JPS63292036A - Sample preparing method for microscope - Google Patents

Abstract

PURPOSE:To simplify and expedite the preparation of a sample, when the sample, which is observed with an electron microscope or an optical microscope, is performed, by cutting the sample in a wedge shape. CONSTITUTION:A sample A to be cut, which is held with a microtome, is moved up and down in a plane, which is inclined at an angle theta with respect to a vertical plane. The sample A is cut with a glass knife. The sample is formed in a wedge shape so that one side is thin and the other side is thick. Generally, the entire surface of the sample is not the object to be observed, but a part of the sample should be clearly observed in the sample structure. In the wedge shape, the part, which has the thickness required for the observation, is always present. Therefore, the sample, which is suitable for the efficient observation, can be obtained.

Description

DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention belongs to the technical field related to a method for preparing a sample for an electron microscope or an optical microscope.

[Background Art] In order to observe an electron beam transmission image or a light transmission image of a sample with high resolution using an electron microscope or an optical microscope, the sample needs to be sufficiently thin. Particularly in the case of an electron microscope, the thickness of the sample is at least 0.
0.018 m or less, usually about several lQnm, is considered appropriate.

Therefore, how to thin the sample to be observed is a factor that determines the quality of the image. For example, for metal materials, samples are processed to be thin using electrolytic polishing. In addition, for biological materials, polymer materials, etc., samples are prepared using a device called a microtome. in this case,
A sample embedded in resin is cut into thin sections using a knife made of glass or diamond blades, and from among these sections, the sample for microscopic observation is selected.

Hereinafter, the cutting mechanism when using a microtome will be explained based on the drawings.

FIG. 3 is a schematic diagram for explaining the cutting mechanism of a conventional microtome, where A is a cut sample prepared by embedding a sample to be observed 1 in resin 2, and 3 is a glass knife. The glass knife 3 is made by cutting thick glass into triangular shapes, and is used by fixing it to a microtome with one sharp edge serving as a cutting edge. The cut sample A is held in the microtome by a special chuck, and when viewed from the side, it moves up and down in the direction shown by the dotted line with respect to the fixed glass knife 3. 3
It hits the cutting edge and is cut. However, when viewed from the front, this vertical movement acts like a circular movement in a vertical plane, and so that the cut sample A is successively fed out in the direction of the glass knife 3 with each rotation. Then, the thickness that touches the cutting edge of the glass knife 3 is continuously cut out as a section.

In other words, the distance the sample is drawn out is the thickness of the sample, and by adjusting that distance, a section with the desired thickness can be created. Samples for microscopic observation are selected from these sections.

As shown in the perspective view of FIG. 4, the sample created as described above has the sample 1 embedded in the center of the resin 2.
The section is of uniform thickness.

However, for observation with an electron microscope, the thickness of the section B
must be cut to a thin thickness, usually on the order of several tens of nanometers, and it is difficult to always obtain observation samples with the desired thickness. Sections are often so thick that electron beams cannot pass through them, or sections that are not uniformly thick and have holes here and there. For this reason, the observer has to create several dozen sections through trial and error and select several samples suitable for observation from among them, which requires a great deal of time and effort. Since it is not always possible to obtain samples that can be observed reliably at the same time, the work involves uncertainties.

[Purpose of the Invention This invention was made in view of the above circumstances,
The purpose of the present invention is to provide a method for easily and reliably preparing a sample for observation with an electron microscope or an optical microscope in a short time.

[Disclosure of the Invention] The present invention is characterized in that a sample is cut into a wedge shape. Hereinafter, a detailed description will be given based on drawings shown as examples.

FIG. 1 is a perspective view of a sample obtained by the method of the present invention, and FIG. 2 is a schematic diagram for explaining the outline of cutting with a microtome. In the present invention, the second
As shown in the figure, the cut sample A held in the microtome is cut by moving up and down within a plane inclined at an angle of θ with respect to the vertical plane. Although it is not intended to be particularly limited, it is free to perform cutting while making a circular motion within this inclined plane.

The sample prepared in this manner is a section having a thin model on one side and a thick model on the other side, as shown in FIG.

When observing such a sample with an electron microscope, a portion with an appropriate thickness is selected for observation. Normally, the entire surface of the sample is not required for observation, but as long as there is only a portion of the thickness where the structure of the sample can be clearly observed,
Fully useful observations can be made from the sample. In addition, if it is wedge-shaped, there is always a section with the thickness necessary for observation, so there is no need to create an unnecessarily large number of sections. Therefore, samples that are efficient and convenient for observation can be obtained.

Although the above description has been made using an example of creating a sample for an electron microscope, the present invention can also be applied to creating a sample for an optical microscope.

[Effects of the Invention] The wedge-shaped section according to the present invention has a number of 10
This eliminates the need to select several samples for observation from a section, and this has the effect of making it possible to reliably obtain a sample for microscopic observation from a small amount of precious sample to be observed, in a short time and with less effort. .

[Brief explanation of the drawing]

FIG. 1 is a perspective view showing the shape of a sample according to the present invention, FIG. 2 is a schematic diagram of a microtome for explaining the present invention in detail, and FIG. 3 is a diagram for explaining the conventional method.
FIG. 4, a schematic diagram of a microtome, is a perspective view showing the shape of a conventional sample. 1: Sample to be observed 2: Resin 3: Knife Patent applicant: Matsushita Electric Works Co., Ltd. Patent attorney Toshimaru Takemitsu (and 2 others) Figure 1 Figure 3 Figure 2 Figure 4

Claims (1)

[Claims] (1) A method for preparing a sample for a microscope, which is characterized by cutting a sample into a wedge shape when preparing a sample for observation with an electron microscope or an optical microscope.