JPS5918195A - Thin film growth device in extremely high vacuum - Google Patents

Thin film growth device in extremely high vacuum

Info

Publication number
JPS5918195A
JPS5918195A JP12502482A JP12502482A JPS5918195A JP S5918195 A JPS5918195 A JP S5918195A JP 12502482 A JP12502482 A JP 12502482A JP 12502482 A JP12502482 A JP 12502482A JP S5918195 A JPS5918195 A JP S5918195A
Authority
JP
Japan
Prior art keywords
chamber
cassette
substrate
cassete
isolation wall
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12502482A
Other languages
Japanese (ja)
Other versions
JPS6214224B2 (en
Inventor
Michiharu Tanabe
田部 道晴
Kenji Kajiyama
梶山 健二
Tetsuo Ishida
哲夫 石田
Minoru Kondo
実 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Nippon Telegraph and Telephone Corp
Original Assignee
Canon Anelva Corp
Nippon Telegraph and Telephone Corp
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Anelva Corp, Nippon Telegraph and Telephone Corp, Anelva Corp filed Critical Canon Anelva Corp
Priority to JP12502482A priority Critical patent/JPS5918195A/en
Publication of JPS5918195A publication Critical patent/JPS5918195A/en
Publication of JPS6214224B2 publication Critical patent/JPS6214224B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B35/00Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
    • C30B35/005Transport systems
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J3/00Processes of utilising sub-atmospheric or super-atmospheric pressure to effect chemical or physical change of matter; Apparatus therefor
    • B01J3/006Processes utilising sub-atmospheric pressure; Apparatus therefor

Abstract

PURPOSE:In transporting a base consisting of plural plates set in a cassete from a base introduction chamber to a preparative exhaust chamber, to raise the treatment speed of the base and to simplify the treatment operation, by carrying out simultaneously the transportation of the cassete and the opening and closing of a pair of opposing partition wall integrated with the cassete by the partition wall. CONSTITUTION:The base 4 consisting of plural plates is set in the cassette 5, equipped in the introduction chamber 1, and the introduction chamber 1 is evacuated. The shaft 7 is driven by the air cylinder 6, and the cassete 5 is transferred to the preparative exhaust chamber 2 which is previously evacuated. In the operation, a pair of opposing partition walls 8 and 9 are also transferred in an integrateded way with the cassete 5. Consequently, the opening and closing of the partition walls 8 and 9 are carried out simultaneously with the transportation of the cassete 5, so the treatment of the base can be done simply at high speed. After the cassete 5 is transferred to the preparative exhaust chamber 2, the base 4 in the cassete is one by one sent to the heating part 11 of the evacuated growth chamber 3 by the shaft 10, and desired film growth is carried out.

Description

【発明の詳細な説明】 本発明は、処理速度が速く、かつ操作が簡便であり、し
かも均一に高温域まで基板加熱が行なえる超高真空薄膜
成長装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ultra-high vacuum thin film growth apparatus that has a high processing speed, is easy to operate, and can uniformly heat a substrate to a high temperature range.

従来のこの種の装置は基板導入室に基板を1枚ずつ装着
する方式が多く、1枚毎に排気、成長、取り出しのサイ
クルを繰り返す必要があり、7枚当りの処理時間が極め
て長いという欠点があった。
Conventional devices of this type often load substrates one by one into the substrate introduction chamber, and the cycle of evacuation, growth, and extraction must be repeated for each substrate, resulting in an extremely long processing time for each seven substrates. was there.

また、vI数枚の基板をカセットにより一度に基板導入
室に装着する方式においても、従来の装置はカセットと
隔離壁とが一体化されておらず、カセットを予備排気室
に移送する際に隔離壁の開閉とカセット移送を別個に操
作するように構成されていたので、やはり処理時間が長
く、かつ操作が煩雑であるという欠点があった。
In addition, even in the method of loading several substrates into the substrate introduction chamber at once using a cassette, in conventional equipment the cassette and isolation wall are not integrated, and when the cassette is transferred to the pre-evacuation chamber, the cassette is isolated. Since the opening/closing of the wall and the transport of the cassette were configured to be operated separately, there were also disadvantages in that the processing time was long and the operations were complicated.

基板加熱については、約700℃以上の高温域まで加熱
する方式として、例えばタンタル線やストライブ状のグ
ラファイトを加熱母体として用いる方法があった。しか
し、これらのヒータで直接基板を加熱するとシリコンの
ような熱伝A比較的小さい基板ではヒータ形状に沿って
基板が局部的に加熱されるという欠点があった。そ9で
、基板を均一に加熱するにはヒータと基板との間に熱伝
導度の大きいモリブデンなどの金属板を挿入し、基板裏
面から均一に加熱する必要があるが、この金属板の挿入
によって熱伝達効率が低下し、基板を約700℃以上に
加熱することが困難であるという欠点があった。
Regarding substrate heating, there is a method of heating the substrate to a high temperature range of about 700° C. or higher, for example, using tantalum wire or striped graphite as a heating base. However, when a substrate is directly heated with these heaters, there is a drawback that the substrate is heated locally along the shape of the heater when the heat conduction A is relatively small, such as silicon. Step 9: In order to uniformly heat the board, it is necessary to insert a metal plate such as molybdenum with high thermal conductivity between the heater and the board, and to heat the board uniformly from the back side of the board. This has the drawback that the heat transfer efficiency decreases and it is difficult to heat the substrate above about 700°C.

そこで、本発明の目的は上述の欠点を除去し、基板7枚
当りの処理速度を速くし、しかもその処理操作を簡便と
なした超高真空薄膜成長装置を提供することにある。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide an ultra-high vacuum thin film growth apparatus that eliminates the above-mentioned drawbacks, increases the processing speed per seven substrates, and simplifies the processing operations.

かかる目的を達成するために、本発明では、複数枚の基
板をカセットに装着したまま基板導入室から予備排気室
に導入する際にカセットと一体になった対向する一対の
隔m壁でカセット移送と隔離壁の開閉を同時に行なうこ
とを特徴とするものである。
In order to achieve such an object, the present invention provides a mechanism for transporting the cassette using a pair of opposing bulkheads that are integrated with the cassette when a plurality of substrates are introduced from the substrate introduction chamber into the pre-evacuation chamber while the cassette is still loaded. It is characterized by opening and closing the isolation wall and the isolation wall at the same time.

また、本発明は、基板を成長室で加熱する際に、ストラ
イブ状のグラファイトヒータをストライブ間の空隙を互
いに補うように一層に重ね、層間および基板とヒータ間
に空隙あるいは石英やアルミナなどの絶縁板を設けるこ
とを特徴とし、それにより均一かつ高温域までの加熱を
実現する。
Furthermore, when heating the substrate in the growth chamber, the strip-shaped graphite heaters are stacked on top of each other so as to compensate for the gaps between the stripes. It is characterized by the provision of an insulating plate, thereby realizing uniform heating up to a high temperature range.

以下に図面を参照して本発明の詳細な説明する。The present invention will be described in detail below with reference to the drawings.

第1図は本発明の実施例であって、装置全体の概略平面
図を示したものである。ここでは排気系は全て省略した
。図中、/は基板導入室、コは予備排気室、3は成長室
である。複数枚の基板、例えばシリコンウニハゲに薄膜
成長を行なうには、カセット!に必要枚数を装着し、基
板導入室l内を約/θ−’ Torrまでターボモレキ
ュラポンプで排気した後、エアシリンダ乙によって駆動
するシャフト7でカセットjを予備排気室−に移送する
。この際、対向する一対の隔離壁!およびワもカセット
jと一体となって移動する。このような構造になってい
るから基板グを装着する時は、大気圧下にある基板導入
室/と10−? TOrr程度にクライオポンプで真空
排気されている予備排気室2とは、隔離壁9によって隔
離されており、カセット!を移送後は隔離壁rによって
隔離されることになり、隔離壁tおよび9の開閉をカセ
ットjの移送と同時に行なえ、ttaj便かつ高速度の
処理が行なえる。
FIG. 1 shows an embodiment of the present invention, and is a schematic plan view of the entire device. The exhaust system has been completely omitted here. In the figure, / is a substrate introduction chamber, C is a preliminary exhaust chamber, and 3 is a growth chamber. To grow thin films on multiple substrates, such as silicon wafers, use a cassette! After the required number of cassettes are loaded into the substrate introduction chamber l and the inside of the substrate introduction chamber l is evacuated to about /θ-' Torr using a turbo molecular pump, the cassette j is transferred to the preliminary evacuation chamber by a shaft 7 driven by an air cylinder B. At this time, a pair of isolation walls facing each other! and wa also move together with cassette j. Because of this structure, when installing the board, the board introduction chamber / and 10-? are under atmospheric pressure. The preliminary evacuation chamber 2, which is evacuated to about TOrr with a cryopump, is separated by an isolation wall 9, and the cassette! After being transferred, the cassettes are separated by the separating wall r, and the separating walls t and 9 can be opened and closed at the same time as the cassette j is transferred, allowing fast and high-speed processing.

例えば、グインチシリコンウエノ\を/θ枚袋装着てか
ら予備排気室に移送し終るまでの時間は5分である。
For example, it takes 5 minutes from when /θ bags of Ginch silicon ueno\ are attached to when they are transferred to the preliminary exhaust chamber.

予備排気室2にカセットjを移送した後は、例えば磁気
カップリングで駆動するシャフト/θを用いてカセット
!内の複数枚のウニ)z lIのうち1枚を/θ−9T
orr程度にクライオポンプで排気されてし)る成長室
3の基板加熱部/lまで移送して受は渡す。
After transferring the cassette j to the preliminary exhaust chamber 2, use a shaft /θ driven by a magnetic coupling, for example, to remove the cassette! (multiple sea urchins) z lI /θ-9T
The substrate is transferred to the substrate heating section/l of the growth chamber 3, which is evacuated to about 100 yen by cryopump.

所望の膜成長後、再びこのウエノ1をシャフト/θを用
いて予備排気室内のカセット!に戻し、必要に応じて他
のウェハを成長室3まて運ぶ。所定のウェハ枚数を処理
したのち、上記手順を逆にたどって基板溝人畜/からウ
ニ)z 41を取り出す。なお、予備排気室−で、カセ
ットjからシャフト10にウニハゲを受は渡す際には、
例えは、予備排気室λの下部に設けたモータ駆動シャフ
トによってカセットを上下さセることによってかかる受
渡しを行なう。
After the desired film growth, this Ueno 1 is placed in the cassette in the pre-evacuation chamber using the shaft /θ again! and transport other wafers to the growth chamber 3 as necessary. After processing a predetermined number of wafers, the above procedure is reversed to take out the wafers 41 from the substrate groove. In addition, when transferring the sea urchin from the cassette j to the shaft 10 in the preliminary exhaust chamber,
For example, such transfer is performed by moving the cassette up and down using a motor drive shaft provided at the bottom of the preliminary exhaust chamber λ.

第、2図囚はその成長室3内の基板加熱部/lの一例を
示す断面図であり、第一図(J3)はその2層目のグラ
ファイトヒータ/2の平面図、第1図(C) ハ同り。
Figures 1 and 2 are cross-sectional views showing an example of the substrate heating section/l in the growth chamber 3, and Figure 1 (J3) is a plan view of the second layer graphite heater/2. C) Same as Ha.

く7層目のグラファイトヒータ/3の平面図であ、る。FIG. 3 is a plan view of the seventh layer of graphite heater/3.

第λ図囚において、/りおよび/Jはそれぞれ2層目お
よび/NN上ヒータ通電用電極であり、例えばタンタル
で作られている。/におよび/7はそれぞれ2層目およ
び/ Ju目のグラファイトヒータ/2および/3を嵌
め込んだ石英板であり、グラファイトヒータ/2および
/3の各層間およびヒータ/2および/3とシリコンウ
ニハゲとの間の電気的絶縁を熱伝達効率を低下させるこ
となく行なうためのものである。また、石英板/7はヒ
ータ/2および/3からシリコンウニハゲへの汚染を防
止する役割もある。/lは反射板であり、ウニハゲへの
熱伝達効率を増加させるためのものである。
In FIG. λ, /J and /J are electrodes for energizing the second layer and /NN upper heater, respectively, and are made of tantalum, for example. / and /7 are quartz plates into which graphite heaters /2 and /3 are fitted in the second layer and /Ju, respectively, and between each layer of graphite heaters /2 and /3 and between heaters /2 and /3 and silicon. This is to provide electrical insulation between the sea urchin bald and the sea urchin bald without reducing heat transfer efficiency. The quartz plate /7 also has the role of preventing contamination from heaters /2 and /3 to the silicon sea urchin bald. /l is a reflective plate, which is used to increase the efficiency of heat transfer to the sea urchin bald.

ヒータ/λおよび/3は互いの空隙を補なうように配列
されている。このような構造によれば、ウニハゲの内部
に温度の不均一性が生じることなく、13oo℃程度ま
での高温まで加熱できる。こ、7のような構造では、均
一性は、例えばダインチのシリコンウェハに対して、1
OOO℃のとき士/θ℃以内である。
Heaters /λ and /3 are arranged so as to compensate for each other's gaps. According to such a structure, it is possible to heat the sea urchin bald to a high temperature of about 130° C. without causing temperature non-uniformity inside the sea urchin bald. In a structure like this 7, the uniformity is, for example, 1 for a die-inch silicon wafer.
It is within θ°C of OOO°C.

温度や成長膜厚の均一性は、ウニハゲの支持枠19を回
転させることによってさらに向上させることもできる。
The uniformity of temperature and growth film thickness can be further improved by rotating the support frame 19 of the sea urchin bald.

なお、ヒータ/2と/3との間に空隙を設けるときには
、石英板16は設けなくてもよい。
Note that when providing a gap between heaters /2 and /3, the quartz plate 16 may not be provided.

また、ヒータ/2および13から基板ダへの汚染が無視
できるような低温域では、石英板/7は用いなくてもよ
い。さらにまた、石英板/6および17の代わりにアル
ミナ板を用いることもできる。
Further, in a low temperature range where contamination of the substrate from the heaters /2 and /13 can be ignored, the quartz plate /7 may not be used. Furthermore, alumina plates can be used instead of quartz plates/6 and 17.

以上説明したように、本発明によれば、基板導入室と予
備排気室との間で多数枚の基板を入れたカセットを移送
する際に、隔離壁の開閉とカセット移送とを同時に行な
うことができるので、速い処理速度と簡便な操作を実現
でき、しかも容易に自動化ができるという利点がある。
As explained above, according to the present invention, when transferring a cassette containing a large number of substrates between the substrate introduction chamber and the preliminary exhaust chamber, it is possible to simultaneously open and close the isolation wall and transfer the cassette. This has the advantage of achieving high processing speed, simple operation, and easy automation.

また、本発明では基板を成長室で加熱する際にグラファ
イトヒータをストライプ間の空隙を互いに補うように2
層に東ね、層間および基板とヒータとの間に空隙あるい
は石英やアルミナなどの絶縁板を設ける構造であるから
、基板を均一にかつ高温域まで加熱できるという利点が
ある。
In addition, in the present invention, when heating the substrate in the growth chamber, two graphite heaters are used to compensate for the gaps between the stripes.
Since the structure is such that gaps or insulating plates such as quartz or alumina are provided between the layers and between the substrate and the heater, there is an advantage that the substrate can be uniformly heated to a high temperature range.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る超高真空薄膜成長装置の一実施例
を、特に基板の移送を説明するように示す構成図、第2
図(4)は本発明超高真空薄膜成長装置の一実施例を特
に基板加熱部を説明するようにして示す構成図、第λ図
CB)および(C)は、それぞれ、そのグラファイトヒ
ータを示す平面図である。 /・・・基板導入室、   −・・・予備排気室、3・
・・成長室、     弘・・・基板(シリコンウェハ
)、!・・・カセット、     乙・・・エアシリン
ダ、7・・・シャフト、     ff、9・・・隔離
壁、lθ・・・シャフト、//・・・基板加熱部、/2
・・・、2層目のグラファイトヒータ、/3・・・7層
目のグラファイトヒータ、# 、 /j・・・通電用電
極、/6./7・・・石英板、1g・・・反射板、  
   19・・・支持枠。
FIG. 1 is a configuration diagram showing one embodiment of the ultra-high vacuum thin film growth apparatus according to the present invention, especially to explain the transfer of a substrate;
Figure (4) is a block diagram showing an embodiment of the ultra-high vacuum thin film growth apparatus of the present invention, with particular explanation of the substrate heating section, and Figures λ (CB) and (C) respectively show the graphite heater thereof. FIG. /... Board introduction chamber, -... Preliminary exhaust chamber, 3.
...Growth room, Hiroshi...Substrate (silicon wafer)! ...Cassette, B...Air cylinder, 7...Shaft, ff, 9...Isolation wall, lθ...Shaft, //...Substrate heating section, /2
..., second layer graphite heater, /3... seventh layer graphite heater, #, /j... current-carrying electrode, /6. /7...Quartz plate, 1g...Reflector,
19...Support frame.

Claims (1)

【特許請求の範囲】 l)基板導入室、予備排気室および成長室を有する′真
空薄膜成長装置において、基板を大気中から真空中に導
入するにあたり、複数枚の基板をカセットに装着し、該
カセットを、第1の隔離壁で前記予備排気室と隔てられ
た前記基板導入室内に配置し、前記基板導入室内を真空
排気した後、前記カセットを予め真空排気しである前記
予備排気室に移送する際に、前記第lの隔離壁および該
第1の隔離壁と対向する第2の隔離壁を前記カセットと
一体に移動させ、前記カセットが前記予備排気室に収納
された時に前記カセットと一体に移動した前記第2の隔
離壁によって前記基板導入室と前記予備排気室とを隔離
するようにしたことを特徴とする超高真空薄膜成長装置
。 、2)基板導入室1.予備排気室および成長室を有する
真空薄膜成長装置において、基板を大気中から真空中に
導入するにあたり、複数枚の基板をカセットに装着し、
該カセットを、第7の隔離壁で前記予備排気室と隔てら
れた前記基板導入室内に配置し、前記基板導入室内を真
空排気した後、前記カセットを予め真空排気しである前
記予備排気室に移送する際に、前記第1の隔離壁および
該第1の隔11ft壁と対向する第一の隔離壁を前記カ
セットと一体に移動させ、前記カセットが前記予備排気
室に収納された時に前記カセットと一体に移動した前記
第一の隔r@壁によって前記基板導入室と前記予備排気
室とを隔離するようにし、前記基板を加熱する前記成長
室には、ストライブ状に切り出した2枚のグラファイト
ヒータをそのストライブ間の空隙を互いに補うように2
層に重ねて配置し、その2層のグラファイトヒータの間
および前記基板と前記グラファイトヒータとの間を絶縁
するようにしたことを特徴とする超高真空薄膜成長装置
[Claims] l) In a vacuum thin film growth apparatus having a substrate introduction chamber, a pre-evacuation chamber, and a growth chamber, when introducing a substrate from the atmosphere into a vacuum, a plurality of substrates are mounted in a cassette, The cassette is placed in the substrate introduction chamber separated from the pre-evacuation chamber by a first isolation wall, and after the substrate introduction chamber is evacuated, the cassette is transferred to the pre-evacuation chamber that has been previously evacuated. When the first isolation wall and the second isolation wall facing the first isolation wall are moved together with the cassette, when the cassette is stored in the preliminary exhaust chamber, the first isolation wall and the second isolation wall facing the first isolation wall are moved together with the cassette. An ultra-high vacuum thin film growth apparatus characterized in that the substrate introduction chamber and the preliminary evacuation chamber are isolated by the second isolation wall that has been moved. , 2) Substrate introduction chamber 1. In a vacuum thin film growth apparatus having a preliminary evacuation chamber and a growth chamber, when introducing a substrate from the atmosphere into a vacuum, a plurality of substrates are mounted in a cassette,
The cassette is placed in the substrate introduction chamber separated from the pre-evacuation chamber by a seventh isolation wall, and after the substrate introduction chamber is evacuated, the cassette is placed in the pre-evacuation chamber that has been evacuated in advance. When transferring, the first isolation wall and the first isolation wall opposite to the first 11 ft wall are moved together with the cassette, and when the cassette is stored in the pre-evacuation chamber, the cassette is removed. The substrate introduction chamber and the preliminary evacuation chamber are separated by the first partition wall that moves together with the substrate. Two graphite heaters are arranged so that the gaps between their stripes compensate for each other.
An ultra-high vacuum thin film growth apparatus characterized in that graphite heaters are arranged in layers to insulate between the two layers of graphite heaters and between the substrate and the graphite heater.
JP12502482A 1982-07-20 1982-07-20 Thin film growth device in extremely high vacuum Granted JPS5918195A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12502482A JPS5918195A (en) 1982-07-20 1982-07-20 Thin film growth device in extremely high vacuum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12502482A JPS5918195A (en) 1982-07-20 1982-07-20 Thin film growth device in extremely high vacuum

Publications (2)

Publication Number Publication Date
JPS5918195A true JPS5918195A (en) 1984-01-30
JPS6214224B2 JPS6214224B2 (en) 1987-04-01

Family

ID=14899961

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12502482A Granted JPS5918195A (en) 1982-07-20 1982-07-20 Thin film growth device in extremely high vacuum

Country Status (1)

Country Link
JP (1) JPS5918195A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0209150A2 (en) * 1985-07-19 1987-01-21 Fujitsu Limited Apparatus of metal organic chemical vapor deposition for growing epitaxial layer of compound semiconductor
EP0211292A2 (en) * 1985-08-09 1987-02-25 Hitachi, Ltd. Molecular beam epitaxy apparatus
JPS63116419A (en) * 1986-11-05 1988-05-20 Nec Corp Substrate heater

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0209150A2 (en) * 1985-07-19 1987-01-21 Fujitsu Limited Apparatus of metal organic chemical vapor deposition for growing epitaxial layer of compound semiconductor
US4883020A (en) * 1985-07-19 1989-11-28 Fujitsu Limited Apparatus of metal organic chemical vapor deposition for growing epitaxial layer of compound semiconductor
EP0211292A2 (en) * 1985-08-09 1987-02-25 Hitachi, Ltd. Molecular beam epitaxy apparatus
JPS63116419A (en) * 1986-11-05 1988-05-20 Nec Corp Substrate heater

Also Published As

Publication number Publication date
JPS6214224B2 (en) 1987-04-01

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