of the coil film. head.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20737786A JPS6363115A (en) | 1986-09-03 | 1986-09-03 | Thin film magnetic head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20737786A JPS6363115A (en) | 1986-09-03 | 1986-09-03 | Thin film magnetic head |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6363115A true JPS6363115A (en) | 1988-03-19 |
Family
ID=16538718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20737786A Pending JPS6363115A (en) | 1986-09-03 | 1986-09-03 | Thin film magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6363115A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7649714B2 (en) | 2004-08-10 | 2010-01-19 | Hitachi Global Storage Technologies Netherlands B.V. | High reliability heater for flying height control |
-
1986
- 1986-09-03 JP JP20737786A patent/JPS6363115A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7649714B2 (en) | 2004-08-10 | 2010-01-19 | Hitachi Global Storage Technologies Netherlands B.V. | High reliability heater for flying height control |
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