JPS6349684Y2 - - Google Patents

Info

Publication number
JPS6349684Y2
JPS6349684Y2 JP1981198029U JP19802981U JPS6349684Y2 JP S6349684 Y2 JPS6349684 Y2 JP S6349684Y2 JP 1981198029 U JP1981198029 U JP 1981198029U JP 19802981 U JP19802981 U JP 19802981U JP S6349684 Y2 JPS6349684 Y2 JP S6349684Y2
Authority
JP
Japan
Prior art keywords
collimator
jig
fluorescent
ray
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981198029U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5897507U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19802981U priority Critical patent/JPS5897507U/ja
Publication of JPS5897507U publication Critical patent/JPS5897507U/ja
Application granted granted Critical
Publication of JPS6349684Y2 publication Critical patent/JPS6349684Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP19802981U 1981-12-24 1981-12-24 螢光ｘ線膜厚計に於ける治具体 Granted JPS5897507U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19802981U JPS5897507U (ja) 1981-12-24 1981-12-24 螢光ｘ線膜厚計に於ける治具体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19802981U JPS5897507U (ja) 1981-12-24 1981-12-24 螢光ｘ線膜厚計に於ける治具体

Publications (2)

Publication Number Publication Date
JPS5897507U JPS5897507U (ja) 1983-07-02
JPS6349684Y2 true JPS6349684Y2 (index.php) 1988-12-21

Family

ID=30111229

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19802981U Granted JPS5897507U (ja) 1981-12-24 1981-12-24 螢光ｘ線膜厚計に於ける治具体

Country Status (1)

Country Link
JP (1) JPS5897507U (index.php)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6124883U (ja) * 1984-07-20 1986-02-14 日立マクセル株式会社 デイスクカ−トリツジ

Also Published As

Publication number Publication date
JPS5897507U (ja) 1983-07-02

Similar Documents

Publication Publication Date Title
US6301007B1 (en) Machine tool locator
KR101972768B1 (ko) 구조 안전진단용 균열길이 측정장치
BRPI0711890A2 (pt) método para determinação do ángulo de divergência entre uma imagem primária e uma imagem secundária gerada por uma vidraça, programa de computador, e método para determinação de um ángulo de divergência entre uma imagem primária e uma imagem secundária gerada por uma vidraça
US5764367A (en) Method and apparatus for measuring a position of a web or sheet
CN113369681A (zh) 一种激光焊接焦距的检测装置
JPS6349684Y2 (index.php)
JPH09178404A (ja) ネジ深さ測定具
CN115096219B (zh) 用于透明陶瓷板拼接平面度的检测装置及半定量测试方法
EP0390478A1 (en) X-ray apparatus for measuring film thickness
CN215145675U (zh) 一种激光焊接焦距的检测装置
US4053782A (en) Device for aligning an x-ray source with an image receptor
JPS6352329B2 (index.php)
JPH03181848A (ja) 半導体材料評価装置
JPH06507722A (ja) 板ガラスの曲げ率を測定する方法及び装置
JPH0125283Y2 (index.php)
JP2001013038A (ja) 車両正対方法及びこの方法に用いるヘッドライトテスタ
CN119023712B (zh) 一种小径管控制成像的方法及工具
JPS628038A (ja) 粒子解析装置
JP3787028B2 (ja) 変位測定装置
SU1379617A1 (ru) Способ контрол чистоты поверхности
JPH0733147Y2 (ja) レンズ焦点位置測定具
WO2000000814A1 (en) Contact angle measuring apparatus
JPS6078309A (ja) 螢光ｘ線膜厚計
JPH02221847A (ja) 微小部ｘ線回折装置の光軸調整方法および光軸調整治具
CN108132027A (zh) 准直测量仪器一体化校零及对准装置