JPS6327868B2 - - Google Patents
Info
- Publication number
- JPS6327868B2 JPS6327868B2 JP57162839A JP16283982A JPS6327868B2 JP S6327868 B2 JPS6327868 B2 JP S6327868B2 JP 57162839 A JP57162839 A JP 57162839A JP 16283982 A JP16283982 A JP 16283982A JP S6327868 B2 JPS6327868 B2 JP S6327868B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- oxide film
- radiation
- metal oxide
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
Landscapes
- Photovoltaic Devices (AREA)
- Light Receiving Elements (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57162839A JPS5952884A (ja) | 1982-09-18 | 1982-09-18 | 放射線または光検出用半導体素子の製造方法 |
US06/698,616 US4960436A (en) | 1982-09-18 | 1985-02-06 | Radiation or light detecting semiconductor element containing heavily doped p-type stopper region |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57162839A JPS5952884A (ja) | 1982-09-18 | 1982-09-18 | 放射線または光検出用半導体素子の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5952884A JPS5952884A (ja) | 1984-03-27 |
JPS6327868B2 true JPS6327868B2 (enrdf_load_stackoverflow) | 1988-06-06 |
Family
ID=15762219
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57162839A Granted JPS5952884A (ja) | 1982-09-18 | 1982-09-18 | 放射線または光検出用半導体素子の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5952884A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01287468A (ja) * | 1988-05-16 | 1989-11-20 | Fuji Xerox Co Ltd | ランダム空間パターンの移動情報検出方法 |
JPH0614913U (ja) * | 1992-07-22 | 1994-02-25 | 株式会社アイチコーポレーション | 作業装置の作動変位検出装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7288825B2 (en) * | 2002-12-18 | 2007-10-30 | Noble Peak Vision Corp. | Low-noise semiconductor photodetectors |
JP5889163B2 (ja) * | 2012-11-02 | 2016-03-22 | 三菱電機株式会社 | 光起電力装置およびその製造方法、光起電力モジュール |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52122488A (en) * | 1976-04-07 | 1977-10-14 | Hitachi Ltd | Semiconductor photo detector |
-
1982
- 1982-09-18 JP JP57162839A patent/JPS5952884A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01287468A (ja) * | 1988-05-16 | 1989-11-20 | Fuji Xerox Co Ltd | ランダム空間パターンの移動情報検出方法 |
JPH0614913U (ja) * | 1992-07-22 | 1994-02-25 | 株式会社アイチコーポレーション | 作業装置の作動変位検出装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS5952884A (ja) | 1984-03-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5719414A (en) | Photoelectric conversion semiconductor device with insulation film | |
US20160351400A1 (en) | Semiconductor device and method of manufacturing semiconductor device | |
US4879466A (en) | Semiconductor radiation detector | |
US6597025B2 (en) | Light sensitive semiconductor component | |
WO1993010471A1 (en) | Mecuric iodide x-ray detector | |
US4151011A (en) | Process of producing semiconductor thermally sensitive switching element by selective implantation of inert ions in thyristor structure | |
US7569901B1 (en) | P channel radhard device with boron diffused P-type polysilicon gate | |
JPS6327868B2 (enrdf_load_stackoverflow) | ||
US4689649A (en) | Semiconductor radiation detector | |
US4835587A (en) | Semiconductor device for detecting radiation | |
WO2006076788A1 (en) | Dark current reduction in metal/a-se/metal structures for application as an x-ray photoconductor layer in digital image detectors | |
US5583352A (en) | Low-noise, reach-through, avalanche photodiodes | |
JPH114012A (ja) | Pinフォトダイオード | |
US4960436A (en) | Radiation or light detecting semiconductor element containing heavily doped p-type stopper region | |
US4060822A (en) | Strip type radiation detector and method of making same | |
JPH08236799A (ja) | 半導体放射線検出素子および整流素子 | |
JP3036258B2 (ja) | 半導体放射線検出器 | |
US6174750B1 (en) | Process for fabricating a drift-type silicon radiation detector | |
JPS59114875A (ja) | 半導体放射線検出器 | |
US3609478A (en) | Buried-layer semiconductor device for detecting and measuring the energy and atomic number of impinging atomic particles | |
JPH0346374A (ja) | 薄膜トランジスタ | |
JPS5951579A (ja) | 放射線または光検出用半導体素子 | |
JPS6390176A (ja) | 半導体放射線検出素子 | |
EP0269335B1 (en) | Radiation-sensitive device | |
JPH07162025A (ja) | 半導体紫外線センサ |