JPS6360805A - Parts conveying bucket - Google Patents

Abstract

PURPOSE:To selectively convey different types of parts without need for increasing the size of a device by providing a stepped recess and grooves into which parts holding craws are inserted on both sides of said recess on a bucket, and selectively inserting different types of parts on the upper and lower stage parts of said recess. CONSTITUTION:Plural buckets 31 are connected to endless chains 32a, 32b leaving a defined space. And, the endless chains 32a, 32b are meshed with sprockets provided on both ends of a conveying mechanism 3 and conveyed. Plural housing opening parts are formed on the bucket 31 leaving a defined space, and a stepped recess 310 and cross-shaped grooves 315 into which the claws of a parts handling arm are inserted on both sides of the recess 310 are provided on each housing opening part. And, different types of IC are housed in the upper and lower recesses 313, 314 respectively. For example, an SOJ type IC is housed in the lower recess 314 while a PGA type IC is housed in the upper recess 313.

Description

[Detailed Description of the Invention] [Field of Application in Industry-1] The present invention relates to a bucket for transporting parts, and in particular, to a bucket for transporting parts, which is used in an IC handler and is capable of individually transporting N number of shaped parts. Regarding buckets for transporting parts.

[Prior Art] FIG. 9 is a schematic diagram showing the basic configuration of a conventional IC handler.

In the figure, A is a loader unit that stores uninspected ICs and sequentially sends them out. Generally, IC magazines 1 h (stacked) are stacked. Inside this IC magazine 1, individual ICs are are arranged.

The ICs in the IC magazine 1 are pretreated at a temperature that meets predetermined inspection conditions while sliding down the ICs in the heat treatment section B while being guided by guide rails. In this case, the -Y preparatory process includes preheating and precooling A9.

After passing through the heat treatment section B, the IC is similarly guided by the guide rail and lowered directly below the measurement section C by its own weight, and is then inspected by an automatic measuring device (inspection head, not shown or recorded). be inspected.

After the inspection, the ICs slide down under their own weight to the unloader section, but on the way, they are sorted and sorted by the sorting section E according to the inspection results. Multiple rows of magazines la+ 1b+ are slid down the lane under their own weight and are loaded into the unloader section 1).
let let IL Any 1 of Ig+lh
is stored in.

[Problems to be solved] In the case of the natural fall method in which the IC slides down the guide rail 16 by its own weight, the IC itself must be held down for heat treatment, measurement processing, etc. The flow is 11
Since it is necessary to change the direction of the IC itself to align it with the falling direction, there is a drawback that the IC pins are easily bent or jammed. In addition, when testing multiple ICs in parallel using guide rails, it is necessary to line up and sink the corresponding number of guide rails, and when testing multiple IC shapes, it is necessary to ．． Special considerations such as preparing +7 river lanes or installing two guide rails are required, and for ICs with different shapes, the flow must be controlled individually, and the equipment The disadvantage is that it becomes larger.

This invention solves the problems of the prior art, and allows parts of different shapes to be selectively conveyed without increasing the size of the device. The purpose of the present invention is to provide a bucket for transporting parts that can be used to transport parts.

[R stage to solve the problem] In order to achieve the above-mentioned 11 objectives, the bucket for transporting parts of the present invention, L-, has a recess in stages I and J, and parts binoqua on both sides of this recess. It is equipped with grooves in which the claws of the puller are placed 1-1, and among the recesses, the I" stage recess and the lower stage (corresponding to the planar shape of the part of a different size than the recess) 12 1 and each opening [1 extends to the surface, these openings are attached to the conveying mechanism facing upward, and a recess on the 1- side and a recess on the lower side are formed. Parts are stored in one direction and transported.

[How it works: In this way, the bucket has a stepped recess and grooves on both sides of the recess into which the claws of the parts pick-up arm are inserted, making it easy to take out and store parts using the pick-up arm.・Different types of parts can be stored in the bucket. Furthermore, since a bucket is used, a large number of parts can be transported at the same time, the jam rate of parts is reduced, and pin bending is less likely to occur.

As a result, when used in an IC handler or the like, there is no need to hold down the parts and keep them on standby, there is no need to transport them by dropping them using guide rails, etc., and there is no case for changing the JJ direction of the parts themselves. For example, if there are multiple parts, +ri processing f11 (
Even if you have to store the parts in parallel, ffi 1. Additionally, multiple parts can be inspected at the same time, and the size of the device itself does not require much attention.

[Example] Hereinafter, an example of the present invention will be described in detail with reference to the drawings.

FIGS. 1(a), (b), and (c) are explanatory diagrams of an IC transport bucket 7) according to an embodiment of the present invention, and FIG.
IC using a parts transport bucket to which this invention is applied
Figure 3 is a side sectional view of the handler, Figure 4 (a) and (b) are explanatory diagrams of its IC storage rack, and Figures 5 (a) and (b) are its An explanatory diagram of the loader section, FIG. 6, is an explanatory diagram of the handling operation for supplying ICs from the loader section to the bucket transport section, and FIGS. 7(a) and (b).
) is a side sectional view and an 11° cross-sectional view of the bucket conveyance mechanism, and FIG. 8 is an explanatory view of the chain.

Note that in each of these figures, the same number is 1-1, and lJ<.

In FIGS. 2 and 3, 10 is an IC handler, 2 is an IC loader section thereof, 3 is a bucket transport mechanism section that receives IC supply from the IC loader section, stores and transports the ICs, and 4 is an IC handler. A constant temperature bath enveloping the transport path of the bucket transport mechanism section 3; 5 a measuring section that receives parts supplied from the bucket transport mechanism section 3 and inspects the parts; 6 a measuring section that tests the ICs after inspection; a sorting section 8 that receives the data from the storage section 7, transports it almost horizontally, and stores it in the rack of the storage section 7 according to the inspection results;
5a is a rack that is attached to the loader section 2 and the storage section 7 and stores test parts (ICs in this case), and 5a is a rack that is attached to the loader section 2 and the storage section 7.
This is a test head that is installed in the IC and measures the electrical characteristics, etc. of the IC.

Here, the loader section 2 includes a rack mounting table 21 and a linear feeder 22, as shown in FIGS. 2 and 5(a).
, a pickup arm 23 (see FIG. 6), which is provided under the rack mounting table 21, and is provided under the rack mounting table 21.
I, which is equipped with an elevator mechanism 24 that moves the
A plurality of +12 C load mechanisms 20 (three in the figure) are provided, and a rack 8 is attached to each rank mounting table 21 of each IC load mechanism 20.

As shown in FIGS. 4(a) and 4(b), the rack 8 is
A plurality of IC storage grooves 81 are stacked downward in multiple stages.
．． 81.・沙・ is formed continuously, and valley groove 8
In 1, individual ICs (here, PGA type IC, hybrid 1-IC) 9 are housed in a form in which they are continuously arranged in the groove direction and - in the F force direction with their pins facing upward. There is.

Then, the push-out pawl 82 shown in the sectional view of FIG. 5(b) is moved downward along the groove 81 by the pawl feeding mechanism 83 at a pitch equal to the number of parts. The groove 81 through which the claw 82 moves is located at a position that corresponds to the blood feeding direction of the rail 22a of the linear feeder 22. The movement of the push-out claw 82 by one pitch is controlled by a control signal from a control section (not shown) each time it is sent out. Further, as shown in FIG. 5(b), the pawl feeding mechanism 83 holds the push-out pawl 82 of the crank cane, and as shown in FIG. It is driven and moves horizontally by sliding on the horizontal axis 841-.

Therefore, one of the ICs 9 supplied to the bucket conveying section 3 is pushed out onto the rail 22a of the linear feeder 22 according to the movement of the push-out claw 82 by one pitch.
The linear feeder 22 transports the material to the pick-up position P at its tip. This causes the I
C9 is set at the tip component pink-up standby position.

Here, the rack 8 is removably attached to the rack mounting table 21, and as the rack mounting table 21 is moved up and down by the elevator mechanism 24, the rack 8 is moved up and down, and all the ICs 9 in the groove 81 are ejected. Then, the upper groove 81 and the lower groove 81 are successively positioned so that their bottom surfaces coincide with the feed direction of the rail 22a of the linear feeder 22. In addition, 25.25 is a component drop prevention bin that passes vertically through both ends of the rack 8, and is held in a suspended position, and its tip side matches the rail 22a of the linear feeder 22. A state in which the groove 81 located at the position is not blocked (when removing parts, use the fall prevention pin 2
The length of 5 corresponds to this).

The IC loading mechanism 20 includes the rack 8, its elevator mechanism 24, a pawl feeding mechanism 83, a rack mounting state detection/positioning guide mechanism 26, etc., and here, three of them are arranged in parallel in the loader section 2. . In the initial state, I
In the rack 8 of the C load mechanism 20, the bottom surface of the groove 81 of the groove 81 is aligned with the −L surface of the rail 22a.
When the IC is sent out and the groove 81 becomes empty, the groove 8
F is raised by 1 stacked pitch (1 pitch).

That is, when the ICs in the groove 81 of a certain rack 8 become empty, the rack 8 is moved downward by the elevator mechanism 24 so that the bottom surface of the groove 81 in the L position becomes -1 of the rail 22a.
- located at the position of the plane.

Now, the IC 9 sent out from the rack 8 and waiting at the tip of the rail 22a of the linear feeder 22 is in a state where the claw 231 of the pick-up puller 1123 is opened, as shown in FIGS. 6 and 7(a). The buckets 31 are lowered and closed, gripped, and sequentially transported along the rails 22a1- to each storage position of the bucket 31 in the bucket transport mechanism section 3. Then, the claws 231 are opened and the ICs 9 are set in their respective storage openings 32. Here, the storage opening 32 is 1
Four buckets 31 are provided, as shown in FIG. 7(a).
As shown in FIG. 3, four ICs 9 are sequentially stored in the storage opening 11 32 from the end of the bucket 31.

Therefore, four ICs 9 are intermittently sent out from the rack 8 at a timing that matches the handling time of the pickup arm 23, and are transported to the standby position P at the tip of the linear feeder 22, and then transferred to the pink-up arm. 2
3, the four IC9s are sequentially transferred from the linear feeder 22.
The pieces are picked up and transported individually to the bucket t+-31.

Note that 232 is a spring that biases the claw 231 of the pickup arm 23 in the closing direction, and 233, 233, 234, and 234 are the springs and rollers that rotate the claw 231 in the opening direction. And 235.235 is claw 23
This is the rotation fulcrum of each of the two claw pieces of 1.

When four ICs are thus set in one bucket 31, the bucket 31 moves forward by one, and the next empty bucket 31 is positioned at the IC supply position corresponding to the linear feeder 22. Here, when all the ICs in the rack 8 of a certain IC loading mechanism 20 become empty, the elevator mechanism 24 is controlled to move up to 1 in accordance with control 4I'J' from the control section, and the rack 8 moves to 1-. Return to the original initial state,
The pink-up arm 23 moves to the next IC loading mechanism 20, ICs are supplied from the rack 8 of that IC loading mechanism 20, and the empty rack 8 is removed. A new rack 8 filled with ICs is then newly loaded into the removed IC loading mechanism 20.

By the way, this bucket 31 is shown in Fig. 7 Fl) + (b)
As shown in FIG. 2, a plurality of pieces are connected at both ends by endless chains 32 Li+ 321) at predetermined intervals. As shown in Figure 3, this chain 732a+
32b engages with sprockets 1-33a and 33b provided at both ends of the bucket 1 to the side portion 3 of the conveyor machine and are conveyed in sequence. That is, these constitute a chain transmission mechanism.

Therefore, the bucket 31 is connected to the chain 32a.

321), and the front sprocket 33a is intermittently connected to the timing belt 3 by motor 934.
5, and each bucket 31 is intermittently fed at a predetermined pitch.

Here, the bucket 31 is made of a member such as a metal with good thermal conductivity, such as aluminum, and has a square bar shape as shown in FIG. 1(a). Two storage openings 32 are provided at predetermined intervals, and screw holes 311, 311 are provided at both ends of the storage openings, which are fixed to chains 32a and 32b via screw pins.
, 312° 312 are opened on both end sides. This bucket 31 is fixed to each link 321 constituting the chain 32a (32b) shown in FIG.
Storage opening 11 part 3 against the conveyance surface by the screw bin through the
2 is fixed so that it is positioned at iTi'iI'.

Storage open IT, Iff1s 32 is a cross-sectional view taken along line II in the same figure (a) as seen in Figure 1 (1)) and a cross-sectional view taken along ■-■ in Figure (a) as seen in Figure 1 (C). A stepped recess 310 provided at ~small and this recess 310
7-shaped grooves 315 into which the claws 231 of the component handling arm are inserted are provided on both sides, and the 1-shaped groove 315 allows the bucket 31 to pass through the bucket 31 directly.

The recess 313 and the recess 314 at the bottom of the recess 310 are formed with openings corresponding to different planar shapes of human-like parts, and each opening extends to the surface. Seventh As seen in figure (b),
These open[-1 is 1. Chains 32a, 3 so as to face
It is attached to 2b. and 1°, either the side recess 313 or the lower recess 314.) A different type of I to J.
Store C.

Specifically, in this embodiment, the recess 314 of the F stage or the S
It has a shape that corresponds to storing an OJ type IC, and the recess 313 on the 1st stage is a PGA type IC.
1.The storage section is especially large enough to store the Vibe'J Soto IC.

Note that 1-1 passing through these depressions 313 and 314
The seven grooves 315 are provided so that the centers of their cross points almost coincide with the centers of these recesses 313 and 314, and a presser pin 37, which will be described later, enters from one layer of the I-shaped groove 315 that penetrates this bucket. The IC 9 to be measured is held down, lifted, and then pulled out.For this purpose, it becomes a holding pin passage hole.

Now, as shown in FIGS. 2 and 3, in the bucket conveyance mechanism section 3, the bucket including the chains 32a and 32b is stored in a constant temperature bath 4, and is heated by a heater 41 provided at the bottom of the constant temperature bath 4. heated.

Therefore, the IC 9 stored in the bucket 31 is heated to a predetermined temperature during this feeding process.

Then, as shown in FIG. 7(b), when the bucket 31 is fed to the position of the 1iil fixed part 5 and the bucket 31 is positioned in the measuring part 5, the sprocket 3 is in the stopped state of the intermittent feed.
In the drive stop state of 3a, at the beginning of this stop period 1, the mechanism 36 presses the holding pin 37 with a chuck while the direct drive cam 38a disposed below the bucket 31 corresponding to the measuring section 5 pushes the pin. is driven to 1-, and the IC 9 is passed through each storage amount [1 part 32 to the measurement part 5 side and pressed 1-.
6 and presser pins 37 are located in parallel on the F side of each storage capacity 11 section 32, and the chuck portion at the tip of the presser pin 37 has a shape similar to the claw 23 of the pickup arm. .

Here, a contact unit 51 (or socket 51) is fixed to the measurement unit 5 from the ceiling side to the bottom side.
are provided so as to correspond to the positions of the respective storage amounts [-1 parts 32, and are pressed by the presser pins 37 as shown by the dotted lines in FIG. 2(b). The IC 9 that has been connected contacts the contacts of this contact unit and is electrically connected. Then, the test head 5a connected to the contact unit 51 performs /1111 constant processing on the IC 9 which is pressed and contacted.

In this way, the IC9 is supplied to the measuring section 5, and the measuring section 5 measures each IC9, and when the measurement is completed, the mechanism 36 is lowered by the return movement of the linear cam 36a when the pin is pressed. Then, the holding pin 37 is lowered and the connection with the contact unit 51 is released. Each IC 9 is then returned to the original storage opening 32 of the bucket 31. Note that, at this point, the chuck at the tip of the holding pin 37 is located below the bottom surface of the bucket 31.

After that, the intermittent feeding stop period ends and the next feeding state begins, and the bucket 31 is moved to the chain 32a.

32b. and the next bucket) 31
is located below the measuring section 5, and the terminal of the next IC 9 is brought into contact with the contact of the contact unit 51, and a similar measurement is made. In this way, the IC is supplied to the measuring section 5.

Next, the IC 9 that has been measured is stored in the bucket 31 again and the four ICs are transported together, and when they come to the component position near the front sprocket 33a, As shown in FIG. 7(b), each of the four ICs 9 is taken out from the bucket 31 by the pi/sofa/sop arm 61 of the sorting section 6, and the belt 62a
1". The pickup arm 61 has a similar configuration to the pickup arm 23, and is transported to 6".
11 is its claw.

Here, the pickup 61 of the classification section is attached to the bucket 31.
The working time for setting each of the four ICs in the storage amount 1] section 32 and the working time for taking out each of the four ICs 9 from each storage opening 32 of the bucket 31 are determined from the IC measurement time of the measuring section 5. This is a short period of time, and is performed while the IC 9 is being measured and the bucket 31 is not being fed.

The sorting section 6 consists of a pickup arm 61, a belt conveyance mechanism 62, and a plurality of IC extrusion mechanisms 63 corresponding to the number of classifications.As shown in FIG.
Groove 62b that crosses in the lateral force direction perpendicular to the conveying direction
A grooved belt 62a with . Then, the IC9 is stored in the groove 62b of this belt 62a, and the IC
9 in the corresponding rack 8 position, actuate the IC pushing mechanism 63 corresponding to the classification and extend its pushing pin 63a to push the IC 9 into the groove 81 of the top and bottom 8 using the groove 62b of the belt as a guide. It's crowded. Based on this, it is classified according to IC9 or Kenkyangsong. In this case, instead of the grooved belt 62a, a bucket having a transverse groove corresponding to the groove of the storage section 11 section 32 of the bagasso 1-31 may be used for conveyance.

In this case, the buckets can be connected by a chain like the bucket 31, or by a belt +7. It may be fixed directly to the

In addition, 1 of the elevator mechanism of the previous elevator machine + R24
- operation control and timing of the drive movement, control and timing of the opening/closing operation of the claw 231 of the pickup arm 23 and the claw of the pickup arm, and control and timing of the movement of the pushing pin f1 of the IC pushing mechanism of the sorting section; Direct power of bottle pusher 1/mechanism 36 1-36 a
of? 1.Return operation control and its timing are electrical signals sent from a control unit with a built-in microprocessor.
It is determined and controlled by

By the way, the iR of the rail 2221 of the linear feeder 22
The vertical section of the bucket 31 has a stepped groove shape similar to that shown in Fig. 1 (C), and the 1.9-step groove has an opening width of 11, which corresponds to parts such as Vibria IC. has become,
The groove at the bottom is wide enough to accommodate parts such as SGO type ICs. Therefore, the rack 8 is connected to the IC loading mechanism 2.
By simply replacing it with 0, it is possible to supply the part W to the bucket 31, and it is possible to inspect different parts II)
It is Noh. In this case, the contact unit 51 of the measuring section is designed to connect these different parts, or the contact unit 51 is replaced each time according to the part to be measured.

As described above, the conveyance mechanism of the bucket conveyance mechanism section is not limited to a chain, and a so-called endless winding transmission mechanism such as a belt can be used. In addition to the transmission mechanism, such winding may be performed by an intermittent feeding mechanism that uses links in the form of \1/-rows to place the bucket on a horizontal rail and feed the bucket with claws. Alternatively, the belt may be provided with claws to directly feed buckets, throats, or parts intermittently.

Furthermore, in this invention, it goes without saying that the components handled are not limited to ICs.

[Effects of the Invention] As can be understood from the explanation in Part 1-, in this invention, the bucket is provided with a stepped recess and grooves on both sides of the recess into which the claws of the component pink-up arm are inserted. Therefore, the pickup arm makes it easy to take out and store parts, and different types of parts can be stored in the same bucket. Furthermore, since a bucket is used, a large number of parts can be transported at the same time, the jam rate of parts is reduced, and pin bending is less likely to occur.

As a result, when used in an IC handler or the like, there is no need to hold down the parts and keep them on standby, there is no need to drop and transport them using guide rails, etc., and there is no need to change the direction of the parts themselves. Even if you have to process multiple ID columns for multiple parts, it will be easier if you store the parts in 16 columns. First, multiple parts can be inspected at the same time, and the size of the device itself does not need to be increased too much.

[Brief explanation of the drawing]

FIGS. 1(a), (b), and (c) are explanatory diagrams of an IC transport bucket according to an embodiment of the present invention, and FIG.
IC using a parts transport bucket to which this invention is applied
Figure 3 is a side sectional view of the handler with part removed, Figures 4 (a) and (b) are explanatory diagrams of its IC storage rack, and Figures 5 (a) and (b) are its side sectional views. An explanatory diagram of the loader section, FIG. 6, is an explanatory diagram of the handling operation for supplying ICs from the loader section to the bucket transport section, and FIGS. 7(a) and (
b) is a side sectional view and an iF surface view of the bucket conveyance mechanism, FIG. 8 is an explanatory diagram of its chain, and FIG. 9 is a conventional I
It is an external view of a C handler. ■...IC handler, 2...IC loader section, 3...
・Bucket transport mechanism section, 4... Constant temperature chamber, 5... Measuring section, 6... Sorting section, 7... Storage section, 8... Measuring section, 8... Rack, 9
...IC, 10...IC handler, 20...IC
Loading mechanism, 21... Rack mounting table, 22... Linear feeder, 23... Pick up arm, 24... Elevator fli structure, 31... Bucket, 32... Storage amount [1 part, 81... Groove.

Claims (4)

[Claims] (1) A planar shape of a component that includes a stepped recess and grooves on both sides of the recess into which the claws of the pick-up arm of the component are inserted, and that the upper recess and the lower recess are different in size from among the recesses. and each opening extends to the surface, and is attached to the conveying mechanism with these openings facing upward, and the component is stored in either the upper recess or the lower recess. A bucket for transporting parts. (2) A bucket for transporting parts according to claim 1, wherein a through hole through which a member for pushing out a component from the recess passes is formed integrally with the groove at approximately the center of the recess. (3) The first or second claim characterized in that the conveying mechanism is an endless winding transmission mechanism that moves almost horizontally.
Bucket for transporting parts as described in section. (4) The endless winding transmission mechanism is installed between the loader section and the measurement section of the IC handler, and the bucket stores the parts supplied from the loader section and transports the IC to the measurement section. A parts transport bucket according to claim 1 selected from claims 1 to 3.