JPS6344149U - - Google Patents

Info

Publication number
JPS6344149U
JPS6344149U JP13781086U JP13781086U JPS6344149U JP S6344149 U JPS6344149 U JP S6344149U JP 13781086 U JP13781086 U JP 13781086U JP 13781086 U JP13781086 U JP 13781086U JP S6344149 U JPS6344149 U JP S6344149U
Authority
JP
Japan
Prior art keywords
signal
discrimination
circuit
defect
slope waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13781086U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0642199Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986137810U priority Critical patent/JPH0642199Y2/ja
Publication of JPS6344149U publication Critical patent/JPS6344149U/ja
Application granted granted Critical
Publication of JPH0642199Y2 publication Critical patent/JPH0642199Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1986137810U 1986-09-10 1986-09-10 欠陥弁別回路 Expired - Lifetime JPH0642199Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986137810U JPH0642199Y2 (ja) 1986-09-10 1986-09-10 欠陥弁別回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986137810U JPH0642199Y2 (ja) 1986-09-10 1986-09-10 欠陥弁別回路

Publications (2)

Publication Number Publication Date
JPS6344149U true JPS6344149U (enExample) 1988-03-24
JPH0642199Y2 JPH0642199Y2 (ja) 1994-11-02

Family

ID=31042211

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986137810U Expired - Lifetime JPH0642199Y2 (ja) 1986-09-10 1986-09-10 欠陥弁別回路

Country Status (1)

Country Link
JP (1) JPH0642199Y2 (enExample)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4957886A (enExample) * 1972-09-30 1974-06-05
JPS5190873U (enExample) * 1975-01-17 1976-07-21
JPS52125389A (en) * 1976-04-13 1977-10-21 Omron Tateisi Electronics Co Defect inspection apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4957886A (enExample) * 1972-09-30 1974-06-05
JPS5190873U (enExample) * 1975-01-17 1976-07-21
JPS52125389A (en) * 1976-04-13 1977-10-21 Omron Tateisi Electronics Co Defect inspection apparatus

Also Published As

Publication number Publication date
JPH0642199Y2 (ja) 1994-11-02

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