JPS6344106U - - Google Patents

Info

Publication number
JPS6344106U
JPS6344106U JP13678786U JP13678786U JPS6344106U JP S6344106 U JPS6344106 U JP S6344106U JP 13678786 U JP13678786 U JP 13678786U JP 13678786 U JP13678786 U JP 13678786U JP S6344106 U JPS6344106 U JP S6344106U
Authority
JP
Japan
Prior art keywords
signal
extensometer
slice
light
dark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13678786U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13678786U priority Critical patent/JPS6344106U/ja
Publication of JPS6344106U publication Critical patent/JPS6344106U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は本考案の実施例の構成を示す図、第２
図はキーボードの構成を示す図、第３図ａ，ｂは
ビデオ信号を例示する図、第４図は従来例の問題
点を説明するための図である。 １…試験片、２…標点マーク、６…ＣＣＤイメ
ージ・センサ、１１…コンパレータ、１４…スラ
イスレベル発生Ｄ／Ａ、１５…コントロール出力
ポート、１８…ＣＰＵ、２０…キーボード。 Fig. 1 is a diagram showing the configuration of an embodiment of the present invention;
This figure shows the structure of the keyboard, FIGS. 3a and 3b are diagrams illustrating video signals, and FIG. 4 is a diagram for explaining problems in the conventional example. DESCRIPTION OF SYMBOLS 1... Test piece, 2... Gauge mark, 6... CCD image sensor, 11... Comparator, 14... Slice level generation D/A, 15... Control output port, 18... CPU, 20... Keyboard.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試験片に明暗のコントラストをつけて表示され
た標点マークを読み取るイメージ・センサから出
力されるビデオ信号を予め設定されているスライ
ス信号と比較して明をあらわす信号と暗をあらわ
す信号に二値化し明暗識別信号として出力し、こ
の信号により試験片の伸びを計測する伸び計であ
つて、計測開始時のキー操作に起因して、イメー
ジ・センサから出力されるビデオ信号の明部と暗
部を示す出力レベルの中央に前記スライス信号を
取り出すためのスライスレベルを設定するスライ
スレベル設定手段を設けたことを特徴とする伸び
計。 The video signal output from the image sensor that reads the gauge mark displayed on the test piece with contrast between light and dark is compared with a preset slice signal, and a binary signal representing brightness and a signal representing darkness are generated. This is an extensometer that measures the elongation of the test specimen by outputting a light/dark identification signal. 1. An extensometer comprising slice level setting means for setting a slice level for extracting the slice signal at the center of the output level indicated by the extensometer.
JP13678786U 1986-09-06 1986-09-06 Pending JPS6344106U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13678786U JPS6344106U (en) 1986-09-06 1986-09-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13678786U JPS6344106U (en) 1986-09-06 1986-09-06

Publications (1)

Publication Number Publication Date
JPS6344106U true JPS6344106U (en) 1988-03-24

Family

ID=31040228

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13678786U Pending JPS6344106U (en) 1986-09-06 1986-09-06

Country Status (1)

Country Link
JP (1) JPS6344106U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183551A (en) * 1975-01-20 1976-07-22 Nippon Kogaku Kk SAITEICHIKENSHUTSUKAIROO JUSURU PATAANSUNHOJIDOSOKUTEISOCHI
JPS5594104A (en) * 1979-01-11 1980-07-17 Sumitomo Electric Ind Ltd Optical surface detector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183551A (en) * 1975-01-20 1976-07-22 Nippon Kogaku Kk SAITEICHIKENSHUTSUKAIROO JUSURU PATAANSUNHOJIDOSOKUTEISOCHI
JPS5594104A (en) * 1979-01-11 1980-07-17 Sumitomo Electric Ind Ltd Optical surface detector

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