JPS6333814A - Normal pressure continuous vapor growth apparatus - Google Patents
Normal pressure continuous vapor growth apparatusInfo
- Publication number
- JPS6333814A JPS6333814A JP17702786A JP17702786A JPS6333814A JP S6333814 A JPS6333814 A JP S6333814A JP 17702786 A JP17702786 A JP 17702786A JP 17702786 A JP17702786 A JP 17702786A JP S6333814 A JPS6333814 A JP S6333814A
- Authority
- JP
- Japan
- Prior art keywords
- tray
- heat insulating
- growth apparatus
- heat
- vapor phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 claims abstract description 11
- 239000007789 gas Substances 0.000 claims abstract description 7
- 235000012431 wafers Nutrition 0.000 claims description 15
- 238000001947 vapour-phase growth Methods 0.000 claims description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 2
- 229910001873 dinitrogen Inorganic materials 0.000 claims 2
- 239000012071 phase Substances 0.000 claims 1
- 239000012495 reaction gas Substances 0.000 abstract description 3
- 239000011810 insulating material Substances 0.000 abstract description 2
- 238000004140 cleaning Methods 0.000 abstract 1
- 150000001875 compounds Chemical class 0.000 description 5
- 230000007547 defect Effects 0.000 description 3
- 239000000428 dust Substances 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
[発明の目的]
(産業上の利用分野)
本発明は、ウェハを載置するための複数のトレイを連続
的に移動させながら気相成長を行なう常圧連続気相成長
装置(常圧連続CVD装置)の改良に関する。Detailed Description of the Invention [Objective of the Invention] (Industrial Application Field) The present invention relates to an atmospheric continuous vapor phase growth method in which vapor phase growth is performed while continuously moving a plurality of trays on which wafers are placed. This invention relates to improvement of a growth apparatus (normal pressure continuous CVD apparatus).
(従来技術)
従来の常圧連続気相成長装置は第2図に示すような基本
構成をしている。すなわち、スプロケットが回転する事
によりキャタピラ式に連結されたトレイbが連続的に移
動する構造となっている。(Prior Art) A conventional normal pressure continuous vapor phase growth apparatus has a basic configuration as shown in FIG. That is, the structure is such that the trays b connected in a caterpillar manner move continuously as the sprockets rotate.
ここで、ガスノズルCの下部付近にトレイb及びトレイ
b上に乗せられたウェハdを加熱する為のヒータeが装
着されている。トレイbは気相成長温度である約450
℃に加熱されると共に、その後はぼ常温まで下り、再び
450℃に加熱されるサイクルとなっている。Here, a heater e for heating the tray b and the wafer d placed on the tray b is installed near the bottom of the gas nozzle C. Tray b has a vapor growth temperature of about 450
The cycle is such that the temperature is heated to 450°C, then the temperature is lowered to about room temperature, and then heated to 450°C again.
(発明が解決しようとする問題点)
しかしながら、このような従来の常圧連続CVD装置に
おいては、トレイbの上にウェハdを乗せて反応ガスの
出るガスノズル13の下を通り連続的に膜付される構造
であるためトレイbのウェハdの無い所にはSlの化合
物の膜が時間の経過と共に堆積されていき、トレイbと
Sl化合物膜との熱膨張系数の差によりSi化合物膜に
やがてクラックが入リドレイbより剥離しダストとなり
ウェハ欠陥の原因となる。(Problems to be Solved by the Invention) However, in such a conventional normal pressure continuous CVD apparatus, the wafer d is placed on the tray b and passed under the gas nozzle 13 from which the reaction gas is emitted to form a film continuously. Because of the structure in which wafers d are not present on tray b, a film of a sl compound is deposited over time, and due to the difference in thermal expansion coefficient between tray b and the sl compound film, The cracks peel off from the redo layer b and become dust, which causes wafer defects.
このため、定期的にトレイbより81化合物膜を完全に
剥離する必要が生じ、かなり面倒であるばかりでなく、
4〜8時間といったかなり長い時間が必要であり、装置
の操業度を低めているといった問題がある。For this reason, it becomes necessary to completely peel off the 81 compound film from tray b periodically, which is not only quite troublesome but also
There is a problem in that a considerably long time of 4 to 8 hours is required, and the operating efficiency of the apparatus is reduced.
本発明は、上記事情に基づきなされたもので、その目的
とするところは、ウェハの膜付処理にあたってダストに
原因する欠陥を防止するためのトレイの清掃回数を減少
さ−せることができ、操業度を高めることを可能とした
常圧連続気相成長装置を提供しようとするものである。The present invention has been made based on the above-mentioned circumstances, and its purpose is to reduce the number of times the tray is cleaned to prevent defects caused by dust during wafer coating processing, and to reduce the number of times the tray is cleaned in order to prevent defects caused by dust during wafer coating processing. The purpose is to provide an atmospheric pressure continuous vapor phase growth apparatus that makes it possible to increase the temperature.
[発明の構成コ
(問題点を解決するための手段)
本発明は、上記問題点を解決するために、ウェハを載置
するための複数のトレイを連続的に移動させながら気相
成長を行なう常圧連続気相成長装置において、上記トレ
イを加熱する加熱手段と、この加熱手段により加熱され
るトレイの移動路を断熱部材で囲繞し内部に保温室を形
成する断熱手段とを具備してなる構成としたものである
。[Configuration of the Invention (Means for Solving the Problems) In order to solve the above problems, the present invention performs vapor phase growth while continuously moving a plurality of trays for placing wafers. An atmospheric pressure continuous vapor phase growth apparatus, comprising a heating means for heating the tray, and a heat insulating means for surrounding a moving path of the tray heated by the heating means with a heat insulating member to form an insulating chamber inside. It is structured as follows.
(作用)
すなわち、本発明は、上記の構成とすることにより、ト
レイに付着したS1化合物が剥離しないようにトレイの
温度を一定に保つことができ、これによりトレイの清掃
回数を減少させることができ、操業性を高めることが可
能となる。(Function) That is, with the above configuration, the present invention can maintain the temperature of the tray constant so that the S1 compound attached to the tray does not peel off, thereby reducing the number of times the tray is cleaned. This makes it possible to improve operability.
(実施例)
第1図に本発明の実施例を示す。図中1・・・はキャタ
ピラ式に連結されたトレイであり、これらトレイト・・
はスプロケット2,2の回転に伴って矢印A方向に無端
走行するようになっている。また、トレイ1の移動路3
の内側には加熱手段としてのヒータ4が配置されている
とともに、外側は断熱部材(保温材)5で囲繞して内部
に保温室10を構成した構成となっており、トレイ温度
を一定に保つ構成とする。ウェハ6は、断熱部材5の途
中に設けた搬入ロアからトレイ1上に載置され、ガスノ
ズル8の下を通過する間に該ガスノズル8から吹ぎ出さ
れる反応ガスにより CVD膜を形成され、断熱部材5
の途中に設けた搬出口9から搬出される。(Example) FIG. 1 shows an example of the present invention. In the figure, 1... is a tray connected in a caterpillar style, and these trays...
runs endlessly in the direction of arrow A as the sprockets 2, 2 rotate. In addition, the movement path 3 of tray 1
A heater 4 as a heating means is disposed inside the tray, and the outside is surrounded by a heat insulating material 5 to form an insulating chamber 10 to keep the tray temperature constant. composition. The wafer 6 is placed on the tray 1 from a loading lower installed in the middle of the heat insulating member 5, and while passing under the gas nozzle 8, a CVD film is formed by the reaction gas blown out from the gas nozzle 8, and the wafer 6 is heat insulated. Part 5
It is carried out from an outlet 9 provided in the middle.
この装置によれば、トレイ1は運転中はとんど一定温度
に保たれるため、トレイ1の表面に付着したCVD膜は
安定しており、簡単にはトレイ1からはがれない。According to this apparatus, since the tray 1 is kept at a constant temperature during operation, the CVD film attached to the surface of the tray 1 is stable and does not easily peel off from the tray 1.
トレイ1上のCVD膜の厚さが限界に達したならば、ト
レイ1へのウェハ6の搬入を停止し、搬入ずみのウェハ
6の処理の完了を待ってヒータ4をオフにし、好ましく
は搬入ロア、搬出口9.ガスノズル8またはヒータ4と
断熱部材5との間などから冷風を送って、トレイ1の表
面に付着したCVD膜を急冷してクラックを発生させ、
該CVD膜の剥離を容易にすると共に、トレイ1を短時
間で冷却することが好ましい。トレイ1からのCVD膜
の剥離はトレイ1を搬入または搬出ロア、9から取出し
、m浄なものと交換して、機外で行なうことになる。When the thickness of the CVD film on the tray 1 reaches its limit, the loading of wafers 6 to the tray 1 is stopped, the heater 4 is turned off after waiting for the processing of the loaded wafers 6 to be completed, and preferably, the loading of the wafers 6 is stopped. Lower, unloading port 9. Cool air is sent from the gas nozzle 8 or between the heater 4 and the heat insulating member 5 to rapidly cool the CVD film attached to the surface of the tray 1 and generate cracks.
It is preferable to facilitate the peeling off of the CVD film and to cool the tray 1 in a short time. Peeling of the CVD film from the tray 1 is carried out outside the machine by taking out the tray 1 from the loading or unloading lower 9 and replacing it with a clean one.
[発明の効果]
本発明は以上説明したように従来装置ではトレイに膜厚
が10μぐらいで81化合物膜のクラックが多くなり、
全面剥離の必要があったのに対し、本発明の装置による
と30μとなり全面剥離の作業回数を大巾に省略できた
。[Effects of the Invention] As explained above, in the present invention, in the conventional device, the 81 compound film has many cracks when the film thickness on the tray is about 10 μm.
Whereas it was necessary to peel off the entire surface, the apparatus of the present invention reduced the total surface peeling to 30μ, making it possible to greatly reduce the number of times the entire surface was peeled off.
第1図は本発明の常圧連続気相成長装置の正面図、第2
図は従来の常圧連続気相成長装置の正面図である。
1・・・トレイ、3・・・トレイの移動路、4・・・ヒ
ータ(加熱手段)、5・・・断熱部材(保温材)、6・
・・ウェハ、10・・・保温室。FIG. 1 is a front view of the atmospheric continuous vapor phase growth apparatus of the present invention, and FIG.
The figure is a front view of a conventional atmospheric pressure continuous vapor phase growth apparatus. DESCRIPTION OF SYMBOLS 1... Tray, 3... Tray movement path, 4... Heater (heating means), 5... Heat insulating member (heat retaining material), 6...
...Wafer, 10...Insulation room.
Claims (2)
移動させながら気相成長を行なう常圧連続気相成長装置
において、上記トレイを加熱する加熱手段と、この加熱
手段により加熱されるトレイの移動路を断熱部材で囲繞
し内部に保温室を形成する断熱手段とを具備してなるこ
とを特徴とする常圧連続気相成長装置。(1) In an atmospheric continuous vapor phase growth apparatus that performs vapor phase growth while continuously moving a plurality of trays for placing wafers, a heating means for heating the trays and a heating means for heating the trays are provided. 1. An atmospheric continuous vapor phase growth apparatus characterized by comprising a heat insulating means for surrounding a movement path of the tray with a heat insulating member and forming an insulating chamber therein.
は全体を窒素ガス雰囲気に晒し得る構成となっているこ
とを特徴とする特許請求の範囲第1項記載の常圧連続気
相成長装置。(2) The atmospheric pressure continuous gas phase according to claim 1, wherein the insulating room is configured to introduce nitrogen gas and expose a part or the entire tray to a nitrogen gas atmosphere. growth equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17702786A JPS6333814A (en) | 1986-07-28 | 1986-07-28 | Normal pressure continuous vapor growth apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17702786A JPS6333814A (en) | 1986-07-28 | 1986-07-28 | Normal pressure continuous vapor growth apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6333814A true JPS6333814A (en) | 1988-02-13 |
Family
ID=16023870
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17702786A Pending JPS6333814A (en) | 1986-07-28 | 1986-07-28 | Normal pressure continuous vapor growth apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6333814A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9008345B2 (en) | 2006-01-12 | 2015-04-14 | Sony Corporation | Earphone device |
-
1986
- 1986-07-28 JP JP17702786A patent/JPS6333814A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9008345B2 (en) | 2006-01-12 | 2015-04-14 | Sony Corporation | Earphone device |
US9826300B2 (en) | 2006-01-12 | 2017-11-21 | Sony Corporation | Earphone device |
US9930437B2 (en) | 2006-01-12 | 2018-03-27 | Sony Corporation | Earphone device |
US9949006B2 (en) | 2006-01-12 | 2018-04-17 | Sony Corporation | Earphone device |
US9949007B2 (en) | 2006-01-12 | 2018-04-17 | Sony Corporation | Earphone device |
US9961428B2 (en) | 2006-01-12 | 2018-05-01 | Sony Corporation | Earphone device |
US11375307B2 (en) | 2006-01-12 | 2022-06-28 | Sony Group Corporation | Earphone device |
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