JPS635002Y2 - - Google Patents
Info
- Publication number
- JPS635002Y2 JPS635002Y2 JP4347182U JP4347182U JPS635002Y2 JP S635002 Y2 JPS635002 Y2 JP S635002Y2 JP 4347182 U JP4347182 U JP 4347182U JP 4347182 U JP4347182 U JP 4347182U JP S635002 Y2 JPS635002 Y2 JP S635002Y2
- Authority
- JP
- Japan
- Prior art keywords
- tube
- torch
- tip
- sample introduction
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 8
- 229910052786 argon Inorganic materials 0.000 claims description 4
- 230000009467 reduction Effects 0.000 claims description 2
- 230000004323 axial length Effects 0.000 claims 1
- 230000005674 electromagnetic induction Effects 0.000 claims 1
- 239000000523 sample Substances 0.000 description 35
- 230000004044 response Effects 0.000 description 13
- 230000004043 responsiveness Effects 0.000 description 13
- 238000009616 inductively coupled plasma Methods 0.000 description 7
- 235000002639 sodium chloride Nutrition 0.000 description 6
- 150000003839 salts Chemical class 0.000 description 5
- 239000000112 cooling gas Substances 0.000 description 4
- 238000002474 experimental method Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 238000001556 precipitation Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000004031 devitrification Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000001637 plasma atomic emission spectroscopy Methods 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000012488 sample solution Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4347182U JPS58145549U (ja) | 1982-03-25 | 1982-03-25 | プラズマ発光分析用ト−チ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4347182U JPS58145549U (ja) | 1982-03-25 | 1982-03-25 | プラズマ発光分析用ト−チ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58145549U JPS58145549U (ja) | 1983-09-30 |
| JPS635002Y2 true JPS635002Y2 (OSRAM) | 1988-02-10 |
Family
ID=30054558
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4347182U Granted JPS58145549U (ja) | 1982-03-25 | 1982-03-25 | プラズマ発光分析用ト−チ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58145549U (OSRAM) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3057184B2 (ja) * | 1991-04-26 | 2000-06-26 | 横河電機株式会社 | プラズマ発生装置 |
| JP6398206B2 (ja) * | 2013-02-21 | 2018-10-03 | 宇部興産株式会社 | 微量不純物を分析する方法、及び当該分析に用いるプラズマトーチ |
-
1982
- 1982-03-25 JP JP4347182U patent/JPS58145549U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58145549U (ja) | 1983-09-30 |
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