JPS6351273B2 - - Google Patents

Info

Publication number
JPS6351273B2
JPS6351273B2 JP54063945A JP6394579A JPS6351273B2 JP S6351273 B2 JPS6351273 B2 JP S6351273B2 JP 54063945 A JP54063945 A JP 54063945A JP 6394579 A JP6394579 A JP 6394579A JP S6351273 B2 JPS6351273 B2 JP S6351273B2
Authority
JP
Japan
Prior art keywords
section
chute
classification
primary
rotary table
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54063945A
Other languages
Japanese (ja)
Other versions
JPS55156331A (en
Inventor
Masaya Naito
Takao Ishihara
Teruhiro Tokura
Akimiki Ide
Mutsuyo Kanetani
Kazuhiko Kimura
Katsujiro Shibayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi High Tech Corp
Original Assignee
Hitachi Ltd
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Ltd
Priority to JP6394579A priority Critical patent/JPS55156331A/en
Publication of JPS55156331A publication Critical patent/JPS55156331A/en
Publication of JPS6351273B2 publication Critical patent/JPS6351273B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

この発明は多分類を必要とする電子部品を分類
し選別する自動選別装置に関する。 可変容量ダイオードのごとき電子部品はその容
量や諸特性に応じて多分類し、選別する必要があ
り、そのために高度に多分類できる自動選別装置
が要求される。 従来の多分類できるこの種の自動選別装置とし
てパーツフイーダより電子部品を順次シユートに
供給し、シユート上に設けてある接点を介しDC
項目や容量を測定し、これら測定値に従つてアド
レス(分類場所)を決定し、下部の分配器(シユ
ート)をXY軸駆動による水平移動させ、平面を
XY方向(20×20)に分割した分類収納部にダイ
オードを落下させて400区分に分類収納する方式
のものが使用されている。このように従来方式の
自動選別装置においては下記の問題点がある。 (1) 分類方式がXY軸にアドレス移動するサイク
ル運動のためにインデツクスアツプが図りにく
い。区分数を増やそうとすると設置面積を広く
とる必要がある。 (2) パルスモータで分配器のXY軸駆動を行なう
ためXY軸及び負荷バランスがくずれると動作
せず誤分類の原因となる。又分配器が原点復帰
動作するため分類動作に時間が多くかかる。 (3) 分類収納部のシヤツタ及び挿入器が摩耗しや
すく、そのためダイオードの供給、送り出しに
誤動作を生じ誤分類の原因となることがある。 (4) シユート中でダイオードがつまつたり、パル
スモータの誤動作があつた場合に停止のフイー
ドバツクができないことにより誤分類を招く。 (5) パーツフイーダ供給方式のため大量チヤージ
ができない。又、電源オン・オフ時のノイズの
発生によつて挿入器やシヤツタの誤動作を起す
ことがある。 本発明は上記した従来技術の欠点を解消するた
めになされたものである。したがつてこの発明の
目的は、多数分類に適合し、しかも誤分類を極力
少なくし得る自動選別装置の提供にある。 上記目的を達成するためこの発明の一実施例に
よれば、供給された電子部品の特性を測定する測
定部と、前記測定部の測定結果に基づいて、電子
部品を分類する1列の複数シユートを有する1次
分類部と、前記1次分類部で分類された電子部品
をさらに分類し、前記1次分類部のシユートの列
に対して、略直角方向に移動する複数列のシユー
トを設けた2次分類部とからなる分類部を有する
と共に、前記測定部及び前記1次分類部を複数個
設け、前記1次分類部を前記2次分類部上に並列
して設置している。 以下本発明を可変容量ダイオードの自動選別装
置に適用した場合の実施例にそつて詳述する。 第1図及び第2図は本発明による自動選別装置
の全体構成を示す。1は外部より供給された電子
部品(ダイオード)群Dから部品を1個ごとに次
段の測定部へ取出すための電子部品個別供給手段
としてのマグネツト・ストツカである。このマグ
ネツト・ストツカは2つの永久磁石を対向させ、
その間に挿入した多数のダイオードの両軸の鉄製
リードを磁力吸引することにより水平保持した状
態で横方向に移動させ、周辺にマグネツトチヤツ
クを配設した円形ドラム2を回転させてダイオー
ドを1個ごと取出し上位置の測定部に送るように
なつている。測定部には数組、例えば3組の接点
3が設けられ、ここでダイオードの電極が接触し
てテスタ4,5により、極性、容量、DC特性等
が同時に測定され、その測定結果によりダイオー
ドごとに分類場所(アドレス)が決定され、コン
ピユータの記憶装置に記憶される。6は測定され
たダイオードの抜き取り機構で、円形ドラム2よ
り機械的手段で抜きとられたダイオードはホツパ
状シユート7を通して搬送チエーン8に載せ、1
次分類部(c)へ送られる。 1次分類部は揺動シユート10と1列の複数シ
ユート(1次分類棚)から構成される。搬送チエ
ーン8で送られてきたダイオードはホツパ状シユ
ート9を通して揺動シユート(首くりストツカと
も称する)10に入り、前記記憶装置よりの指示
信号によつて揺動シユートの角度が選択され、ダ
イオードはその方向にある1次分類棚11のシユ
ート内に入る。この1次分類棚は揺動シユートの
揺動方向にそつて1列に10区分(A)のシユートを配
したものであり、ダイオードはその一つのシユー
トを選んで入ることにより1次分類がなされる。
この1次分類棚の各シユート内には出入するダイ
オードの存在を感知する感知器12が設けてあ
り、その下部には各シユート底を開閉するシヤツ
タ13を介して2次分類部が設置される。 2次分類部は、1次分類部のシユートの列に対
応して、円周方向に複数列のシユートを有する回
転テーブルと、前記回転テーブルのシユート底を
開閉するシヤツタ群と、前記回転テーブルに設け
られた各シユートに対応する様に配列されたシユ
ートを有する固定テープから成り、固定テーブル
下に各シユートに対応する収納ピン17を有する
収納部が設置される。2次分類部は、1次分類部
の1列シユートに対応する回転テーブルの半径方
向を10区分として、円周方向にそつて120区分さ
れ、全体で10×120=1200分類に相当するシユー
トを有し、テーブルの回転によつて各シユートが
1次分類部のシユートの列の方向と直角の方向で
移動する。1次分類部でダイオードが1次分類さ
れた後、回転テーブルの目的とする番地のシユー
トが直下に移動してきたときにシヤツタが開いて
ダイオードが降下して2次分類がなされ、この回
転テーブルが所定位置に来たときに回転テーブル
と固定テーブルとの間のシヤツタが開いて回転テ
ーブルのシユート内のダイオードは対応位置にあ
る固定テーブルのシユートを介してその直下にあ
る目的とする番地(アドレス)の収納ビン17中
に収納されて分類選別が完了する。この2次分類
部の回転テーブル上の各シユート内にもダイオー
ドの存在を感知する感知器18がとりつけてあ
る。 本発明において、第4図のシステム構成図に示
すように1次分類の前段階である電子部品供給手
段(マグネツトストツカ)1a,1b…、測定部
3a,3b…、搬送チエーン等の搬送部と、揺動
シユートと分類棚を含む1次分類Ca,Cb,Cc
は複数組(例えば4組)併設され1組の2次分類
Bに対応するようになつている。同図の19はコ
ンピユータ(記憶部)、20は制御部、21はテ
ープリーダ、22はタイプライタを示す。 第3図はこれら分類系統を図示するものであ
り、1次分類部Cで半径方向にA区分(A=10)、
2次分類を円周方向にB区分(B=120)行なう
もので全区分数T=A×B(=1200)となり多分
類を一度に処理できる。1次分類部CはCaから
Cdの4組あるので、2次分類Bの回転テーブル
にCaより落下するのはBa,Ba′,Ba″と4個おき
に割りつけ、4組を1度に動作することができ
る。この1次分類部の使用組数は4台と限らず、
1次分類部Cと2次分類部Bの処理スピードの比
により決定する。 本発明において、測定部と分類選別機構を分け
たことにより作業性、保守性及び選別精度が向上
した。 この方式の採用により長い測定時間tを要する
テスト項目も1次分類Cと2次分類Bの処理スピ
ードの比をp:1にとることによりt/pで処理
できるのでインデツクスの向上をはかることがで
きる。なお、測定部に数個の接点を設けることに
より特性の異なる測定を同時に又は順次に行なう
ことができ、測定精度の向上とともに測定時間の
短縮ができる。 本発明の具体的効果は下表に示す通りである。
The present invention relates to an automatic sorting device for sorting and sorting electronic parts that require multiple sorting. Electronic components such as variable capacitance diodes need to be classified and sorted according to their capacitance and various characteristics, and therefore an automatic sorting device that can highly classify them is required. As a conventional automatic sorting device of this type capable of multiple classification, electronic components are sequentially supplied from a parts feeder to a chute, and DC
Measure the item and capacity, determine the address (classification location) according to these measured values, and move the lower distributor (chute) horizontally using the XY axis drive to spread the plane.
A method is used in which diodes are dropped into a classification storage section divided in the XY direction (20 x 20) and classified into 400 categories. As described above, the conventional automatic sorting apparatus has the following problems. (1) It is difficult to index up because the classification method uses a cyclical motion that moves addresses along the XY axes. Increasing the number of sections requires a wider installation area. (2) Since the XY axes of the distributor are driven by a pulse motor, if the XY axes or the load balance is disrupted, the device will not operate and may cause misclassification. Furthermore, since the distributor performs a return-to-origin operation, the classification operation takes a lot of time. (3) The shutters and inserters in the classification storage section are prone to wear, which may cause malfunctions in the supply and delivery of diodes, resulting in misclassification. (4) If the diode becomes clogged in the chute or the pulse motor malfunctions, the inability to provide stop feedback may lead to misclassification. (5) Large-scale charging is not possible due to parts feeder supply system. Furthermore, noise generated when the power is turned on and off may cause the inserter or shutter to malfunction. The present invention has been made in order to eliminate the drawbacks of the prior art described above. Therefore, an object of the present invention is to provide an automatic sorting device that is suitable for multiple classifications and can minimize misclassifications. In order to achieve the above object, according to an embodiment of the present invention, there is provided a measuring section for measuring the characteristics of supplied electronic components, and a plurality of shots in one row for classifying the electronic components based on the measurement results of the measuring section. and a plurality of rows of chutes that further classify the electronic components classified by the primary classification portion and move in a direction substantially perpendicular to the row of chutes of the primary classification portion. It has a classification section consisting of a secondary classification section, a plurality of the measurement sections and the primary classification section, and the primary classification section is installed in parallel on the secondary classification section. DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment in which the present invention is applied to an automatic sorting device for variable capacitance diodes will be described in detail below. 1 and 2 show the overall configuration of an automatic sorting device according to the present invention. Reference numeral 1 designates a magnetic stocker as an electronic component individual supply means for taking out components one by one from a group D of electronic components (diodes) supplied from the outside to the next measuring section. This magnet stocker has two permanent magnets facing each other,
By magnetically attracting the iron leads on both axes of a large number of diodes inserted between them, they are held horizontally and moved laterally, and a circular drum 2 with magnetic chucks arranged around the periphery is rotated to remove one diode. The entire sample is taken out and sent to the measuring section located at the top. The measuring section is provided with several sets, for example, three sets of contacts 3, where the electrodes of the diodes come into contact and the testers 4 and 5 measure the polarity, capacitance, DC characteristics, etc. at the same time. A classification location (address) is determined and stored in the computer's storage device. 6 is a mechanism for extracting the measured diodes, in which the diodes extracted from the circular drum 2 by mechanical means are placed on a conveyor chain 8 through a hopper-like chute 7;
It is sent to the next classification section (c). The primary sorting section is composed of a swinging chute 10 and a row of multiple chute (primary sorting shelves). The diode sent by the conveyance chain 8 passes through a hopper-like chute 9 and enters a swing chute (also called a neck stocker) 10, and the angle of the swing chute is selected by an instruction signal from the storage device, and the diode is Enter the chute of the primary sorting shelf 11 in that direction. This primary classification shelf has 10 categories (A) of chute arranged in one row along the swinging direction of the swinging chute, and the diode is first classified by selecting and entering one of the chute. Ru.
A sensor 12 is provided in each chute of this primary sorting shelf to detect the presence of a diode going in and out, and a secondary sorting section is installed below it via a shutter 13 that opens and closes the bottom of each chute. . The secondary classification section includes a rotary table having a plurality of rows of chute in the circumferential direction corresponding to the rows of chute of the primary classification section, a group of shutters for opening and closing the chute bottom of the rotary table, and a shutter group for opening and closing the chute bottom of the rotary table; It consists of a fixing tape having chute arranged so as to correspond to each chute provided, and a storage part having a storage pin 17 corresponding to each chute is installed under the fixed table. The secondary classification section has 10 divisions in the radial direction of the rotary table corresponding to the 1-row chute of the primary classification section, and 120 divisions along the circumferential direction, and the chute corresponding to 10 x 120 = 1200 classifications in total. The rotation of the table causes each chute to move in a direction perpendicular to the direction of the chute rows of the primary sorting section. After the diodes have been subjected to primary classification in the primary classification section, when the shutter at the target address of the rotary table moves directly below, the shutter opens and the diodes descend, performing secondary classification. When the rotary table and the fixed table reach a predetermined position, the shutter between the rotary table and the fixed table opens, and the diode in the chute of the rotary table reads the target address directly below it through the chute of the fixed table at the corresponding position. are stored in the storage bin 17, and the classification and sorting is completed. A sensor 18 for detecting the presence of a diode is also installed in each chute on the rotary table of the secondary classification section. In the present invention, as shown in the system configuration diagram of FIG. 4, the electronic component supplying means (magnetic stocker) 1a, 1b..., measuring parts 3a, 3b..., and transport parts such as a transport chain, which are the pre-stages of the primary sorting, and primary classification C a , C b , C c ... including swing chute and classification shelf.
A plurality of sets (for example, 4 sets) are arranged together to correspond to one set of secondary classification B. In the figure, 19 is a computer (storage unit), 20 is a control unit, 21 is a tape reader, and 22 is a typewriter. Figure 3 illustrates these classification systems, and the primary classification section C is divided into A divisions (A=10) in the radial direction;
The secondary classification is performed in B divisions (B=120) in the circumferential direction, and the total number of divisions is T=A×B (=1200), and multiple classifications can be processed at once. Primary classification part C is from C a
Since there are four sets of C d , the ones that fall from C a to the rotary table of secondary classification B are assigned every fourth as B a , B a ′, and B a ″, and all four sets are operated at once. The number of sets used for this primary classification section is not limited to four,
It is determined by the ratio of the processing speeds of the primary classification section C and the secondary classification section B. In the present invention, workability, maintainability, and sorting accuracy are improved by separating the measuring section and the sorting and sorting mechanism. By adopting this method, even test items that require a long measurement time t can be processed in t/p by setting the processing speed ratio of primary classification C and secondary classification B to p:1, making it possible to improve the index. can. Note that by providing several contact points in the measuring section, measurements of different characteristics can be performed simultaneously or sequentially, and measurement accuracy can be improved and measurement time can be shortened. The specific effects of the present invention are shown in the table below.

【表】 本発明の実施例により可変容量ダイオードのレ
ジンモールドタイプからDHD(ガラス封止ダブ
ル・ヒートシンク・ダイオード)タイプへの製品
切替えがスムーズにでき、原価低減に大きく寄与
した。 本発明は前記実施例に限定されない。例えば2
次分類部において回転テーブルに代えて第5図に
示すように一部で水平方向に直線移動し、他部で
上下方向へ湾曲してエンドレス回転するベルト体
23のものに多列シユートを配設したものであつ
てもよい。 本発明の説明において可変容量ダイオード用自
動選別装置を例に掲げたが、本発明は一般の電子
部品、特に2極の抵抗、コンデンサ、3極のトラ
ンジスタ等で多分類、等級分けを必要とするもの
に全て適用できる。
[Table] The embodiment of the present invention made it possible to smoothly switch from a resin mold type variable capacitance diode to a DHD (glass-sealed double heat sink diode) type, which greatly contributed to cost reduction. The invention is not limited to the above embodiments. For example 2
In place of the rotary table in the next sorting section, a multi-row chute is installed on the belt body 23, which moves linearly in the horizontal direction in one part and curves vertically in the other part to rotate endlessly, as shown in Figure 5. It may be something that has been done. In the explanation of the present invention, an automatic sorting device for variable capacitance diodes was used as an example, but the present invention is also applicable to general electronic components, especially 2-pole resistors, capacitors, 3-pole transistors, etc., which require multiple classification and grading. It can be applied to everything.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による自動選別装置の全体構成
を示す一部断面正面図、第2図は第1図の装置の
各構成部を説明するための一部断面斜視図、第3
図は本発明による分類の形態を示す説明図、第4
図は本発明による選別装置を概略化したシステム
ブロツク線図、第5図は本発明の応用例を示す一
部斜視図である。 1……マグネツトストツカ、2……円形ドラ
ム、3……接点(測定部)、4,5……テスタ、
6……ダイオード抜き取り機構、7……ホツパ状
シユート、8……搬送チエーン、9……ホツパ状
シユート、10……揺動シユート、11……1次
分類棚、12……感知器、13……シヤツタ、1
4……回転テーブル、15……シヤツタ、16…
…固定テーブル、17……収納ビン、18……感
知器、19……コンピユータ、20……制御部、
21……テープリーダ、22……タイプライタ、
23……ベルト体。
FIG. 1 is a partially sectional front view showing the overall configuration of an automatic sorting device according to the present invention, FIG. 2 is a partially sectional perspective view illustrating each component of the device in FIG. 1, and FIG.
The figure is an explanatory diagram showing the form of classification according to the present invention.
The figure is a system block diagram schematically illustrating a sorting device according to the present invention, and FIG. 5 is a partial perspective view showing an application example of the present invention. 1... Magnetic stocker, 2... Circular drum, 3... Contact (measuring part), 4, 5... Tester,
6... Diode extraction mechanism, 7... Hopper-shaped chute, 8... Conveyance chain, 9... Hopper-shaped chute, 10... Rocking chute, 11... Primary sorting shelf, 12... Sensor, 13... ...Shattuta, 1
4... Rotating table, 15... Shutter, 16...
... fixed table, 17 ... storage bin, 18 ... sensor, 19 ... computer, 20 ... control unit,
21... tape reader, 22... typewriter,
23...Belt body.

Claims (1)

【特許請求の範囲】 1 供給された電子部品の特性を測定する測定部
と、前記測定部の測定結果に基づいて、電子部品
を分類する1列の複数シユートを有する1次分類
部、前記1次分類部で分類された電子部品をさら
に分類し、前記1次分類部のシユートの列に対し
て、略直角方向に移動する複数列のシユートを設
けた2次分類部とからなる分類部を有すると共
に、前記測定部及び前記1次分類部を複数個設
け、前記1次分類部を前記2次分類部上に並列し
て設置していることを特徴とする電子部品選別装
置。 2 上記測定部と上記1次分類部とは、1対1に
対応する様に設置されている特許請求の範囲第1
項記載の電子部品選別装置。 3 上記2次分類部は、上記1次分類部のシユー
トの列に対応して円周方向に複数列のシユートを
有する回転テーブルと、前記回転テーブルに設け
られた各シユートに対応する様に配列されたシユ
ートを有する固定テーブルとからなる特許請求の
範囲第1項又は第2項に記載の電子部品選別装
置。
[Scope of Claims] 1. A measuring section for measuring characteristics of supplied electronic components; and a primary classification section having a plurality of chutes in one row for classifying electronic components based on the measurement results of the measuring section; The electronic parts classified in the secondary classification section are further classified, and the classification section is composed of a secondary classification section provided with multiple rows of chute that move in a direction approximately perpendicular to the row of chute of the primary classification section. An electronic component sorting device comprising: a plurality of measurement units and a plurality of primary classification units, and the primary classification unit is installed in parallel on the secondary classification unit. 2. The measurement section and the primary classification section are installed in a one-to-one correspondence.
The electronic component sorting device described in Section 1. 3 The secondary sorting section includes a rotary table having a plurality of rows of chute in the circumferential direction corresponding to the rows of chute of the primary sorting section, and a rotary table arranged so as to correspond to each chute provided on the rotary table. An electronic component sorting device according to claim 1 or 2, comprising a fixed table having a chute.
JP6394579A 1979-05-25 1979-05-25 Electronic parts selector Granted JPS55156331A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6394579A JPS55156331A (en) 1979-05-25 1979-05-25 Electronic parts selector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6394579A JPS55156331A (en) 1979-05-25 1979-05-25 Electronic parts selector

Publications (2)

Publication Number Publication Date
JPS55156331A JPS55156331A (en) 1980-12-05
JPS6351273B2 true JPS6351273B2 (en) 1988-10-13

Family

ID=13243984

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6394579A Granted JPS55156331A (en) 1979-05-25 1979-05-25 Electronic parts selector

Country Status (1)

Country Link
JP (1) JPS55156331A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015068761A (en) * 2013-09-30 2015-04-13 澁谷工業株式会社 Article sorting device

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI64862C (en) * 1982-02-05 1984-01-10 Kone Oy REQUIREMENTS FOR PHOTOMETRIC MAINTENANCE OF THE REQUIREMENTS AND REACTIONS
JP4850409B2 (en) * 2004-11-22 2012-01-11 株式会社オーテックメカニカル Parts distribution device
KR20120015034A (en) * 2010-08-11 2012-02-21 디엔씨엔지니어링 주식회사 The examination and classification equipment for led package
JP5630300B2 (en) * 2011-02-07 2014-11-26 澁谷工業株式会社 Sorting device
JP6460804B2 (en) * 2015-01-15 2019-01-30 株式会社新川 Classification apparatus and classification method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015068761A (en) * 2013-09-30 2015-04-13 澁谷工業株式会社 Article sorting device

Also Published As

Publication number Publication date
JPS55156331A (en) 1980-12-05

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