JPS63274694A - Production of titanium sapphire single crystal having high quality - Google Patents

Production of titanium sapphire single crystal having high quality

Info

Publication number
JPS63274694A
JPS63274694A JP10952287A JP10952287A JPS63274694A JP S63274694 A JPS63274694 A JP S63274694A JP 10952287 A JP10952287 A JP 10952287A JP 10952287 A JP10952287 A JP 10952287A JP S63274694 A JPS63274694 A JP S63274694A
Authority
JP
Japan
Prior art keywords
single crystal
partial pressure
crystal
oxygen partial
titanium sapphire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10952287A
Other languages
Japanese (ja)
Other versions
JPH042558B2 (en
Inventor
Shigeyuki Kimura
木村 茂行
Nobuhiro Kodama
展宏 小玉
Kenji Kitamura
健二 北村
Nobuo Ii
伸夫 井伊
Tsutomu Sawada
勉 沢田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute for Research in Inorganic Material
Original Assignee
National Institute for Research in Inorganic Material
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Institute for Research in Inorganic Material filed Critical National Institute for Research in Inorganic Material
Priority to JP10952287A priority Critical patent/JPS63274694A/en
Publication of JPS63274694A publication Critical patent/JPS63274694A/en
Publication of JPH042558B2 publication Critical patent/JPH042558B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To prevent titanium sapphire from having parasitic absorption band in growing titanium sapphire single crystal and annealing the single crystal after growth by controlling oxygen partial pressure in the atm. CONSTITUTION:In growing titanium sapphire single crystal and annealing the crystal after growth, the number of valence of Ti ion in the single crystal is controlled by O2 partial pressure in the atm. so that other Ti ion than trivalent Ti ion in the crystal can be neglected. Thereby the occurrence of parasitic absorption band in the crystal is prevented, because crystal defect is produced by gathering trivalent Ti ion, bivalent Ti ion and hole of oxygen atom in the crystal into an assemblage or analogue and results in the occurrence of parasitic absorption band.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はレーザ発振波長域での光吸収が格段に低い波長
可変レーザ用として有効な高品質チタンサファイヤ単結
晶の製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a method for manufacturing a high quality titanium sapphire single crystal that is effective for use in a wavelength tunable laser and has extremely low light absorption in the laser oscillation wavelength range.

本発明におけるチタンサファイヤ単結晶とは、少量の三
二酸化チタン(TizOs)を含む酸化アルミニウム(
八1tOx)の単結晶である。チタンサファイヤ単結晶
は広い波長可変域を持つ波長可変レーザ用結晶として注
目を集めている素材である。
The titanium sapphire single crystal in the present invention refers to aluminum oxide (aluminum oxide) containing a small amount of titanium sesquioxide (TizOs).
It is a single crystal of 81tOx). Titanium sapphire single crystal is a material that is attracting attention as a crystal for wavelength tunable lasers with a wide wavelength tuning range.

従来技術 従来、チタンサファイヤ単結晶は熱交換法、温度勾配徐
冷法、引上げ法、フローティングゾーン法により製造さ
れている。雰囲気はチタンイオンの価数が通常の酸化雰
囲気中では4価であることから、これを3価にする目的
で、還元性のものを用いている。しかし、得られた結晶
には、最も効率良くレーザ発振が起こる700〜900
n−の波長域を覆う幅広い吸収帯がある。特に高効率発
振を期待して高濃度のチタン導入を行った結晶ではこの
吸収帯が顕著に現れる。この吸収帯は寄生吸収帯と呼ば
れ、その発生原因は明らかになっていなく、これを防止
する方法は知られていない。
Prior Art Conventionally, titanium sapphire single crystals have been produced by a heat exchange method, a temperature gradient slow cooling method, a pulling method, and a floating zone method. Since the valence of titanium ions is 4 in a normal oxidizing atmosphere, a reducing atmosphere is used for the purpose of making titanium ions trivalent. However, the obtained crystal has a 700 to 900
There is a broad absorption band covering the n- wavelength range. In particular, this absorption band appears prominently in crystals into which a high concentration of titanium has been introduced in hopes of achieving high efficiency oscillation. This absorption band is called a parasitic absorption band, and the cause of its occurrence is not clear, and there is no known method to prevent it.

発明の目的 本発明の目的は寄生吸収帯の発生のないチタンサファイ
ヤ単結晶の製造方法を提供するにある。
OBJECTS OF THE INVENTION An object of the present invention is to provide a method for producing a titanium sapphire single crystal without the generation of parasitic absorption bands.

発明の構成 本発明者はこの寄生吸収帯の発生原因について、数多く
の実験的検討を加えた結果、寄生吸収帯は3価のチタン
イオン、2価のチタンイオン及び空の酸素イオン格子の
3者が結晶中で集合体を作るため、あるいはこの集合体
に類似したものより結晶欠陥が生ずることにより起こる
ことを知見し得た。
Structure of the Invention As a result of numerous experimental investigations into the causes of the occurrence of this parasitic absorption band, the present inventor found that the parasitic absorption band consists of three types: trivalent titanium ions, divalent titanium ions, and empty oxygen ion lattices. We found that this occurs due to the formation of aggregates in the crystal, or due to the generation of crystal defects that are similar to these aggregates.

このような集合体を除去するには、7 t Z+を除去
することが効果的である。そのためには雰囲気の酸素分
圧を高くすればよいが、酸素分圧を高くし過ぎると二酸
化チタンの析出を誘発し、散乱による光損失を増加させ
るので好ましくない、また二酸化チタンの析出が起こる
程酸素分圧が高くなくとも、Ti”が生じて寄生吸収帯
に似た光吸収が現れ光損失を増加する。従って雰囲気条
件には適切な範囲がある。酸素分圧と光吸収係数との関
係を示すと第1図の通りである。このように、酸素分圧
を調整して単結晶中に3価以外のチタンイオンが残存し
ないようにすればよいことが分かった。
To remove such aggregates, it is effective to remove 7 t Z+. To achieve this, it is possible to increase the oxygen partial pressure in the atmosphere, but if the oxygen partial pressure is too high, it induces the precipitation of titanium dioxide and increases light loss due to scattering, which is undesirable. Even if the oxygen partial pressure is not high, Ti'' is generated and optical absorption similar to a parasitic absorption band appears, increasing optical loss.Therefore, there is an appropriate range of atmospheric conditions.Relationship between oxygen partial pressure and optical absorption coefficient is shown in Fig. 1. In this way, it has been found that the oxygen partial pressure can be adjusted to prevent titanium ions other than trivalent from remaining in the single crystal.

この知見に基づいて本発明を完成した。The present invention was completed based on this knowledge.

本発明の要旨は、 チタンサファイヤ単結晶の成長およびまたは成長後の焼
鈍に際して、雰囲気中の酸素分圧を調整して単結晶中に
3価以外のチタンイオンが無視できる程度まで少なくな
るように、単結晶中のチタンイオンの価数制御を行うこ
とを特徴とする高品質チタンサファイヤ単結晶の製造方
法にある。
The gist of the present invention is to adjust the oxygen partial pressure in the atmosphere during the growth and/or post-growth annealing of a titanium sapphire single crystal so that the amount of titanium ions other than trivalent in the single crystal is reduced to a negligible level. The present invention provides a method for producing a high-quality titanium sapphire single crystal, which is characterized by controlling the valence of titanium ions in the single crystal.

本発明における酸素分圧とは雰囲気中の酸素の量を圧力
の単位で表わしたものである。
The oxygen partial pressure in the present invention is the amount of oxygen in the atmosphere expressed in units of pressure.

具体的な焼鈍における雰囲気条件としては、前記したよ
うにチタンの含有量にもよるが、log Pot=T/
200−22+ 3で示される条件である。ただし、T
は摂氏で示した温度、Potは気圧単位で示した酸素分
圧である。
As mentioned above, the specific atmospheric conditions for annealing depend on the titanium content, but log Pot=T/
The condition is expressed as 200-22+3. However, T
is the temperature in degrees Celsius, and Pot is the oxygen partial pressure in atmospheric pressure units.

焼鈍温度は700〜2000℃、好ましくは1300〜
1950℃である。所定の酸素分圧を得るためには、気
体種を用いても、あるいは制御された真空を用いてもよ
いが、C0tll!、 CO□+CO,HtO+ Hz
、 HtO+ Co。
Annealing temperature is 700~2000℃, preferably 1300~
The temperature is 1950°C. To obtain a predetermined oxygen partial pressure, gaseous species or a controlled vacuum may be used, but C0tll! , CO□+CO,HtO+ Hz
, HtO+Co.

あるいはこれらに不活性気体(Arやhなど)を混合し
たものを用いることが好ましい、特に好ましくはcot
+ttt、 cot+co、 uzo+tttあるいは
これらに不活性気体を混合したものである。
Alternatively, it is preferable to use a mixture of these and an inert gas (Ar, h, etc.), particularly preferably cot.
+ttt, cot+co, uzo+ttt, or a mixture of these with an inert gas.

焼鈍時間は特に制限はないが、寄生吸収帯を十分に低下
させることができる範囲で、生産性を高めるためにでき
るだけ短時間であることが望ましい。
Although there are no particular restrictions on the annealing time, it is desirable that the annealing time be as short as possible in order to increase productivity and within a range that can sufficiently reduce the parasitic absorption band.

適切な焼鈍条件における酸素分圧及び温度の範囲は第2
図の通りである。
The oxygen partial pressure and temperature range under appropriate annealing conditions are
As shown in the figure.

このような焼鈍雰囲気°は、結晶成長雰囲気として用い
ると焼鈍を行わなくても寄生吸収帯が極めて小さいチタ
ンサファイヤ単結晶を合成することができる。
When such an annealing atmosphere is used as a crystal growth atmosphere, a titanium sapphire single crystal with an extremely small parasitic absorption band can be synthesized without annealing.

融液からの単結晶成長に際しては、融点が約2000℃
であるので、前記酸素分圧式で示す酸素分圧範囲での1
0−”〜lQ−+s気圧、更に好ましくは10−16〜
10− ”気圧であることがよい。
When growing a single crystal from a melt, the melting point is approximately 2000°C.
Therefore, 1 in the oxygen partial pressure range shown in the oxygen partial pressure formula above.
0-” to lQ-+s atmospheric pressure, more preferably 10-16 to
Preferably, the pressure is 10-”atm.

融点降下剤を添加して、サファイヤよりも低い融点を持
つ溶液から単結晶を成長させる場合は第2図に示される
酸素分圧範囲を利用する。
When a single crystal is grown from a solution having a melting point lower than that of sapphire by adding a melting point depressant, the oxygen partial pressure range shown in FIG. 2 is used.

チタンサファイヤ単結晶を高品質性に確保するためには
、結晶成長時及び焼鈍時の酸素分圧を前記のように調整
した雰囲気下で行うことが好ましい。
In order to ensure a high quality titanium sapphire single crystal, it is preferable to perform crystal growth and annealing in an atmosphere in which the oxygen partial pressure is adjusted as described above.

実施例1゜ A1□O3に混入させたチタン濃度がTizO3のモル
%で表わして0.3%のチタンサファイヤ単結晶(7φ
X61m)を、0.02%COz+99.98%H!(
PG。
Example 1 Titanium sapphire single crystal (7φ
x61m), 0.02%COz+99.98%H! (
P.G.

−10−”・5気圧)の酸素分圧に調整した雰囲気下、
屏 1760℃で金時間焼鈍した。得られたチタンサファイ
ヤ単結晶のC軸方向に透過する波長800 nmの光の
吸収係数は0.01am−’であった。
In an atmosphere adjusted to an oxygen partial pressure of -10-"・5 atm),
The plate was annealed at 1,760°C for an hour. The absorption coefficient of light with a wavelength of 800 nm transmitted in the C-axis direction of the obtained titanium sapphire single crystal was 0.01 am-'.

気圧)(不純物ガスに起因)として実施例1と同条件の
温度1時間焼鈍した。得られた波長800n−の光の吸
収係数は0.80cm−’であった。
Atmospheric pressure) (due to impurity gas), and was annealed at the same temperature as in Example 1 for 1 hour. The absorption coefficient of the obtained light with a wavelength of 800 n- was 0.80 cm-'.

実施例2゜ AI、O,に混入させたチタン濃度がTizO,のモル
%で表わして0.2%のチタンサファイヤ単結晶を、集
光式FZ法(フローティングゾーン法)によって、その
雰囲気を95.511i^f+5%■2に1.5 Xl
0−’気圧の1180を加え、酸素分圧を10−”気圧
とし、単結晶を育成した。得られた単結晶のC軸方向に
透過する波長800 nmの光の吸収係数は0゜Olc
m−’以下であった。
Example 2 A titanium sapphire single crystal with a titanium concentration of 0.2% expressed as mol% of TizO mixed in AI, O, was heated to an atmosphere of 95% by concentrating FZ method (floating zone method). .511i^f+5%■2 to 1.5 Xl
A single crystal was grown by applying 0-'atm of 1180 to make the oxygen partial pressure 10-'atm.The absorption coefficient of light with a wavelength of 800 nm transmitted in the C-axis direction of the obtained single crystal was 0°Olc.
m-' or less.

比較例2、 実施例2における雰囲気を95%Ar+5%H3のみで
単結晶を育成した。得られた単結晶のC軸方向に透過す
る波長800n−の光の喋収係数は0.30cm−’で
あった。
Single crystals were grown in Comparative Example 2 and Example 2 using only 95% Ar + 5% H3 atmosphere. The absorption coefficient of light with a wavelength of 800 n-' transmitted in the C-axis direction of the obtained single crystal was 0.30 cm-'.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はチタンサファイヤ単結晶の焼鈍雰囲気中の酸素
分圧による波長800 n−の光の吸収係数の変化図、
第2図は高品質チタンサファイヤ単結晶の焼鈍又は成長
における適切な雰囲気条件の範囲図を示す。 ::1.ブ、−2  “− 第1図 ogPo2 第  2  図 温度(0C)
Figure 1 is a diagram of changes in the absorption coefficient of light with a wavelength of 800 n- due to oxygen partial pressure in the annealing atmosphere of titanium sapphire single crystal.
FIG. 2 shows a range diagram of suitable atmospheric conditions for annealing or growing high quality titanium sapphire single crystals. ::1. -2 "- Figure 1 ogPo2 Figure 2 Temperature (0C)

Claims (1)

【特許請求の範囲】 1)チタンサファイヤ単結晶の成長およびまたは成長後
の焼鈍に際して、雰囲気中の酸素分圧を調整して単結晶
中に3価以外のチタンイオンが無視できる程度まで少な
くなるように単結晶中のチタンイオンの価数制御を行う
ことを特徴とする高品質チタンサファイヤ単結晶の製造
方法。 2)雰囲気中の酸素分圧をlogPo_2=T/200
−22±3(Po_2は気圧単位で示した酸素分圧、T
は摂氏で示した温度を表わす)とする特許請求の範囲第
1項記載の製造方法。 3)雰囲気中の酸素分圧を調整する方法が雰囲気中にC
O_2+H_2、CO_2+CO、H_2O+H_2、
H_2O+COあるいはこれらに不活性気体を混合した
ものを導入することによって行う特許請求の範囲第1項
記載の製造方法。
[Claims] 1) During the growth of a titanium sapphire single crystal and/or annealing after growth, the oxygen partial pressure in the atmosphere is adjusted so that titanium ions other than trivalent titanium ions in the single crystal are reduced to a negligible level. A method for producing a high-quality titanium sapphire single crystal, which is characterized by controlling the valence of titanium ions in the single crystal. 2) The oxygen partial pressure in the atmosphere is logPo_2=T/200
-22±3 (Po_2 is oxygen partial pressure in atmospheric pressure units, T
2. The manufacturing method according to claim 1, wherein: represents the temperature in degrees Celsius. 3) The method of adjusting the oxygen partial pressure in the atmosphere is
O_2+H_2, CO_2+CO, H_2O+H_2,
The manufacturing method according to claim 1, which is carried out by introducing H_2O+CO or a mixture thereof with an inert gas.
JP10952287A 1987-05-01 1987-05-01 Production of titanium sapphire single crystal having high quality Granted JPS63274694A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10952287A JPS63274694A (en) 1987-05-01 1987-05-01 Production of titanium sapphire single crystal having high quality

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10952287A JPS63274694A (en) 1987-05-01 1987-05-01 Production of titanium sapphire single crystal having high quality

Publications (2)

Publication Number Publication Date
JPS63274694A true JPS63274694A (en) 1988-11-11
JPH042558B2 JPH042558B2 (en) 1992-01-20

Family

ID=14512389

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10952287A Granted JPS63274694A (en) 1987-05-01 1987-05-01 Production of titanium sapphire single crystal having high quality

Country Status (1)

Country Link
JP (1) JPS63274694A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6641939B1 (en) 1998-07-01 2003-11-04 The Morgan Crucible Company Plc Transition metal oxide doped alumina and methods of making and using
JP2004250283A (en) * 2003-02-20 2004-09-09 National Institute Of Advanced Industrial & Technology Method and device for preparing sample by controlling oxygen partial pressure
WO2011125897A1 (en) * 2010-03-31 2011-10-13 独立行政法人産業技術総合研究所 Manufacturing method of metal compound crystal, ornament manufacturing method, and metal compound crystal
JP2017197411A (en) * 2016-04-28 2017-11-02 日本電信電話株式会社 Method for manufacturing single crystal fiber

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61266394A (en) * 1985-05-20 1986-11-26 ユニオン・カ−バイド・コ−ポレ−シヨン Method of heightening fluorescence degree of ti:al203 tunable laser crystal by annealing

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61266394A (en) * 1985-05-20 1986-11-26 ユニオン・カ−バイド・コ−ポレ−シヨン Method of heightening fluorescence degree of ti:al203 tunable laser crystal by annealing

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6641939B1 (en) 1998-07-01 2003-11-04 The Morgan Crucible Company Plc Transition metal oxide doped alumina and methods of making and using
JP2004250283A (en) * 2003-02-20 2004-09-09 National Institute Of Advanced Industrial & Technology Method and device for preparing sample by controlling oxygen partial pressure
WO2011125897A1 (en) * 2010-03-31 2011-10-13 独立行政法人産業技術総合研究所 Manufacturing method of metal compound crystal, ornament manufacturing method, and metal compound crystal
JP2017197411A (en) * 2016-04-28 2017-11-02 日本電信電話株式会社 Method for manufacturing single crystal fiber

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