JPS6329787B2 - - Google Patents

Info

Publication number
JPS6329787B2
JPS6329787B2 JP55102089A JP10208980A JPS6329787B2 JP S6329787 B2 JPS6329787 B2 JP S6329787B2 JP 55102089 A JP55102089 A JP 55102089A JP 10208980 A JP10208980 A JP 10208980A JP S6329787 B2 JPS6329787 B2 JP S6329787B2
Authority
JP
Japan
Prior art keywords
voltage
ion source
peak
focus
repeller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55102089A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5727553A (en
Inventor
Tooru Asada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP10208980A priority Critical patent/JPS5727553A/ja
Publication of JPS5727553A publication Critical patent/JPS5727553A/ja
Publication of JPS6329787B2 publication Critical patent/JPS6329787B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP10208980A 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer Granted JPS5727553A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10208980A JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10208980A JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Publications (2)

Publication Number Publication Date
JPS5727553A JPS5727553A (en) 1982-02-13
JPS6329787B2 true JPS6329787B2 (enrdf_load_html_response) 1988-06-15

Family

ID=14318042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10208980A Granted JPS5727553A (en) 1980-07-25 1980-07-25 Adjusting method for ion source of mass-spectrometer

Country Status (1)

Country Link
JP (1) JPS5727553A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104204791A (zh) * 2012-03-22 2014-12-10 株式会社岛津制作所 质量分析装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532483A (en) * 1994-03-17 1996-07-02 Hitachi, Ltd. Mass spectrometer and ion source
US8330101B2 (en) * 2010-01-19 2012-12-11 Agilent Technologies, Inc. System and method for replacing an ion source in a mass spectrometer
WO2013065173A1 (ja) * 2011-11-04 2013-05-10 株式会社島津製作所 質量分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104204791A (zh) * 2012-03-22 2014-12-10 株式会社岛津制作所 质量分析装置

Also Published As

Publication number Publication date
JPS5727553A (en) 1982-02-13

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