JPS63249065A - Hydraulic type heat shock testing apparatus - Google Patents
Hydraulic type heat shock testing apparatusInfo
- Publication number
- JPS63249065A JPS63249065A JP8290587A JP8290587A JPS63249065A JP S63249065 A JPS63249065 A JP S63249065A JP 8290587 A JP8290587 A JP 8290587A JP 8290587 A JP8290587 A JP 8290587A JP S63249065 A JPS63249065 A JP S63249065A
- Authority
- JP
- Japan
- Prior art keywords
- compressor
- heater
- temp
- temperature
- refrigeration cycle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims description 13
- 230000035939 shock Effects 0.000 title claims description 8
- 238000010438 heat treatment Methods 0.000 claims abstract description 9
- 238000001816 cooling Methods 0.000 claims abstract description 3
- 238000005057 refrigeration Methods 0.000 claims description 14
- 239000007788 liquid Substances 0.000 claims description 10
- 239000003507 refrigerant Substances 0.000 abstract description 4
- 239000000498 cooling water Substances 0.000 abstract description 2
- 239000002826 coolant Substances 0.000 abstract 3
- 239000007789 gas Substances 0.000 description 10
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000006835 compression Effects 0.000 description 2
- 238000009835 boiling Methods 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分熱〕
本発明は、半導体等の冷却、加熱くり返し試験を行う冷
熱衝撃試験装置に係り、!!!fiこ低温槽のランニン
グコストを安くし、装置の安全性能を向上させる構造憂
こ関する。[Detailed Description of the Invention] [Industrial Use of Heat] The present invention relates to a thermal shock testing device that performs repeated cooling and heating tests on semiconductors, etc.! ! ! The structure is related to reducing the running cost of the cryostat and improving the safety performance of the equipment.
(従来の技術〕
従来の装置は、!開昭60−129658号IC記載の
ように低温槽の温度制量は冷却器および加熱器で行なう
ようになっているが、加熱器の熱媒体に及ぼす影響、ラ
ンニングコスト、安全性等誓こついては配慮されていな
かった。(Prior art) In conventional equipment, the temperature of the cryostat is controlled by a cooler and a heater, as described in IC No. 60-129658, but the effect on the heat medium of the heater is No consideration was given to the impact, running costs, safety, etc.
(発明が解決しようとする間萌点)
上記従来技術は低温槽の厖度側−を冷却器で加熱し電気
ヒータで加熱した場合、その分だけ電力型が多くなり、
装置のランニングコストが高くなる問題がある。また低
温槽1ご用いる熱媒体は流動点が低いかわりに沸点も低
いため、電気ヒータ等を用いた場合表面温度が200°
C以上となり極度の液面低下をさせた場合、熱媒体を分
解させ人体に害を及ぼすガス体を発生してしまう問題も
あり、複雑な液面制御も必要であった。(Interval point to be solved by the invention) In the above conventional technology, when the cold side of the low temperature chamber is heated with a cooler and then heated with an electric heater, the number of electric power types increases accordingly.
There is a problem that the running cost of the device becomes high. In addition, the heat medium used in cryostat 1 has a low pour point but also a low boiling point, so if an electric heater or the like is used, the surface temperature will be 200°.
If the temperature exceeds C and the liquid level is extremely lowered, there is a problem that the heat medium will decompose and gases that are harmful to the human body will be generated, which requires complicated liquid level control.
(問題点を解決すふための手段〕
上記目的は低温槽の熱媒体加熱は二元冷凍サイクル高温
側の吐出ガスを用いて加熱することfこより、達成され
る。(Means for Solving the Problems) The above object is achieved by heating the heat medium in the low temperature chamber using the discharge gas from the high temperature side of the binary refrigeration cycle.
第1冷凍サイクルAの第1圧縮機21より吐出された冷
媒ガスは凝縮@22で外気または冷却水に放熱して凝縮
する。この凝縮液は第1膨脹弁28で減圧され、カスケ
ード熱交換器8に流入し、ここで第2冷凍サイクルBと
の熱交換により蒸発して第1圧縮機21に戻る。第2冷
凍サイクルBの第2圧縮@7より吐出された冷媒ガスは
カスケード熱交換器8にて前述の第1冷凍サイクルAに
放熱して冷却され、凝縮する、この凝縮液は第2膨脹弁
9にて後、蒸発器6に流入し、ここで低温槽熱媒体を冷
却して蒸発し、第2圧縮器7に戻る。このとき低温槽5
内を冷却しすぎないようにするため低温槽5内に設けた
温度センサ(図示せず)の信号によりホットガス往路系
29Aの制御弁81を0N−OFFまた比例制)御させ
、第1圧縮機21よりの冷媒ガスを加熱器10へ流入さ
せて、熱媒体2を加熱し調温する。The refrigerant gas discharged from the first compressor 21 of the first refrigeration cycle A radiates heat to the outside air or cooling water and condenses at condensation@22. This condensed liquid is depressurized by the first expansion valve 28 and flows into the cascade heat exchanger 8, where it evaporates through heat exchange with the second refrigeration cycle B and returns to the first compressor 21. The refrigerant gas discharged from the second compression @7 of the second refrigeration cycle B is cooled by radiating heat to the first refrigeration cycle A in the cascade heat exchanger 8, and is condensed.This condensed liquid is transferred to the second expansion valve. At 9, the heat transfer medium flows into the evaporator 6, where it is cooled and evaporated, and returns to the second compressor 7. At this time, the cryostat 5
In order to prevent the inside from being too cooled, the control valve 81 of the hot gas outgoing path system 29A is controlled (ON-OFF or proportional control) by a signal from a temperature sensor (not shown) installed in the low temperature chamber 5, and the first compression Refrigerant gas from the machine 21 is made to flow into the heater 10 to heat the heat medium 2 and adjust its temperature.
このように、低12iR11S内の熱媒体を電気加熱器
を用いず1こ調温できるので、ランニングコス+t−安
くできる。また耐媒ガスの温度ri100℃前後のため
加熱器の表面温度も極度に高くならず熱媒体を熱分解さ
せることがない。また電気加熱器の使用箇所が少なくな
るので、安全性が向上する。In this way, since the temperature of the heat medium in the low 12iR11S can be controlled without using an electric heater, the running cost +t- can be reduced. Furthermore, since the temperature ri of the medium gas is around 100° C., the surface temperature of the heater does not become extremely high and the heat medium is not thermally decomposed. Additionally, safety is improved because the number of locations where electric heaters are used is reduced.
以下、本発明の一実施例を第1図、第2図Eこより説明
する。第1図は本発明の液式熱衝撃試験装置における機
器の構成を系統図で表わしたものであり、第2図は低温
槽および冷凍サイクル系統図を表わしている。16は装
置本体で内部fこは高温槽1及び低温槽5を適宜配置す
る高温槽1には熱媒体2を所定の高温温度に上昇させ維
持するための電気加熱器4及び高温槽内を攪拌するため
の攪拌機8を具備している。又高温槽1には試験中の蒸
発等により減少する熱媒体2を補給する貯水器18とを
配管接続している。一方低温槽5には。An embodiment of the present invention will be described below with reference to FIGS. 1 and 2E. FIG. 1 is a system diagram showing the configuration of equipment in the liquid thermal shock testing apparatus of the present invention, and FIG. 2 is a system diagram of a low temperature chamber and a refrigeration cycle. Reference numeral 16 denotes the main body of the apparatus, and the internal f is a high-temperature tank 1 and a low-temperature tank 5, which are appropriately arranged. It is equipped with a stirrer 8 for this purpose. Further, a water reservoir 18 is connected to the high temperature tank 1 by piping to replenish the heat medium 2 which decreases due to evaporation or the like during the test. On the other hand, in the cryostat 5.
熱媒体2を所定の低m湛変に降下させるための蒸発器6
.調温維持するための加熱器10及び低温槽5内を攪拌
するための攪拌愼11を具備している。7t−jm2圧
縮機で前記蒸発器6と配管1こよって接続されるととも
に、第2膨脹弁9、カスケード熱交換lS8を配・Uに
よって顆序直列に接続して第2冷凍サイクルを形成して
いる。また前記加熱器10には第1圧縮機21、凝縮器
22、第1膨脹弁28、カスケード熱交換器8により構
成される第1冷凍サイクルと順次直列に配管により接続
し、第1圧縮器21からの吐出ガスを流入するように構
成されている。熱衝撃試験を行う場合、高温槽lは熱媒
体2を電気加熱器4により加熱し。Evaporator 6 for lowering the heat medium 2 to a predetermined low m content
.. It is equipped with a heater 10 for controlling and maintaining the temperature, and a stirrer 11 for stirring the inside of the low temperature bath 5. A 7t-jm2 compressor is connected to the evaporator 6 by the pipe 1, and a second expansion valve 9 and a cascade heat exchanger 1S8 are connected in series by an arrangement U to form a second refrigeration cycle. There is. Further, the heater 10 is connected in series with a first refrigeration cycle composed of a first compressor 21, a condenser 22, a first expansion valve 28, and a cascade heat exchanger 8 through piping. It is configured to allow discharge gas from to flow in therein. When performing a thermal shock test, the high temperature bath 1 heats the heat medium 2 with the electric heater 4.
高温の所定温度で維持し低温槽5は熱媒体2を、冷凍サ
イクル運転を行い、蒸発器6で冷却し、低温の所定温度
まで到達した時点で加熱器10#こより温度維持させる
。次に試料を試料115に入れ駆動装置14により駆動
させ、低温槽5又は高温槽1に交互に出し入れし、低温
試験、高温試験を行う。このときの低温槽5内の温度制
御は第2図に示すように、第2冷凍サイクルBの蒸発器
6で冷却しながら、第1冷凍サイクルAの加熱器1゜曝
こ第1冷凍サイクルAの第1圧a@21からのホットガ
スを制御弁81を開閉させコントロールする。制御弁の
開閉力法ri低低槽槽内5内こ設けた温度センサ(図示
せず)の信号により、0N−OF’F、比例制御等によ
り行なうことにより精度の高いat−17トロールも可
能となる。このよう番こ本実施例によれば、低温槽5内
の熱媒体2を電気加熱器を用いずに調温できるので、ラ
ンニングコストを安くできる。また電気加熱器の使用箇
所が少なくなるので、安全性が向上する。また熱媒性の
物性にあった使用方法ができ有害なガスの発生もさせる
ことなく、安全性が向上する。さらlこ本実施例のよう
にIIIN弁81全81制−によりコントロールすれば
高精度の温度コントロールも可能となる。The heat medium 2 is maintained at a predetermined high temperature, and the cryostat 5 performs a refrigeration cycle operation to cool the heat medium 2 with an evaporator 6, and when it reaches a predetermined low temperature, the temperature is maintained by a heater 10#. Next, a sample is placed in the sample 115 and driven by the drive device 14, and is alternately taken in and out of the low temperature bath 5 or the high temperature bath 1 to perform a low temperature test and a high temperature test. At this time, the temperature inside the cryostat 5 is controlled as shown in FIG. The hot gas from the first pressure a@21 is controlled by opening and closing the control valve 81. Control valve opening/closing force method ri Highly accurate AT-17 trawl is possible by performing 0N-OF'F, proportional control, etc. using a signal from a temperature sensor (not shown) installed inside the low-low tank 5. becomes. According to this embodiment, the temperature of the heat medium 2 in the low temperature chamber 5 can be controlled without using an electric heater, so running costs can be reduced. Additionally, safety is improved because the number of locations where electric heaters are used is reduced. In addition, it can be used in a way that matches the physical properties of the heating medium, and does not generate harmful gases, improving safety. Furthermore, if the temperature is controlled using the III-IN valve 81 as in this embodiment, highly accurate temperature control is also possible.
(発明の効果〕
本発明によれば、低温槽の調温を電気加熱器を用いるこ
となく行えるので、装置のランニングコストを低減でき
、かつ電気加熱器の使用箇所も少なくなるので、安全性
が高くなる。(Effects of the Invention) According to the present invention, the temperature of the cryostat can be controlled without using an electric heater, so the running cost of the device can be reduced, and the number of places where the electric heater is used is reduced, so safety is improved. It gets expensive.
第1図は本発明の一実施例の熱衝撃試験装置の機器の構
成系統図、第2図は低温槽および冷凍サイクル系統を示
す図である。
l・・・高温槽 5・・・低温槽 14・・・駆動
装置15・・・試料t
′$1図
+1FIG. 1 is a structural diagram of equipment of a thermal shock test apparatus according to an embodiment of the present invention, and FIG. 2 is a diagram showing a low temperature chamber and a refrigeration cycle system. l...High temperature tank 5...Low temperature tank 14...Drive device 15...Sample t'$1 Figure +1
Claims (1)
持する低温槽と液体熱媒体を加熱手段により高温温度に
保持する高温槽を適宜配置し被試験品を移動手段により
前記各槽へ交互に出し入れする液式熱衝撃試験装置にお
いて、第1圧縮機、凝縮器、第1膨脹弁、カスケード熱
交換器により構成される第1冷凍サイクルおよび第2圧
縮機、前記カスケード熱交換器、第2膨脹弁、蒸発器に
より構成される第2冷凍サイクルと、加熱器とを備え、
前記第2冷凍サイクルの蒸発器および前記加熱器を低温
槽内に配設し、その加熱器に前記第1冷凍サイクルのホ
ットガスを流入させるように構成したことを特徴とする
液式熱衝撃試験装置。 2、前記加熱器へのホットガスの流入を比例制御弁を用
いることを特徴とする特許請求の範囲第1項記載の液式
熱衝撃試験装置[Scope of Claims] 1. A low-temperature chamber that maintains a liquid heat medium at a low temperature by a cooling means and a heating means, and a high-temperature bath that maintains a liquid heat medium at a high temperature by a heating means are appropriately arranged, and the test article is moved by a moving means. In the liquid type thermal shock test device that alternately takes in and out of each tank, the first refrigeration cycle and the second compressor are composed of a first compressor, a condenser, a first expansion valve, and a cascade heat exchanger, and A second refrigeration cycle composed of an exchanger, a second expansion valve, and an evaporator, and a heater,
A liquid thermal shock test characterized in that the evaporator of the second refrigeration cycle and the heater are arranged in a low temperature chamber, and the hot gas of the first refrigeration cycle is allowed to flow into the heater. Device. 2. The liquid type thermal shock test apparatus according to claim 1, characterized in that a proportional control valve is used to control the inflow of hot gas into the heater.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8290587A JPS63249065A (en) | 1987-04-06 | 1987-04-06 | Hydraulic type heat shock testing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8290587A JPS63249065A (en) | 1987-04-06 | 1987-04-06 | Hydraulic type heat shock testing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63249065A true JPS63249065A (en) | 1988-10-17 |
Family
ID=13787274
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8290587A Pending JPS63249065A (en) | 1987-04-06 | 1987-04-06 | Hydraulic type heat shock testing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63249065A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03195038A (en) * | 1989-12-25 | 1991-08-26 | Nippon Telegr & Teleph Corp <Ntt> | Evaluating apparatus for semiconductor integrated circuit |
KR100565257B1 (en) | 2004-10-05 | 2006-03-30 | 엘지전자 주식회사 | Secondary refrigerant cycle using compressor and air conditioner having the same |
CN109147514A (en) * | 2018-09-30 | 2019-01-04 | 三峡大学 | A kind of circulating miniature pumping-up energy-storage system suitable for teaching, training and research |
-
1987
- 1987-04-06 JP JP8290587A patent/JPS63249065A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03195038A (en) * | 1989-12-25 | 1991-08-26 | Nippon Telegr & Teleph Corp <Ntt> | Evaluating apparatus for semiconductor integrated circuit |
KR100565257B1 (en) | 2004-10-05 | 2006-03-30 | 엘지전자 주식회사 | Secondary refrigerant cycle using compressor and air conditioner having the same |
CN109147514A (en) * | 2018-09-30 | 2019-01-04 | 三峡大学 | A kind of circulating miniature pumping-up energy-storage system suitable for teaching, training and research |
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