JPS6348576B2 - - Google Patents

Info

Publication number
JPS6348576B2
JPS6348576B2 JP61235970A JP23597086A JPS6348576B2 JP S6348576 B2 JPS6348576 B2 JP S6348576B2 JP 61235970 A JP61235970 A JP 61235970A JP 23597086 A JP23597086 A JP 23597086A JP S6348576 B2 JPS6348576 B2 JP S6348576B2
Authority
JP
Japan
Prior art keywords
halogen
ccl
treatment layer
waste gas
treatment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP61235970A
Other languages
Japanese (ja)
Other versions
JPS6391129A (en
Inventor
Takao Yagi
Chitoshi Nogami
Kunihiko Koike
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iwatani Corp
Original Assignee
Iwatani Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iwatani Corp filed Critical Iwatani Corp
Priority to JP61235970A priority Critical patent/JPS6391129A/en
Publication of JPS6391129A publication Critical patent/JPS6391129A/en
Publication of JPS6348576B2 publication Critical patent/JPS6348576B2/ja
Granted legal-status Critical Current

Links

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は、CCl4を含むハロゲン系廃ガスの処
理装置に関し、特に、化学的に安定で処理の難し
いCCl4を初め、ドライエツチング廃ガス等に含
まれる有毒なハロゲン系ガスを効率良く、確実に
除去し、しかも、装置の耐久性を向上できるもの
を提供する。
[Detailed Description of the Invention] <Industrial Application Field> The present invention relates to a treatment device for halogen-based waste gas containing CCl 4 , and in particular for dry etching waste gas such as CCl 4 , which is chemically stable and difficult to process. To provide an apparatus capable of efficiently and surely removing toxic halogen gas contained in etc., and improving the durability of the device.

〈従来技術〉 現在、ハロゲン系ガスはドライエツチング、ド
ーピング等の半導体用を初めとして、光フアイバ
ー、エキシマレーザー等にも拡く使用されてい
る。
<Prior Art> At present, halogen-based gases are widely used not only for dry etching and doping for semiconductors, but also for optical fibers, excimer lasers, and the like.

しかしながら、このハロゲン系ガスは毒性が強
いので、使用後には不活性ガスやガス状フツ化物
で希釈したうえで、中に含まれる有毒ガスが安全
な低濃度になるように当該ハロゲン系廃ガスを処
理する必要がある。
However, this halogen-based gas is highly toxic, so after use, it must be diluted with an inert gas or gaseous fluoride, and the halogen-based waste gas must be diluted to a safe low concentration of toxic gases. need to be processed.

ハロゲン系有毒ガスを含む廃ガスの処理装置と
しては、例えば、F2含有廃ガスをソーダ石灰、
活性アルミナ等で常温処理する装置が知られてい
るのを初め、F2含有廃ガスを炭酸石灰若しくは
消石灰で処理するものが特公昭54−35191号公報
に、HF含有廃ガスを活性アルミナで処理するも
のが特公昭57−92号公報に、また、HCl含有ガス
を粒状焼成ドロマイトで処理するものが特開昭57
−150526号公報に各々開示されている。
As a treatment device for waste gas containing halogen-based toxic gases, for example, waste gas containing F2 can be treated with soda lime,
There are known devices that treat F2-containing waste gas at room temperature with activated alumina, etc., as well as devices that treat F2 -containing waste gas with carbonated lime or slaked lime, as described in Japanese Patent Publication No. 54-35191. A method for treating HCl-containing gas with granular calcined dolomite is disclosed in Japanese Patent Publication No. 1983-92, and a method for treating HCl-containing gas with granular calcined dolomite is disclosed in Japanese Patent Publication No. 57-92.
-150526, respectively.

〈発明が解決しようとする問題点〉 実際にドライエツチング廃ガスには、Cl2
BCl3、SiCl4等の他にCCl4が含まれている場合が
多く、前三者が比較的容易にアルカリ水溶液に反
応するのに対し、CCl4は安定であつて当該アル
カリ水溶液にも反応せず、このため、CCl4含有
ハロゲン系廃ガスを湿式処理する装置としては有
効なものがないのが現状である。
<Problems to be solved by the invention> Actually, dry etching waste gas contains Cl 2 ,
CCl 4 is often included in addition to BCl 3 , SiCl 4 , etc., and while the former three react relatively easily with aqueous alkaline solutions, CCl 4 is stable and reacts with aqueous alkaline solutions as well. Therefore, there is currently no effective device for wet treatment of CCl 4 -containing halogen waste gas.

また、上記CCl4含有廃ガスを乾式処理する装
置としては、粉末状の活性炭を充填した処理装置
が知られており、活性炭によりCCl4を吸着除去
するものである。
Furthermore, as a device for dry processing the CCl 4 -containing waste gas, a processing device filled with powdered activated carbon is known, and the activated carbon adsorbs and removes CCl 4 .

しかしながら、上記吸着処理装置においては再
びCCl4が脱着してくる虞れがあるうえ、処理が
長期に及べば、CCl4に対する吸着能力が低下し
て来る虞れもある。
However, in the adsorption treatment apparatus described above, there is a risk that CCl 4 will be desorbed again, and if the treatment continues for a long time, there is also a possibility that the adsorption capacity for CCl 4 will decrease.

一方、叙上のように、CCl4以外のハロゲン系
廃ガスを乾式処理する装置は多種あるが、含有濃
度の低いハロゲン系廃ガスをソーダ石灰を初めと
する固形処理剤に接触させてもその除去効率は低
い場合が多いうえ、装置の腐食が進行して長期処
理に耐え得ないことも少なくない。
On the other hand, as mentioned above, there are many types of dry processing equipment for halogen waste gases other than CCl 4 , but even if halogen waste gas with a low concentration is brought into contact with solid processing agents such as soda lime, the Removal efficiency is often low, and the equipment often becomes corroded and cannot withstand long-term treatment.

本発明は、処理の困難なCCl4を初め、他のハ
ロゲン系ガスを含有濃度が低い場合でも確実に排
除するとともに、処理装置の長期使用を可能なら
しめることを技術的課題とする。
The technical problem of the present invention is to reliably eliminate CCl 4 , which is difficult to process, and other halogen gases even if the concentration thereof is low, and to enable long-term use of a processing device.

〈問題点を解決するための手段〉 (1) CCl4は鉄又はアルミニウムを触媒として加
水分解されることを出発点として種々検討の結
果、水の存在下に酸化アルミニウムを反応物と
してCCl4に作用させると加水分解反応を起こ
して、処理の容易なHCl、CO2、AlCl3に分解
されると推定できること、 (2) 固形処理剤に水分が含まれていると、ハロゲ
ン系ガスとの接触面積を減らして除去効率が低
下すること、 そして、上記水分はハロゲン系ガスと反応し
てHCl、HF等の酸性ガスを生成せしめ、装置
の腐触を進行させること、 を新たに見い出し、この発見に基いて本発明を完
成した。
<Means for solving the problem> (1) As a result of various studies, starting from the idea that CCl 4 is hydrolyzed using iron or aluminum as a catalyst, we found that CCl 4 can be converted to CCl 4 using aluminum oxide as a reactant in the presence of water. It can be assumed that when exposed to water, a hydrolysis reaction occurs and decomposition into HCl, CO 2 and AlCl 3 , which are easy to treat. (2) If the solid processing agent contains water, contact with halogen gas We have newly discovered that reducing the area reduces the removal efficiency, and that the above moisture reacts with halogen gases to generate acidic gases such as HCl and HF, which accelerates corrosion of the equipment. The present invention was completed based on this.

即ち、本発明は、処理装置に固形処理層を組み
込み、処理装置の入口にガス導入ラインを、ま
た、その出口にガス導出ラインを各々接続して、
CCl4含有ハロゲン系廃ガスを上記ガス導入ライ
ンから導入し、固形処理層でハロゲン系ガスの濃
度を低減させてガス導出ラインから導出するよう
にしたCCl4を含むハロゲン系廃ガスの処理装置
において、水分を伴う酸化アルミニウム処理層の
少なくとも下流側に、予め脱水乾燥させたソーダ
石灰処理層を直列状に配置して固形処理層を構成
し、第1段目でCCl4含有ハロゲン系廃ガスを酸
化アルミニウム処理層に通してCCl4を分解除去
し、第2段目でCCl4を除く他のハロゲン系ガス
をソーダ石灰処理層で除去するようにしたことを
特徴とするものである。
That is, the present invention incorporates a solid treatment layer into a processing device, connects a gas introduction line to the inlet of the processing device, and connects a gas outlet line to the outlet thereof,
In a treatment device for halogen-based waste gas containing CCl 4 , the halogen-based waste gas containing CCl 4 is introduced through the gas introduction line, the concentration of the halogen-based gas is reduced in a solid treatment layer, and the halogen-based waste gas is led out from the gas outlet line. At least downstream of the moisture-containing aluminum oxide treatment layer, a soda lime treatment layer that has been previously dehydrated and dried is arranged in series to form a solid treatment layer, and in the first stage, CCl 4 -containing halogen waste gas is removed. It is characterized in that CCl 4 is decomposed and removed by passing through an aluminum oxide treatment layer, and in the second stage, other halogen gases other than CCl 4 are removed by a soda lime treatment layer.

固形処理層に充填されるソーダ石灰はか粒状若
しくは粉末状とする。
The soda lime filled in the solid treatment layer is in the form of granules or powder.

当該ソーダ石灰は、廃ガスに接触させる前に予
め脱水乾燥処理を施される。この処理は常温で真
空乾燥しても良いが、300℃で5時間程度加熱乾
燥するのが好ましい。
The soda lime is previously subjected to dehydration and drying treatment before being brought into contact with the waste gas. This treatment may be carried out by vacuum drying at room temperature, but it is preferable to heat dry at 300° C. for about 5 hours.

上記酸化アルミニウムは、工業的にはα型、γ
型アルミナであつて、か粒状、粉末状を問わな
い。また、結晶水を有する水和アルミナが好まし
いが、結晶水を持たないものであつても差し支え
ない。この場合には、別途処理剤として水分を補
填する必要がある。
The above aluminum oxide is industrially α type, γ type
Type alumina, whether in granular or powder form. Further, hydrated alumina having crystal water is preferable, but hydrated alumina without crystal water may also be used. In this case, it is necessary to supplement moisture with a separate processing agent.

上記処理装置は、2つの反応筒を直列状に結
び、個々の反応筒に固形処理層を収容したもので
あつても、また、1つの反応筒内に固形処理層を
まとめて収容したものでも差し支えない。
The above-mentioned processing apparatus may be one in which two reaction tubes are connected in series and the solid treatment layer is housed in each reaction tube, or one in which the solid treatment layer is housed all together in one reaction tube. No problem.

上記固形処理層は、酸化アルミニウム処理層の
少なくとも下流側にソーダ石灰処理層を直列状に
配置して構成され、酸化アルミニウム処理層→ソ
ーダ石灰処理層のように二層状に形成することを
初め、当該酸化アルミニウム処理層の上流側にソ
ーダ石灰処理層を追加して三層状に構成すること
もできる。
The solid treatment layer is formed by arranging a soda lime treatment layer in series at least on the downstream side of the aluminum oxide treatment layer, and is formed in two layers such as the aluminum oxide treatment layer → soda lime treatment layer, It is also possible to add a soda lime treatment layer upstream of the aluminum oxide treatment layer to form a three-layer structure.

〈作用〉 ガス導入ラインから導入されたCCl4含有ハロ
ゲン系廃ガスが上流側の酸化アルミニウム処理層
に接触すると、その中に含まれるCCl4は、酸化
アルミニウム及び水により、化学量論的な加水分
解反応を受けて、処理の容易なHCl、CO2
AlCl3に分解されてしまうと推定できる。
<Function> When the CCl 4 -containing halogen waste gas introduced from the gas introduction line comes into contact with the aluminum oxide treatment layer on the upstream side, the CCl 4 contained therein is stoichiometrically hydrated by aluminum oxide and water. HCl, CO 2 , which undergoes a decomposition reaction and is easy to treat,
It can be estimated that it will be decomposed into AlCl 3 .

CCl4を除く他のハロゲン系ガス、例えば、Cl2
BCl3、SiCl4、F2、BF3等は上記酸化アルミニウ
ム処理層内を分解されることなく素通りして、下
流側のソーダ石灰処理層に到達する。
Other halogen gases except CCl4 , such as Cl2 ,
BCl 3 , SiCl 4 , F 2 , BF 3 and the like pass through the aluminum oxide treatment layer without being decomposed and reach the soda lime treatment layer on the downstream side.

このため、上記ソーダ石灰処理層にはCCl4
分解して生成したHClを初め、酸化アルミニウム
処理層を素通りしたCCl4以外のハロゲン系ガス
が接触して、これらがまとめて除去される。
Therefore, the soda-lime treatment layer is contacted with HCl generated by decomposition of CCl 4 and other halogen gases other than CCl 4 that have passed through the aluminum oxide treatment layer, and these are removed all at once.

この場合、当該ソーダ石灰は予め脱水乾燥され
ているので、ソーダ石灰の表面が水分で覆われる
ことがなく、廃ガスと接触し得るソーダ石灰の表
面積を大きく確保できる。
In this case, since the soda lime has been dehydrated and dried in advance, the surface of the soda lime is not covered with moisture, and a large surface area of the soda lime that can come into contact with the waste gas can be ensured.

また、ソーダ石灰中の水分がほとんど排除され
るので、廃ガス中のハロゲン系ガス、例えば、
Cl2、BCl3、F2等がこの水分と反応してHCl、
HF等の酸性ガスを生じ、この酸性ガスにより装
置が腐食するということもなくせる。
In addition, since most of the moisture in soda lime is removed, halogen gases in waste gas, such as
Cl 2 , BCl 3 , F 2 , etc. react with this moisture to form HCl,
This eliminates the possibility of generating acidic gas such as HF and causing corrosion of the equipment.

但し、処理装置の腐食は水分の存在下に酸性ガ
スが発生した場合に起こるのであつて、水分がほ
とんど排除されたソーダ石灰層に、CCl4の分解
で生成したHClが上流側から流れて来ても、水分
によつてイオン化されないので装置の腐食はな
い。
However, corrosion of processing equipment occurs when acidic gas is generated in the presence of moisture, and HCl generated by decomposition of CCl 4 flows from upstream into the soda lime layer from which almost all moisture has been removed. However, since it is not ionized by moisture, there is no corrosion of the equipment.

この結果、CCl4含有ハロゲン系ガスを処理装
置に通すと、まずCCl4が酸化アルミニウム処理
層で分解除去され、これ以外のハロゲン系ガスは
ソーダ石灰処理層で除去されるので、ガス導出ラ
インからは許容限界以下の濃度に低減されたハロ
ゲン系ガスが排出される。
As a result, when CCl 4 -containing halogen gas is passed through the processing equipment, CCl 4 is first decomposed and removed in the aluminum oxide treatment layer, and other halogen gases are removed in the soda lime treatment layer, so that they are removed from the gas outlet line. In this case, halogen-based gases whose concentration is reduced to below the permissible limit are discharged.

〈発明の効果〉 (1) 酸化アルミニウム処理装置において、CCl4
は化学量論的に分解されるので、低濃度に稀釈
されたCCl4含有廃ガスでも、反応物である酸
化アルミニウムと水が処理装置内に存在する限
り、有効に加水分解反応を継続して、確実に
CCl4を許容限界以下に低減できる。
<Effects of the invention> (1) In the aluminum oxide treatment equipment, CCl 4
is decomposed stoichiometrically, so even if the waste gas contains CCl4 diluted to a low concentration, as long as the reactants aluminum oxide and water are present in the treatment equipment, the hydrolysis reaction can continue effectively. ,surely
CCl 4 can be reduced to below permissible limits.

また、CCl4を処理の容易な他の物質に分解
してしまうので、吸着反応のようにCCl4が再
び脱着して来るという虞れは全くなく、CCl4
を根本的に排除できる。
In addition, since CCl 4 is decomposed into other substances that are easy to process, there is no risk that CCl 4 will be desorbed again as in an adsorption reaction.
can be fundamentally eliminated.

しかも、ソーダ石灰処理層において、廃ガス
と接触し得るソーダ石灰の表面積を大きく確保
できるので、低濃度のハロゲン系廃ガスでも十
分にこれを許容限界以下の濃度に除去できる。
Furthermore, since a large surface area of soda lime that can come into contact with waste gas can be ensured in the soda lime treatment layer, even a low concentration of halogen waste gas can be sufficiently removed to a concentration below the permissible limit.

これにより、CCl4を初め、多種のハロゲン
系ガスを含むドライエツチング廃ガス等を含有
濃度が低い場合でも確実に排除できる。
This makes it possible to reliably eliminate dry etching waste gas and the like containing various halogen-based gases, including CCl4 , even if the concentration thereof is low.

(2) ソーダ石灰中の水分をほとんど排除できるの
で、ハロゲン系ガスとの接触によつても酸性ガ
スの発生がないうえ、上流側から当該ソーダ石
灰処理層にHClが流れて来ても水分によつてイ
オン化されないので、処理装置の腐食はなく、
長期に亘つて処理を継続できる。
(2) Since most of the moisture in soda lime can be removed, no acid gas is generated even when it comes into contact with halogen-based gas, and even if HCl flows into the soda lime treatment layer from the upstream side, it will not be converted to moisture. As it is not ionized, there is no corrosion of processing equipment.
Processing can be continued for a long period of time.

(3) 下流側のソーダ石灰処理層が固形状であるの
で、上流側の酸化アルミニウム処理層に水和ア
ルミナを充填すれば、CCl4含有ハロゲン系廃
ガスを簡便、迅速に乾式処理できる。
(3) Since the soda lime treatment layer on the downstream side is solid, if the aluminum oxide treatment layer on the upstream side is filled with hydrated alumina, the CCl4- containing halogen-based waste gas can be easily and quickly dry-treated.

また、乾式で処理すれば、装置全体の構造も
簡略にできる。
Moreover, if the process is carried out in a dry manner, the structure of the entire apparatus can be simplified.

〈実施例〉 以下、本発明の実施例を図面に基づいて説明す
る。
<Example> Hereinafter, an example of the present invention will be described based on the drawings.

第1図は第1実施例を示す処理装置の概略説明
図であつて、処理装置1の入口2にガス導入ライ
ン3を入・切弁4を介して接続し、その出口5に
ガス導出ライン6を入・切弁7を介して接続す
る。
FIG. 1 is a schematic explanatory diagram of a processing apparatus showing a first embodiment, in which a gas introduction line 3 is connected to an inlet 2 of the processing apparatus 1 via an in/off valve 4, and a gas outlet line is connected to an outlet 5 of the processing apparatus 1. 6 is connected via an on/off valve 7.

上記ガス導入ライン3にはロータリポンプ8を
接続して、CCl4含有ハロゲン系廃ガスをN2等の
不活性ガスで稀釈して処理装置1に圧送可能に構
成する。
A rotary pump 8 is connected to the gas introduction line 3 so that the CCl 4 -containing halogen-based waste gas can be diluted with an inert gas such as N 2 and then pumped to the processing device 1 .

CCl4含有ハロゲン系廃ガスは、冒述したよう
に、半導体製造過程で出るドライエツチング廃ガ
ス等を指し、具体的には、CCl4を含むほか、Cl2
HCl、BCl3、SiCl4、SiH2Cl2等の塩素系有毒ガ
ス、及び、F2、HF、BF3、SiF4、GeF4、MoF6
WF6等のフツ素系有毒ガスの少なくとも一種を
併存するものである。
As mentioned above, the CCl 4 -containing halogen-based waste gas refers to the dry etching waste gas generated during the semiconductor manufacturing process, and specifically, in addition to containing CCl 4 , it also contains Cl 2 ,
Chlorine-based toxic gases such as HCl, BCl 3 , SiCl 4 , SiH 2 Cl 2 , and F 2 , HF, BF 3 , SiF 4 , GeF 4 , MoF 6 ,
At least one type of fluorine-based toxic gas such as WF 6 coexists.

また、有毒ハロゲン系ガスは、安全のために所
定のガスで稀釈して含有濃度を下げたうえで、廃
ガスとして処理装置に導入される。
Further, for safety, the toxic halogen gas is diluted with a predetermined gas to lower its concentration, and then introduced into the processing device as waste gas.

尚、上記稀釈ガスには、N2、CO2、He、Ar、
Ne等の不活性ガス或いはCF4、C2F6、SF6等の不
活性なガス状フツ化物が用いられる。
In addition, the above dilution gas includes N 2 , CO 2 , He, Ar,
An inert gas such as Ne or an inert gaseous fluoride such as CF 4 , C 2 F 6 or SF 6 is used.

上記処理装置1は、2つの垂直固定床式反応筒
10,12を入・切弁16を介して直列状に接続
して構成される。
The processing apparatus 1 is constructed by connecting two vertical fixed bed reaction columns 10 and 12 in series via an on/off valve 16.

上流側の反応筒10には、か粒状の水和アルミ
ナを充填した酸化アルミニウム処理層14を組み
込む。
An aluminum oxide treatment layer 14 filled with granular hydrated alumina is installed in the upstream reaction column 10 .

当該反応筒10の周壁には加熱ヒータが付設さ
れ、処理層14にCA熱電対等の温度センサーを
埋没させて、筒内温度を調整可能にする。
A heater is attached to the peripheral wall of the reaction tube 10, and a temperature sensor such as a CA thermocouple is embedded in the processing layer 14, so that the temperature inside the tube can be adjusted.

また、下流側の反応筒12には、粉末状のソー
ダ石灰を充填したソーダ石灰処理層15を組み込
み、筒内に加熱ヒータを上記反応筒10のように
付設する。
Further, a soda lime treatment layer 15 filled with powdered soda lime is installed in the reaction tube 12 on the downstream side, and a heater is provided inside the tube like the reaction tube 10 described above.

上記ソーダ石灰は叙上のように、予め脱水乾燥
させて水分を除去し、廃ガスとの接触面積を大き
く確保しておく。
As mentioned above, the soda lime is dehydrated and dried in advance to remove moisture and ensure a large contact area with the waste gas.

そこで、例えば、塩素系ドライエツチング廃ガ
スを通した場合の上記処理装置の機能を述べる
と、まず、水和アルミナ充填反応筒10の温度を
350℃に、ソーダ石灰充填反応筒12の温度を250
℃に各々設定し、エツチング装置から排出される
塩素系ガスをロータリポンプ8によりN2で稀釈
したうえで、ガス導入ライン3から処理装置1に
導入する。
Therefore, for example, to describe the function of the above treatment device when chlorine-based dry etching waste gas is passed through, first, the temperature of the hydrated alumina-filled reaction tube 10 is controlled.
The temperature of the soda-lime-filled reactor 12 was set at 350°C and 250°C.
℃, and the chlorine-based gas discharged from the etching apparatus is diluted with N 2 by the rotary pump 8 and then introduced into the processing apparatus 1 through the gas introduction line 3.

CCl4、Cl2、BCl3等を含むハロゲン系廃ガスが
処理装置1に入ると、まずCCl4が酸化アルミニ
ウム処理層14により分解除去され、他のガスは
分解反応を受けずに素通りしてしまう。
When halogen-based waste gas containing CCl 4 , Cl 2 , BCl 3 , etc. enters the treatment device 1 , CCl 4 is first decomposed and removed by the aluminum oxide treatment layer 14 , and other gases pass through without undergoing a decomposition reaction. Put it away.

CCl4は加水分解反応を受けて、HCl、CO2
AlCl3に分解されると推定され、これらのうち
AlCl3は反応筒10の出口乃至下流側へのライン
途上で冷却されて、これらの内壁内に凝固し、他
のHCl、CO2は下流側の反応筒12に到達する。
CCl 4 undergoes a hydrolysis reaction to form HCl, CO 2 ,
It is estimated that it is decomposed into AlCl 3 , of which
AlCl 3 is cooled along the line from the outlet of the reaction tube 10 to the downstream side and solidifies within these inner walls, while other HCl and CO 2 reach the reaction tube 12 on the downstream side.

上記反応筒12では、上流側反応筒10を素通
りしたCl2、BCl3等の塩素系ガス及び同反応筒1
0で分解生成したHClがソーダ石灰によつて処理
されて許容限界以下に除去される。
In the reaction tube 12, chlorine-based gases such as Cl 2 and BCl 3 that have passed through the upstream reaction tube 10 and the reaction tube 1
The HCl decomposed at 0 is treated with soda lime and removed below acceptable limits.

この場合、第1図の仮想線で示すように、処理
装置1の入口側の入・切弁4と両反応筒間の入・
切弁16を三方弁に置き換え、この二つの入・切
弁4,16間にバイパスライン17を接続すれ
ば、例えば、ハロゲン系廃ガス中にCCl4が含ま
れていない場合には、当該廃ガスをこのバイパス
ライン17に通して直接的にソーダ石灰充填反応
筒12で処理するだけで良い。
In this case, as shown by the imaginary line in FIG.
If the cut-off valve 16 is replaced with a three-way valve and the bypass line 17 is connected between the two inlet and cut-off valves 4 and 16, for example, if the halogen-based waste gas does not contain CCl 4 , the waste gas will be It is sufficient to simply pass the gas through this bypass line 17 and treat it directly in the soda-lime-filled reactor 12.

一方、第2図は本発明の第2実施例を示し、処
理装置1を一つの反応筒18から形成し、処理装
置内の上流側に酸化アルミニウム処理層14を、
また、その下流側にソーダ石灰処理層15を二層
状に組み込んだものである。
On the other hand, FIG. 2 shows a second embodiment of the present invention, in which the processing apparatus 1 is formed from one reaction tube 18, and an aluminum oxide treatment layer 14 is provided on the upstream side of the processing apparatus.
Furthermore, a two-layer soda lime treatment layer 15 is incorporated on the downstream side thereof.

当該実施例では、反応筒が一つで済み、処理装
置全体の構造を簡略にできる。
In this embodiment, only one reaction tube is required, and the structure of the entire processing apparatus can be simplified.

第3図は本発明の第3実施例を示し、処理装置
1を一つの反応筒20で形成し、処理装置内にソ
ーダ石灰処理層15、酸化アルミニウム処理層1
4及びソーダ石灰処理層15をサンドイツチ状に
組み込んだものである。
FIG. 3 shows a third embodiment of the present invention, in which a treatment apparatus 1 is formed of one reaction tube 20, and inside the treatment apparatus there is a soda lime treatment layer 15, an aluminum oxide treatment layer 1.
4 and a soda-lime treated layer 15 are assembled in a sandwich-like pattern.

当該実施例では、CCl4以外のハロゲン系ガス
を二重に除去処理することができ、大量の廃ガス
を迅速に処理する場合に適している。
In this embodiment, halogen-based gases other than CCl 4 can be removed in a double manner, and it is suitable for rapidly processing a large amount of waste gas.

さらに、上記三層処理の場合には、第2実施例
で用いた二層状の反応筒18の上流側に、ソーダ
石灰充填反応筒10を一筒追加接続し、この全体
を処理装置1として形成しても差し支えない。
Furthermore, in the case of the above-mentioned three-layer treatment, one additional soda-lime-filled reaction tube 10 is connected to the upstream side of the two-layer reaction tube 18 used in the second embodiment, and this whole is formed as the treatment apparatus 1. It's okay to do that.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明の実施例を示すもので、第1図は
第1実施例を示す処理装置の概略説明図、第2図
は第2実施例を示す第1図相当図、第3図は第3
実施例を示す第1図相当図である。 1……処理装置、2……1の入口、3……ガス
導入ライン、5……1の出口、6……ガス導出ラ
イン、10,12,18,20……反応筒、14
……酸化アルミニウム処理層、15……ソーダ石
灰処理層。
The drawings show embodiments of the present invention; FIG. 1 is a schematic explanatory diagram of a processing device showing the first embodiment, FIG. 2 is a diagram corresponding to FIG. 1 showing the second embodiment, and FIG. 3
FIG. 1 is a diagram corresponding to FIG. 1 showing an embodiment. 1... Processing device, 2... Inlet of 1, 3... Gas introduction line, 5... Outlet of 1, 6... Gas outlet line, 10, 12, 18, 20... Reaction column, 14
...Aluminum oxide treatment layer, 15...Soda lime treatment layer.

Claims (1)

【特許請求の範囲】 1 処理装置に固形処理層を組み込み、処理装置
の入口にガス導入ラインを、また、その出口にガ
ス導出ラインを各々接続して、 CCl4含有ハロゲン系廃ガスを上記ガス導入ラ
インから導入し、固形処理層でハロゲン系ガスの
濃度を低減させてガス導出ラインから導出するよ
うにしたCCl4を含むハロゲン系廃ガスの処理装
置において、水分を伴う酸化アルミニウム処理層
の少なくとも下流側に、予め脱水乾燥させたソー
ダ石灰処理層を直列状に配置して固形処理層を構
成し、第1段目でCCl4含有ハロゲン系廃ガスを
酸化アルミニウム処理層に通してCCl4を分解除
去し、第2段目でCCl4を除く他のハロゲン系ガ
スをソーダ石灰処理層で除去するようにしたこと
を特徴とするCCl4を含むハロゲン系廃ガスの処
理装置。 2 処理装置を直列状に結んだ2つの反応筒から
形成し、上流側の反応筒に酸化アルミニウム処理
層を、また、下流側の反応筒にソーダ石灰処理層
を各々収容したことを特徴とする特許請求の範囲
第1項に記載のCCl4を含むハロゲン系廃ガスの
処理装置。 3 処理装置を1つの反応筒から形成し、反応筒
の上流側に酸化アルミニウム処理層を、下流側に
ソーダ石灰処理層を積層状に収容したことを特徴
とする特許請求の範囲第1項に記載のCCl4を含
むハロゲン系廃ガスの処理装置。 4 処理装置を1つの反応筒から形成し、反応筒
にソーダ石灰処理層、酸化アルミニウム処理層及
びソーダ石灰処理層をサンドイツチ状に収容した
ことを特徴とする特許請求の範囲第1項に記載の
CCl4を含むハロゲン系廃ガスの処理装置。 5 水分を伴う酸化アルミニウムが水和アルミナ
であることを特徴とする特許請求の範囲第1〜4
項のいずれか1項に記載のCCl4を含むハロゲン
系廃ガスの処理装置。
[Claims] 1. A solid treatment layer is installed in the treatment device, and a gas introduction line is connected to the inlet of the treatment device, and a gas outlet line is connected to the outlet of the treatment device, so that the CCl4 - containing halogen-based waste gas is converted into the above-mentioned gas. In a treatment device for halogen-based waste gas containing CCl 4 , which is introduced from an inlet line, the concentration of the halogen-based gas is reduced in a solid treatment layer, and then led out from a gas outlet line, at least one of the aluminum oxide treatment layers containing moisture is treated. On the downstream side, soda lime treatment layers that have been dehydrated and dried in advance are arranged in series to form a solid treatment layer, and in the first stage, the CCl 4 -containing halogen waste gas is passed through the aluminum oxide treatment layer to convert CCl 4 into A treatment device for halogen-based waste gas containing CCl 4 , characterized in that the halogen-based gases other than CCl 4 are removed by decomposition and removed in a second stage using a soda lime treatment layer. 2. The treatment device is formed from two reaction tubes connected in series, and the upstream reaction tube houses an aluminum oxide treatment layer, and the downstream reaction tube houses a soda lime treatment layer. A treatment device for halogen-based waste gas containing CCl 4 according to claim 1. 3. Claim 1, characterized in that the treatment device is formed from one reaction tube, and an aluminum oxide treatment layer is housed in a laminated manner on the upstream side of the reaction tube and a soda lime treatment layer is housed on the downstream side. A treatment device for halogen-based waste gas containing CCl 4 as described above. 4. The treatment device as set forth in claim 1, wherein the treatment device is formed from one reaction tube, and the reaction tube houses a soda lime treatment layer, an aluminum oxide treatment layer, and a soda lime treatment layer in the shape of a sandwich arch.
Treatment equipment for halogen waste gas containing CCl 4 . 5 Claims 1 to 4 characterized in that the aluminum oxide accompanied by moisture is hydrated alumina.
A treatment device for halogen-based waste gas containing CCl 4 according to any one of the above items.
JP61235970A 1986-10-02 1986-10-02 Device for treating halogenous waste gas containing ccl4 Granted JPS6391129A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61235970A JPS6391129A (en) 1986-10-02 1986-10-02 Device for treating halogenous waste gas containing ccl4

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61235970A JPS6391129A (en) 1986-10-02 1986-10-02 Device for treating halogenous waste gas containing ccl4

Publications (2)

Publication Number Publication Date
JPS6391129A JPS6391129A (en) 1988-04-21
JPS6348576B2 true JPS6348576B2 (en) 1988-09-29

Family

ID=16993905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61235970A Granted JPS6391129A (en) 1986-10-02 1986-10-02 Device for treating halogenous waste gas containing ccl4

Country Status (1)

Country Link
JP (1) JPS6391129A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6060034A (en) * 1998-06-02 2000-05-09 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Abatement system for ClF3 containing exhaust gases

Also Published As

Publication number Publication date
JPS6391129A (en) 1988-04-21

Similar Documents

Publication Publication Date Title
JP4424783B2 (en) Method for removing NOx and SOx from gaseous effluent from a metal pickling bath
JPS6151935B2 (en)
JP4488545B2 (en) Treatment method, treatment agent and treatment apparatus for exhaust gas containing halogen fluoride
JP2581642B2 (en) Etching exhaust gas abatement agent and exhaust gas treatment method
WO2001076725A1 (en) Method for treating exhaust gas containing fluorine-containing compound
JPS6347497B2 (en)
JPH0257974B2 (en)
JPS6348576B2 (en)
JPH06177B2 (en) Method for treating exhaust gas containing C1F (bottom 3)
KR960010382B1 (en) Treating waste gas
JP4256447B2 (en) Abatement device and abatement method
KR920007856B1 (en) Method of removing gassy acidic halogen compound
JP2691927B2 (en) How to remove harmful components
JP3260825B2 (en) How to purify harmful gases
JPH0938463A (en) Treating method of waste gas from semiconductor production
KR100684201B1 (en) Method for the abatement of waste gas comprising fluorine and its adsorption column device
WO2005077496A1 (en) Method and apparatus for treating gas containing fluorine-containing compounds
JPH0356123A (en) Removal of mercury and nox in gas
JPH1076138A (en) Treatment of waste gas containing halogen compound
JPS61129026A (en) Purification of exhaust gas
JPH0679138A (en) Method for pretreating nf3 gas
JPS6391128A (en) Method for decomposing waste gas containing ccl4
JP2000157830A (en) Exhaust gas treatment method and apparatus
JPS6388024A (en) Removal of mercury in exhaust gas
CN87102271A (en) Remove the method for the titanium tetrachloride vapors in the air-flow