JPS6346853Y2 - - Google Patents
Info
- Publication number
- JPS6346853Y2 JPS6346853Y2 JP4421183U JP4421183U JPS6346853Y2 JP S6346853 Y2 JPS6346853 Y2 JP S6346853Y2 JP 4421183 U JP4421183 U JP 4421183U JP 4421183 U JP4421183 U JP 4421183U JP S6346853 Y2 JPS6346853 Y2 JP S6346853Y2
- Authority
- JP
- Japan
- Prior art keywords
- holder
- fixed metal
- probe
- metal rod
- discharge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002184 metal Substances 0.000 claims description 64
- 238000012360 testing method Methods 0.000 claims description 31
- 239000004020 conductor Substances 0.000 claims description 22
- 239000000523 sample Substances 0.000 claims description 20
- 239000003990 capacitor Substances 0.000 claims description 11
- 238000007599 discharging Methods 0.000 claims description 5
- 239000003989 dielectric material Substances 0.000 claims description 2
- 239000012212 insulator Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 5
- 230000005855 radiation Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000004323 axial length Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4421183U JPS59151170U (ja) | 1983-03-29 | 1983-03-29 | 静電気放電試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4421183U JPS59151170U (ja) | 1983-03-29 | 1983-03-29 | 静電気放電試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59151170U JPS59151170U (ja) | 1984-10-09 |
| JPS6346853Y2 true JPS6346853Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-12-05 |
Family
ID=30174746
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4421183U Granted JPS59151170U (ja) | 1983-03-29 | 1983-03-29 | 静電気放電試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59151170U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
-
1983
- 1983-03-29 JP JP4421183U patent/JPS59151170U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59151170U (ja) | 1984-10-09 |
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